PL3242126T3 - Sposób i system obrazowania promieniowaniem podwójnej energii - Google Patents

Sposób i system obrazowania promieniowaniem podwójnej energii

Info

Publication number
PL3242126T3
PL3242126T3 PL15875158T PL15875158T PL3242126T3 PL 3242126 T3 PL3242126 T3 PL 3242126T3 PL 15875158 T PL15875158 T PL 15875158T PL 15875158 T PL15875158 T PL 15875158T PL 3242126 T3 PL3242126 T3 PL 3242126T3
Authority
PL
Poland
Prior art keywords
imaging method
dual energy
energy imaging
dual
imaging
Prior art date
Application number
PL15875158T
Other languages
English (en)
Inventor
Liang Li
Zhiqiang Chen
Kejun Kang
Li Zhang
Ziran Zhao
Yuxiang Xing
Yongshun Xiao
Jianping Gu
Juan Zheng
Original Assignee
Tsinghua University
Nuctech Company Limited
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tsinghua University, Nuctech Company Limited filed Critical Tsinghua University
Publication of PL3242126T3 publication Critical patent/PL3242126T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T12/00—Tomographic reconstruction from projections
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T12/00—Tomographic reconstruction from projections
    • G06T12/30—Image post-processing, e.g. metal artefact correction
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10072—Tomographic images
    • G06T2207/10081—Computed x-ray tomography [CT]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30112—Baggage; Luggage; Suitcase
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2211/00—Image generation
    • G06T2211/40—Computed tomography
    • G06T2211/408—Dual energy

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
PL15875158T 2014-12-30 2015-12-23 Sposób i system obrazowania promieniowaniem podwójnej energii PL3242126T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
CN201410842363.XA CN105806856B (zh) 2014-12-30 2014-12-30 双能射线成像方法和系统
EP15875158.6A EP3242126B1 (en) 2014-12-30 2015-12-23 Dual-energy ray imaging method and system
PCT/CN2015/098470 WO2016107480A1 (zh) 2014-12-30 2015-12-23 双能射线成像方法和系统

Publications (1)

Publication Number Publication Date
PL3242126T3 true PL3242126T3 (pl) 2022-06-27

Family

ID=56284255

Family Applications (1)

Application Number Title Priority Date Filing Date
PL15875158T PL3242126T3 (pl) 2014-12-30 2015-12-23 Sposób i system obrazowania promieniowaniem podwójnej energii

Country Status (6)

Country Link
US (1) US10339673B2 (pl)
EP (1) EP3242126B1 (pl)
CN (1) CN105806856B (pl)
MY (1) MY186391A (pl)
PL (1) PL3242126T3 (pl)
WO (1) WO2016107480A1 (pl)

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CN107595311A (zh) * 2017-08-30 2018-01-19 沈阳东软医疗系统有限公司 双能量ct图像处理方法、装置以及设备
US10795047B2 (en) * 2018-01-09 2020-10-06 Voti Inc. Methods for removing a background object from an image
CN108720858A (zh) * 2018-05-24 2018-11-02 东南大学 一种使用高次曲面拟合的新型骨密度计算方法及装置
CN109064447A (zh) * 2018-06-29 2018-12-21 沈阳东软医疗系统有限公司 骨密度展示方法、装置及设备
CN109100775B (zh) * 2018-07-06 2020-05-29 郑州云海信息技术有限公司 一种双层探测器的能量谱校正方法与装置
CN109297996A (zh) * 2018-10-12 2019-02-01 西南大学 一种利用γ射线测量复合材料成分比例的方法
US11977037B2 (en) 2018-10-22 2024-05-07 Rapiscan Holdings, Inc. Insert for screening tray
CN109471185B (zh) * 2018-12-17 2024-09-27 同方威视技术股份有限公司 Ct系统和用于ct系统的探测装置
WO2021051191A1 (en) 2019-09-16 2021-03-25 Voti Inc. Probabilistic image analysis
FR3106409B1 (fr) * 2020-01-16 2022-04-22 Commissariat Energie Atomique Procédé d'établissement d'une fonction de réponse spectrale d'un système de mesure par rayon X ou gamma
US11564645B2 (en) * 2020-02-25 2023-01-31 GE Precision Healthcare LLC Methods and systems for digital mammography imaging
CN111239793B (zh) * 2020-03-04 2024-08-06 北京镧宇科技有限公司 一种气体、固体混合探测装置及系统
CN111489406B (zh) * 2020-03-26 2023-11-14 深圳先进技术研究院 生成高能ct图像模型的训练及生成方法、设备、存储介质
CN113491526B (zh) * 2020-04-07 2023-12-05 辽宁开普医疗系统有限公司 一种基于dr系统的骨密度校正和测量的方法
CN112666194B (zh) * 2020-12-22 2022-12-20 上海培云教育科技有限公司 一种虚拟数字dr图像的生成方法及dr虚拟仿真仪器
CN112950877B (zh) * 2021-02-18 2021-10-15 黑龙江省机场管理集团有限公司 行李安检x光机防入侵系统
TWI776443B (zh) * 2021-03-26 2022-09-01 行政院原子能委員會核能研究所 用於雙能量x光成像系統之有效原子序計算方法
US11885752B2 (en) 2021-06-30 2024-01-30 Rapiscan Holdings, Inc. Calibration method and device therefor
US12019035B2 (en) 2021-07-16 2024-06-25 Rapiscan Holdings, Inc. Material detection in x-ray security screening
CN115105107A (zh) * 2022-06-20 2022-09-27 北京朗视仪器股份有限公司 一种能谱成像方法及能谱成像系统
CN115482307A (zh) * 2022-09-02 2022-12-16 首都师范大学 一种基于二次曲面模型的双能谱ct基材料分解方法和装置
JP7254237B1 (ja) 2022-11-15 2023-04-07 株式会社日立パワーソリューションズ Ｘ線装置及びｘ線を用いた材質分類方法
CN116206176A (zh) * 2023-03-02 2023-06-02 上海影探科技有限公司 双能x射线图像危险品智能识别数据集的生成方法和装置
CN115993102B (zh) * 2023-03-24 2023-09-29 杭州宇称电子技术有限公司 基于单光子探测器的重叠物厚度检测方法、装置及其应用
CN117705842B (zh) * 2023-12-11 2024-07-23 北京工业职业技术学院 一种在线煤灰分仪及检测方法
CN118247586B (zh) * 2024-05-28 2024-11-22 杭州睿影科技有限公司 一种材料识别方法、装置、存储介质和电子设备
CN120890848B (zh) * 2025-09-30 2026-01-30 深圳市曼恩斯特科技股份有限公司 锂电涂布极片面密度测量方法、系统及涂布检测设备

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DE19812055C2 (de) * 1998-03-19 2002-08-08 Heimann Systems Gmbh & Co Bildverarbeitung zur Materialerkennung mittels Röntgenstrahlungen
CN101266216A (zh) * 2007-03-14 2008-09-17 清华大学 标定双能ct系统的方法和图像重建方法
JP5124227B2 (ja) * 2007-10-01 2013-01-23 浜松ホトニクス株式会社 放射線検出器
CN101435783B (zh) * 2007-11-15 2011-01-26 同方威视技术股份有限公司 物质识别方法和设备
US8218837B2 (en) * 2008-06-06 2012-07-10 General Electric Company Material composition detection from effective atomic number computation
EP2298040A4 (en) * 2008-06-13 2013-10-09 L 3 Comm Security & Detection INVESTIGATION OF A REGION USING DOUBLE-EFFICIENCY RADIATION
CN101647706B (zh) * 2008-08-13 2012-05-30 清华大学 高能双能ct系统的图象重建方法
JP5297142B2 (ja) 2008-10-09 2013-09-25 アンリツ産機システム株式会社 異物検出方法および装置
US7970096B2 (en) * 2009-01-07 2011-06-28 Analogic Corporation Method of and system for low cost implementation of dual energy CT imaging
CN101900695B (zh) * 2009-05-27 2011-11-23 清华大学 伪双能欠采样物质识别系统和方法

Also Published As

Publication number Publication date
EP3242126A1 (en) 2017-11-08
US20170309043A1 (en) 2017-10-26
US10339673B2 (en) 2019-07-02
MY186391A (en) 2021-07-22
CN105806856A (zh) 2016-07-27
CN105806856B (zh) 2019-02-19
EP3242126A4 (en) 2018-11-07
EP3242126B1 (en) 2022-01-26
WO2016107480A1 (zh) 2016-07-07

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