GB2570377B - Defect inspection method and defect inspection system - Google Patents

Defect inspection method and defect inspection system Download PDF

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Publication number
GB2570377B
GB2570377B GB1818898.7A GB201818898A GB2570377B GB 2570377 B GB2570377 B GB 2570377B GB 201818898 A GB201818898 A GB 201818898A GB 2570377 B GB2570377 B GB 2570377B
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GB
United Kingdom
Prior art keywords
defect inspection
inspection system
inspection method
defect
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
GB1818898.7A
Other versions
GB201818898D0 (en
GB2570377A (en
Inventor
Konishi Takaaki
Kobayashi Ryousuke
Naganuma Junichiro
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi GE Nuclear Energy Ltd
Original Assignee
Hitachi GE Nuclear Energy Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi GE Nuclear Energy Ltd filed Critical Hitachi GE Nuclear Energy Ltd
Publication of GB201818898D0 publication Critical patent/GB201818898D0/en
Publication of GB2570377A publication Critical patent/GB2570377A/en
Application granted granted Critical
Publication of GB2570377B publication Critical patent/GB2570377B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/08—Testing mechanical properties
    • G01M11/081—Testing mechanical properties by using a contact-less detection method, i.e. with a camera
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M5/00—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings
    • G01M5/0091—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings by using electromagnetic excitation or detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M5/00—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings
    • G01M5/0033—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings by determining damage, crack or wear
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M5/00—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings
    • G01M5/0075—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings by means of external apparatus, e.g. test benches or portable test systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8809—Adjustment for highlighting flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E30/00—Energy generation of nuclear origin
    • Y02E30/30—Nuclear fission reactors
GB1818898.7A 2017-12-28 2018-11-20 Defect inspection method and defect inspection system Active GB2570377B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2017252743A JP7178171B2 (en) 2017-12-28 2017-12-28 Defect inspection method and defect inspection system

Publications (3)

Publication Number Publication Date
GB201818898D0 GB201818898D0 (en) 2019-01-02
GB2570377A GB2570377A (en) 2019-07-24
GB2570377B true GB2570377B (en) 2020-07-01

Family

ID=64740027

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1818898.7A Active GB2570377B (en) 2017-12-28 2018-11-20 Defect inspection method and defect inspection system

Country Status (2)

Country Link
JP (1) JP7178171B2 (en)
GB (1) GB2570377B (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112378924A (en) * 2020-09-24 2021-02-19 宁波市鄞州世纪耀达市政建设有限公司 Pipeline crack positioning method and system, storage medium and intelligent terminal
CN114324387A (en) * 2021-12-14 2022-04-12 北京玖瑞科技有限公司 Plate defect detection device and method
CN114511557B (en) * 2022-04-02 2022-09-13 深圳市君合环保水务科技有限公司 Image processing-based underdrain structure defect detection method

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103383361A (en) * 2013-08-02 2013-11-06 湖州职业技术学院 Steel wire core conveyer belt detection device and method
EP3176537A1 (en) * 2015-12-01 2017-06-07 General Electric Company System for automated in-process inspection of welds
WO2018006180A1 (en) * 2016-07-08 2018-01-11 Ats Automation Tooling Systems Inc. System and method for combined automatic and manual inspection
KR20180133040A (en) * 2017-06-05 2018-12-13 충북대학교 산학협력단 Apparatus and method for classifying defect

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07103905A (en) * 1993-10-07 1995-04-21 Toyo Commun Equip Co Ltd Flaw inspecting equipment
JP2005062037A (en) * 2003-08-15 2005-03-10 Fuji Photo Film Co Ltd Method for detecting flaw of ink jet recording paper and flaw detector therefor
JP2006208347A (en) * 2004-02-25 2006-08-10 Jfe Steel Kk Surface defect detector, grinding device, surface defect detection method and surface defect detection program for reduction roll, and reduction roll grinding method
JP2006058170A (en) * 2004-08-20 2006-03-02 Dainippon Screen Mfg Co Ltd Visual confirmation device and inspection system
JP2008076218A (en) * 2006-09-21 2008-04-03 Olympus Corp Visual inspection apparatus
KR100826153B1 (en) * 2006-11-29 2008-04-30 한국표준과학연구원 Width measurement method of the crack by using the depth value in histogram of image
JP5351673B2 (en) * 2009-09-09 2013-11-27 パナソニック株式会社 Appearance inspection device, appearance inspection method
JP5696221B2 (en) * 2011-09-15 2015-04-08 日立Ｇｅニュークリア・エナジー株式会社 Underwater inspection device
JP6099479B2 (en) * 2013-05-21 2017-03-22 大成建設株式会社 Crack detection method

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103383361A (en) * 2013-08-02 2013-11-06 湖州职业技术学院 Steel wire core conveyer belt detection device and method
EP3176537A1 (en) * 2015-12-01 2017-06-07 General Electric Company System for automated in-process inspection of welds
WO2018006180A1 (en) * 2016-07-08 2018-01-11 Ats Automation Tooling Systems Inc. System and method for combined automatic and manual inspection
KR20180133040A (en) * 2017-06-05 2018-12-13 충북대학교 산학협력단 Apparatus and method for classifying defect

Also Published As

Publication number Publication date
GB201818898D0 (en) 2019-01-02
JP2019120491A (en) 2019-07-22
GB2570377A (en) 2019-07-24
JP7178171B2 (en) 2022-11-25

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