SE9802559L - Feldetektering i digitalt system - Google Patents
Feldetektering i digitalt systemInfo
- Publication number
- SE9802559L SE9802559L SE9802559A SE9802559A SE9802559L SE 9802559 L SE9802559 L SE 9802559L SE 9802559 A SE9802559 A SE 9802559A SE 9802559 A SE9802559 A SE 9802559A SE 9802559 L SE9802559 L SE 9802559L
- Authority
- SE
- Sweden
- Prior art keywords
- digital system
- logical units
- fault
- testing
- noticed
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/27—Built-in tests
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9802559A SE512916C2 (sv) | 1998-07-16 | 1998-07-16 | Metod och anordning för feldetektering i digitalt system |
EP99930105A EP1095333B1 (en) | 1998-07-16 | 1999-06-15 | Fault detection in digital system |
DE69942859T DE69942859D1 (de) | 1998-07-16 | 1999-06-15 | Fehlererkennung in einem digitalen system |
AU46712/99A AU4671299A (en) | 1998-07-16 | 1999-06-15 | Fault detection in digital system |
PCT/SE1999/001062 WO2000004449A2 (en) | 1998-07-16 | 1999-06-15 | Fault detection in digital system |
US09/354,988 US6457145B1 (en) | 1998-07-16 | 1999-07-16 | Fault detection in digital system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9802559A SE512916C2 (sv) | 1998-07-16 | 1998-07-16 | Metod och anordning för feldetektering i digitalt system |
Publications (3)
Publication Number | Publication Date |
---|---|
SE9802559D0 SE9802559D0 (sv) | 1998-07-16 |
SE9802559L true SE9802559L (sv) | 2000-01-17 |
SE512916C2 SE512916C2 (sv) | 2000-06-05 |
Family
ID=20412102
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE9802559A SE512916C2 (sv) | 1998-07-16 | 1998-07-16 | Metod och anordning för feldetektering i digitalt system |
Country Status (6)
Country | Link |
---|---|
US (1) | US6457145B1 (sv) |
EP (1) | EP1095333B1 (sv) |
AU (1) | AU4671299A (sv) |
DE (1) | DE69942859D1 (sv) |
SE (1) | SE512916C2 (sv) |
WO (1) | WO2000004449A2 (sv) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2812958B1 (fr) * | 2000-08-11 | 2002-11-08 | Thomson Csf | Systeme de maintenance pour un ensemble d'equipements |
US7424658B1 (en) * | 2002-07-01 | 2008-09-09 | Altera Corporation | Method and apparatus for testing integrated circuits |
US20040034820A1 (en) * | 2002-08-15 | 2004-02-19 | Soltis, Donald C. | Apparatus and method for pseudorandom rare event injection to improve verification quality |
US20040193982A1 (en) * | 2003-03-31 | 2004-09-30 | Arraycomm, Inc. | Built-in self-test for digital transmitters |
US20040193985A1 (en) * | 2003-03-31 | 2004-09-30 | Veerendra Bhora | Autonomous built-in self-test for integrated circuits |
US7904775B2 (en) | 2004-04-21 | 2011-03-08 | Stmicroelectronics Sa | Microprocessor comprising signature means for detecting an attack by error injection |
FR2883998A1 (fr) * | 2005-04-05 | 2006-10-06 | St Microelectronics Sa | Coprocesseur securise comprenant un circuit de detection d'un evenement |
FR2884000A1 (fr) * | 2005-04-05 | 2006-10-06 | St Microelectronics Sa | Coprocesseur securise comprenant des moyens pour empecher l'acces a un organe du coprocesseur |
US7502971B2 (en) * | 2005-10-12 | 2009-03-10 | Hewlett-Packard Development Company, L.P. | Determining a recurrent problem of a computer resource using signatures |
FR2897439A1 (fr) * | 2006-02-15 | 2007-08-17 | St Microelectronics Sa | Circuit elelctronique comprenant un mode de test securise par l'utilisation d'un identifiant, et procede associe |
US8667352B2 (en) * | 2008-05-27 | 2014-03-04 | Freescale Semiconductor, Inc. | Semiconductor device and method for validating a state thereof |
US9027258B2 (en) | 2010-10-21 | 2015-05-12 | Whirlpool Corporation | Laundry treating appliance with controlled cycle time |
US8555522B2 (en) | 2010-10-21 | 2013-10-15 | Whirlpool Corporation | Laundry treating appliance with inlet temperature compensation |
US8441248B2 (en) | 2010-10-21 | 2013-05-14 | Whirlpool Corporation | Laundry treating appliance with voltage detection |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4601034A (en) * | 1984-03-30 | 1986-07-15 | Texas Instruments Incorporated | Method and apparatus for testing very large scale integrated memory circuits |
US5051996A (en) * | 1989-03-27 | 1991-09-24 | The United States Of America As Represented By The United States Department Of Energy | Built-in-test by signature inspection (bitsi) |
US5230000A (en) * | 1991-04-25 | 1993-07-20 | At&T Bell Laboratories | Built-in self-test (bist) circuit |
US5255208A (en) * | 1991-08-08 | 1993-10-19 | Aeg Westinghouse Transportation Systems, Inc. | On-line processor based diagnostic system |
JP3377225B2 (ja) | 1992-04-07 | 2003-02-17 | 富士写真フイルム株式会社 | チェック回路を含む集積回路 |
US5638383A (en) * | 1992-07-24 | 1997-06-10 | Trw Inc. | Advanced integrated avionics testing system |
US5475694A (en) * | 1993-01-19 | 1995-12-12 | The University Of British Columbia | Fuzzy multiple signature compaction scheme for built-in self-testing of large scale digital integrated circuits |
US5450414A (en) * | 1993-05-17 | 1995-09-12 | At&T Corp. | Partial-scan built-in self-testing circuit having improved testability |
GB2282244B (en) * | 1993-09-23 | 1998-01-14 | Advanced Risc Mach Ltd | Integrated circuit |
US5600788A (en) | 1994-01-19 | 1997-02-04 | Martin Marietta Corporation | Digital test and maintenance architecture |
US5544174A (en) | 1994-03-17 | 1996-08-06 | The United States Of America As Represented By The Secretary Of The Air Force | Programmable boundary scan and input output parameter device for testing integrated circuits |
EP0733910B1 (de) | 1995-03-16 | 1996-12-11 | Siemens Aktiengesellschaft | Platine mit eingebauter Kontaktfühlerprüfung für integrierte Schaltungen |
KR100186920B1 (ko) | 1995-05-09 | 1999-04-15 | 모리시다 요이치 | 테스트 회로를 내장한 집적회로 |
-
1998
- 1998-07-16 SE SE9802559A patent/SE512916C2/sv not_active IP Right Cessation
-
1999
- 1999-06-15 EP EP99930105A patent/EP1095333B1/en not_active Expired - Lifetime
- 1999-06-15 DE DE69942859T patent/DE69942859D1/de not_active Expired - Lifetime
- 1999-06-15 AU AU46712/99A patent/AU4671299A/en not_active Abandoned
- 1999-06-15 WO PCT/SE1999/001062 patent/WO2000004449A2/en active Application Filing
- 1999-07-16 US US09/354,988 patent/US6457145B1/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP1095333B1 (en) | 2010-10-13 |
WO2000004449A3 (en) | 2000-04-20 |
EP1095333A2 (en) | 2001-05-02 |
SE512916C2 (sv) | 2000-06-05 |
AU4671299A (en) | 2000-02-07 |
DE69942859D1 (de) | 2010-11-25 |
SE9802559D0 (sv) | 1998-07-16 |
WO2000004449A2 (en) | 2000-01-27 |
US6457145B1 (en) | 2002-09-24 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
NUG | Patent has lapsed |