SE9802559D0 - Fault detection in digital system - Google Patents

Fault detection in digital system

Info

Publication number
SE9802559D0
SE9802559D0 SE9802559A SE9802559A SE9802559D0 SE 9802559 D0 SE9802559 D0 SE 9802559D0 SE 9802559 A SE9802559 A SE 9802559A SE 9802559 A SE9802559 A SE 9802559A SE 9802559 D0 SE9802559 D0 SE 9802559D0
Authority
SE
Sweden
Prior art keywords
digital system
logical units
fault
testing
noticed
Prior art date
Application number
SE9802559A
Other languages
English (en)
Other versions
SE512916C2 (sv
SE9802559L (sv
Inventor
Per Anders Holmberg
Dan Olov Halvarsson
Lars Tomas Jonsson
Original Assignee
Ericsson Telefon Ab L M
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ericsson Telefon Ab L M filed Critical Ericsson Telefon Ab L M
Priority to SE9802559A priority Critical patent/SE512916C2/sv
Publication of SE9802559D0 publication Critical patent/SE9802559D0/sv
Priority to EP99930105A priority patent/EP1095333B1/en
Priority to PCT/SE1999/001062 priority patent/WO2000004449A2/en
Priority to DE69942859T priority patent/DE69942859D1/de
Priority to AU46712/99A priority patent/AU4671299A/en
Priority to US09/354,988 priority patent/US6457145B1/en
Publication of SE9802559L publication Critical patent/SE9802559L/sv
Publication of SE512916C2 publication Critical patent/SE512916C2/sv

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/27—Built-in tests

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
SE9802559A 1998-07-16 1998-07-16 Metod och anordning för feldetektering i digitalt system SE512916C2 (sv)

Priority Applications (6)

Application Number Priority Date Filing Date Title
SE9802559A SE512916C2 (sv) 1998-07-16 1998-07-16 Metod och anordning för feldetektering i digitalt system
EP99930105A EP1095333B1 (en) 1998-07-16 1999-06-15 Fault detection in digital system
PCT/SE1999/001062 WO2000004449A2 (en) 1998-07-16 1999-06-15 Fault detection in digital system
DE69942859T DE69942859D1 (de) 1998-07-16 1999-06-15 Fehlererkennung in einem digitalen system
AU46712/99A AU4671299A (en) 1998-07-16 1999-06-15 Fault detection in digital system
US09/354,988 US6457145B1 (en) 1998-07-16 1999-07-16 Fault detection in digital system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE9802559A SE512916C2 (sv) 1998-07-16 1998-07-16 Metod och anordning för feldetektering i digitalt system

Publications (3)

Publication Number Publication Date
SE9802559D0 true SE9802559D0 (sv) 1998-07-16
SE9802559L SE9802559L (sv) 2000-01-17
SE512916C2 SE512916C2 (sv) 2000-06-05

Family

ID=20412102

Family Applications (1)

Application Number Title Priority Date Filing Date
SE9802559A SE512916C2 (sv) 1998-07-16 1998-07-16 Metod och anordning för feldetektering i digitalt system

Country Status (6)

Country Link
US (1) US6457145B1 (sv)
EP (1) EP1095333B1 (sv)
AU (1) AU4671299A (sv)
DE (1) DE69942859D1 (sv)
SE (1) SE512916C2 (sv)
WO (1) WO2000004449A2 (sv)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2812958B1 (fr) * 2000-08-11 2002-11-08 Thomson Csf Systeme de maintenance pour un ensemble d'equipements
US7424658B1 (en) * 2002-07-01 2008-09-09 Altera Corporation Method and apparatus for testing integrated circuits
US20040034820A1 (en) * 2002-08-15 2004-02-19 Soltis, Donald C. Apparatus and method for pseudorandom rare event injection to improve verification quality
US20040193982A1 (en) * 2003-03-31 2004-09-30 Arraycomm, Inc. Built-in self-test for digital transmitters
US20040193985A1 (en) * 2003-03-31 2004-09-30 Veerendra Bhora Autonomous built-in self-test for integrated circuits
US7584386B2 (en) * 2004-04-21 2009-09-01 Stmicroelectronics Sa Microprocessor comprising error detection means protected against an attack by error injection
FR2884000A1 (fr) * 2005-04-05 2006-10-06 St Microelectronics Sa Coprocesseur securise comprenant des moyens pour empecher l'acces a un organe du coprocesseur
FR2883998A1 (fr) * 2005-04-05 2006-10-06 St Microelectronics Sa Coprocesseur securise comprenant un circuit de detection d'un evenement
US7502971B2 (en) * 2005-10-12 2009-03-10 Hewlett-Packard Development Company, L.P. Determining a recurrent problem of a computer resource using signatures
FR2897439A1 (fr) * 2006-02-15 2007-08-17 St Microelectronics Sa Circuit elelctronique comprenant un mode de test securise par l'utilisation d'un identifiant, et procede associe
US8667352B2 (en) * 2008-05-27 2014-03-04 Freescale Semiconductor, Inc. Semiconductor device and method for validating a state thereof
US8555522B2 (en) 2010-10-21 2013-10-15 Whirlpool Corporation Laundry treating appliance with inlet temperature compensation
US8441248B2 (en) 2010-10-21 2013-05-14 Whirlpool Corporation Laundry treating appliance with voltage detection
US9027258B2 (en) 2010-10-21 2015-05-12 Whirlpool Corporation Laundry treating appliance with controlled cycle time

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4601034A (en) * 1984-03-30 1986-07-15 Texas Instruments Incorporated Method and apparatus for testing very large scale integrated memory circuits
US5051996A (en) * 1989-03-27 1991-09-24 The United States Of America As Represented By The United States Department Of Energy Built-in-test by signature inspection (bitsi)
US5230000A (en) * 1991-04-25 1993-07-20 At&T Bell Laboratories Built-in self-test (bist) circuit
US5255208A (en) * 1991-08-08 1993-10-19 Aeg Westinghouse Transportation Systems, Inc. On-line processor based diagnostic system
JP3377225B2 (ja) 1992-04-07 2003-02-17 富士写真フイルム株式会社 チェック回路を含む集積回路
US5638383A (en) * 1992-07-24 1997-06-10 Trw Inc. Advanced integrated avionics testing system
US5475694A (en) * 1993-01-19 1995-12-12 The University Of British Columbia Fuzzy multiple signature compaction scheme for built-in self-testing of large scale digital integrated circuits
US5450414A (en) * 1993-05-17 1995-09-12 At&T Corp. Partial-scan built-in self-testing circuit having improved testability
GB2282244B (en) * 1993-09-23 1998-01-14 Advanced Risc Mach Ltd Integrated circuit
US5600788A (en) 1994-01-19 1997-02-04 Martin Marietta Corporation Digital test and maintenance architecture
US5544174A (en) 1994-03-17 1996-08-06 The United States Of America As Represented By The Secretary Of The Air Force Programmable boundary scan and input output parameter device for testing integrated circuits
DE59500064D1 (de) 1995-03-16 1997-01-23 Siemens Ag Platine mit eingebauter Kontaktfühlerprüfung für integrierte Schaltungen
KR100186920B1 (ko) 1995-05-09 1999-04-15 모리시다 요이치 테스트 회로를 내장한 집적회로

Also Published As

Publication number Publication date
DE69942859D1 (de) 2010-11-25
EP1095333A2 (en) 2001-05-02
SE512916C2 (sv) 2000-06-05
AU4671299A (en) 2000-02-07
US6457145B1 (en) 2002-09-24
WO2000004449A2 (en) 2000-01-27
EP1095333B1 (en) 2010-10-13
SE9802559L (sv) 2000-01-17
WO2000004449A3 (en) 2000-04-20

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