SG63843A1 - Multi-layer solder seal band for semiconductor substrates and process thereof - Google Patents

Multi-layer solder seal band for semiconductor substrates and process thereof

Info

Publication number
SG63843A1
SG63843A1 SG1998000886A SG1998000886A SG63843A1 SG 63843 A1 SG63843 A1 SG 63843A1 SG 1998000886 A SG1998000886 A SG 1998000886A SG 1998000886 A SG1998000886 A SG 1998000886A SG 63843 A1 SG63843 A1 SG 63843A1
Authority
SG
Singapore
Prior art keywords
semiconductor substrates
seal band
layer solder
solder seal
layer
Prior art date
Application number
SG1998000886A
Other languages
English (en)
Inventor
David Linn Edwards
Armando Salvatore Cammarano
Jeffery Thomas Coffin
Mark Gerard Courtney
Stephen S Drofitz Jr
Michael Joseph Ellsworth Jr
Lewis Sigmund Goldmann
Sushumna Iruvanti
William Edward Sablinski
Raed A Sherie
Hilton T Toy
Frank Louis Pompeo
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Publication of SG63843A1 publication Critical patent/SG63843A1/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/50Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor for integrated circuit devices, e.g. power bus, number of leads
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/02Containers; Seals
    • H01L23/10Containers; Seals characterised by the material or arrangement of seals between parts, e.g. between cap and base of the container or between leads and walls of the container
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73253Bump and layer connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01068Erbium [Er]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01078Platinum [Pt]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01079Gold [Au]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/013Alloys
    • H01L2924/0132Binary Alloys
    • H01L2924/01322Eutectic Alloys, i.e. obtained by a liquid transforming into two solid phases
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/095Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00 with a principal constituent of the material being a combination of two or more materials provided in the groups H01L2924/013 - H01L2924/0715
    • H01L2924/097Glass-ceramics, e.g. devitrified glass
    • H01L2924/09701Low temperature co-fired ceramic [LTCC]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15312Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a pin array, e.g. PGA
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/161Cap
    • H01L2924/1615Shape
    • H01L2924/16152Cap comprising a cavity for hosting the device, e.g. U-shaped cap

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Wire Bonding (AREA)
  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
  • Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
SG1998000886A 1997-04-30 1998-04-28 Multi-layer solder seal band for semiconductor substrates and process thereof SG63843A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/846,935 US5881945A (en) 1997-04-30 1997-04-30 Multi-layer solder seal band for semiconductor substrates and process

Publications (1)

Publication Number Publication Date
SG63843A1 true SG63843A1 (en) 1999-03-30

Family

ID=25299353

Family Applications (1)

Application Number Title Priority Date Filing Date
SG1998000886A SG63843A1 (en) 1997-04-30 1998-04-28 Multi-layer solder seal band for semiconductor substrates and process thereof

Country Status (9)

Country Link
US (1) US5881945A (de)
EP (1) EP0875932B1 (de)
JP (1) JP2999992B2 (de)
KR (1) KR100294968B1 (de)
CN (1) CN1160780C (de)
DE (1) DE69832324T2 (de)
MY (1) MY120319A (de)
SG (1) SG63843A1 (de)
TW (1) TW373276B (de)

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US6390353B1 (en) * 1998-01-06 2002-05-21 Williams Advanced Materials, Inc. Integral solder and plated sealing cover and method of making the same
US6053394A (en) * 1998-01-13 2000-04-25 International Business Machines Corporation Column grid array substrate attachment with heat sink stress relief
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US6136128A (en) * 1998-06-23 2000-10-24 Amerasia International Technology, Inc. Method of making an adhesive preform lid for electronic devices
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US6091603A (en) * 1999-09-30 2000-07-18 International Business Machines Corporation Customizable lid for improved thermal performance of modules using flip chips
US6592019B2 (en) * 2000-04-27 2003-07-15 Advanpack Solutions Pte. Ltd Pillar connections for semiconductor chips and method of manufacture
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US6806568B2 (en) * 2001-07-20 2004-10-19 The Board Of Trustees Of The University Of Arkansas Decoupling capacitor for integrated circuit package and electrical components using the decoupling capacitor and associated methods
US20040071970A1 (en) * 2002-03-11 2004-04-15 Helmut Kahl Device housing having a shielding gasket or wall comprising a conductive coating
DE10238581B4 (de) * 2002-08-22 2008-11-27 Qimonda Ag Halbleiterbauelement
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US7690551B2 (en) * 2003-12-31 2010-04-06 Chippac, Inc. Die attach by temperature gradient lead free soft solder metal sheet or film
US20050174738A1 (en) * 2004-02-06 2005-08-11 International Business Machines Corporation Method and structure for heat sink attachment in semiconductor device packaging
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US20050253282A1 (en) * 2004-04-27 2005-11-17 Daoqiang Lu Temperature resistant hermetic sealing formed at low temperatures for MEMS packages
JP4513513B2 (ja) * 2004-11-09 2010-07-28 株式会社村田製作所 電子部品の製造方法
US7743963B1 (en) 2005-03-01 2010-06-29 Amerasia International Technology, Inc. Solderable lid or cover for an electronic circuit
US20070037004A1 (en) * 2005-08-12 2007-02-15 Antaya Technologies Corporation Multilayer solder article
US20070036670A1 (en) * 2005-08-12 2007-02-15 John Pereira Solder composition
US20070231594A1 (en) * 2005-08-12 2007-10-04 John Pereira Multilayer solder article
US20080175748A1 (en) * 2005-08-12 2008-07-24 John Pereira Solder Composition
US20070292708A1 (en) * 2005-08-12 2007-12-20 John Pereira Solder composition
JP5696173B2 (ja) * 2005-08-12 2015-04-08 アンタヤ・テクノロジーズ・コープ はんだ組成物
JP4764159B2 (ja) * 2005-12-20 2011-08-31 富士通セミコンダクター株式会社 半導体装置
US7629684B2 (en) * 2006-04-04 2009-12-08 Endicott Interconnect Technologies, Inc. Adjustable thickness thermal interposer and electronic package utilizing same
WO2007129496A1 (ja) * 2006-04-07 2007-11-15 Murata Manufacturing Co., Ltd. 電子部品およびその製造方法
KR100703458B1 (ko) * 2006-04-20 2007-04-03 삼성에스디아이 주식회사 유기전계발광 표시 장치 및 그의 제작 방법
US7849914B2 (en) * 2006-05-02 2010-12-14 Clockspeed, Inc. Cooling apparatus for microelectronic devices
US7513035B2 (en) * 2006-06-07 2009-04-07 Advanced Micro Devices, Inc. Method of integrated circuit packaging
US20080296756A1 (en) * 2007-05-30 2008-12-04 Koch James L Heat spreader compositions and materials, integrated circuitry, methods of production and uses thereof
US20090004500A1 (en) * 2007-06-26 2009-01-01 Daewoong Suh Multilayer preform for fast transient liquid phase bonding
JP5310309B2 (ja) * 2009-06-26 2013-10-09 千住金属工業株式会社 はんだコートリッド
JP5537119B2 (ja) * 2009-10-28 2014-07-02 京セラ株式会社 蓋体並びに蓋体の製造方法および電子装置の製造方法
KR100976812B1 (ko) * 2010-02-08 2010-08-20 옵토팩 주식회사 전자 소자 패키지 및 그 제조 방법
US8558374B2 (en) 2011-02-08 2013-10-15 Endicott Interconnect Technologies, Inc. Electronic package with thermal interposer and method of making same
EP2541593B1 (de) * 2011-06-30 2019-04-17 Rohm Co., Ltd. Laminierte Lötschicht mit hohem Schmelzpunkt
US8240545B1 (en) * 2011-08-11 2012-08-14 Western Digital (Fremont), Llc Methods for minimizing component shift during soldering
DE102011112476A1 (de) * 2011-09-05 2013-03-07 Epcos Ag Bauelement und Verfahren zum Herstellen eines Bauelements
US20140238726A1 (en) * 2013-02-28 2014-08-28 Cooper Technologies Company External moisture barrier package for circuit board electrical component
EP2992551B1 (de) * 2013-04-29 2017-03-29 ABB Schweiz AG Modulanordnung für leistungshalbleitervorrichtungen
US8912641B1 (en) * 2013-09-09 2014-12-16 Harris Corporation Low profile electronic package and associated methods
JP6499886B2 (ja) * 2015-03-11 2019-04-10 田中貴金属工業株式会社 電子部品封止用キャップ
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Also Published As

Publication number Publication date
EP0875932A3 (de) 1999-08-04
JP2999992B2 (ja) 2000-01-17
TW373276B (en) 1999-11-01
CN1226746A (zh) 1999-08-25
DE69832324T2 (de) 2006-07-27
KR19980079651A (ko) 1998-11-25
CN1160780C (zh) 2004-08-04
EP0875932A2 (de) 1998-11-04
MY120319A (en) 2005-10-31
DE69832324D1 (de) 2005-12-22
US5881945A (en) 1999-03-16
JPH113952A (ja) 1999-01-06
EP0875932B1 (de) 2005-11-16
KR100294968B1 (ko) 2001-07-12

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