SE408500B - Laddningsoverforingsavkenningskrets - Google Patents

Laddningsoverforingsavkenningskrets

Info

Publication number
SE408500B
SE408500B SE7508311A SE7508311A SE408500B SE 408500 B SE408500 B SE 408500B SE 7508311 A SE7508311 A SE 7508311A SE 7508311 A SE7508311 A SE 7508311A SE 408500 B SE408500 B SE 408500B
Authority
SE
Sweden
Prior art keywords
charge transfer
sensor circuit
transfer sensor
circuit
charge
Prior art date
Application number
SE7508311A
Other languages
English (en)
Swedish (sv)
Other versions
SE7508311L (sv
Inventor
R H Dennard
D P Spampinato
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Publication of SE7508311L publication Critical patent/SE7508311L/
Publication of SE408500B publication Critical patent/SE408500B/xx

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/403Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells with charge regeneration common to a multiplicity of memory cells, i.e. external refresh
    • G11C11/404Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells with charge regeneration common to a multiplicity of memory cells, i.e. external refresh with one charge-transfer gate, e.g. MOS transistor, per cell
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/409Read-write [R-W] circuits 
    • G11C11/4091Sense or sense/refresh amplifiers, or associated sense circuitry, e.g. for coupled bit-line precharging, equalising or isolating

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Dram (AREA)
  • Static Random-Access Memory (AREA)
  • Amplifiers (AREA)
  • Read Only Memory (AREA)
SE7508311A 1974-07-23 1975-07-22 Laddningsoverforingsavkenningskrets SE408500B (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/491,023 US3949381A (en) 1974-07-23 1974-07-23 Differential charge transfer sense amplifier

Publications (2)

Publication Number Publication Date
SE7508311L SE7508311L (sv) 1976-01-26
SE408500B true SE408500B (sv) 1979-06-11

Family

ID=23950483

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7508311A SE408500B (sv) 1974-07-23 1975-07-22 Laddningsoverforingsavkenningskrets

Country Status (13)

Country Link
US (1) US3949381A (it)
JP (2) JPS5539075B2 (it)
BE (1) BE830434A (it)
CA (1) CA1058321A (it)
CH (1) CH594956A5 (it)
DE (1) DE2525225C2 (it)
ES (1) ES439584A1 (it)
FR (1) FR2280247A1 (it)
GB (1) GB1495063A (it)
IT (1) IT1039030B (it)
NL (1) NL7508612A (it)
SE (1) SE408500B (it)
SU (1) SU673202A3 (it)

Families Citing this family (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1523752A (en) * 1974-08-28 1978-09-06 Siemens Ag Dynamic semiconductor data stores
US4168537A (en) * 1975-05-02 1979-09-18 Tokyo Shibaura Electric Co., Ltd. Nonvolatile memory system enabling nonvolatile data transfer during power on
JPS51139220A (en) * 1975-05-28 1976-12-01 Hitachi Ltd Sense amplifier
US4158891A (en) * 1975-08-18 1979-06-19 Honeywell Information Systems Inc. Transparent tri state latch
US3983544A (en) * 1975-08-25 1976-09-28 International Business Machines Corporation Split memory array sharing same sensing and bit decode circuitry
DE2541686A1 (de) * 1975-09-18 1977-03-24 Siemens Ag Regenerierschaltung fuer ladungsgekoppelte elemente
US4031415A (en) * 1975-10-22 1977-06-21 Texas Instruments Incorporated Address buffer circuit for semiconductor memory
US4039861A (en) * 1976-02-09 1977-08-02 International Business Machines Corporation Cross-coupled charge transfer sense amplifier circuits
JPS5922316B2 (ja) * 1976-02-24 1984-05-25 株式会社東芝 ダイナミツクメモリ装置
US4038567A (en) * 1976-03-22 1977-07-26 International Business Machines Corporation Memory input signal buffer circuit
US4045783A (en) * 1976-04-12 1977-08-30 Standard Microsystems Corporation Mos one transistor cell ram having divided and balanced bit lines, coupled by regenerative flip-flop sense amplifiers, and balanced access circuitry
US4028557A (en) * 1976-05-21 1977-06-07 Bell Telephone Laboratories, Incorporated Dynamic sense-refresh detector amplifier
US4081701A (en) * 1976-06-01 1978-03-28 Texas Instruments Incorporated High speed sense amplifier for MOS random access memory
JPS52152128A (en) * 1976-06-14 1977-12-17 Nippon Telegr & Teleph Corp <Ntt> Minute signal detection circuit
DE2630797C2 (de) * 1976-07-08 1978-08-10 Siemens Ag, 1000 Berlin Und 8000 Muenchen Funktionsgenerator zur Erzeugung einer Spannung an einem Knoten, an den den Bitleitungen eines MOS-Speichers zugeordnete Flip-Flops aus MOS-Transistoren angeschlossen sind
US4113880A (en) * 1976-11-17 1978-09-12 The Upjohn Company 2'-Hydroxy-3'-carboxy-5'-nitrooxanilate compounds, compositions, and methods of use
DE2712735B1 (de) * 1977-03-23 1978-09-14 Ibm Deutschland Lese-/Schreibzugriffschaltung zu Speicherzellen eines Speichers und Verfahren zu ihrem Betrieb
JPS53123039A (en) * 1977-04-01 1978-10-27 Nippon Telegr & Teleph Corp <Ntt> Detection circuit for signal voltage
US4134151A (en) * 1977-05-02 1979-01-09 Electronic Memories & Magnetics Corporation Single sense line memory cell
DE2801255C2 (de) * 1978-01-12 1984-06-28 Siemens AG, 1000 Berlin und 8000 München Bewerterschaltung für symmetrisch strukturierte Halbleiterspeicher mit Ein-Transistor-Speicherelementen
US4162416A (en) * 1978-01-16 1979-07-24 Bell Telephone Laboratories, Incorporated Dynamic sense-refresh detector amplifier
JPS5817997B2 (ja) * 1978-03-31 1983-04-11 株式会社日立製作所 メモリシステム
US4160275A (en) * 1978-04-03 1979-07-03 International Business Machines Corporation Accessing arrangement for memories with small cells
DE2919166C2 (de) * 1978-05-12 1986-01-02 Nippon Electric Co., Ltd., Tokio/Tokyo Speichervorrichtung
US4239993A (en) * 1978-09-22 1980-12-16 Texas Instruments Incorporated High performance dynamic sense amplifier with active loads
US4370575A (en) * 1978-09-22 1983-01-25 Texas Instruments Incorporated High performance dynamic sense amplifier with active loads
JPS5545188A (en) * 1978-09-27 1980-03-29 Nec Corp Dynamic random access memory unit
JPS5931155B2 (ja) * 1979-10-11 1984-07-31 インターナシヨナルビジネス マシーンズ コーポレーシヨン 感知増幅回路
US4279023A (en) * 1979-12-19 1981-07-14 International Business Machines Corporation Sense latch
DE3364452D1 (de) * 1982-01-20 1986-08-21 Matsushita Electric Ind Co Ltd Fet circuits
JPS61145794A (ja) * 1984-12-19 1986-07-03 Nec Corp 半導体メモリの駆動方法
US4816706A (en) * 1987-09-10 1989-03-28 International Business Machines Corporation Sense amplifier with improved bitline precharging for dynamic random access memory
US5270591A (en) * 1992-02-28 1993-12-14 Xerox Corporation Content addressable memory architecture and circuits
US5532623A (en) * 1994-10-21 1996-07-02 Waferscale Integration, Inc. Sense amplifier with read current tracking and zero standby power consumption
US5525918A (en) * 1994-12-27 1996-06-11 Alliance Semiconductor Corporation Pre-sense amplifier for monolithic memories
KR100264075B1 (ko) * 1997-06-20 2000-08-16 김영환 전하 증폭 비트 라인 센스 앰프
US7023243B2 (en) * 2002-05-08 2006-04-04 University Of Southern California Current source evaluation sense-amplifier
US6606049B1 (en) * 2002-08-02 2003-08-12 Ami Semiconductor, Inc. Analog to digital converters based on transconveyance amplifiers
US7263016B1 (en) 2004-06-07 2007-08-28 Virage Logic Corporation Method and system for pre-charging and biasing a latch-type sense amplifier
WO2007099623A1 (ja) * 2006-03-01 2007-09-07 Renesas Technology Corp. 半導体記憶装置
CN103559903B (zh) * 2013-10-25 2016-09-28 中国科学院微电子研究所 一种灵敏放大器
US11037621B2 (en) * 2018-12-26 2021-06-15 Micron Technology, Inc. Sensing techniques using a charge transfer device

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3514765A (en) * 1969-05-23 1970-05-26 Shell Oil Co Sense amplifier comprising cross coupled mosfet's operating in a race mode for single device per bit mosfet memories
US3678473A (en) * 1970-06-04 1972-07-18 Shell Oil Co Read-write circuit for capacitive memory arrays
BE789500A (fr) * 1971-09-30 1973-03-29 Siemens Ag Memoire a semiconducteurs avec elements de memorisation a un seul transistor
US3760381A (en) * 1972-06-30 1973-09-18 Ibm Stored charge memory detection circuit
US3771147A (en) * 1972-12-04 1973-11-06 Bell Telephone Labor Inc Igfet memory system

Also Published As

Publication number Publication date
JPS58116B2 (ja) 1983-01-05
US3949381A (en) 1976-04-06
CA1058321A (en) 1979-07-10
DE2525225A1 (de) 1976-02-05
ES439584A1 (es) 1977-02-16
CH594956A5 (it) 1978-01-31
JPS5539075B2 (it) 1980-10-08
JPS5119943A (it) 1976-02-17
AU8328875A (en) 1977-01-27
DE2525225C2 (de) 1984-02-23
FR2280247B1 (it) 1977-07-22
SU673202A3 (ru) 1979-07-05
FR2280247A1 (fr) 1976-02-20
SE7508311L (sv) 1976-01-26
BE830434A (fr) 1975-10-16
NL7508612A (nl) 1976-01-27
IT1039030B (it) 1979-12-10
JPS5512600A (en) 1980-01-29
GB1495063A (en) 1977-12-14

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