SG10202006567TA - Compact tester - Google Patents

Compact tester

Info

Publication number
SG10202006567TA
SG10202006567TA SG10202006567TA SG10202006567TA SG10202006567TA SG 10202006567T A SG10202006567T A SG 10202006567TA SG 10202006567T A SG10202006567T A SG 10202006567TA SG 10202006567T A SG10202006567T A SG 10202006567TA SG 10202006567T A SG10202006567T A SG 10202006567TA
Authority
SG
Singapore
Prior art keywords
compact tester
tester
compact
Prior art date
Application number
SG10202006567TA
Inventor
See Jean Chan
Shiau Fen Lau
Jiun Pin Goh
Zhaomeng Wang
Rao Balachandran Seenivas
MAK Yao Kun Leonard
Prabaharan Pichaiyan
Original Assignee
Aem Singapore Pte Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Aem Singapore Pte Ltd filed Critical Aem Singapore Pte Ltd
Publication of SG10202006567TA publication Critical patent/SG10202006567TA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2862—Chambers or ovens; Tanks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2868—Complete testing stations; systems; procedures; software aspects

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
SG10202006567TA 2019-07-08 2020-07-08 Compact tester SG10202006567TA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SG10201906332S 2019-07-08

Publications (1)

Publication Number Publication Date
SG10202006567TA true SG10202006567TA (en) 2021-02-25

Family

ID=71527640

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10202006567TA SG10202006567TA (en) 2019-07-08 2020-07-08 Compact tester

Country Status (3)

Country Link
US (1) US11181575B2 (en)
EP (1) EP3764105B1 (en)
SG (1) SG10202006567TA (en)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6288561B1 (en) 1988-05-16 2001-09-11 Elm Technology Corporation Method and apparatus for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatus
JP3012853B2 (en) 1990-09-14 2000-02-28 株式会社富士通宮城エレクトロニクス Semiconductor test equipment handler
US10161962B2 (en) * 2014-06-06 2018-12-25 Advantest Corporation Universal test cell
US10481197B2 (en) 2016-12-27 2019-11-19 Nanning Fugui Precision Industrial Co., Ltd. Circuit board testing device and chassis for same
US10267845B2 (en) 2017-05-12 2019-04-23 Delta V Instruments, Inc. Wafer level burn-in system
US10539610B2 (en) * 2017-11-02 2020-01-21 Xilinx, Inc. Chip package test system

Also Published As

Publication number Publication date
EP3764105A1 (en) 2021-01-13
US20210011078A1 (en) 2021-01-14
EP3764105B1 (en) 2023-10-18
US11181575B2 (en) 2021-11-23

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