PT732579E - Processo para reconhecer e avaliar os defeitos nas camadas superficiais parcialmente reflectoras - Google Patents
Processo para reconhecer e avaliar os defeitos nas camadas superficiais parcialmente reflectorasInfo
- Publication number
- PT732579E PT732579E PT95401909T PT95401909T PT732579E PT 732579 E PT732579 E PT 732579E PT 95401909 T PT95401909 T PT 95401909T PT 95401909 T PT95401909 T PT 95401909T PT 732579 E PT732579 E PT 732579E
- Authority
- PT
- Portugal
- Prior art keywords
- colour
- recognizing
- reflective surface
- surface layers
- partially reflective
- Prior art date
Links
- 239000002344 surface layer Substances 0.000 title 1
- 239000011521 glass Substances 0.000 abstract 2
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N7/00—Television systems
- H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
- G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N2021/1765—Method using an image detector and processing of image signal
- G01N2021/177—Detector of the video camera type
- G01N2021/1776—Colour camera
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
- G01N2021/8427—Coatings
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Textile Engineering (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Spectrometry And Color Measurement (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19509345A DE19509345A1 (de) | 1995-03-15 | 1995-03-15 | Verfahren zum Erkennen und Bewerten von Fehlern in teilreflektierenden Oberflächenschichten |
Publications (1)
Publication Number | Publication Date |
---|---|
PT732579E true PT732579E (pt) | 2002-06-28 |
Family
ID=7756720
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PT95401909T PT732579E (pt) | 1995-03-15 | 1995-08-18 | Processo para reconhecer e avaliar os defeitos nas camadas superficiais parcialmente reflectoras |
Country Status (10)
Country | Link |
---|---|
US (1) | US5887077A (pt) |
EP (1) | EP0732579B1 (pt) |
JP (1) | JPH08292156A (pt) |
KR (1) | KR100399507B1 (pt) |
CN (1) | CN1099032C (pt) |
AT (1) | ATE211820T1 (pt) |
DE (2) | DE19509345A1 (pt) |
DK (1) | DK0732579T3 (pt) |
ES (1) | ES2170128T3 (pt) |
PT (1) | PT732579E (pt) |
Families Citing this family (41)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
AU6942998A (en) * | 1997-03-31 | 1998-10-22 | Microtherm, Llc | Optical inspection module and method for detecting particles and defects on substrates in integrated process tools |
DE19813072A1 (de) * | 1998-03-25 | 1999-09-30 | Laser Sorter Gmbh | Verfahren und Vorrichtung zur Bestimmung der optischen Qualität und zur Detektion von Fehlern von Flachglas und anderen optisch transparenten Materialien |
DE19948190B4 (de) * | 1999-10-06 | 2013-05-16 | GPP Chemnitz Gesellschaft für Prozeßrechnerprogrammierung mbH | Anordnung zur Charakterisierung von Unregelmässigkeiten auf ebenen und transparenten Oberflächen von Gegenständen, bspw. von einer Kittschicht |
EP1126273A1 (en) * | 2000-02-09 | 2001-08-22 | Orbis Oy | Method and arrangement for inspecting a transparent object for flaws |
WO2002018980A2 (en) * | 2000-09-01 | 2002-03-07 | Applied Process Technologies | Optical system for imaging distortions in moving reflective sheets |
US7082218B2 (en) * | 2001-07-27 | 2006-07-25 | Hewlett-Packard Development Company, L.P. | Color correction of images |
GB2378077A (en) * | 2001-07-27 | 2003-01-29 | Hewlett Packard Co | Electronic image colour plane reconstruction |
EP1357515A1 (de) * | 2002-04-22 | 2003-10-29 | Agfa-Gevaert AG | Verfahren zur Verarbeitung digitaler Bilddaten von fotografischen Bildern |
US6995847B2 (en) | 2002-05-24 | 2006-02-07 | Honeywell International Inc. | Methods and systems for substrate surface evaluation |
US7463765B2 (en) * | 2003-02-25 | 2008-12-09 | Lamda-Lite Enterprises Incorporated | System and method for detecting and reporting fabrication defects using a multi-variant image analysis |
DE10326217A1 (de) * | 2003-06-11 | 2004-12-30 | Bayerische Motoren Werke Ag | Verfahren zum Erkennen von Fehlern der Haftung einer Beschichtung |
DE10326216B4 (de) * | 2003-06-11 | 2007-03-15 | Bayerische Motoren Werke Ag | Verfahren zum Erkennen von Fehlern der Haftung einer Beschichtung auf einem Substrat |
US20060026807A1 (en) * | 2003-08-07 | 2006-02-09 | Carnevali Jeffrey D | Quick release mounting apparatus |
DE102005007715B4 (de) * | 2005-02-18 | 2008-07-24 | Schott Ag | Vorrichtung zur Erfassung von Fehlstellen und Verwendung der Vorrichtung |
CN101346623B (zh) * | 2005-12-26 | 2012-09-05 | 株式会社尼康 | 根据图像分析进行缺陷检查的缺陷检查装置 |
US7369240B1 (en) | 2006-07-20 | 2008-05-06 | Litesentry Corporation | Apparatus and methods for real-time adaptive inspection for glass production |
US7551274B1 (en) | 2007-02-28 | 2009-06-23 | Lite Sentry Corporation | Defect detection lighting system and methods for large glass sheets |
DE102007058180B3 (de) * | 2007-12-04 | 2008-08-21 | Höge, Günther | Vorrichtung zur Aufbringung eines Fluids auf einen Körperteil |
KR100953204B1 (ko) * | 2008-05-19 | 2010-04-15 | (주)쎄미시스코 | 기판의 품질 검사장치 및 그 검사방법 |
TWI412736B (zh) * | 2009-12-04 | 2013-10-21 | Delta Electronics Inc | 基板內部缺陷檢查裝置及方法 |
US8270701B2 (en) * | 2010-01-08 | 2012-09-18 | 3M Innovative Properties Company | Optical web-based defect detection using intrasensor uniformity correction |
WO2012007782A1 (en) * | 2010-07-15 | 2012-01-19 | Ppg Iberica, S.A. | Device for the micro-inspection of flat surfaces and method of use |
CN103175851B (zh) * | 2011-12-21 | 2015-01-07 | 北京兆维电子(集团)有限责任公司 | 用于多相机扫描系统的标定工具及标定方法 |
GB201122082D0 (en) * | 2011-12-22 | 2012-02-01 | Rolls Royce Deutschland | Method and apparatus for inspection of components |
JP5944719B2 (ja) * | 2012-04-04 | 2016-07-05 | 大塚電子株式会社 | 配光特性測定装置および配光特性測定方法 |
US9140655B2 (en) | 2012-12-27 | 2015-09-22 | Shenzhen China Star Optoelectronics Technology Co., Ltd. | Mother glass inspection device and mother glass inspection method |
CN103076343B (zh) * | 2012-12-27 | 2016-09-14 | 深圳市华星光电技术有限公司 | 素玻璃激光检查机及素玻璃检查方法 |
FR3001043B1 (fr) * | 2013-01-11 | 2016-05-06 | Commissariat Energie Atomique | Procede de surveillance de la degradation d'un miroir |
DE102013216566A1 (de) * | 2013-08-21 | 2015-02-26 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Vorrichtung und verfahren zur erfassung einer zumindest teilweise spiegelnden oberfläche |
CN103528546A (zh) * | 2013-09-23 | 2014-01-22 | 芜湖长信科技股份有限公司 | 一种检测浮法玻璃波纹度的装置和方法 |
DE102014100594A1 (de) * | 2014-01-20 | 2015-07-23 | Isra Surface Vision Gmbh | Vorrichtung zur Inspektion eines mit einer beschichteten Oberfläche versehenen Materials und entsprechendes Verfahren |
US9933373B2 (en) * | 2014-04-29 | 2018-04-03 | Glasstech, Inc. | Glass sheet acquisition and positioning mechanism for an inline system for measuring the optical characteristics of a glass sheet |
CN104316543B (zh) * | 2014-10-10 | 2016-10-05 | 南京大树智能科技股份有限公司 | 一种烟包玻璃纸检测方法 |
JP6314798B2 (ja) * | 2014-11-12 | 2018-04-25 | Jfeスチール株式会社 | 表面欠陥検出方法及び表面欠陥検出装置 |
JP6697285B2 (ja) * | 2015-02-25 | 2020-05-20 | 株式会社昭和電気研究所 | ウェハ欠陥検査装置 |
US10851013B2 (en) | 2015-03-05 | 2020-12-01 | Glasstech, Inc. | Glass sheet acquisition and positioning system and associated method for an inline system for measuring the optical characteristics of a glass sheet |
CN105021530A (zh) * | 2015-06-26 | 2015-11-04 | 淮南市巨惠工贸有限公司 | 一种监测铝塑板生产时漏涂色差的装置 |
CN111812063B (zh) * | 2020-07-16 | 2022-11-04 | 中国计量大学 | 一种金属漆表面闪光效果的评价方法及测量装置 |
CN112683912B (zh) * | 2020-11-27 | 2024-06-18 | 成都数之联科技股份有限公司 | 一种布面缺陷视觉检测方法及其装置 |
CN115435666B (zh) * | 2022-07-13 | 2024-06-11 | 沪东中华造船(集团)有限公司 | 一种船舶涂层区域破损面积估算辅助装置及估算方法 |
CN116818798A (zh) * | 2023-05-31 | 2023-09-29 | 成都瑞波科材料科技有限公司 | 用于涂布工艺的彩虹纹检测装置、方法及涂布工艺设备 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2182254A5 (pt) * | 1972-04-24 | 1973-12-07 | Saint Gobain Pont A Mousson | |
US4812904A (en) * | 1986-08-11 | 1989-03-14 | Megatronics, Incorporated | Optical color analysis process |
US5073952A (en) * | 1988-09-07 | 1991-12-17 | Sigmax Kabushiki Kaisha | Pattern recognition device |
JP2573434B2 (ja) * | 1991-05-31 | 1997-01-22 | 松下電工株式会社 | 特定色抽出方法 |
US5225890A (en) * | 1991-10-28 | 1993-07-06 | Gencorp Inc. | Surface inspection apparatus and method |
JP2756386B2 (ja) * | 1991-12-27 | 1998-05-25 | 日本たばこ産業株式会社 | 円筒形物体の外観検査装置 |
JPH05332838A (ja) * | 1992-05-26 | 1993-12-17 | Imaizumi Shokai:Kk | 色ムラ外観検査装置 |
US5335293A (en) * | 1992-06-16 | 1994-08-02 | Key Technology, Inc. | Product inspection method and apparatus |
GB9219450D0 (en) * | 1992-09-15 | 1992-10-28 | Glaverbel | Thin film thickness monitoring and control |
GB2272615A (en) * | 1992-11-17 | 1994-05-18 | Rudolf Bisping | Controlling signal-to-noise ratio in noisy recordings |
DE4309802A1 (de) * | 1993-03-28 | 1994-09-29 | Robert Prof Dr Ing Massen | Produktionsnahe Farbkontrolle mit bildgebenden Sensoren |
-
1995
- 1995-03-15 DE DE19509345A patent/DE19509345A1/de not_active Withdrawn
- 1995-08-18 DE DE69524939T patent/DE69524939T2/de not_active Expired - Lifetime
- 1995-08-18 ES ES95401909T patent/ES2170128T3/es not_active Expired - Lifetime
- 1995-08-18 DK DK95401909T patent/DK0732579T3/da active
- 1995-08-18 EP EP95401909A patent/EP0732579B1/fr not_active Expired - Lifetime
- 1995-08-18 AT AT95401909T patent/ATE211820T1/de active
- 1995-08-18 PT PT95401909T patent/PT732579E/pt unknown
-
1996
- 1996-03-13 US US08/614,606 patent/US5887077A/en not_active Expired - Lifetime
- 1996-03-14 KR KR1019960007473A patent/KR100399507B1/ko not_active IP Right Cessation
- 1996-03-14 CN CN96107312A patent/CN1099032C/zh not_active Expired - Lifetime
- 1996-03-15 JP JP8059225A patent/JPH08292156A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
DK0732579T3 (da) | 2002-04-29 |
JPH08292156A (ja) | 1996-11-05 |
CN1099032C (zh) | 2003-01-15 |
US5887077A (en) | 1999-03-23 |
CN1147634A (zh) | 1997-04-16 |
ES2170128T3 (es) | 2002-08-01 |
DE69524939D1 (de) | 2002-02-14 |
EP0732579A2 (fr) | 1996-09-18 |
EP0732579A3 (fr) | 1998-01-07 |
DE19509345A1 (de) | 1996-09-19 |
KR100399507B1 (ko) | 2003-12-24 |
ATE211820T1 (de) | 2002-01-15 |
DE69524939T2 (de) | 2002-09-05 |
KR960036673A (ko) | 1996-10-28 |
EP0732579B1 (fr) | 2002-01-09 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
PT732579E (pt) | Processo para reconhecer e avaliar os defeitos nas camadas superficiais parcialmente reflectoras | |
SE9700539D0 (sv) | Förfarande och anordning för mätning och kvantifiering av ytdefekter på en provyta | |
MX9705701A (es) | Metodo y aparato para seguir e inspeccionar un borde o margen. | |
EP0362679A3 (en) | Inside surface inspection system and method therefor | |
WO1999026052A3 (en) | Automatic lens inspection system | |
CA2142715A1 (en) | Projection system for projecting a color video picture and transformation optical system for same | |
EP0847024A3 (en) | Fingerprint input apparatus | |
KR860001344A (ko) | 투명 제품의 선택굴절성 결함 검출계통 | |
WO1998017993A3 (de) | Verfahren für die ermittlung von optischen fehlern in grossflächigen scheiben | |
TW334659B (en) | System for optically scanning images using optical shutter | |
DE3688547D1 (de) | "diffraktosight"-verfahren. | |
WO2020232618A1 (zh) | 一种基于密集独立光源的表面瑕疵检测设备 | |
WO1999056166A3 (de) | Projektionseinrichtung | |
EP0823629A3 (en) | Process for the automatic recognition and categorization of defects in pallets or similar elements, and corresponding system | |
JP3596182B2 (ja) | 画像処理システム | |
JPS5530215A (en) | Color picture reader | |
JPH05188006A (ja) | 表面疵検知装置 | |
JP3507171B2 (ja) | レンチキュラーレンズシートの欠陥検査方法 | |
KR960003534A (ko) | 인쇄 회로 기판 검사용 시각 인식장치 | |
JPH0723211U (ja) | 透明プラスチック板の検査装置 | |
JP2000121574A (ja) | 鋼板の疵検査装置 | |
JPS6355513A (ja) | 光学装置 | |
JPH06118024A (ja) | 表示素子の輝度ムラ検査方法 | |
CN1119647C (zh) | 用于产生物体表面形状增强了的图象的装置和方法 | |
JPH04240538A (ja) | カラーフィルタの検査方法 |