NO20002268L - Integrert krets med flaggregister til bruk i seleksjon av permanente celler i volumoperasjoner - Google Patents

Integrert krets med flaggregister til bruk i seleksjon av permanente celler i volumoperasjoner

Info

Publication number
NO20002268L
NO20002268L NO20002268A NO20002268A NO20002268L NO 20002268 L NO20002268 L NO 20002268L NO 20002268 A NO20002268 A NO 20002268A NO 20002268 A NO20002268 A NO 20002268A NO 20002268 L NO20002268 L NO 20002268L
Authority
NO
Norway
Prior art keywords
selection
integrated circuit
flag registers
volume operations
permanent cells
Prior art date
Application number
NO20002268A
Other languages
English (en)
Other versions
NO20002268D0 (no
NO317781B1 (no
Inventor
Srinivas Ramamurthy
Jinglun Tam
Geoffrey S Gongwer
Jr James Fahey
Neal Berger
William J Saiki
Original Assignee
Atmel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Atmel Corp filed Critical Atmel Corp
Publication of NO20002268D0 publication Critical patent/NO20002268D0/no
Publication of NO20002268L publication Critical patent/NO20002268L/no
Publication of NO317781B1 publication Critical patent/NO317781B1/no

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318558—Addressing or selecting of subparts of the device under test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Debugging And Monitoring (AREA)
NO20002268A 1997-11-07 2000-04-28 System for bruk i grensesnitt-testere med adresseavhengige instruksjoner NO317781B1 (no)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/965,919 US6032279A (en) 1997-11-07 1997-11-07 Boundary scan system with address dependent instructions
PCT/US1998/023420 WO1999024841A1 (en) 1997-11-07 1998-11-03 Boundary scan system with address dependent instructions

Publications (3)

Publication Number Publication Date
NO20002268D0 NO20002268D0 (no) 2000-04-28
NO20002268L true NO20002268L (no) 2000-07-06
NO317781B1 NO317781B1 (no) 2004-12-13

Family

ID=25510676

Family Applications (1)

Application Number Title Priority Date Filing Date
NO20002268A NO317781B1 (no) 1997-11-07 2000-04-28 System for bruk i grensesnitt-testere med adresseavhengige instruksjoner

Country Status (12)

Country Link
US (1) US6032279A (no)
EP (1) EP1036338B1 (no)
JP (1) JP2001523005A (no)
KR (1) KR20010040269A (no)
CN (1) CN1176383C (no)
CA (1) CA2309144A1 (no)
DE (1) DE69827159T2 (no)
HK (1) HK1030810A1 (no)
MY (1) MY114077A (no)
NO (1) NO317781B1 (no)
TW (1) TW411393B (no)
WO (1) WO1999024841A1 (no)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7590910B2 (en) * 1998-03-27 2009-09-15 Texas Instruments Incorporated Tap and linking module for scan access of multiple cores with IEEE 1149.1 test access ports
US6408413B1 (en) * 1998-02-18 2002-06-18 Texas Instruments Incorporated Hierarchical access of test access ports in embedded core integrated circuits
US6694467B2 (en) * 1999-06-24 2004-02-17 Texas Instruments Incorporated Low power testing of very large circuits
US6595685B2 (en) * 1998-10-13 2003-07-22 National Research Laboratory Of Metrology Method and apparatus for measuring thermophysical properties
JP4489870B2 (ja) * 1999-06-28 2010-06-23 三菱電機株式会社 内部信号観測方法
US6779145B1 (en) * 1999-10-01 2004-08-17 Stmicroelectronics Limited System and method for communicating with an integrated circuit
US6594802B1 (en) * 2000-03-23 2003-07-15 Intellitech Corporation Method and apparatus for providing optimized access to circuits for debug, programming, and test
US6651201B1 (en) * 2000-07-26 2003-11-18 International Business Machines Corporation Programmable memory built-in self-test combining microcode and finite state machine self-test
KR100399355B1 (ko) * 2001-03-12 2003-09-26 삼성전자주식회사 로컬 모니터 회로를 포함하는 반도체 집적 회로
US7065675B1 (en) * 2001-05-08 2006-06-20 Mips Technologies, Inc. System and method for speeding up EJTAG block data transfers
JP4249019B2 (ja) * 2001-09-20 2009-04-02 エヌエックスピー ビー ヴィ 電子デバイス
US7231552B2 (en) * 2002-10-24 2007-06-12 Intel Corporation Method and apparatus for independent control of devices under test connected in parallel
ATE346309T1 (de) * 2002-12-20 2006-12-15 Koninkl Philips Electronics Nv Verbindung mehrerer testzugriffsportsteuerungsvorrichtungen durch ein einzeltestzugriffsport
JP2004264057A (ja) * 2003-02-12 2004-09-24 Sharp Corp バウンダリスキャンコントローラ、半導体装置、半導体装置の半導体回路チップ識別方法、半導体装置の半導体回路チップ制御方法
CN100365584C (zh) * 2003-07-28 2008-01-30 华为技术有限公司 一种边界扫描测试的实现方法及装置
CN100427964C (zh) * 2003-08-04 2008-10-22 华为技术有限公司 一种电路板的边界扫描测试方法
CN100357751C (zh) * 2004-02-26 2007-12-26 联想(北京)有限公司 一种jtag模块及应用该模块的调试方法
WO2010096707A2 (en) * 2009-02-19 2010-08-26 Touchdown Technologies, Inc. Microelectronic contactor assembly, structures thereof, and methods of constructing same
GB2518866A (en) * 2013-10-03 2015-04-08 St Microelectronics Res & Dev Flexible interface
CN103678068B (zh) * 2013-12-23 2016-09-28 大唐微电子技术有限公司 一种环形边界扫描装置及方法
CN108693466B (zh) * 2017-04-12 2020-09-11 上海鹏武电子科技有限公司 一种边界扫描器件、装置及控制方法和扫描方法
CN108008275B (zh) * 2017-11-20 2020-05-01 上海华力微电子有限公司 一种具备故障诊断的系统级芯片生产方法
CN108845829B (zh) * 2018-07-03 2021-06-25 中国人民解放军国防科技大学 一种系统寄存器访问指令的执行方法
WO2020240223A1 (en) * 2019-05-31 2020-12-03 Micron Technology, Inc. Improved jtag registers with concurrent inputs
CN112098818B (zh) * 2020-11-02 2021-02-02 创意电子(南京)有限公司 一种基于标准边界扫描电路的sip器件测试系统

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5155732A (en) * 1990-10-09 1992-10-13 At&T Bell Laboratories Method and apparatus for data transfer to and from devices through a boundary-scan test access port
US5355369A (en) * 1991-04-26 1994-10-11 At&T Bell Laboratories High-speed integrated circuit testing with JTAG
US5237218A (en) * 1991-05-03 1993-08-17 Lattice Semiconductor Corporation Structure and method for multiplexing pins for in-system programming
US5412260A (en) * 1991-05-03 1995-05-02 Lattice Semiconductor Corporation Multiplexed control pins for in-system programming and boundary scan state machines in a high density programmable logic device
US5394403A (en) * 1992-06-12 1995-02-28 Sun Microsystems, Inc. Fully testable chip having self-timed memory arrays
US5477545A (en) * 1993-02-09 1995-12-19 Lsi Logic Corporation Method and apparatus for testing of core-cell based integrated circuits
US5459737A (en) * 1993-07-07 1995-10-17 National Semiconductor Corporation Test access port controlled built in current monitor for IC devices
US5635855A (en) * 1995-07-21 1997-06-03 Lattice Semiconductor Corporation Method for simultaneous programming of in-system programmable integrated circuits
JP3287539B2 (ja) * 1996-11-13 2002-06-04 富士通株式会社 テスト機構を有する処理システム

Also Published As

Publication number Publication date
DE69827159D1 (de) 2004-11-25
DE69827159T2 (de) 2005-11-17
NO20002268D0 (no) 2000-04-28
CN1278332A (zh) 2000-12-27
EP1036338B1 (en) 2004-10-20
WO1999024841A1 (en) 1999-05-20
CN1176383C (zh) 2004-11-17
NO317781B1 (no) 2004-12-13
CA2309144A1 (en) 1999-05-20
EP1036338A4 (en) 2003-06-18
EP1036338A1 (en) 2000-09-20
TW411393B (en) 2000-11-11
US6032279A (en) 2000-02-29
JP2001523005A (ja) 2001-11-20
KR20010040269A (ko) 2001-05-15
HK1030810A1 (en) 2001-05-18
MY114077A (en) 2002-07-31

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