NO20050075L - Mikroelektronikkrengjoring og antireflektive beleggfjernersammensetninger - Google Patents
Mikroelektronikkrengjoring og antireflektive beleggfjernersammensetningerInfo
- Publication number
- NO20050075L NO20050075L NO20050075A NO20050075A NO20050075L NO 20050075 L NO20050075 L NO 20050075L NO 20050075 A NO20050075 A NO 20050075A NO 20050075 A NO20050075 A NO 20050075A NO 20050075 L NO20050075 L NO 20050075L
- Authority
- NO
- Norway
- Prior art keywords
- reflective coating
- cleaning
- coating remover
- remover compositions
- microelectronics
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/30—Imagewise removal using liquid means
- G03F7/32—Liquid compositions therefor, e.g. developers
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23G—CLEANING OR DE-GREASING OF METALLIC MATERIAL BY CHEMICAL METHODS OTHER THAN ELECTROLYSIS
- C23G1/00—Cleaning or pickling metallic material with solutions or molten salts
- C23G1/02—Cleaning or pickling metallic material with solutions or molten salts with acid solutions
- C23G1/04—Cleaning or pickling metallic material with solutions or molten salts with acid solutions using inhibitors
- C23G1/06—Cleaning or pickling metallic material with solutions or molten salts with acid solutions using inhibitors organic inhibitors
- C23G1/061—Cleaning or pickling metallic material with solutions or molten salts with acid solutions using inhibitors organic inhibitors nitrogen-containing compounds
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/42—Stripping or agents therefor
- G03F7/422—Stripping or agents therefor using liquids only
- G03F7/425—Stripping or agents therefor using liquids only containing mineral alkaline compounds; containing organic basic compounds, e.g. quaternary ammonium compounds; containing heterocyclic basic compounds containing nitrogen
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/26—Cleaning or polishing of the conductive pattern
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D2111/00—Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
- C11D2111/10—Objects to be cleaned
- C11D2111/14—Hard surfaces
- C11D2111/22—Electronic devices, e.g. PCBs or semiconductors
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/07—Treatments involving liquids, e.g. plating, rinsing
- H05K2203/0779—Treatments involving liquids, e.g. plating, rinsing characterised by the specific liquids involved
- H05K2203/0783—Using solvent, e.g. for cleaning; Regulating solvent content of pastes or coatings for adjusting the viscosity
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/12—Using specific substances
- H05K2203/121—Metallo-organic compounds
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/12—Using specific substances
- H05K2203/122—Organic non-polymeric compounds, e.g. oil, wax or thiol
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Metallurgy (AREA)
- Mechanical Engineering (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Detergent Compositions (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US38680002P | 2002-06-07 | 2002-06-07 | |
| US40168802P | 2002-08-07 | 2002-08-07 | |
| PCT/US2003/016829 WO2003104901A2 (en) | 2002-06-07 | 2003-05-27 | Microelectronic cleaning and arc remover compositions |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NO20050075L true NO20050075L (no) | 2005-01-06 |
Family
ID=29739917
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NO20050075A NO20050075L (no) | 2002-06-07 | 2005-01-06 | Mikroelektronikkrengjoring og antireflektive beleggfjernersammensetninger |
Country Status (17)
| Country | Link |
|---|---|
| US (1) | US8906838B2 (show.php) |
| EP (1) | EP1512050A2 (show.php) |
| JP (1) | JP4330529B2 (show.php) |
| KR (1) | KR100958068B1 (show.php) |
| CN (2) | CN1659480A (show.php) |
| AU (1) | AU2003240827A1 (show.php) |
| BR (1) | BR0311830A (show.php) |
| CA (1) | CA2488737A1 (show.php) |
| IL (1) | IL165581A (show.php) |
| IN (2) | IN2004CH02744A (show.php) |
| MY (1) | MY142745A (show.php) |
| NO (1) | NO20050075L (show.php) |
| PL (1) | PL207297B1 (show.php) |
| RS (1) | RS106104A (show.php) |
| TW (1) | TWI330766B (show.php) |
| WO (1) | WO2003104901A2 (show.php) |
| ZA (1) | ZA200409622B (show.php) |
Families Citing this family (39)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7208049B2 (en) * | 2003-10-20 | 2007-04-24 | Air Products And Chemicals, Inc. | Process solutions containing surfactants used as post-chemical mechanical planarization treatment |
| US7521406B2 (en) * | 2004-02-11 | 2009-04-21 | Mallinckrodt Baker, Inc | Microelectronic cleaning composition containing halogen oxygen acids, salts and derivatives thereof |
| US8338087B2 (en) * | 2004-03-03 | 2012-12-25 | Advanced Technology Materials, Inc | Composition and process for post-etch removal of photoresist and/or sacrificial anti-reflective material deposited on a substrate |
| US7867779B2 (en) | 2005-02-03 | 2011-01-11 | Air Products And Chemicals, Inc. | System and method comprising same for measurement and/or analysis of particles in gas stream |
| US7923424B2 (en) * | 2005-02-14 | 2011-04-12 | Advanced Process Technologies, Llc | Semiconductor cleaning using superacids |
| US8044009B2 (en) * | 2005-04-04 | 2011-10-25 | Avantor Performance Materials, Inc. | Compositions for cleaning ion implanted photoresist in front end of line applications |
| EP1891482B1 (en) | 2005-06-07 | 2014-04-30 | Advanced Technology Materials, Inc. | Metal and dielectric compatible sacrificial anti-reflective coating cleaning and removal composition |
| KR101152139B1 (ko) | 2005-12-06 | 2012-06-15 | 삼성전자주식회사 | 표시 장치용 세정제 및 이를 사용하는 박막 트랜지스터표시판의 제조 방법 |
| WO2007072727A1 (ja) * | 2005-12-20 | 2007-06-28 | Mitsubishi Gas Chemical Company, Inc. | 配線基板の残渣除去用組成物および洗浄方法 |
| US20080149884A1 (en) * | 2006-12-21 | 2008-06-26 | Junaid Ahmed Siddiqui | Method and slurry for tuning low-k versus copper removal rates during chemical mechanical polishing |
| US20100163788A1 (en) * | 2006-12-21 | 2010-07-01 | Advanced Technology Materials, Inc. | Liquid cleaner for the removal of post-etch residues |
| US8110508B2 (en) * | 2007-11-22 | 2012-02-07 | Samsung Electronics Co., Ltd. | Method of forming a bump structure using an etching composition for an under bump metallurgy layer |
| CN101487993A (zh) * | 2008-01-18 | 2009-07-22 | 安集微电子(上海)有限公司 | 一种厚膜光刻胶清洗剂 |
| CA2716641A1 (en) * | 2008-02-29 | 2009-09-03 | Mallinckrodt Baker, Inc. | Microelectronic substrate cleaning compositions |
| JP2009231354A (ja) * | 2008-03-19 | 2009-10-08 | Fujifilm Corp | 半導体デバイス用洗浄液、および洗浄方法 |
| CN101359189B (zh) * | 2008-09-17 | 2011-04-27 | 电子科技大学 | 正性光敏聚酰亚胺光刻胶用显影液 |
| KR20110105396A (ko) * | 2009-01-14 | 2011-09-26 | 아반토르 퍼포먼스 머티리얼스 베.파우. | 웨이퍼 표면 저항 및/또는 광전지 전력 밀도 수준을 증가시키기 위한 용액 |
| BRPI1008034A2 (pt) * | 2009-02-25 | 2016-03-15 | Avantor Performance Mat Inc | composições removedoras para limpeza de fotorresistor implantado por íons de discos de silício de dispositivos semicondutores |
| SG173834A1 (en) * | 2009-02-25 | 2011-09-29 | Avantor Performance Mat Inc | Multipurpose acidic, organic solvent based microelectronic cleaning composition |
| US8754021B2 (en) | 2009-02-27 | 2014-06-17 | Advanced Technology Materials, Inc. | Non-amine post-CMP composition and method of use |
| CN101901784B (zh) * | 2010-07-21 | 2012-05-30 | 河北工业大学 | 钽化学机械抛光工序中的表面清洗方法 |
| CN101901782B (zh) * | 2010-07-21 | 2011-12-14 | 河北工业大学 | 极大规模集成电路多层布线碱性抛光后防氧化方法 |
| CN103958640B (zh) * | 2011-10-21 | 2016-05-18 | 安格斯公司 | 无胺cmp后组合物及其使用方法 |
| CN103809394B (zh) * | 2012-11-12 | 2019-12-31 | 安集微电子科技(上海)股份有限公司 | 一种去除光阻蚀刻残留物的清洗液 |
| US9460934B2 (en) | 2013-03-15 | 2016-10-04 | Globalfoundries Inc. | Wet strip process for an antireflective coating layer |
| US9834746B2 (en) | 2013-10-21 | 2017-12-05 | Fujifilm Electronic Materials U.S.A., Inc. | Cleaning formulations for removing residues on surfaces |
| JP2015108041A (ja) * | 2013-12-03 | 2015-06-11 | ダイキン工業株式会社 | 洗浄用組成物 |
| EP3104398B1 (en) | 2013-12-06 | 2020-03-11 | Fujifilm Electronic Materials USA, Inc. | Cleaning formulation and method for removing residues on surfaces |
| US9803162B2 (en) | 2014-04-10 | 2017-10-31 | Mitsubishi Gas Chemical Company, Inc. | Liquid composition for cleaning semiconductor device, and method for cleaning semiconductor device |
| US9570285B2 (en) * | 2015-04-17 | 2017-02-14 | Taiwan Semiconductor Manufacturing Company, Ltd. | Cleaning composition and methods thereof |
| TWI705132B (zh) | 2015-10-08 | 2020-09-21 | 日商三菱瓦斯化學股份有限公司 | 半導體元件之洗淨用液體組成物、半導體元件之洗淨方法及半導體元件之製造方法 |
| TWI816635B (zh) | 2015-10-15 | 2023-10-01 | 日商三菱瓦斯化學股份有限公司 | 半導體元件之洗淨用液體組成物、半導體元件之洗淨方法及半導體元件之製造方法 |
| TWI796289B (zh) | 2016-03-09 | 2023-03-21 | 美商恩特葛瑞斯股份有限公司 | 化學機械研磨後清洗組合物及清洗方法 |
| CN107313055A (zh) * | 2017-07-19 | 2017-11-03 | 马爱连 | 一种金属油污清洗剂及其制备方法和使用方法 |
| KR102333896B1 (ko) * | 2018-03-26 | 2021-12-02 | 미쯔비시 가스 케미칼 컴파니, 인코포레이티드 | 에칭액 |
| IL277275B2 (en) | 2018-03-28 | 2023-11-01 | Fujifilm Electronic Mat Usa Inc | cleaning products |
| WO2022163350A1 (ja) * | 2021-01-29 | 2022-08-04 | 富士フイルム株式会社 | 組成物、基板の洗浄方法 |
| KR102853955B1 (ko) * | 2022-09-05 | 2025-09-03 | 재원산업 주식회사 | 과산화수소의 분해 안정성이 향상된 마스크 세정용 조성물 |
| JP2024060243A (ja) * | 2022-10-19 | 2024-05-02 | Jsr株式会社 | 半導体処理用組成物及び処理方法 |
Family Cites Families (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3673099A (en) * | 1970-10-19 | 1972-06-27 | Bell Telephone Labor Inc | Process and composition for stripping cured resins from substrates |
| US4744834A (en) * | 1986-04-30 | 1988-05-17 | Noor Haq | Photoresist stripper comprising a pyrrolidinone, a diethylene glycol ether, a polyglycol and a quaternary ammonium hydroxide |
| US5037724A (en) * | 1988-02-25 | 1991-08-06 | Hoya Corporation | Peeling solution for photo- or electron beam-sensitive resin |
| US6492311B2 (en) * | 1990-11-05 | 2002-12-10 | Ekc Technology, Inc. | Ethyenediaminetetraacetic acid or its ammonium salt semiconductor process residue removal composition and process |
| US5308745A (en) * | 1992-11-06 | 1994-05-03 | J. T. Baker Inc. | Alkaline-containing photoresist stripping compositions producing reduced metal corrosion with cross-linked or hardened resist resins |
| US5561105A (en) * | 1995-05-08 | 1996-10-01 | Ocg Microelectronic Materials, Inc. | Chelating reagent containing photoresist stripper composition |
| JPH1055993A (ja) * | 1996-08-09 | 1998-02-24 | Hitachi Ltd | 半導体素子製造用洗浄液及びそれを用いた半導体素子の製造方法 |
| JPH1116882A (ja) * | 1997-06-19 | 1999-01-22 | Toray Fine Chem Co Ltd | フォトレジスト剥離用組成物 |
| JPH1167632A (ja) * | 1997-08-18 | 1999-03-09 | Mitsubishi Gas Chem Co Inc | 半導体装置用洗浄剤 |
| JPH11323394A (ja) * | 1998-05-14 | 1999-11-26 | Texas Instr Japan Ltd | 半導体素子製造用洗浄剤及びそれを用いた半導体素子の製造方法 |
| JP3606738B2 (ja) * | 1998-06-05 | 2005-01-05 | 東京応化工業株式会社 | アッシング後の処理液およびこれを用いた処理方法 |
| JP4224652B2 (ja) * | 1999-03-08 | 2009-02-18 | 三菱瓦斯化学株式会社 | レジスト剥離液およびそれを用いたレジストの剥離方法 |
| US6531436B1 (en) * | 2000-02-25 | 2003-03-11 | Shipley Company, L.L.C. | Polymer removal |
| US6475966B1 (en) * | 2000-02-25 | 2002-11-05 | Shipley Company, L.L.C. | Plasma etching residue removal |
| MY129673A (en) * | 2000-03-20 | 2007-04-30 | Avantor Performance Mat Inc | Method and composition for removing sodium-containing material from microcircuit substrates |
| US6274296B1 (en) * | 2000-06-08 | 2001-08-14 | Shipley Company, L.L.C. | Stripper pretreatment |
| US6455479B1 (en) * | 2000-08-03 | 2002-09-24 | Shipley Company, L.L.C. | Stripping composition |
| US6599370B2 (en) | 2000-10-16 | 2003-07-29 | Mallinckrodt Inc. | Stabilized alkaline compositions for cleaning microelectronic substrates |
| US6773873B2 (en) * | 2002-03-25 | 2004-08-10 | Advanced Technology Materials, Inc. | pH buffered compositions useful for cleaning residue from semiconductor substrates |
-
2003
- 2003-05-27 CA CA002488737A patent/CA2488737A1/en not_active Abandoned
- 2003-05-27 US US10/515,372 patent/US8906838B2/en active Active
- 2003-05-27 TW TW092114287A patent/TWI330766B/zh not_active IP Right Cessation
- 2003-05-27 BR BR0311830-4A patent/BR0311830A/pt not_active IP Right Cessation
- 2003-05-27 CN CN038130262A patent/CN1659480A/zh active Pending
- 2003-05-27 EP EP03731423A patent/EP1512050A2/en not_active Withdrawn
- 2003-05-27 WO PCT/US2003/016829 patent/WO2003104901A2/en not_active Ceased
- 2003-05-27 KR KR1020047019579A patent/KR100958068B1/ko not_active Expired - Lifetime
- 2003-05-27 PL PL374021A patent/PL207297B1/pl not_active IP Right Cessation
- 2003-05-27 RS YUP-1061/04A patent/RS106104A/sr unknown
- 2003-05-27 AU AU2003240827A patent/AU2003240827A1/en not_active Abandoned
- 2003-05-27 JP JP2004511911A patent/JP4330529B2/ja not_active Expired - Fee Related
- 2003-05-27 CN CN2011100761494A patent/CN102135735A/zh active Pending
- 2003-06-06 MY MYPI20032124A patent/MY142745A/en unknown
-
2004
- 2004-11-29 ZA ZA200409622A patent/ZA200409622B/xx unknown
- 2004-12-06 IL IL165581A patent/IL165581A/en active IP Right Grant
- 2004-12-06 IN IN2744CH2004 patent/IN2004CH02744A/en unknown
- 2004-12-07 IN IN2762CH2004 patent/IN2004CH02762A/en unknown
-
2005
- 2005-01-06 NO NO20050075A patent/NO20050075L/no not_active Application Discontinuation
Also Published As
| Publication number | Publication date |
|---|---|
| EP1512050A2 (en) | 2005-03-09 |
| US20050176602A1 (en) | 2005-08-11 |
| AU2003240827A1 (en) | 2003-12-22 |
| JP4330529B2 (ja) | 2009-09-16 |
| IN2004CH02762A (show.php) | 2006-02-10 |
| KR20050012770A (ko) | 2005-02-02 |
| CN102135735A (zh) | 2011-07-27 |
| KR100958068B1 (ko) | 2010-05-14 |
| TWI330766B (en) | 2010-09-21 |
| CN1659480A (zh) | 2005-08-24 |
| AU2003240827A8 (en) | 2003-12-22 |
| US8906838B2 (en) | 2014-12-09 |
| IL165581A0 (en) | 2006-01-15 |
| MY142745A (en) | 2010-12-31 |
| BR0311830A (pt) | 2005-03-29 |
| IL165581A (en) | 2009-06-15 |
| JP2005529363A (ja) | 2005-09-29 |
| CA2488737A1 (en) | 2003-12-18 |
| ZA200409622B (en) | 2006-05-31 |
| PL374021A1 (en) | 2005-09-19 |
| IN2004CH02744A (show.php) | 2006-02-10 |
| TW200401958A (en) | 2004-02-01 |
| PL207297B1 (pl) | 2010-11-30 |
| WO2003104901A3 (en) | 2004-03-18 |
| WO2003104901A2 (en) | 2003-12-18 |
| RS106104A (sr) | 2007-04-10 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| NO20050075L (no) | Mikroelektronikkrengjoring og antireflektive beleggfjernersammensetninger | |
| NO20050076L (no) | Mikroelektronikk-rengjoringssammensetninger som inneholder oksidasjonsmidler og organiske losemidler | |
| TW200639595A (en) | Fluoride liquid cleaners with polar and non-polar solvent mixtures for cleaning low-k-containing microelectronic devices | |
| MY130394A (en) | Aqueous stripping and cleaning composition | |
| MY127401A (en) | Low surface tension, low viscosity, aqueous, acidic compositions containing fluoride and organic, polar solvents for removal of photoresist and organic and inorganic etch residues at room temperature | |
| NO20033424L (no) | 3,4-disubstituerte syklobuten-1,2-dioner som CXC- kjemokinreseptorantagonister | |
| TW200702427A (en) | Etchant, method for fabricating interconnection line using the etchant, and method for fabricating thin film transistor substrate using the etchant | |
| TW200730621A (en) | Oxidizing aqueous cleaner for the removal of post-etch residues | |
| MY143399A (en) | Microelectronic cleaning compositons containing ammonia-free fluoride salts for selective photoresist stripping and plasma ash residue cleaning | |
| SG164385A1 (en) | Composition useful for removal of post-etch photoresist and bottom anti- reflection coatings | |
| WO2002018503A3 (en) | Paint stripping compositions | |
| WO2002018502A3 (en) | Paint remover and degreasing compositions | |
| NO20034260D0 (no) | Sammensetninger som inneholder en buffer og et peroksid eller en persyre, som er nyttig for å behandle brönner | |
| NO20051689D0 (no) | Substituerte piperaziner, (1,4) diaszepiner og 2,5-diazabicyklo(2.2.1) heptaner som histamin H1 og/eller H3 antagonister eller histamin H3 revers antagonister | |
| DE60015190D1 (de) | Fluorierte lösungsmittel enthaltend ozon | |
| NO20070835L (no) | Vannfrie, mikroelektroniske rensesammensetninger inneholdende fruktose | |
| ATE512521T1 (de) | Abschätzung der verfügbaren bandbreite | |
| ATE535075T1 (de) | Drahtlose knotenvorrichtung und drahtloses mehrstrom-lan-system | |
| ATE295669T1 (de) | Verfahren zum automatischen aufbau eines betriebs-und wartungskanals für eine basisstation in internationalen mobilekommunikationsnetzwerken | |
| BRPI0419056A (pt) | método de gerenciamento de comutação de um ponto de terminação de túnel rede privada virtual de um primeiro endereço para um segundo endereço, e, gerenciador de comutação de ponto de terminação de túnel de rede privada virtual | |
| MY143658A (en) | Non-aqueous, non-corrosive microelectronic cleaning compositions containing polymeric corrosion inhibitors | |
| EP1701217A3 (en) | Composition for photoresist stripping solution and process of photoresist stripping | |
| NO20034527D0 (no) | 3,7-diazabicyklo(3,3,1) formuleringer som antiarytmiforbindelser | |
| NO20040067L (no) | Ammoniakkfrei alkaliske mikroelektroniske rengjoringssammensetninger med forbedret substratkompatibilitet | |
| DE602006001544D1 (de) | Filtern von Paketen |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FC2A | Withdrawal, rejection or dismissal of laid open patent application |