PL3505977T3 - Układ do kontroli CT oraz sposób obrazowania CT - Google Patents

Układ do kontroli CT oraz sposób obrazowania CT

Info

Publication number
PL3505977T3
PL3505977T3 PL19150074.3T PL19150074T PL3505977T3 PL 3505977 T3 PL3505977 T3 PL 3505977T3 PL 19150074 T PL19150074 T PL 19150074T PL 3505977 T3 PL3505977 T3 PL 3505977T3
Authority
PL
Poland
Prior art keywords
inspection system
imaging method
imaging
inspection
Prior art date
Application number
PL19150074.3T
Other languages
English (en)
Inventor
Kejun Kang
Jianmin Li
Xiulin NI
Yulan Li
Yuanjing Li
Zhiqiang Chen
Li Zhang
Liang Li
Xiang Zou
Weifeng Yu
Hejun Zhou
Chunguang ZONG
Original Assignee
Tsinghua University
Nuctech Company Limited
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tsinghua University, Nuctech Company Limited filed Critical Tsinghua University
Publication of PL3505977T3 publication Critical patent/PL3505977T3/pl

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/226Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays using tomography
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/30Accessories, mechanical or electrical features
    • G01N2223/33Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Theoretical Computer Science (AREA)
  • Pulmonology (AREA)
  • Engineering & Computer Science (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
PL19150074.3T 2017-12-28 2019-01-02 Układ do kontroli CT oraz sposób obrazowania CT PL3505977T3 (pl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201711451912.0A CN108120729B (zh) 2017-12-28 2017-12-28 Ct检查系统和ct成像方法

Publications (1)

Publication Number Publication Date
PL3505977T3 true PL3505977T3 (pl) 2024-04-22

Family

ID=62231980

Family Applications (1)

Application Number Title Priority Date Filing Date
PL19150074.3T PL3505977T3 (pl) 2017-12-28 2019-01-02 Układ do kontroli CT oraz sposób obrazowania CT

Country Status (5)

Country Link
US (1) US10935691B2 (pl)
EP (1) EP3505977B1 (pl)
CN (1) CN108120729B (pl)
PL (1) PL3505977T3 (pl)
WO (1) WO2019128704A1 (pl)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108226195B (zh) 2017-12-28 2023-10-13 清华大学 Ct检查系统和ct成像方法
CN108120729B (zh) * 2017-12-28 2024-04-02 清华大学 Ct检查系统和ct成像方法
CN116095932B (zh) * 2021-11-05 2024-05-24 同方威视技术股份有限公司 成像系统中光机出束控制方法、装置、ct成像系统

Family Cites Families (54)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62221338A (ja) 1986-03-24 1987-09-29 横河メディカルシステム株式会社 放射線断層撮像装置におけるスキャンデ−タ収集方法
JP3597918B2 (ja) * 1995-09-11 2004-12-08 株式会社日立メディコ X線ct装置
US6233308B1 (en) * 1999-03-19 2001-05-15 General Electric Company Methods and apparatus for artifact compensation with variable angular sampling
US6553091B2 (en) * 2000-06-22 2003-04-22 Kabushiki Kaisha Toshiba X-ray CT apparatus
JP4164282B2 (ja) * 2002-04-16 2008-10-15 キヤノン株式会社 放射線撮影装置、放射線撮影方法及びコンピュータプログラム
US7813473B2 (en) * 2002-07-23 2010-10-12 General Electric Company Method and apparatus for generating temporally interpolated projections
US6882703B2 (en) * 2002-07-31 2005-04-19 Ge Medical Systems Global Technology Company, Llc Electron source and cable for x-ray tubes
DE10301891B3 (de) * 2003-01-17 2004-10-21 Siemens Ag Verfahren zum Betrieb eines Röntgen-Tomographie-Geräts und Röntgen-Tomographie-Gerät
DE10336278A1 (de) * 2003-08-07 2005-03-10 Siemens Ag Verfahren und Vorrichtung zur Abbildung eines Organs
DE102005049603B4 (de) * 2005-10-17 2010-09-16 Siemens Ag Verfahren und Vorrichtung zur Abbildung eines Organs
ATE500778T1 (de) * 2005-12-22 2011-03-15 Visen Medical Inc Kombiniertes röntgen- und optisches tomographie- bildgebungssystem
US7817773B2 (en) * 2007-01-05 2010-10-19 Dexela Limited Variable speed three-dimensional imaging system
US7724866B2 (en) * 2007-06-27 2010-05-25 Analogic Corporation Method of and system for variable pitch computed tomography scanning for baggage screening
JP5273957B2 (ja) * 2007-07-03 2013-08-28 キヤノン株式会社 放射線画像撮影装置
US7936858B2 (en) * 2007-09-28 2011-05-03 Siemens Medical Solutions Usa, Inc. System and method for tomosynthesis
US8044681B2 (en) * 2007-10-08 2011-10-25 General Electric Company Apparatus and method for channel-specific configuration in a readout ASIC
JP5451756B2 (ja) * 2008-06-06 2014-03-26 コーニンクレッカ フィリップス エヌ ヴェ 減弱補正のための方法及び装置
WO2010015951A1 (en) * 2008-08-04 2010-02-11 Koninklijke Philips Electronics N.V. Data acquisition
CN101683271B (zh) * 2008-09-28 2014-03-12 清华大学 X射线ct设备、图像重建方法和x射线成像方法
US7881426B2 (en) * 2009-02-26 2011-02-01 Morpho Detection, Inc. Method and system for performing a scan of an object
DE102009031549A1 (de) * 2009-07-02 2011-01-05 Siemens Aktiengesellschaft Medizinisches Bildaufnahmeverfahren und zugehörige Vorrichtung
JP5458771B2 (ja) * 2009-09-24 2014-04-02 株式会社島津製作所 放射線断層像撮影装置
US8451972B2 (en) * 2009-10-23 2013-05-28 Arineta Ltd. Methods, circuits, devices, apparatus, assemblies and systems for computer tomography
FI123899B (fi) * 2009-11-25 2013-12-13 Planmeca Oy Hammaslääketieteellinen tietokonetomografialaitteisto
FI125450B (fi) * 2009-11-25 2015-10-15 Planmeca Oy Hammaslääketieteellinen tietokonetomografialaitteisto
US9848835B2 (en) * 2010-08-16 2017-12-26 Varian Medical Systems International Ag Variable-speed computed tomography scanning
JP5758155B2 (ja) * 2011-03-10 2015-08-05 株式会社東芝 X線ct装置
EP2736415B1 (en) * 2011-07-28 2017-04-12 The Board Of Trustees Of The University Of the Leland Stanford Junior University Modulating gantry rotation speed and image acquisition in respiratory correlated (4d) cone beam ct images
DE102012212124B4 (de) * 2012-07-11 2018-06-14 Siemens Healthcare Gmbh Zählender digitaler Röntgendetektor und Verfahren zur Aufnahme einer Serie von Röntgenbildern
DE102012217555A1 (de) * 2012-09-27 2014-03-27 Siemens Aktiengesellschaft Verfahren und Computertomographie-System zur Ermittlung von Knochenmineraldichtewerten
WO2014154188A1 (en) * 2013-03-26 2014-10-02 Institute Of Experimental And Applied Physics Method of phase gradient radiography and arrangement of an imaging system for application of the method
BR112015028336A2 (pt) * 2013-05-16 2017-07-25 Koninklijke Philips Nv placa detectora de imageamento em silício, método, e, detector do método
CN103472074B (zh) * 2013-06-19 2016-01-20 清华大学 Ct成像系统和方法
WO2015030091A1 (ja) * 2013-09-02 2015-03-05 株式会社 日立メディコ X線撮影装置およびx線透視画像表示方法
JP5937552B2 (ja) * 2013-09-09 2016-06-22 富士フイルム株式会社 放射線撮影システムおよびその作動方法
JP6050206B2 (ja) * 2013-09-17 2016-12-21 富士フイルム株式会社 放射線撮影システム及び通信環境制御装置
CN104510486B (zh) * 2013-09-30 2021-04-20 Ge医疗系统环球技术有限公司 计算机化断层扫描设备及其机架旋转控制装置和方法
KR102201407B1 (ko) * 2013-11-18 2021-01-12 삼성전자주식회사 엑스선 영상장치 및 그 제어방법
JP6071853B2 (ja) * 2013-11-26 2017-02-01 富士フイルム株式会社 放射線画像処理装置、方法およびプログラム
CN104749197B (zh) * 2013-12-26 2017-08-11 清华大学 Ct系统及其方法
CN103767725B (zh) * 2013-12-31 2016-06-29 沈阳东软医疗系统有限公司 一种用于平衡ct机架的方法和装置
CN106232007B (zh) * 2014-03-14 2019-07-09 株式会社日立制作所 X射线ct装置和处理装置
JP6178272B2 (ja) * 2014-03-24 2017-08-09 株式会社東芝 放射線計測装置、および放射線計測プログラム
CN104198506B (zh) * 2014-08-27 2017-11-07 清华大学 小角度自摆式大型多层螺旋ct设备和检查方法
JP6280851B2 (ja) * 2014-09-30 2018-02-14 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー 放射線断層撮影装置及びプログラム
JP6490974B2 (ja) * 2015-01-30 2019-03-27 キヤノンメディカルシステムズ株式会社 医用画像診断装置、医用画像診断方法および医用画像診断プログラム
JP6662385B2 (ja) * 2015-07-17 2020-03-11 コニカミノルタ株式会社 放射線画像撮影装置および放射線画像撮影システム
DE102015217617A1 (de) * 2015-09-15 2017-03-16 Siemens Healthcare Gmbh Verfahren zum Korrigieren von Röntgenbilddaten umfassend Information bezüglich eines Zerfallsprozesses eines radioaktiven Materials
JP6668717B2 (ja) * 2015-12-04 2020-03-18 コニカミノルタ株式会社 放射線撮影装置及び放射線撮影システム
JP6780291B2 (ja) * 2016-05-16 2020-11-04 コニカミノルタ株式会社 X線画像撮影装置
US10561391B2 (en) * 2016-08-18 2020-02-18 General Electric Company Methods and systems for computed tomography
JP2018175700A (ja) * 2017-04-20 2018-11-15 キヤノンメディカルシステムズ株式会社 医用画像診断装置、医用画像処理装置、及び医用画像処理プログラム
CN207816864U (zh) * 2017-12-28 2018-09-04 清华大学 Ct检查系统
CN108120729B (zh) * 2017-12-28 2024-04-02 清华大学 Ct检查系统和ct成像方法

Also Published As

Publication number Publication date
CN108120729B (zh) 2024-04-02
US10935691B2 (en) 2021-03-02
EP3505977A1 (en) 2019-07-03
US20190204243A1 (en) 2019-07-04
EP3505977B1 (en) 2023-11-29
CN108120729A (zh) 2018-06-05
WO2019128704A1 (zh) 2019-07-04

Similar Documents

Publication Publication Date Title
GB2547360B (en) Image reconstruction system and method
GB2549208B (en) System and method for image reconstruction
GB2563602B (en) Method and apparatus for imaging
GB201915931D0 (en) X-ray tomography inspection systems and methods
EP3313290A4 (en) SYSTEM AND METHOD FOR X-RAY IMAGING ORIENTATION
IL254078A0 (en) Method and system for creating images for testing
PL3341713T3 (pl) Układ kontrolny dla obiektów w postaci kapsułek oraz powiązany sposób
PL3242126T3 (pl) Sposób i system obrazowania promieniowaniem podwójnej energii
GB2545101B (en) Imaging apparatus and imaging system
GB201702118D0 (en) Method and system for calibrating imaging system
GB2568749B (en) Imaging apparatus and method
GB202007322D0 (en) X-Ray Tomography inspection systems and methods
GB2577662B (en) System and method for image reconstruction
GB2550503B (en) System and method for computed tomography
PL3505975T3 (pl) Układ do kontroli promieniowaniem oraz sposób kontroli promieniowaniem
EP3247275A4 (en) Tomography imaging apparatus and method
GB2569541B (en) Method and apparatus for medical imaging
TWI562343B (en) Electrical radiography imaging system and method thereof
PL2959836T3 (pl) Sposób kalibracji obrazu tomografii komputerowej oraz urządzenie i system tomografii komputerowej
GB2566942B (en) Multimodal imaging system and method
GB2541675B (en) Imaging apparatus and method
PL3505977T3 (pl) Układ do kontroli CT oraz sposób obrazowania CT
GB2551027B (en) Imaging apparatus and radiographic imaging system
GB201800340D0 (en) Imaging system and method
IL273086A (en) Imaging system and method therefor