SG90251A1 - Gold wire for semiconductor element connection and semiconductor element connection method - Google Patents
Gold wire for semiconductor element connection and semiconductor element connection methodInfo
- Publication number
- SG90251A1 SG90251A1 SG200103210A SG200103210A SG90251A1 SG 90251 A1 SG90251 A1 SG 90251A1 SG 200103210 A SG200103210 A SG 200103210A SG 200103210 A SG200103210 A SG 200103210A SG 90251 A1 SG90251 A1 SG 90251A1
- Authority
- SG
- Singapore
- Prior art keywords
- semiconductor element
- element connection
- gold wire
- connection method
- gold
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 title 1
Classifications
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- H01L24/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K20/00—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating
- B23K20/002—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating specially adapted for particular articles or work
- B23K20/004—Wire welding
- B23K20/005—Capillary welding
- B23K20/007—Ball bonding
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- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
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- C22C5/02—Alloys based on gold
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- H01L2924/207—Diameter ranges
- H01L2924/2076—Diameter ranges equal to or larger than 100 microns
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/12—All metal or with adjacent metals
- Y10T428/12493—Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.]
- Y10T428/12528—Semiconductor component
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Mechanical Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Wire Bonding (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000166524A JP3382918B2 (ja) | 2000-05-31 | 2000-05-31 | 半導体素子接続用金線 |
Publications (1)
Publication Number | Publication Date |
---|---|
SG90251A1 true SG90251A1 (en) | 2002-07-23 |
Family
ID=18669826
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200103210A SG90251A1 (en) | 2000-05-31 | 2001-05-29 | Gold wire for semiconductor element connection and semiconductor element connection method |
Country Status (9)
Country | Link |
---|---|
US (1) | US6492593B2 (zh) |
EP (1) | EP1160344B1 (zh) |
JP (1) | JP3382918B2 (zh) |
KR (1) | KR100692495B1 (zh) |
CN (1) | CN1169202C (zh) |
DE (1) | DE60140778D1 (zh) |
MY (1) | MY117233A (zh) |
SG (1) | SG90251A1 (zh) |
TW (1) | TW569361B (zh) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7271497B2 (en) * | 2003-03-10 | 2007-09-18 | Fairchild Semiconductor Corporation | Dual metal stud bumping for flip chip applications |
KR100618052B1 (ko) * | 2003-04-14 | 2006-08-30 | 엠케이전자 주식회사 | 반도체 소자 본딩용 금 합금세선 |
JP4462864B2 (ja) * | 2003-07-18 | 2010-05-12 | フィガロ技研株式会社 | ガスセンサの製造方法 |
JP4513440B2 (ja) * | 2004-07-15 | 2010-07-28 | 住友ベークライト株式会社 | 半導体装置 |
EP1811555A4 (en) * | 2004-09-30 | 2012-06-20 | Tanaka Electronics Ind | AU-ALLOY BOND WIRE |
JP2006324553A (ja) * | 2005-05-20 | 2006-11-30 | Renesas Technology Corp | 半導体装置及びその製造方法 |
JP5166738B2 (ja) | 2006-03-24 | 2013-03-21 | 新日鉄住金マテリアルズ株式会社 | 半導体素子接続用金線 |
CN101332477B (zh) * | 2007-06-28 | 2010-09-29 | 山东华宏微电子材料科技有限公司 | 半导体器件硅铝键合线制造方法 |
JP4134261B1 (ja) * | 2007-10-24 | 2008-08-20 | 田中電子工業株式会社 | ボールボンディング用金合金線 |
JP4195495B1 (ja) * | 2007-11-06 | 2008-12-10 | 田中電子工業株式会社 | ボールボンディング用金合金線 |
JP2010123817A (ja) * | 2008-11-21 | 2010-06-03 | Fujitsu Ltd | ワイヤボンディング方法および電子装置とその製造方法 |
CN101626006B (zh) * | 2009-07-09 | 2012-06-20 | 烟台一诺电子材料有限公司 | 柔性键合铜丝及其制备方法 |
KR20130026805A (ko) * | 2011-09-06 | 2013-03-14 | 삼성전자주식회사 | 반도체 패키지의 와이어 본딩 시스템 |
US8540136B1 (en) * | 2012-09-06 | 2013-09-24 | Taiwan Semiconductor Manufacturing Company, Ltd. | Methods for stud bump formation and apparatus for performing the same |
JP6455037B2 (ja) * | 2014-09-12 | 2019-01-23 | 富士電機株式会社 | 半導体装置の製造方法 |
CN110718526A (zh) * | 2019-10-22 | 2020-01-21 | 烟台一诺电子材料有限公司 | 一种超细线距电子封装用稀土铜合金键合丝及其制备方法 |
CN111485131B (zh) * | 2020-04-17 | 2021-12-24 | 烟台招金励福贵金属股份有限公司 | 一种键合金丝及其制备方法 |
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US4885135A (en) * | 1981-12-04 | 1989-12-05 | Mitsubishi Kinzoku Kabushiki Kaisha | Fine gold alloy wire for bonding of a semi-conductor device |
JPH02205641A (ja) * | 1989-01-31 | 1990-08-15 | Tatsuta Electric Wire & Cable Co Ltd | ボンディング用金合金細線 |
GB2262944A (en) * | 1989-04-28 | 1993-07-07 | Tanaka Electronics Ind | Gold wire |
EP0685565B1 (en) * | 1993-09-06 | 1999-03-24 | Mitsubishi Materials Corporation | Golden ornament material hardened by alloying with minor components |
JP2000040710A (ja) * | 1998-07-24 | 2000-02-08 | Sumitomo Metal Mining Co Ltd | ボンディング用金合金細線 |
JP2000144282A (ja) * | 1998-11-09 | 2000-05-26 | Mitsubishi Materials Corp | 半導体装置のボンディング用金合金細線 |
EP0810293B1 (en) * | 1996-05-28 | 2001-10-24 | Tanaka Denshi Kogyo Kabushiki Kaisha | Gold alloy wire and method for making a bump |
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JPS5282183A (en) * | 1975-12-29 | 1977-07-09 | Nec Corp | Connecting wires for semiconductor devices |
GB2201545B (en) * | 1987-01-30 | 1991-09-11 | Tanaka Electronics Ind | Method for connecting semiconductor material |
US4950866A (en) * | 1987-12-08 | 1990-08-21 | Hitachi, Ltd. | Method and apparatus of bonding insulated and coated wire |
JP2778093B2 (ja) * | 1988-09-29 | 1998-07-23 | 三菱マテリアル株式会社 | 金バンプ用金合金細線 |
JPH02205651A (ja) | 1989-02-06 | 1990-08-15 | Furukawa Alum Co Ltd | 磁気ディスク基板用アルミニウム合金 |
US4970365A (en) * | 1989-09-28 | 1990-11-13 | International Business Machines Corporation | Method and apparatus for bonding components leads to pads located on a non-rigid substrate |
JP2792337B2 (ja) * | 1992-06-04 | 1998-09-03 | 日本電気株式会社 | ワイヤボンディング装置 |
JP2922388B2 (ja) * | 1993-04-22 | 1999-07-19 | 新日本製鐵株式会社 | ボンディング用金合金細線 |
US5842628A (en) * | 1995-04-10 | 1998-12-01 | Fujitsu Limited | Wire bonding method, semiconductor device, capillary for wire bonding and ball bump forming method |
US5945065A (en) * | 1996-07-31 | 1999-08-31 | Tanaka Denshi Kogyo | Method for wedge bonding using a gold alloy wire |
JP3126926B2 (ja) | 1996-09-09 | 2001-01-22 | 新日本製鐵株式会社 | 半導体素子用金合金細線および半導体装置 |
JP3573321B2 (ja) * | 1996-12-11 | 2004-10-06 | 住友金属鉱山株式会社 | Auボンディングワイヤー |
JP3673366B2 (ja) | 1997-04-30 | 2005-07-20 | 新日本製鐵株式会社 | 半導体素子 |
JP2990128B2 (ja) * | 1997-10-16 | 1999-12-13 | 九州日本電気株式会社 | 半導体装置内部接続用被覆金属細線 |
JPH11126788A (ja) * | 1997-10-23 | 1999-05-11 | Tanaka Electron Ind Co Ltd | Icチップ接続用金合金線 |
JP3689234B2 (ja) | 1997-11-25 | 2005-08-31 | 新日本製鐵株式会社 | バンプ用微小金ボールおよび半導体装置 |
-
2000
- 2000-05-31 JP JP2000166524A patent/JP3382918B2/ja not_active Expired - Fee Related
-
2001
- 2001-05-29 SG SG200103210A patent/SG90251A1/en unknown
- 2001-05-29 DE DE60140778T patent/DE60140778D1/de not_active Expired - Lifetime
- 2001-05-29 EP EP01250190A patent/EP1160344B1/en not_active Expired - Lifetime
- 2001-05-30 KR KR1020010030074A patent/KR100692495B1/ko not_active IP Right Cessation
- 2001-05-30 TW TW090113064A patent/TW569361B/zh not_active IP Right Cessation
- 2001-05-30 MY MYPI20012572A patent/MY117233A/en unknown
- 2001-05-31 US US09/872,651 patent/US6492593B2/en not_active Expired - Fee Related
- 2001-05-31 CN CNB011213205A patent/CN1169202C/zh not_active Expired - Fee Related
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
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US4885135A (en) * | 1981-12-04 | 1989-12-05 | Mitsubishi Kinzoku Kabushiki Kaisha | Fine gold alloy wire for bonding of a semi-conductor device |
JPH02205641A (ja) * | 1989-01-31 | 1990-08-15 | Tatsuta Electric Wire & Cable Co Ltd | ボンディング用金合金細線 |
GB2262944A (en) * | 1989-04-28 | 1993-07-07 | Tanaka Electronics Ind | Gold wire |
EP0685565B1 (en) * | 1993-09-06 | 1999-03-24 | Mitsubishi Materials Corporation | Golden ornament material hardened by alloying with minor components |
EP0810293B1 (en) * | 1996-05-28 | 2001-10-24 | Tanaka Denshi Kogyo Kabushiki Kaisha | Gold alloy wire and method for making a bump |
JP2000040710A (ja) * | 1998-07-24 | 2000-02-08 | Sumitomo Metal Mining Co Ltd | ボンディング用金合金細線 |
JP2000144282A (ja) * | 1998-11-09 | 2000-05-26 | Mitsubishi Materials Corp | 半導体装置のボンディング用金合金細線 |
Also Published As
Publication number | Publication date |
---|---|
CN1169202C (zh) | 2004-09-29 |
EP1160344B1 (en) | 2009-12-16 |
JP2001345342A (ja) | 2001-12-14 |
TW569361B (en) | 2004-01-01 |
JP3382918B2 (ja) | 2003-03-04 |
EP1160344A1 (en) | 2001-12-05 |
KR100692495B1 (ko) | 2007-03-09 |
KR20010110133A (ko) | 2001-12-12 |
CN1326224A (zh) | 2001-12-12 |
US6492593B2 (en) | 2002-12-10 |
US20020007957A1 (en) | 2002-01-24 |
MY117233A (en) | 2004-05-31 |
DE60140778D1 (de) | 2010-01-28 |
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