TW200504350A - Substrate inspection system, substrate inspection method and substrate inspection device - Google Patents
Substrate inspection system, substrate inspection method and substrate inspection deviceInfo
- Publication number
- TW200504350A TW200504350A TW093108290A TW93108290A TW200504350A TW 200504350 A TW200504350 A TW 200504350A TW 093108290 A TW093108290 A TW 093108290A TW 93108290 A TW93108290 A TW 93108290A TW 200504350 A TW200504350 A TW 200504350A
- Authority
- TW
- Taiwan
- Prior art keywords
- substrate inspection
- substrate
- inspected
- inspection
- defect
- Prior art date
Links
Classifications
-
- A—HUMAN NECESSITIES
- A01—AGRICULTURE; FORESTRY; ANIMAL HUSBANDRY; HUNTING; TRAPPING; FISHING
- A01K—ANIMAL HUSBANDRY; CARE OF BIRDS, FISHES, INSECTS; FISHING; REARING OR BREEDING ANIMALS, NOT OTHERWISE PROVIDED FOR; NEW BREEDS OF ANIMALS
- A01K61/00—Culture of aquatic animals
- A01K61/10—Culture of aquatic animals of fish
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
- G01N2021/8867—Grading and classifying of flaws using sequentially two or more inspection runs, e.g. coarse and fine, or detecting then analysing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N2021/9513—Liquid crystal panels
Landscapes
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Pathology (AREA)
- Immunology (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Environmental Sciences (AREA)
- Biochemistry (AREA)
- Zoology (AREA)
- Marine Sciences & Fisheries (AREA)
- Biodiversity & Conservation Biology (AREA)
- Animal Husbandry (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003084741A JP4529365B2 (ja) | 2003-03-26 | 2003-03-26 | 基板検査システムおよび基板検査方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200504350A true TW200504350A (en) | 2005-02-01 |
TWI307408B TWI307408B (zh) | 2009-03-11 |
Family
ID=33399840
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW093108290A TW200504350A (en) | 2003-03-26 | 2004-03-26 | Substrate inspection system, substrate inspection method and substrate inspection device |
Country Status (4)
Country | Link |
---|---|
US (1) | US7330042B2 (zh) |
JP (1) | JP4529365B2 (zh) |
KR (1) | KR101104665B1 (zh) |
TW (1) | TW200504350A (zh) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10308258A1 (de) * | 2003-02-25 | 2004-09-02 | Leica Microsystems Jena Gmbh | Vorrichtung und Verfahren zur Dünnschichtmetrologie |
US7858404B2 (en) | 2007-03-14 | 2010-12-28 | Taiwan Semiconductor Manufacturing Company, Ltd. | Measurement of overlay offset in semiconductor processing |
US8340801B2 (en) * | 2009-12-29 | 2012-12-25 | Memc Electronic Materials, Inc. | Systems for generating representations of flatness defects on wafers |
US8165706B2 (en) * | 2009-12-29 | 2012-04-24 | Memc Electronic Materials, Inc. | Methods for generating representations of flatness defects on wafers |
JP5625935B2 (ja) * | 2011-01-18 | 2014-11-19 | オムロン株式会社 | 判定基準値の適否判定方法およびその適正値の特定方法ならびに適正値への変更方法、部品実装基板の検査システム、生産現場におけるシミュレーション方法およびシミュレーションシステム |
JP5782782B2 (ja) * | 2011-03-30 | 2015-09-24 | 株式会社Sumco | 特定欠陥の検出方法、特定欠陥の検出システムおよびプログラム |
US20130335743A1 (en) * | 2012-06-19 | 2013-12-19 | Shenzhen China Star Optoelectronics Technology Co. Ltd. | Inspection Device for Glass Substrate Cassette |
CN103247550B (zh) * | 2013-05-07 | 2016-04-13 | 上海华力微电子有限公司 | 监控制程稳定性的测试模块和方法 |
US9262821B2 (en) | 2014-05-12 | 2016-02-16 | Kla-Tencor Corp. | Inspection recipe setup from reference image variation |
US10438340B2 (en) * | 2017-03-21 | 2019-10-08 | Test Research, Inc. | Automatic optical inspection system and operating method thereof |
JP6819451B2 (ja) * | 2017-05-08 | 2021-01-27 | 信越化学工業株式会社 | 大型合成石英ガラス基板並びにその評価方法及び製造方法 |
US11300521B2 (en) * | 2017-06-14 | 2022-04-12 | Camtek Ltd. | Automatic defect classification |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5944778B2 (ja) * | 1980-11-29 | 1984-11-01 | 日本電気ホームエレクトロニクス株式会社 | 半導体ペレツト外観検査方法 |
JPS5910231A (ja) * | 1982-07-09 | 1984-01-19 | Mitsubishi Electric Corp | パタ−ン欠陥解析装置 |
US4644172A (en) * | 1984-02-22 | 1987-02-17 | Kla Instruments Corporation | Electronic control of an automatic wafer inspection system |
JPS62173731A (ja) * | 1986-01-28 | 1987-07-30 | Toshiba Corp | 被検査物の表面検査装置 |
IL99823A0 (en) * | 1990-11-16 | 1992-08-18 | Orbot Instr Ltd | Optical inspection method and apparatus |
JPH07321174A (ja) * | 1994-05-25 | 1995-12-08 | Sony Corp | 半導体検査装置 |
JP2847351B2 (ja) * | 1994-12-29 | 1999-01-20 | 名古屋電機工業株式会社 | 実装済印刷配線板自動検査装置 |
JP3361945B2 (ja) * | 1996-12-19 | 2003-01-07 | 株式会社日立製作所 | 平面ディスプレイパネルの製造方法およびプラズマディスプレイパネルの製造方法 |
JP3981895B2 (ja) | 1997-08-29 | 2007-09-26 | 株式会社ニコン | 自動マクロ検査装置 |
JP3333148B2 (ja) | 1999-05-31 | 2002-10-07 | オリンパス光学工業株式会社 | 外観検査装置 |
JP2001099788A (ja) | 1999-09-28 | 2001-04-13 | Sharp Corp | 自動マクロ外観検査装置 |
JP2001141657A (ja) * | 1999-10-29 | 2001-05-25 | Internatl Business Mach Corp <Ibm> | マクロ検査用照明装置、マクロ検査装置及び該方法 |
JP3801849B2 (ja) * | 2000-08-07 | 2006-07-26 | 東京エレクトロン株式会社 | 基板処理装置及びその方法 |
JP2002076077A (ja) * | 2000-08-31 | 2002-03-15 | Nikon Corp | 検査装置 |
JP4004248B2 (ja) * | 2000-09-01 | 2007-11-07 | 大日本スクリーン製造株式会社 | 基板処理装置および基板検査方法 |
JP4733252B2 (ja) * | 2000-09-05 | 2011-07-27 | Sumco Techxiv株式会社 | ウエハの表面検査装置及び検査方法 |
US6673637B2 (en) * | 2000-09-20 | 2004-01-06 | Kla-Tencor Technologies | Methods and systems for determining a presence of macro defects and overlay of a specimen |
US6891627B1 (en) * | 2000-09-20 | 2005-05-10 | Kla-Tencor Technologies Corp. | Methods and systems for determining a critical dimension and overlay of a specimen |
-
2003
- 2003-03-26 JP JP2003084741A patent/JP4529365B2/ja not_active Expired - Fee Related
-
2004
- 2004-03-23 KR KR1020040019584A patent/KR101104665B1/ko active IP Right Grant
- 2004-03-24 US US10/807,262 patent/US7330042B2/en active Active
- 2004-03-26 TW TW093108290A patent/TW200504350A/zh unknown
Also Published As
Publication number | Publication date |
---|---|
TWI307408B (zh) | 2009-03-11 |
KR20040084710A (ko) | 2004-10-06 |
US7330042B2 (en) | 2008-02-12 |
JP4529365B2 (ja) | 2010-08-25 |
JP2004294172A (ja) | 2004-10-21 |
KR101104665B1 (ko) | 2012-01-13 |
US20050072945A1 (en) | 2005-04-07 |
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