PT1216419E - Ponta de sonda para a medicao de altas - frequencias e processo para a sua producao - Google Patents

Ponta de sonda para a medicao de altas - frequencias e processo para a sua producao

Info

Publication number
PT1216419E
PT1216419E PT00978936T PT00978936T PT1216419E PT 1216419 E PT1216419 E PT 1216419E PT 00978936 T PT00978936 T PT 00978936T PT 00978936 T PT00978936 T PT 00978936T PT 1216419 E PT1216419 E PT 1216419E
Authority
PT
Portugal
Prior art keywords
coaxial
conductor structure
contact end
coplanar conductor
dielectric
Prior art date
Application number
PT00978936T
Other languages
English (en)
Inventor
Michael Wollitzer
Original Assignee
Rosenberger Hochfrequenztech
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rosenberger Hochfrequenztech filed Critical Rosenberger Hochfrequenztech
Publication of PT1216419E publication Critical patent/PT1216419E/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
PT00978936T 1999-09-21 2000-09-18 Ponta de sonda para a medicao de altas - frequencias e processo para a sua producao PT1216419E (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19945178A DE19945178C2 (de) 1999-09-21 1999-09-21 Meßspitze zur Hochfrequenzmessung und Verfahren zu deren Herstellung

Publications (1)

Publication Number Publication Date
PT1216419E true PT1216419E (pt) 2004-07-30

Family

ID=7922746

Family Applications (1)

Application Number Title Priority Date Filing Date
PT00978936T PT1216419E (pt) 1999-09-21 2000-09-18 Ponta de sonda para a medicao de altas - frequencias e processo para a sua producao

Country Status (11)

Country Link
US (1) US7042236B1 (pt)
EP (1) EP1216419B1 (pt)
JP (1) JP2003510574A (pt)
CN (1) CN1162707C (pt)
AT (1) ATE261585T1 (pt)
CA (1) CA2385337C (pt)
DE (2) DE19945178C2 (pt)
DK (1) DK1216419T3 (pt)
ES (1) ES2214335T3 (pt)
PT (1) PT1216419E (pt)
WO (1) WO2001022097A1 (pt)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000003252A2 (en) * 1998-07-08 2000-01-20 Capres Aps Multi-point probe
JP4678993B2 (ja) * 2001-06-19 2011-04-27 日置電機株式会社 高周波プローブおよび高周波プローブの製造方法
DE10136726A1 (de) * 2001-07-27 2003-04-03 Connexion Rosenberger Gmbh Meßanordnung für Hochfrequenzmessungen mit mehreren Meßsonden und ein Verfahren zur Herstellung derselben
DE10201491C1 (de) * 2002-01-16 2003-08-28 Gfd Ges Fuer Diamantprodukte M Meßspitzensystem und Verfahren zu dessen Herstellung
DE10229038B4 (de) * 2002-06-28 2013-08-14 Robert Bosch Gmbh Verkapptes Mikrostrukturbauelement mit Hochfrequenzdurchführung
US7427868B2 (en) * 2003-12-24 2008-09-23 Cascade Microtech, Inc. Active wafer probe
DE202004019636U1 (de) 2004-12-20 2005-03-03 Rosenberger Hochfrequenztechnik Gmbh & Co. Kg Meßspitze für HF-Messung
JP4679244B2 (ja) * 2005-05-26 2011-04-27 株式会社アドバンテスト 測定用コンタクト端子、測定装置、プローブカードセット、およびウエハプローバ装置
DE202006006359U1 (de) * 2006-04-20 2006-07-13 Rosenberger Hochfrequenztechnik Gmbh & Co. Kg Potentialfreie Gehäusedurchführung
DE102007006195A1 (de) 2007-02-07 2008-08-14 Infineon Technologies Ag Kontaktelement, Kontakteinheit, Verfahren zur Herstellung einer Kontakteinheit und Verfahren zur Inbetriebnahme für Fine-Pitch Bauteile
US7982480B2 (en) * 2008-08-01 2011-07-19 Aes Technologies, Inc. Calibrated wideband high frequency passive impedance probe
DE202008010533U1 (de) * 2008-08-07 2008-10-30 Rosenberger Hochfrequenztechnik Gmbh & Co. Kg Kontaktlose Schleifensonde
DE202008013982U1 (de) * 2008-10-20 2009-01-08 Rosenberger Hochfrequenztechnik Gmbh & Co. Kg Messsystem zum Bestimmen von Streuparametern
DE202009003966U1 (de) 2009-03-20 2009-06-04 Rosenberger Hochfrequenztechnik Gmbh & Co. Kg Messspitzen
DE202012002391U1 (de) 2012-03-08 2013-06-10 Rosenberger Hochfrequenztechnik Gmbh & Co. Kg Vorrichtung zur Messung elektronischer Bauteile
DE102012107556A1 (de) * 2012-08-17 2014-02-20 HARTING Electronics GmbH Vorrichtung und Verfahren zur reversiblen, mechanischen Fixierung und elektrischen Kontaktierung elektrischer Leiter
DE202014002841U1 (de) 2014-04-01 2014-06-25 Rosenberger Hochfrequenztechnik Gmbh & Co. Kg Kontaktieranordnung, insbesondere HF-Messspitze
CN105092975B (zh) * 2015-09-23 2017-11-03 广州兴森快捷电路科技有限公司 Pcb板内单端阻抗测试头
US11041880B2 (en) * 2017-12-01 2021-06-22 Tektronix, Inc. Contactless coupling between test and measurement system and a device under test
DE102018104264A1 (de) 2018-02-26 2019-08-29 Rosenberger Hochfrequenztechnik Gmbh & Co. Kg Verfahren zur herstellung von mindestens einem hochfrequenz-kontaktelement oder einer hochfrequenz-kontaktelement-anordnung sowie zugehörige vorrichtung
WO2020022085A1 (ja) * 2018-07-27 2020-01-30 日置電機株式会社 測定装置
JP7387285B2 (ja) 2019-04-26 2023-11-28 日置電機株式会社 プローブ装置
TW202212836A (zh) * 2020-06-11 2022-04-01 美商鋒法特股份有限公司 多導體傳輸線探針
CN112993058B (zh) * 2021-02-03 2023-11-24 中国电子科技集团公司第四十三研究所 一种基于混合集成工艺的光电微系统封装结构

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4697143A (en) * 1984-04-30 1987-09-29 Cascade Microtech, Inc. Wafer probe
US4894612A (en) 1987-08-13 1990-01-16 Hypres, Incorporated Soft probe for providing high speed on-wafer connections to a circuit
US4871964A (en) * 1988-04-12 1989-10-03 G. G. B. Industries, Inc. Integrated circuit probing apparatus
US5512838A (en) * 1992-09-03 1996-04-30 Hewlett-Packard Company Probe with reduced input capacitance
US5373231A (en) * 1993-06-10 1994-12-13 G. G. B. Industries, Inc. Integrated circuit probing apparatus including a capacitor bypass structure
US5561378A (en) * 1994-07-05 1996-10-01 Motorola, Inc. Circuit probe for measuring a differential circuit
US5506515A (en) * 1994-07-20 1996-04-09 Cascade Microtech, Inc. High-frequency probe tip assembly
US5565788A (en) * 1994-07-20 1996-10-15 Cascade Microtech, Inc. Coaxial wafer probe with tip shielding
US5508630A (en) * 1994-09-09 1996-04-16 Board Of Regents, University Of Texas Systems Probe having a power detector for use with microwave or millimeter wave device
DE19641880A1 (de) * 1996-10-10 1998-04-16 Rosenberger Hochfrequenztech Meßspitzeneinheit zum Kontaktieren von planaren Mikrowellenschaltungen
JP3100930B2 (ja) * 1997-09-10 2000-10-23 株式会社双晶テック コンタクトプローブ
US6118287A (en) * 1997-12-09 2000-09-12 Boll; Gregory George Probe tip structure

Also Published As

Publication number Publication date
CA2385337A1 (en) 2001-03-29
WO2001022097A1 (de) 2001-03-29
ES2214335T3 (es) 2004-09-16
EP1216419B1 (de) 2004-03-10
US7042236B1 (en) 2006-05-09
CN1162707C (zh) 2004-08-18
DE50005616D1 (de) 2004-04-15
DE19945178C2 (de) 2003-05-28
EP1216419A1 (de) 2002-06-26
CN1373853A (zh) 2002-10-09
CA2385337C (en) 2010-01-12
DK1216419T3 (da) 2004-07-12
DE19945178A1 (de) 2001-08-02
JP2003510574A (ja) 2003-03-18
ATE261585T1 (de) 2004-03-15

Similar Documents

Publication Publication Date Title
PT1216419E (pt) Ponta de sonda para a medicao de altas - frequencias e processo para a sua producao
WO2004107401A3 (en) Probe for testing a device under test
JP4921344B2 (ja) 検査ソケット
SE0004340D0 (sv) Antenn
JPWO2008072322A1 (ja) 同軸ケーブルユニット、及び試験装置
WO2002050556A3 (de) Hochfrequenz-tastspitze
US11726111B2 (en) Test device
KR940022949A (ko) 공통 전기 커넥터
KR101634258B1 (ko) 테스트 프로드
AU1405102A (en) System for testing an electric high frequency signal and level measuring device provided with said system
TW200603178A (en) Flexible test cable
JP2003133659A (ja) 屈曲性能を具備した高周波用フレキシブルプリント配線板
KR970012848A (ko) 가스차단기
KR880004322A (ko) 집적회로 프로브시스템
US9529014B1 (en) System and method for acquiring electrical measurements of an electronic device
KR830006834A (ko) 다심 케이블용 접촉기
ES2171490T3 (es) Contacto por desplazamiento de aislante para multiples tamaños de cable.
BR9610328A (pt) Conector elétrico
NO960584L (no) Böyelig båndkabel
JP2003187888A (ja) ボード対ボード型電気コネクタ
DE60210978D1 (de) Steckverbinder für eine mehrzahl von anschlussbuchsen für koaxialkabel
BR0206857A (pt) Dispositivo de contato para a união separável de um aparelho móvel com corpos de contato fixos
JPH07104361B2 (ja) 高周波プローブ
CN113219220B (zh) 探针卡装置及其指向性探针
DE3686418D1 (de) Elektrische kontaktanordnung fuer eine insbesondere als mehradriges kabel ausgebildete leiteranordnung.