TW200509224A - Surface processing method, manufacturing method of silicon epitaxy wafer and silicon epitaxy wafer - Google Patents
Surface processing method, manufacturing method of silicon epitaxy wafer and silicon epitaxy waferInfo
- Publication number
- TW200509224A TW200509224A TW093113228A TW93113228A TW200509224A TW 200509224 A TW200509224 A TW 200509224A TW 093113228 A TW093113228 A TW 093113228A TW 93113228 A TW93113228 A TW 93113228A TW 200509224 A TW200509224 A TW 200509224A
- Authority
- TW
- Taiwan
- Prior art keywords
- single crystal
- crystal substrate
- silicon
- silicon single
- silicon epitaxy
- Prior art date
Links
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title abstract 12
- 229910052710 silicon Inorganic materials 0.000 title abstract 12
- 239000010703 silicon Substances 0.000 title abstract 12
- 238000000407 epitaxy Methods 0.000 title abstract 5
- 238000004519 manufacturing process Methods 0.000 title abstract 2
- 238000003672 processing method Methods 0.000 title 1
- 239000013078 crystal Substances 0.000 abstract 7
- 239000000758 substrate Substances 0.000 abstract 7
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 abstract 2
- 230000002093 peripheral effect Effects 0.000 abstract 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 1
- 239000007788 liquid Substances 0.000 abstract 1
- 239000002245 particle Substances 0.000 abstract 1
- 229910052814 silicon oxide Inorganic materials 0.000 abstract 1
- 238000007740 vapor deposition Methods 0.000 abstract 1
- 238000000927 vapour-phase epitaxy Methods 0.000 abstract 1
Classifications
-
- E—FIXED CONSTRUCTIONS
- E04—BUILDING
- E04D—ROOF COVERINGS; SKY-LIGHTS; GUTTERS; ROOF-WORKING TOOLS
- E04D11/00—Roof covering, as far as not restricted to features covered by only one of groups E04D1/00 - E04D9/00; Roof covering in ways not provided for by groups E04D1/00 - E04D9/00, e.g. built-up roofs, elevated load-supporting roof coverings
- E04D11/02—Build-up roofs, i.e. consisting of two or more layers bonded together in situ, at least one of the layers being of watertight composition
-
- E—FIXED CONSTRUCTIONS
- E04—BUILDING
- E04D—ROOF COVERINGS; SKY-LIGHTS; GUTTERS; ROOF-WORKING TOOLS
- E04D13/00—Special arrangements or devices in connection with roof coverings; Protection against birds; Roof drainage ; Sky-lights
- E04D13/17—Ventilation of roof coverings not otherwise provided for
Landscapes
- Engineering & Computer Science (AREA)
- Architecture (AREA)
- Civil Engineering (AREA)
- Structural Engineering (AREA)
- Weting (AREA)
- Chemical Vapour Deposition (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003143633A JP4066881B2 (ja) | 2003-05-21 | 2003-05-21 | 表面処理方法、シリコンエピタキシャルウェーハの製造方法及びシリコンエピタキシャルウェーハ |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200509224A true TW200509224A (en) | 2005-03-01 |
| TWI334167B TWI334167B (enExample) | 2010-12-01 |
Family
ID=33531359
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW093113228A TW200509224A (en) | 2003-05-21 | 2004-05-11 | Surface processing method, manufacturing method of silicon epitaxy wafer and silicon epitaxy wafer |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP4066881B2 (enExample) |
| KR (1) | KR101050679B1 (enExample) |
| CN (2) | CN100401483C (enExample) |
| TW (1) | TW200509224A (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100365889C (zh) * | 2006-05-18 | 2008-01-30 | 中微光电子(潍坊)有限公司 | 一种防止垂直腔面发射半导体激光器在湿法氧化时开裂的方法 |
| CN101311340B (zh) * | 2008-03-19 | 2010-06-02 | 南京国盛电子有限公司 | 硅反外延片的制造方法及其专用设备 |
| WO2010035409A1 (ja) * | 2008-09-26 | 2010-04-01 | 信越半導体株式会社 | シリコンエピタキシャルウェーハの製造方法 |
| JP5141541B2 (ja) * | 2008-12-24 | 2013-02-13 | 株式会社Sumco | エピタキシャルウェーハの製造方法 |
| KR101022567B1 (ko) * | 2009-02-02 | 2011-03-16 | 주식회사 엘지실트론 | 에피택셜 웨이퍼 제조 방법 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04245431A (ja) * | 1991-01-30 | 1992-09-02 | Kyushu Electron Metal Co Ltd | 半導体基板の酸化膜除去方法とその装置 |
| JP2970499B2 (ja) * | 1995-10-30 | 1999-11-02 | 日本電気株式会社 | 半導体装置の製造方法 |
| JP3635200B2 (ja) * | 1998-06-04 | 2005-04-06 | 信越半導体株式会社 | Soiウェーハの製造方法 |
| US6444027B1 (en) * | 2000-05-08 | 2002-09-03 | Memc Electronic Materials, Inc. | Modified susceptor for use in chemical vapor deposition process |
| JP3727602B2 (ja) * | 2002-03-11 | 2005-12-14 | 大日本スクリーン製造株式会社 | 基板周縁処理装置および基板周縁処理方法 |
-
2003
- 2003-05-21 JP JP2003143633A patent/JP4066881B2/ja not_active Expired - Fee Related
-
2004
- 2004-05-11 TW TW093113228A patent/TW200509224A/zh not_active IP Right Cessation
- 2004-05-17 KR KR1020040034749A patent/KR101050679B1/ko not_active Expired - Fee Related
- 2004-05-21 CN CNB2004100457066A patent/CN100401483C/zh not_active Expired - Fee Related
- 2004-05-21 CN CN2008100955430A patent/CN101271870B/zh not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| CN101271870B (zh) | 2010-12-08 |
| KR20040100937A (ko) | 2004-12-02 |
| CN1574247A (zh) | 2005-02-02 |
| TWI334167B (enExample) | 2010-12-01 |
| CN100401483C (zh) | 2008-07-09 |
| CN101271870A (zh) | 2008-09-24 |
| JP2004349405A (ja) | 2004-12-09 |
| KR101050679B1 (ko) | 2011-07-22 |
| JP4066881B2 (ja) | 2008-03-26 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US7922813B2 (en) | Epitaxially coated silicon wafer and method for producing epitaxially coated silicon wafers | |
| JP2827885B2 (ja) | 半導体単結晶基板およびその製造方法 | |
| JP2004502298A5 (enExample) | ||
| EP1054442A3 (en) | Method for growing epitaxial group III nitride compound semiconductors on silicon | |
| WO2019128524A1 (zh) | 一种消除晶圆翘曲的方法及复合衬底 | |
| WO2006060466A3 (en) | Near single-crystalline, high-carrier-mobility silicon thin film on a polycrystalline/amorphous substrate | |
| EP0866493A3 (en) | Semiconductor substrate having compound semiconductor layer, process for its production, and electronic device fabricated on semiconductor substrate | |
| EP1396877A3 (en) | Substrate for electronic devices, manufacturing method therefor, and electronic device | |
| MY149217A (en) | Nitride semiconductor component layer structure on a group iv substrate surface and fabrication method | |
| EP0826801A3 (en) | Silicon substrate manufacture | |
| SG176450A1 (en) | Epitaxially coated silicon wafer with <110> orientation and method for producing it | |
| EP1601009A1 (en) | Nitride semiconductor device and method for manufacturing same | |
| TW200509224A (en) | Surface processing method, manufacturing method of silicon epitaxy wafer and silicon epitaxy wafer | |
| CN109686837A (zh) | 一种高灵敏度霍尔元件的制备方法 | |
| CN103074676B (zh) | 一种实现具有自剥离功能半导体材料生长的边缘保护方法 | |
| JPH06232057A (ja) | エピタキシャル基板の製造方法 | |
| JP2003022989A (ja) | エピタキシャル半導体ウェーハ及びその製造方法 | |
| JP4196542B2 (ja) | 気相成長用サセプタ及びこれを用いた気相成長方法 | |
| WO2003009377A3 (en) | Semiconductor structures with coplaner surfaces | |
| US20060138540A1 (en) | Semiconductor wafer having a semiconductor layer and an electrically insulating layer beneath it, and process for producing it | |
| JPWO2007088958A1 (ja) | 化合物半導体成長用基板およびエピタキシャル成長方法 | |
| TW200620452A (en) | Method of preparing the surface of a Si substrate or layer or source and drain recess of semiconductor elements for depositing an epitaxial layer of sige | |
| CA2193098A1 (en) | Preparation of Semiconductor Substrates | |
| WO2020151132A1 (zh) | 一种半导体器件的制备方法及系统 | |
| US6599758B2 (en) | Post-epitaxial thermal oxidation for reducing microsteps on polished semiconductor wafers |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |