SE435553B - Anordning for metning av en storhet som paverkar en felteffekttransistor - Google Patents
Anordning for metning av en storhet som paverkar en felteffekttransistorInfo
- Publication number
- SE435553B SE435553B SE7909093A SE7909093A SE435553B SE 435553 B SE435553 B SE 435553B SE 7909093 A SE7909093 A SE 7909093A SE 7909093 A SE7909093 A SE 7909093A SE 435553 B SE435553 B SE 435553B
- Authority
- SE
- Sweden
- Prior art keywords
- field effect
- effect transistor
- auxiliary signal
- measured
- input
- Prior art date
Links
- 230000005669 field effect Effects 0.000 claims description 17
- 239000000758 substrate Substances 0.000 claims description 2
- 230000001678 irradiating effect Effects 0.000 claims 1
- 239000004020 conductor Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 2
- 230000002238 attenuated effect Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000010926 purge Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
- G01N27/403—Cells and electrode assemblies
- G01N27/414—Ion-sensitive or chemical field-effect transistors, i.e. ISFETS or CHEMFETS
- G01N27/4148—Integrated circuits therefor, e.g. fabricated by CMOS processing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0023—Measuring currents or voltages from sources with high internal resistance by means of measuring circuits with high input impedance, e.g. OP-amplifiers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/32—Compensating for temperature change
Landscapes
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Electrochemistry (AREA)
- Immunology (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Computer Hardware Design (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Molecular Biology (AREA)
- Pathology (AREA)
- Amplifiers (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Measurement Of Current Or Voltage (AREA)
- Investigating Or Analysing Biological Materials (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| NLAANVRAGE7811001,A NL187546C (nl) | 1978-11-06 | 1978-11-06 | Meetinrichting voorzien van een veldeffekttransistor voor het meten van een de geleiding in het kanaal van de veldeffekttransistor beinvloedende uitwendige grootheid. |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| SE7909093L SE7909093L (sv) | 1980-05-07 |
| SE435553B true SE435553B (sv) | 1984-10-01 |
Family
ID=19831846
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SE7909093A SE435553B (sv) | 1978-11-06 | 1979-11-02 | Anordning for metning av en storhet som paverkar en felteffekttransistor |
Country Status (10)
| Country | Link |
|---|---|
| US (1) | US4267504A (de) |
| JP (1) | JPS59780B2 (de) |
| AU (1) | AU531917B2 (de) |
| CA (1) | CA1123968A (de) |
| CH (1) | CH644448A5 (de) |
| DE (1) | DE2944364C2 (de) |
| FR (1) | FR2440599A1 (de) |
| GB (1) | GB2035577B (de) |
| NL (1) | NL187546C (de) |
| SE (1) | SE435553B (de) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5639454A (en) * | 1979-09-10 | 1981-04-15 | Olympus Optical Co Ltd | Chemical suybstance detector by using chemical sensitive element with structure of insulated-gate field-effect transistor |
| US4641249A (en) * | 1983-06-22 | 1987-02-03 | Kuraray Co., Ltd. | Method and device for compensating temperature-dependent characteristic changes in ion-sensitive FET transducer |
| NL8302964A (nl) * | 1983-08-24 | 1985-03-18 | Cordis Europ | Inrichting voor het bepalen van de aktiviteit van een ion (pion) in een vloeistof. |
| JPS60170174U (ja) * | 1984-04-23 | 1985-11-11 | 吉田 公麿 | 切り絵おもちやに利用しうるコツプ |
| US4974592A (en) * | 1988-11-14 | 1990-12-04 | American Sensor Systems Corporation | Continuous on-line blood monitoring system |
| DE3921537A1 (de) * | 1989-06-30 | 1991-05-23 | Maria D Gyulai | Messverfahren zur verbesserung der stabilitaet |
| US5911873A (en) * | 1997-05-02 | 1999-06-15 | Rosemount Analytical Inc. | Apparatus and method for operating an ISFET at multiple drain currents and gate-source voltages allowing for diagnostics and control of isopotential points |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3328685A (en) * | 1964-04-07 | 1967-06-27 | Hewlett Packard Co | Ohmmeter utilizing field-effect transistor as a constant current source |
| US3490039A (en) * | 1967-02-23 | 1970-01-13 | Canadian Patents Dev | Method and apparatus for measuring high resistances in relation to resistance ratio,capacitance,and a time interval |
| US4103227A (en) * | 1977-03-25 | 1978-07-25 | University Of Pennsylvania | Ion-controlled diode |
-
1978
- 1978-11-06 NL NLAANVRAGE7811001,A patent/NL187546C/xx not_active IP Right Cessation
-
1979
- 1979-09-28 FR FR7924170A patent/FR2440599A1/fr active Granted
- 1979-10-22 US US06/086,922 patent/US4267504A/en not_active Expired - Lifetime
- 1979-11-01 CA CA338,932A patent/CA1123968A/en not_active Expired
- 1979-11-02 JP JP54141395A patent/JPS59780B2/ja not_active Expired
- 1979-11-02 SE SE7909093A patent/SE435553B/sv not_active IP Right Cessation
- 1979-11-02 DE DE2944364A patent/DE2944364C2/de not_active Expired
- 1979-11-02 AU AU52438/79A patent/AU531917B2/en not_active Ceased
- 1979-11-02 CH CH988279A patent/CH644448A5/de not_active IP Right Cessation
- 1979-11-02 GB GB7938089A patent/GB2035577B/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| FR2440599A1 (fr) | 1980-05-30 |
| GB2035577A (en) | 1980-06-18 |
| NL7811001A (nl) | 1980-05-08 |
| DE2944364A1 (de) | 1980-06-12 |
| DE2944364C2 (de) | 1983-01-20 |
| NL187546C (nl) | 1991-11-01 |
| CH644448A5 (de) | 1984-07-31 |
| CA1123968A (en) | 1982-05-18 |
| JPS59780B2 (ja) | 1984-01-09 |
| AU5243879A (en) | 1980-05-15 |
| SE7909093L (sv) | 1980-05-07 |
| FR2440599B1 (de) | 1981-10-02 |
| US4267504A (en) | 1981-05-12 |
| JPS5566750A (en) | 1980-05-20 |
| GB2035577B (en) | 1982-09-15 |
| AU531917B2 (en) | 1983-09-08 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| NUG | Patent has lapsed |
Ref document number: 7909093-2 Effective date: 19930610 Format of ref document f/p: F |