SG64454A1 - Geometrical control of device corner threshold - Google Patents
Geometrical control of device corner thresholdInfo
- Publication number
- SG64454A1 SG64454A1 SG1997003836A SG1997003836A SG64454A1 SG 64454 A1 SG64454 A1 SG 64454A1 SG 1997003836 A SG1997003836 A SG 1997003836A SG 1997003836 A SG1997003836 A SG 1997003836A SG 64454 A1 SG64454 A1 SG 64454A1
- Authority
- SG
- Singapore
- Prior art keywords
- device corner
- corner threshold
- geometrical control
- geometrical
- control
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
- H01L21/762—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
- H01L21/76224—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using trench refilling with dielectric materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/28008—Making conductor-insulator-semiconductor electrodes
- H01L21/28017—Making conductor-insulator-semiconductor electrodes the insulator being formed after the semiconductor body, the semiconductor being silicon
- H01L21/28026—Making conductor-insulator-semiconductor electrodes the insulator being formed after the semiconductor body, the semiconductor being silicon characterised by the conductor
- H01L21/28123—Lithography-related aspects, e.g. sub-lithography lengths; Isolation-related aspects, e.g. to solve problems arising at the crossing with the side of the device isolation; Planarisation aspects
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
- H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
- H01L21/822—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using silicon technology
- H01L21/8232—Field-effect technology
- H01L21/8234—MIS technology, i.e. integration processes of field effect transistors of the conductor-insulator-semiconductor type
- H01L21/823437—MIS technology, i.e. integration processes of field effect transistors of the conductor-insulator-semiconductor type with a particular manufacturing method of the gate conductors, e.g. particular materials, shapes
- H01L21/823456—MIS technology, i.e. integration processes of field effect transistors of the conductor-insulator-semiconductor type with a particular manufacturing method of the gate conductors, e.g. particular materials, shapes gate conductors with different shapes, lengths or dimensions
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/888—Shaping or removal of materials, e.g. etching
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/902—Specified use of nanostructure
- Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
- Y10S977/936—Specified use of nanostructure for electronic or optoelectronic application in a transistor or 3-terminal device
- Y10S977/938—Field effect transistors, FETS, with nanowire- or nanotube-channel region
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
- Semiconductor Memories (AREA)
- Element Separation (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/753,234 US5858866A (en) | 1996-11-22 | 1996-11-22 | Geometrical control of device corner threshold |
Publications (1)
Publication Number | Publication Date |
---|---|
SG64454A1 true SG64454A1 (en) | 1999-04-27 |
Family
ID=25029754
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG1997003836A SG64454A1 (en) | 1996-11-22 | 1997-10-22 | Geometrical control of device corner threshold |
Country Status (7)
Country | Link |
---|---|
US (3) | US5858866A (ja) |
JP (1) | JP3160237B2 (ja) |
KR (1) | KR100295727B1 (ja) |
CN (1) | CN1087503C (ja) |
MY (1) | MY122084A (ja) |
SG (1) | SG64454A1 (ja) |
TW (1) | TW385538B (ja) |
Families Citing this family (44)
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US5970471A (en) | 1996-03-22 | 1999-10-19 | Charles E. Hill & Associates, Inc. | Virtual catalog and product presentation method and apparatus |
US6133099A (en) * | 1997-02-04 | 2000-10-17 | Nec Corporation | Vertical MOSFET and method of manufacturing thereof |
US6002160A (en) * | 1997-12-12 | 1999-12-14 | Advanced Micro Devices, Inc. | Semiconductor isolation process to minimize weak oxide problems |
US6742183B1 (en) * | 1998-05-15 | 2004-05-25 | United Video Properties, Inc. | Systems and methods for advertising television networks, channels, and programs |
US6127215A (en) * | 1998-10-29 | 2000-10-03 | International Business Machines Corp. | Deep pivot mask for enhanced buried-channel PFET performance and reliability |
JP4649006B2 (ja) | 1999-07-16 | 2011-03-09 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
KR20020073521A (ko) * | 2000-02-01 | 2002-09-26 | 유나이티드 비디오 프로퍼티즈, 인크. | 녹화된 프로그램에 광고물을 제공하기 위한 시스템 및 방법 |
ES2349503T3 (es) | 2000-02-01 | 2011-01-04 | United Video Properties, Inc. | Métodos y sistemas para publicidad forzada. |
US6468853B1 (en) * | 2000-08-18 | 2002-10-22 | Chartered Semiconductor Manufacturing Ltd. | Method of fabricating a shallow trench isolation structure with reduced local oxide recess near corner |
DE10131710B4 (de) * | 2001-06-29 | 2006-05-18 | Infineon Technologies Ag | Verfahren zur gezielten Einstellung der Stufenhöhe bei der STI-Technik zur Herstellung von integrierten Schaltungen |
US7105899B2 (en) * | 2002-01-17 | 2006-09-12 | Micron Technology, Inc. | Transistor structure having reduced transistor leakage attributes |
US6806163B2 (en) * | 2002-07-05 | 2004-10-19 | Taiwan Semiconductor Manufacturing Co., Ltd | Ion implant method for topographic feature corner rounding |
KR20040011016A (ko) * | 2002-07-26 | 2004-02-05 | 동부전자 주식회사 | 알에프 반도체소자 제조방법 |
US7736394B2 (en) * | 2002-08-22 | 2010-06-15 | Victhom Human Bionics Inc. | Actuated prosthesis for amputees |
US6855606B2 (en) * | 2003-02-20 | 2005-02-15 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor nano-rod devices |
US7074656B2 (en) * | 2003-04-29 | 2006-07-11 | Taiwan Semiconductor Manufacturing Company, Ltd. | Doping of semiconductor fin devices |
US7005330B2 (en) * | 2003-06-27 | 2006-02-28 | Taiwan Semiconductor Manufacturing Company, Ltd. | Structure and method for forming the gate electrode in a multiple-gate transistor |
US6828248B1 (en) | 2003-08-08 | 2004-12-07 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method of pull back for forming shallow trench isolation |
US20050147247A1 (en) * | 2003-11-14 | 2005-07-07 | Westberg Thomas E. | Interactive television systems having POD modules and methods for use in the same |
US20100153997A1 (en) * | 2004-01-21 | 2010-06-17 | United Video Properties, Inc. | Interactive television system with templates for managing vendor-specific video-on-demand content |
US7452778B2 (en) * | 2004-06-10 | 2008-11-18 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor nano-wire devices and methods of fabrication |
KR100615570B1 (ko) * | 2004-07-05 | 2006-08-25 | 삼성전자주식회사 | 둥근 활성코너를 갖는 리세스 채널 모스 트랜지스터의제조방법 |
DE102005037566B4 (de) * | 2005-08-09 | 2008-04-24 | Qimonda Ag | Herstellungsverfahren für eine Halbleiterstruktur und entsprechende Halbleiterstruktur |
US20070231870A1 (en) * | 2006-03-31 | 2007-10-04 | Fundacion Instituto De Estudios Avanzados (Idea) | Process for the upgrading of heavy crude oil, extra-heavy crude oil or bitumens through the addition of a biocatalyst |
US20070245019A1 (en) * | 2006-04-12 | 2007-10-18 | United Video Properties, Inc. | Interactive media content delivery using a backchannel communications network |
US20080272437A1 (en) * | 2007-05-01 | 2008-11-06 | Doris Bruce B | Threshold Adjustment for High-K Gate Dielectric CMOS |
US8107977B2 (en) | 2007-09-07 | 2012-01-31 | United Video Properties, Inc. | Cross-platform messaging |
TW200921851A (en) * | 2007-11-14 | 2009-05-16 | Nanya Technology Corp | Methods for forming semiconductor device |
US8601526B2 (en) * | 2008-06-13 | 2013-12-03 | United Video Properties, Inc. | Systems and methods for displaying media content and media guidance information |
US8117564B2 (en) * | 2009-04-10 | 2012-02-14 | United Video Properties, Inc. | Systems and methods for generating a media guidance application with multiple perspective views |
US20100306708A1 (en) * | 2009-05-29 | 2010-12-02 | Rovi Techonologies Corporation | Systems and methods for handling profiles in a community |
US20110016492A1 (en) * | 2009-07-16 | 2011-01-20 | Gemstar Development Corporation | Systems and methods for forwarding media asset events |
US20110072452A1 (en) * | 2009-09-23 | 2011-03-24 | Rovi Technologies Corporation | Systems and methods for providing automatic parental control activation when a restricted user is detected within range of a device |
US20110070819A1 (en) * | 2009-09-23 | 2011-03-24 | Rovi Technologies Corporation | Systems and methods for providing reminders associated with detected users |
US9014546B2 (en) | 2009-09-23 | 2015-04-21 | Rovi Guides, Inc. | Systems and methods for automatically detecting users within detection regions of media devices |
US9201627B2 (en) * | 2010-01-05 | 2015-12-01 | Rovi Guides, Inc. | Systems and methods for transferring content between user equipment and a wireless communications device |
US9167196B2 (en) | 2010-05-19 | 2015-10-20 | Rovi Guides, Inc. | Systems and methods for trimming recorded content using a media guidance application |
US8949901B2 (en) | 2011-06-29 | 2015-02-03 | Rovi Guides, Inc. | Methods and systems for customizing viewing environment preferences in a viewing environment control application |
US8552478B2 (en) * | 2011-07-01 | 2013-10-08 | Nanya Technology Corporation | Corner transistor and method of fabricating the same |
US9218122B2 (en) | 2011-12-29 | 2015-12-22 | Rovi Guides, Inc. | Systems and methods for transferring settings across devices based on user gestures |
US9253262B2 (en) | 2013-01-24 | 2016-02-02 | Rovi Guides, Inc. | Systems and methods for connecting media devices through web sockets |
US9674563B2 (en) | 2013-11-04 | 2017-06-06 | Rovi Guides, Inc. | Systems and methods for recommending content |
US10381263B1 (en) | 2018-05-04 | 2019-08-13 | International Business Machines Corporation | Method of forming via contact with resistance control |
US10373866B1 (en) | 2018-05-04 | 2019-08-06 | International Business Machines Corporation | Method of forming metal insulator metal capacitor with extended capacitor plates |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4538343A (en) * | 1984-06-15 | 1985-09-03 | Texas Instruments Incorporated | Channel stop isolation technology utilizing two-step etching and selective oxidation with sidewall masking |
US4830978A (en) * | 1987-03-16 | 1989-05-16 | Texas Instruments Incorporated | Dram cell and method |
JPS63289871A (ja) * | 1987-05-21 | 1988-11-28 | Hitachi Ltd | 半導体装置 |
US5258332A (en) * | 1987-08-28 | 1993-11-02 | Kabushiki Kaisha Toshiba | Method of manufacturing semiconductor devices including rounding of corner portions by etching |
US4863562A (en) * | 1988-02-11 | 1989-09-05 | Sgs-Thomson Microelectronics, Inc. | Method for forming a non-planar structure on the surface of a semiconductor substrate |
KR940003218B1 (ko) * | 1988-03-24 | 1994-04-16 | 세이꼬 엡슨 가부시끼가이샤 | 반도체 장치 및 그 제조방법 |
US5206535A (en) * | 1988-03-24 | 1993-04-27 | Seiko Epson Corporation | Semiconductor device structure |
US4943537A (en) * | 1988-06-23 | 1990-07-24 | Dallas Semiconductor Corporation | CMOS integrated circuit with reduced susceptibility to PMOS punchthrough |
US5122474A (en) * | 1988-06-23 | 1992-06-16 | Dallas Semiconductor Corporation | Method of fabricating a CMOS IC with reduced susceptibility to PMOS punchthrough |
JPH02271624A (ja) * | 1989-04-13 | 1990-11-06 | Seiko Epson Corp | 半導体装置の製造方法 |
JP2870054B2 (ja) * | 1989-10-25 | 1999-03-10 | ソニー株式会社 | 半導体装置の製造方法 |
US5047356A (en) * | 1990-02-16 | 1991-09-10 | Hughes Aircraft Company | High speed silicon-on-insulator device and process of fabricating same |
US5130268A (en) * | 1991-04-05 | 1992-07-14 | Sgs-Thomson Microelectronics, Inc. | Method for forming planarized shallow trench isolation in an integrated circuit and a structure formed thereby |
JP3208575B2 (ja) * | 1991-08-16 | 2001-09-17 | ソニー株式会社 | 半導体装置の製法 |
US5387540A (en) * | 1993-09-30 | 1995-02-07 | Motorola Inc. | Method of forming trench isolation structure in an integrated circuit |
JP2955459B2 (ja) * | 1993-12-20 | 1999-10-04 | 株式会社東芝 | 半導体装置の製造方法 |
US5459096A (en) * | 1994-07-05 | 1995-10-17 | Motorola Inc. | Process for fabricating a semiconductor device using dual planarization layers |
US5721448A (en) * | 1996-07-30 | 1998-02-24 | International Business Machines Corporation | Integrated circuit chip having isolation trenches composed of a dielectric layer with oxidation catalyst material |
US5757059A (en) * | 1996-07-30 | 1998-05-26 | International Business Machines Corporation | Insulated gate field effect transistor |
US5674775A (en) * | 1997-02-20 | 1997-10-07 | Taiwan Semiconductor Manufacturing Company, Ltd. | Isolation trench with a rounded top edge using an etch buffer layer |
-
1996
- 1996-11-22 US US08/753,234 patent/US5858866A/en not_active Expired - Fee Related
-
1997
- 1997-09-29 KR KR1019970049631A patent/KR100295727B1/ko not_active IP Right Cessation
- 1997-10-20 MY MYPI97004939A patent/MY122084A/en unknown
- 1997-10-21 CN CN97121223A patent/CN1087503C/zh not_active Expired - Fee Related
- 1997-10-22 TW TW086115621A patent/TW385538B/zh not_active IP Right Cessation
- 1997-10-22 SG SG1997003836A patent/SG64454A1/en unknown
- 1997-11-13 JP JP31242997A patent/JP3160237B2/ja not_active Expired - Fee Related
-
1998
- 1998-05-15 US US09/078,517 patent/US5998852A/en not_active Expired - Lifetime
- 1998-07-22 US US09/120,190 patent/US6022796A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
TW385538B (en) | 2000-03-21 |
JP3160237B2 (ja) | 2001-04-25 |
KR19980041904A (ko) | 1998-08-17 |
MY122084A (en) | 2006-03-31 |
US6022796A (en) | 2000-02-08 |
US5858866A (en) | 1999-01-12 |
CN1183649A (zh) | 1998-06-03 |
CN1087503C (zh) | 2002-07-10 |
US5998852A (en) | 1999-12-07 |
KR100295727B1 (ko) | 2001-08-07 |
JPH10290009A (ja) | 1998-10-27 |
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