SG10202102804VA - Pogo block - Google Patents
Pogo blockInfo
- Publication number
- SG10202102804VA SG10202102804VA SG10202102804VA SG10202102804VA SG 10202102804V A SG10202102804V A SG 10202102804VA SG 10202102804V A SG10202102804V A SG 10202102804VA SG 10202102804V A SG10202102804V A SG 10202102804VA
- Authority
- SG
- Singapore
- Prior art keywords
- pogo block
- pogo
- block
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/0735—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card arranged on a flexible frame or film
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R31/00—Coupling parts supported only by co-operation with counterpart
- H01R31/005—Intermediate parts for distributing signals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06722—Spring-loaded
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06755—Material aspects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
- H01R13/2428—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using meander springs
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/62—Means for facilitating engagement or disengagement of coupling parts or for holding them in engagement
- H01R13/629—Additional means for facilitating engagement or disengagement of coupling parts, e.g. aligning or guiding means, levers, gas pressure electrical locking indicators, manufacturing tolerances
- H01R13/631—Additional means for facilitating engagement or disengagement of coupling parts, e.g. aligning or guiding means, levers, gas pressure electrical locking indicators, manufacturing tolerances for engagement only
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R9/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, e.g. terminal strips or terminal blocks; Terminals or binding posts mounted upon a base or in a case; Bases therefor
- H01R9/22—Bases, e.g. strip, block, panel
- H01R9/24—Terminal blocks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/70—Coupling devices
- H01R12/7076—Coupling devices for connection between PCB and component, e.g. display
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/70—Coupling devices
- H01R12/7082—Coupling device supported only by cooperation with PCB
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/70—Coupling devices
- H01R12/91—Coupling devices allowing relative movement between coupling parts, e.g. floating or self aligning
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R2201/00—Connectors or connections adapted for particular applications
- H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Geometry (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2020058492A JP7374037B2 (ja) | 2020-03-27 | 2020-03-27 | ポゴブロック |
Publications (1)
Publication Number | Publication Date |
---|---|
SG10202102804VA true SG10202102804VA (en) | 2021-10-28 |
Family
ID=77809058
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10202102804V SG10202102804VA (en) | 2020-03-27 | 2021-03-19 | Pogo block |
Country Status (5)
Country | Link |
---|---|
US (1) | US11563297B2 (zh) |
JP (1) | JP7374037B2 (zh) |
KR (1) | KR102542800B1 (zh) |
CN (1) | CN113447675A (zh) |
SG (1) | SG10202102804VA (zh) |
Family Cites Families (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2532331B2 (ja) * | 1992-11-09 | 1996-09-11 | 日本発条株式会社 | 導電性接触子 |
JP2003084047A (ja) | 2001-06-29 | 2003-03-19 | Sony Corp | 半導体装置の測定用治具 |
JP3878449B2 (ja) | 2001-10-17 | 2007-02-07 | 株式会社ルネサステクノロジ | 半導体装置の製造方法 |
JP2004144742A (ja) | 2002-10-02 | 2004-05-20 | Renesas Technology Corp | プローブシート、プローブカード、半導体検査装置および半導体装置の製造方法 |
US7109732B2 (en) * | 2003-07-31 | 2006-09-19 | Endicott Interconnect Technologies, Inc. | Electronic component test apparatus |
JP2005233858A (ja) | 2004-02-23 | 2005-09-02 | Japan Electronic Materials Corp | プローブカード |
JP2009002845A (ja) * | 2007-06-22 | 2009-01-08 | Micronics Japan Co Ltd | 接触子及び接続装置 |
JP5049694B2 (ja) | 2007-08-07 | 2012-10-17 | ルネサスエレクトロニクス株式会社 | プローブカード、半導体検査装置および半導体装置の製造方法 |
US8633724B2 (en) * | 2008-11-26 | 2014-01-21 | Nhk Spring Co., Ltd. | Probe-unit base member and probe unit |
KR101805816B1 (ko) | 2011-01-04 | 2017-12-07 | (주)엠투엔 | 프로브 카드 |
KR101284212B1 (ko) * | 2012-04-27 | 2013-07-09 | 주식회사 아이에스시 | 위치정렬이 용이한 테스트용 소켓 |
JP6099347B2 (ja) * | 2012-10-03 | 2017-03-22 | 東京エレクトロン株式会社 | ウエハ取り付け方法及びウエハ検査装置 |
KR101577396B1 (ko) * | 2015-10-06 | 2015-12-14 | 넥슨전자주식회사 | 전기 단자 테스트용 컨택 핀 |
KR101816703B1 (ko) | 2016-02-29 | 2018-01-11 | (주) 루켄테크놀러지스 | 프로브 블록 및 그 제조 방법 |
JP6895772B2 (ja) | 2017-03-07 | 2021-06-30 | 東京エレクトロン株式会社 | 検査装置およびコンタクト方法 |
JP6710808B2 (ja) * | 2017-03-30 | 2020-06-17 | 日本発條株式会社 | プローブホルダおよびプローブユニット |
JP6991782B2 (ja) * | 2017-08-23 | 2022-01-13 | センサータ テクノロジーズ インコーポレーテッド | ソケット |
JP7209938B2 (ja) | 2018-02-27 | 2023-01-23 | 株式会社東京精密 | プローバ |
KR102243839B1 (ko) * | 2018-07-13 | 2021-04-22 | 도쿄엘렉트론가부시키가이샤 | 중간 접속 부재, 및 검사 장치 |
JP7175179B2 (ja) | 2018-07-13 | 2022-11-18 | 東京エレクトロン株式会社 | 中間接続部材、および検査装置 |
JP7170494B2 (ja) * | 2018-10-15 | 2022-11-14 | 東京エレクトロン株式会社 | 中間接続部材及び検査装置 |
-
2020
- 2020-03-27 JP JP2020058492A patent/JP7374037B2/ja active Active
-
2021
- 2021-03-17 CN CN202110285995.0A patent/CN113447675A/zh active Pending
- 2021-03-18 KR KR1020210035295A patent/KR102542800B1/ko active IP Right Grant
- 2021-03-19 SG SG10202102804V patent/SG10202102804VA/en unknown
- 2021-03-24 US US17/210,740 patent/US11563297B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
US20210305761A1 (en) | 2021-09-30 |
CN113447675A (zh) | 2021-09-28 |
US11563297B2 (en) | 2023-01-24 |
KR102542800B1 (ko) | 2023-06-14 |
JP2021158270A (ja) | 2021-10-07 |
KR20210120854A (ko) | 2021-10-07 |
JP7374037B2 (ja) | 2023-11-06 |
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