NL8701716A - Aftastende optische mikroskoop. - Google Patents

Aftastende optische mikroskoop. Download PDF

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Publication number
NL8701716A
NL8701716A NL8701716A NL8701716A NL8701716A NL 8701716 A NL8701716 A NL 8701716A NL 8701716 A NL8701716 A NL 8701716A NL 8701716 A NL8701716 A NL 8701716A NL 8701716 A NL8701716 A NL 8701716A
Authority
NL
Netherlands
Prior art keywords
radiation
spot
microscope according
grid
microscope
Prior art date
Application number
NL8701716A
Other languages
English (en)
Dutch (nl)
Original Assignee
Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Nv filed Critical Philips Nv
Priority to NL8701716A priority Critical patent/NL8701716A/nl
Priority to EP88201517A priority patent/EP0300571B1/de
Priority to DE8888201517T priority patent/DE3879790T2/de
Priority to US07/219,516 priority patent/US4861982A/en
Priority to JP63177254A priority patent/JPS6437521A/ja
Publication of NL8701716A publication Critical patent/NL8701716A/nl

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
NL8701716A 1987-07-21 1987-07-21 Aftastende optische mikroskoop. NL8701716A (nl)

Priority Applications (5)

Application Number Priority Date Filing Date Title
NL8701716A NL8701716A (nl) 1987-07-21 1987-07-21 Aftastende optische mikroskoop.
EP88201517A EP0300571B1 (de) 1987-07-21 1988-07-14 Optisches Rastermikroskop
DE8888201517T DE3879790T2 (de) 1987-07-21 1988-07-14 Optisches rastermikroskop.
US07/219,516 US4861982A (en) 1987-07-21 1988-07-15 Scanning optical microscope with position detection grating
JP63177254A JPS6437521A (en) 1987-07-21 1988-07-18 Scan type optical microscope

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NL8701716A NL8701716A (nl) 1987-07-21 1987-07-21 Aftastende optische mikroskoop.
NL8701716 1987-07-21

Publications (1)

Publication Number Publication Date
NL8701716A true NL8701716A (nl) 1989-02-16

Family

ID=19850349

Family Applications (1)

Application Number Title Priority Date Filing Date
NL8701716A NL8701716A (nl) 1987-07-21 1987-07-21 Aftastende optische mikroskoop.

Country Status (5)

Country Link
US (1) US4861982A (de)
EP (1) EP0300571B1 (de)
JP (1) JPS6437521A (de)
DE (1) DE3879790T2 (de)
NL (1) NL8701716A (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106990542A (zh) * 2017-05-26 2017-07-28 四川瑞丰锻造有限公司 稳定性好的分光器

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8817672D0 (en) * 1988-07-25 1988-09-01 Sira Ltd Optical apparatus
US5057686A (en) * 1988-10-12 1991-10-15 Mitutoyo Corporation Self-stabilizing photoelectric displacement detector
JP3018687B2 (ja) * 1991-12-12 2000-03-13 松下電器産業株式会社 走査型レーザー顕微鏡
JPH06148525A (ja) * 1992-10-30 1994-05-27 Koike Seiki Kk 共焦点レーザー顕微鏡
US5594242A (en) * 1993-09-09 1997-01-14 Kabushiki Kaisha Topcon Position detecting apparatus which uses a continuously moving light spot
US5880880A (en) * 1995-01-13 1999-03-09 The General Hospital Corp. Three-dimensional scanning confocal laser microscope
US6108127A (en) * 1997-05-15 2000-08-22 3M Innovative Properties Company High resolution confocal microscope
WO1999042885A2 (de) * 1998-02-20 1999-08-26 Leica Microsystems Heidelberg Gmbh Anordnung zum kalibrieren eines laserscanmikroskops
DE19944148C2 (de) * 1999-09-15 2003-08-21 Leica Microsystems Mikroskop
US6423960B1 (en) * 1999-12-31 2002-07-23 Leica Microsystems Heidelberg Gmbh Method and system for processing scan-data from a confocal microscope
DE10160172B4 (de) * 2001-12-07 2016-06-09 Carl Zeiss Microscopy Gmbh Laserscanningmikroskop und Laserscanningmikroskopieverfahren
US7129473B2 (en) * 2003-05-16 2006-10-31 Olympus Corporation Optical image pickup apparatus for imaging living body tissue
WO2005014065A1 (en) 2003-08-06 2005-02-17 The Procter & Gamble Company Absorbant structures comprising coated water-swellable material
DE602004031849D1 (de) 2003-08-06 2011-04-28 Procter & Gamble Saugfähiger artikel mit einem beschichteten in wasser quellbaren material
MXPA06001291A (es) 2003-08-06 2006-04-11 Procter & Gamble Material recubierto que se dilata en agua.
EP1518567B1 (de) 2003-09-25 2017-06-28 The Procter & Gamble Company Absorbierende artikel mit flüssigkeitsaufnahmezone und darin beschichteten superabsorbierenden partikeln
ATE487500T1 (de) * 2005-02-04 2010-11-15 Procter & Gamble Absorbierende struktur mit verbessertem wasserabsorbierendem material
EP1846047B1 (de) * 2005-02-04 2010-07-14 Basf Se Verfahren zur herstellung eines wasserabsorbierenden materials mit einem überzug aus elastischen filmbildenden polymeren
EP1846050A2 (de) * 2005-02-04 2007-10-24 Basf Aktiengesellschaft Verfahren zur herstellung eines wasserabsorbierenden materials mit einer beschichtung aus elastischen, folienbildenden polymeren
US20080161499A1 (en) * 2005-02-04 2008-07-03 Basf Aktiengesellschaft Water Swellable Material
JP2008538121A (ja) * 2005-02-04 2008-10-09 ビーエーエスエフ ソシエタス・ヨーロピア 弾性膜形成ポリマーのコーティングを有する水吸収材料
JP4877634B2 (ja) * 2008-10-09 2012-02-15 修 永井 ナースコールクリップ
US9519224B2 (en) * 2011-10-20 2016-12-13 Asml Netherlands B.V. Lithographic apparatus and method
JP5896797B2 (ja) * 2012-03-16 2016-03-30 オリンパス株式会社 ピクセルクロック発生装置
EP3538941A4 (de) 2016-11-10 2020-06-17 The Trustees of Columbia University in the City of New York Schnelles hochauflösendes bildgebungsverfahren für grosse proben

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3849004A (en) * 1973-10-11 1974-11-19 Geisco Ass Photo-detector for optical inspection system
US4037941A (en) * 1975-06-30 1977-07-26 International Business Machines Corporation Inspection tool
US4152588A (en) * 1977-10-28 1979-05-01 Hughes Aircraft Company Infrared scanning and display system having a noncontacting angle encoder
JPS5850333U (ja) * 1981-09-30 1983-04-05 スズキ株式会社 車輛用油圧式クツシヨン装置
JPS6197619A (ja) * 1984-10-19 1986-05-16 Fuji Photo Film Co Ltd 光学式リニアエンコ−ダ
US4643569A (en) * 1985-06-18 1987-02-17 Lincoln Laser Company Dual beam laser inspection apparatus
DE3531129A1 (de) * 1985-08-30 1987-03-12 Siemens Ag Verfahren und anordnung zum betrieb eines rastermikroskopes
US4775788A (en) * 1986-10-03 1988-10-04 Greyhawk Systems, Inc. Apparatus for detecting position of a rotating element using a two-grating moire pattern

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106990542A (zh) * 2017-05-26 2017-07-28 四川瑞丰锻造有限公司 稳定性好的分光器
CN106990542B (zh) * 2017-05-26 2023-07-04 四川瑞丰锻造有限公司 稳定性好的分光器

Also Published As

Publication number Publication date
EP0300571A1 (de) 1989-01-25
US4861982A (en) 1989-08-29
DE3879790D1 (de) 1993-05-06
DE3879790T2 (de) 1993-09-23
EP0300571B1 (de) 1993-03-31
JPS6437521A (en) 1989-02-08

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