PL3505975T3 - Układ do kontroli promieniowaniem oraz sposób kontroli promieniowaniem - Google Patents

Układ do kontroli promieniowaniem oraz sposób kontroli promieniowaniem

Info

Publication number
PL3505975T3
PL3505975T3 PL18215790T PL18215790T PL3505975T3 PL 3505975 T3 PL3505975 T3 PL 3505975T3 PL 18215790 T PL18215790 T PL 18215790T PL 18215790 T PL18215790 T PL 18215790T PL 3505975 T3 PL3505975 T3 PL 3505975T3
Authority
PL
Poland
Prior art keywords
radiation inspection
inspection system
inspection method
radiation
inspection
Prior art date
Application number
PL18215790T
Other languages
English (en)
Inventor
Yigang Yang
Dongyu Wang
Hao Yu
Quanwei Song
Jianmin Li
Weizhen Wang
Yulan Li
Chunguang ZONG
Qinjian Zhang
Ming Zeng
Zhiqiang Chen
Yuanjing Li
Li Zhang
Original Assignee
Tsinghua University
Nuctech Company Limited
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tsinghua University, Nuctech Company Limited filed Critical Tsinghua University
Publication of PL3505975T3 publication Critical patent/PL3505975T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/005—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using neutrons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/04—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/106—Different kinds of radiation or particles neutrons
    • G01N2223/1066—Different kinds of radiation or particles neutrons thermal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/20—Sources of radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/316—Accessories, mechanical or electrical features collimators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/32—Accessories, mechanical or electrical features adjustments of elements during operation

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Geophysics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
PL18215790T 2017-12-26 2018-12-21 Układ do kontroli promieniowaniem oraz sposób kontroli promieniowaniem PL3505975T3 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201711429492.6A CN107966460B (zh) 2017-12-26 2017-12-26 辐射检查系统和辐射检查方法
EP18215790.9A EP3505975B1 (en) 2017-12-26 2018-12-21 Radiation inspection system and radiation inspection method

Publications (1)

Publication Number Publication Date
PL3505975T3 true PL3505975T3 (pl) 2021-07-12

Family

ID=61995956

Family Applications (1)

Application Number Title Priority Date Filing Date
PL18215790T PL3505975T3 (pl) 2017-12-26 2018-12-21 Układ do kontroli promieniowaniem oraz sposób kontroli promieniowaniem

Country Status (5)

Country Link
US (1) US10739491B2 (pl)
EP (1) EP3505975B1 (pl)
CN (1) CN107966460B (pl)
PL (1) PL3505975T3 (pl)
WO (1) WO2019128697A1 (pl)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10762998B2 (en) 2014-11-20 2020-09-01 Viken Detection Corporation X-ray scanning system
US10770195B2 (en) 2017-04-05 2020-09-08 Viken Detection Corporation X-ray chopper wheel assembly
CN109521486A (zh) * 2019-01-04 2019-03-26 同方威视技术股份有限公司 辐射检查设备
WO2021247615A1 (en) * 2020-06-02 2021-12-09 Viken Detection Corporation X-ray imaging apparatus and method
CN113075241A (zh) * 2021-04-01 2021-07-06 中国原子能科学研究院 中子成像和x射线成像系统、方法以及装置

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USRE28544E (en) * 1971-07-07 1975-09-02 Radiant energy imaging with scanning pencil beam
JPH0512424A (ja) * 1991-07-05 1993-01-22 Toshiba Corp 散乱線断層画像撮影装置
US5493596A (en) * 1993-11-03 1996-02-20 Annis; Martin High-energy X-ray inspection system
US6269142B1 (en) * 1999-08-11 2001-07-31 Steven W. Smith Interrupted-fan-beam imaging
US6272206B1 (en) * 1999-11-03 2001-08-07 Perkinelmer Detection Systems, Inc. Rotatable cylinder dual beam modulator
US7103137B2 (en) * 2002-07-24 2006-09-05 Varian Medical Systems Technology, Inc. Radiation scanning of objects for contraband
CN101576513B (zh) * 2008-05-09 2011-12-21 清华大学 利用前向散射辐射检查物体的方法及其设备
US10393915B2 (en) * 2010-02-25 2019-08-27 Rapiscan Systems, Inc. Integrated primary and special nuclear material alarm resolution
JP6277186B2 (ja) * 2012-07-05 2018-02-07 アメリカン サイエンス アンド エンジニアリング, インコーポレイテッドAmerican Science and Engineering, Inc. 放射線ビーム生成システムおよび放射線ビーム照射方法
US9935375B2 (en) * 2013-12-10 2018-04-03 Elwha Llc Surface scattering reflector antenna
CN103808739B (zh) * 2014-01-20 2016-06-22 北京睿思厚德辐射信息科技有限公司 一种透射成像和背散射成像一体化的安全检查装置
US9711852B2 (en) * 2014-06-20 2017-07-18 The Invention Science Fund I Llc Modulation patterns for surface scattering antennas
CN103997839B (zh) * 2014-06-06 2018-03-30 同方威视技术股份有限公司 一种准直可调制的x射线发生器
US9700738B2 (en) * 2014-06-17 2017-07-11 Intuitive Therapeutics Sa System and computer program product for radiation inverse treatment planning
US10441230B2 (en) 2014-07-15 2019-10-15 Koninklijke Philips N.V. Projection data acquisition apparatus
US20160030769A1 (en) 2014-08-01 2016-02-04 Phenix Medical Llc Method and device for fast raster beam scanning in intensity-modulated ion beam therapy
US20160228728A1 (en) * 2015-02-11 2016-08-11 Viewray Incorporated Planning and control for magnetic resonance guided radiation therapy
US10151716B2 (en) * 2015-08-06 2018-12-11 Georgetown Rail Equipment Company System and method for internal inspection of rail components
CN106841249A (zh) * 2017-04-12 2017-06-13 北京君和信达科技有限公司 透射式辐射成像系统
CN207816856U (zh) * 2017-12-26 2018-09-04 清华大学 辐射检查系统

Also Published As

Publication number Publication date
EP3505975B1 (en) 2021-01-20
US20200025968A1 (en) 2020-01-23
EP3505975A1 (en) 2019-07-03
WO2019128697A1 (zh) 2019-07-04
CN107966460A (zh) 2018-04-27
US10739491B2 (en) 2020-08-11
CN107966460B (zh) 2024-05-10

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