DE69524939D1 - Verfahren zum Erkennen und Beurteilen von Fehlern in semi-reflektierender Oberflächenschicht - Google Patents

Verfahren zum Erkennen und Beurteilen von Fehlern in semi-reflektierender Oberflächenschicht

Info

Publication number
DE69524939D1
DE69524939D1 DE69524939T DE69524939T DE69524939D1 DE 69524939 D1 DE69524939 D1 DE 69524939D1 DE 69524939 T DE69524939 T DE 69524939T DE 69524939 T DE69524939 T DE 69524939T DE 69524939 D1 DE69524939 D1 DE 69524939D1
Authority
DE
Germany
Prior art keywords
colour
assessment
defects
semi
procedure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69524939T
Other languages
English (en)
Other versions
DE69524939T2 (de
Inventor
Wolfgang Bongardt
Ekkehard Wilde
Martin Lorek
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Saint Gobain Glass Deutschland GmbH
Original Assignee
VEGLA VEREINIGTE GLAS-WERKE GmbH
Vegla Vereinigte Glaswerke GmbH
Saint Gobain Glass France SAS
Compagnie de Saint Gobain SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by VEGLA VEREINIGTE GLAS-WERKE GmbH, Vegla Vereinigte Glaswerke GmbH, Saint Gobain Glass France SAS, Compagnie de Saint Gobain SA filed Critical VEGLA VEREINIGTE GLAS-WERKE GmbH
Priority to DE69524939T priority Critical patent/DE69524939T2/de
Publication of DE69524939D1 publication Critical patent/DE69524939D1/de
Application granted granted Critical
Publication of DE69524939T2 publication Critical patent/DE69524939T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N7/00—Television systems
    • H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1765—Method using an image detector and processing of image signal
    • G01N2021/177—Detector of the video camera type
    • G01N2021/1776—Colour camera
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G01N2021/8427—Coatings

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Textile Engineering (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE69524939T 1995-03-15 1995-08-18 Verfahren zum Erkennen und Beurteilen von Fehlern in semi-reflektierender Oberflächenschicht Expired - Lifetime DE69524939T2 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE69524939T DE69524939T2 (de) 1995-03-15 1995-08-18 Verfahren zum Erkennen und Beurteilen von Fehlern in semi-reflektierender Oberflächenschicht

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19509345A DE19509345A1 (de) 1995-03-15 1995-03-15 Verfahren zum Erkennen und Bewerten von Fehlern in teilreflektierenden Oberflächenschichten
DE69524939T DE69524939T2 (de) 1995-03-15 1995-08-18 Verfahren zum Erkennen und Beurteilen von Fehlern in semi-reflektierender Oberflächenschicht

Publications (2)

Publication Number Publication Date
DE69524939D1 true DE69524939D1 (de) 2002-02-14
DE69524939T2 DE69524939T2 (de) 2002-09-05

Family

ID=7756720

Family Applications (2)

Application Number Title Priority Date Filing Date
DE19509345A Withdrawn DE19509345A1 (de) 1995-03-15 1995-03-15 Verfahren zum Erkennen und Bewerten von Fehlern in teilreflektierenden Oberflächenschichten
DE69524939T Expired - Lifetime DE69524939T2 (de) 1995-03-15 1995-08-18 Verfahren zum Erkennen und Beurteilen von Fehlern in semi-reflektierender Oberflächenschicht

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE19509345A Withdrawn DE19509345A1 (de) 1995-03-15 1995-03-15 Verfahren zum Erkennen und Bewerten von Fehlern in teilreflektierenden Oberflächenschichten

Country Status (10)

Country Link
US (1) US5887077A (de)
EP (1) EP0732579B1 (de)
JP (1) JPH08292156A (de)
KR (1) KR100399507B1 (de)
CN (1) CN1099032C (de)
AT (1) ATE211820T1 (de)
DE (2) DE19509345A1 (de)
DK (1) DK0732579T3 (de)
ES (1) ES2170128T3 (de)
PT (1) PT732579E (de)

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AU6942998A (en) * 1997-03-31 1998-10-22 Microtherm, Llc Optical inspection module and method for detecting particles and defects on substrates in integrated process tools
DE19813072A1 (de) * 1998-03-25 1999-09-30 Laser Sorter Gmbh Verfahren und Vorrichtung zur Bestimmung der optischen Qualität und zur Detektion von Fehlern von Flachglas und anderen optisch transparenten Materialien
DE19948190B4 (de) * 1999-10-06 2013-05-16 GPP Chemnitz Gesellschaft für Prozeßrechnerprogrammierung mbH Anordnung zur Charakterisierung von Unregelmässigkeiten auf ebenen und transparenten Oberflächen von Gegenständen, bspw. von einer Kittschicht
EP1126273A1 (de) * 2000-02-09 2001-08-22 Orbis Oy Verfahren und Vorrichtung zur Detektion von Fehlern in einem durchsichtigen Gegenstand
AU2001288641A1 (en) * 2000-09-01 2002-03-13 Mark M. Abbott Optical system for imaging distortions in moving reflective sheets
US7082218B2 (en) * 2001-07-27 2006-07-25 Hewlett-Packard Development Company, L.P. Color correction of images
GB2408888B (en) * 2001-07-27 2006-02-22 Hewlett Packard Co Electronic image colour plane reconstruction
EP1357515A1 (de) * 2002-04-22 2003-10-29 Agfa-Gevaert AG Verfahren zur Verarbeitung digitaler Bilddaten von fotografischen Bildern
US6995847B2 (en) * 2002-05-24 2006-02-07 Honeywell International Inc. Methods and systems for substrate surface evaluation
US7463765B2 (en) * 2003-02-25 2008-12-09 Lamda-Lite Enterprises Incorporated System and method for detecting and reporting fabrication defects using a multi-variant image analysis
DE10326217A1 (de) * 2003-06-11 2004-12-30 Bayerische Motoren Werke Ag Verfahren zum Erkennen von Fehlern der Haftung einer Beschichtung
DE10326216B4 (de) * 2003-06-11 2007-03-15 Bayerische Motoren Werke Ag Verfahren zum Erkennen von Fehlern der Haftung einer Beschichtung auf einem Substrat
US20060026807A1 (en) * 2003-08-07 2006-02-09 Carnevali Jeffrey D Quick release mounting apparatus
DE102005007715B4 (de) * 2005-02-18 2008-07-24 Schott Ag Vorrichtung zur Erfassung von Fehlstellen und Verwendung der Vorrichtung
JP5228490B2 (ja) * 2005-12-26 2013-07-03 株式会社ニコン 画像解析によって欠陥検査を行う欠陥検査装置
US7369240B1 (en) 2006-07-20 2008-05-06 Litesentry Corporation Apparatus and methods for real-time adaptive inspection for glass production
US7551274B1 (en) 2007-02-28 2009-06-23 Lite Sentry Corporation Defect detection lighting system and methods for large glass sheets
DE102007058180B3 (de) * 2007-12-04 2008-08-21 Höge, Günther Vorrichtung zur Aufbringung eines Fluids auf einen Körperteil
KR100953204B1 (ko) * 2008-05-19 2010-04-15 (주)쎄미시스코 기판의 품질 검사장치 및 그 검사방법
TWI412736B (zh) * 2009-12-04 2013-10-21 Delta Electronics Inc 基板內部缺陷檢查裝置及方法
US8270701B2 (en) * 2010-01-08 2012-09-18 3M Innovative Properties Company Optical web-based defect detection using intrasensor uniformity correction
WO2012007782A1 (en) * 2010-07-15 2012-01-19 Ppg Iberica, S.A. Device for the micro-inspection of flat surfaces and method of use
CN103175851B (zh) * 2011-12-21 2015-01-07 北京兆维电子(集团)有限责任公司 用于多相机扫描系统的标定工具及标定方法
GB201122082D0 (en) * 2011-12-22 2012-02-01 Rolls Royce Deutschland Method and apparatus for inspection of components
JP5944719B2 (ja) * 2012-04-04 2016-07-05 大塚電子株式会社 配光特性測定装置および配光特性測定方法
US9140655B2 (en) 2012-12-27 2015-09-22 Shenzhen China Star Optoelectronics Technology Co., Ltd. Mother glass inspection device and mother glass inspection method
CN103076343B (zh) * 2012-12-27 2016-09-14 深圳市华星光电技术有限公司 素玻璃激光检查机及素玻璃检查方法
FR3001043B1 (fr) * 2013-01-11 2016-05-06 Commissariat Energie Atomique Procede de surveillance de la degradation d'un miroir
DE102013216566A1 (de) * 2013-08-21 2015-02-26 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung und verfahren zur erfassung einer zumindest teilweise spiegelnden oberfläche
CN103528546A (zh) * 2013-09-23 2014-01-22 芜湖长信科技股份有限公司 一种检测浮法玻璃波纹度的装置和方法
DE102014100594A1 (de) 2014-01-20 2015-07-23 Isra Surface Vision Gmbh Vorrichtung zur Inspektion eines mit einer beschichteten Oberfläche versehenen Materials und entsprechendes Verfahren
US9933373B2 (en) * 2014-04-29 2018-04-03 Glasstech, Inc. Glass sheet acquisition and positioning mechanism for an inline system for measuring the optical characteristics of a glass sheet
CN104316543B (zh) * 2014-10-10 2016-10-05 南京大树智能科技股份有限公司 一种烟包玻璃纸检测方法
JP6314798B2 (ja) * 2014-11-12 2018-04-25 Ｊｆｅスチール株式会社 表面欠陥検出方法及び表面欠陥検出装置
JP6697285B2 (ja) * 2015-02-25 2020-05-20 株式会社昭和電気研究所 ウェハ欠陥検査装置
US10851013B2 (en) 2015-03-05 2020-12-01 Glasstech, Inc. Glass sheet acquisition and positioning system and associated method for an inline system for measuring the optical characteristics of a glass sheet
CN105021530A (zh) * 2015-06-26 2015-11-04 淮南市巨惠工贸有限公司 一种监测铝塑板生产时漏涂色差的装置
CN111812063B (zh) * 2020-07-16 2022-11-04 中国计量大学 一种金属漆表面闪光效果的评价方法及测量装置
CN112683912B (zh) * 2020-11-27 2024-06-18 成都数之联科技股份有限公司 一种布面缺陷视觉检测方法及其装置
CN115435666B (zh) * 2022-07-13 2024-06-11 沪东中华造船(集团)有限公司 一种船舶涂层区域破损面积估算辅助装置及估算方法
CN116818798A (zh) * 2023-05-31 2023-09-29 成都瑞波科材料科技有限公司 用于涂布工艺的彩虹纹检测装置、方法及涂布工艺设备

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US4812904A (en) * 1986-08-11 1989-03-14 Megatronics, Incorporated Optical color analysis process
US5073952A (en) * 1988-09-07 1991-12-17 Sigmax Kabushiki Kaisha Pattern recognition device
JP2573434B2 (ja) * 1991-05-31 1997-01-22 松下電工株式会社 特定色抽出方法
US5225890A (en) * 1991-10-28 1993-07-06 Gencorp Inc. Surface inspection apparatus and method
JP2756386B2 (ja) * 1991-12-27 1998-05-25 日本たばこ産業株式会社 円筒形物体の外観検査装置
JPH05332838A (ja) * 1992-05-26 1993-12-17 Imaizumi Shokai:Kk 色ムラ外観検査装置
US5335293A (en) * 1992-06-16 1994-08-02 Key Technology, Inc. Product inspection method and apparatus
GB9219450D0 (en) * 1992-09-15 1992-10-28 Glaverbel Thin film thickness monitoring and control
GB2272615A (en) * 1992-11-17 1994-05-18 Rudolf Bisping Controlling signal-to-noise ratio in noisy recordings
DE4309802A1 (de) * 1993-03-28 1994-09-29 Robert Prof Dr Ing Massen Produktionsnahe Farbkontrolle mit bildgebenden Sensoren

Also Published As

Publication number Publication date
KR960036673A (ko) 1996-10-28
CN1147634A (zh) 1997-04-16
EP0732579A2 (de) 1996-09-18
ES2170128T3 (es) 2002-08-01
EP0732579B1 (de) 2002-01-09
DE69524939T2 (de) 2002-09-05
US5887077A (en) 1999-03-23
PT732579E (pt) 2002-06-28
CN1099032C (zh) 2003-01-15
DK0732579T3 (da) 2002-04-29
EP0732579A3 (de) 1998-01-07
JPH08292156A (ja) 1996-11-05
KR100399507B1 (ko) 2003-12-24
DE19509345A1 (de) 1996-09-19
ATE211820T1 (de) 2002-01-15

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Legal Events

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8327 Change in the person/name/address of the patent owner

Owner name: SAINT-GOBAIN GLASS DEUTSCHLAND GMBH, 52066 AACHEN,

8364 No opposition during term of opposition
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Ref document number: 732579

Country of ref document: EP

Representative=s name: TOMAS LENDVAI, 52134 HERZOGENRATH, DE