DE3879790D1 - Optisches rastermikroskop. - Google Patents

Optisches rastermikroskop.

Info

Publication number
DE3879790D1
DE3879790D1 DE8888201517T DE3879790T DE3879790D1 DE 3879790 D1 DE3879790 D1 DE 3879790D1 DE 8888201517 T DE8888201517 T DE 8888201517T DE 3879790 T DE3879790 T DE 3879790T DE 3879790 D1 DE3879790 D1 DE 3879790D1
Authority
DE
Germany
Prior art keywords
optical grid
grid microscope
microscope
optical
grid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8888201517T
Other languages
English (en)
Other versions
DE3879790T2 (de
Inventor
Albert Smid
Antonius Hermanus Ma Akkermans
Jozef Petrus Henricus Benschop
Cornelis Jozef Petr Rooyackers
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Application granted granted Critical
Publication of DE3879790D1 publication Critical patent/DE3879790D1/de
Publication of DE3879790T2 publication Critical patent/DE3879790T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
DE8888201517T 1987-07-21 1988-07-14 Optisches rastermikroskop. Expired - Fee Related DE3879790T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL8701716A NL8701716A (nl) 1987-07-21 1987-07-21 Aftastende optische mikroskoop.

Publications (2)

Publication Number Publication Date
DE3879790D1 true DE3879790D1 (de) 1993-05-06
DE3879790T2 DE3879790T2 (de) 1993-09-23

Family

ID=19850349

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8888201517T Expired - Fee Related DE3879790T2 (de) 1987-07-21 1988-07-14 Optisches rastermikroskop.

Country Status (5)

Country Link
US (1) US4861982A (de)
EP (1) EP0300571B1 (de)
JP (1) JPS6437521A (de)
DE (1) DE3879790T2 (de)
NL (1) NL8701716A (de)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8817672D0 (en) * 1988-07-25 1988-09-01 Sira Ltd Optical apparatus
US5057686A (en) * 1988-10-12 1991-10-15 Mitutoyo Corporation Self-stabilizing photoelectric displacement detector
JP3018687B2 (ja) * 1991-12-12 2000-03-13 松下電器産業株式会社 走査型レーザー顕微鏡
JPH06148525A (ja) * 1992-10-30 1994-05-27 Koike Seiki Kk 共焦点レーザー顕微鏡
US5594242A (en) * 1993-09-09 1997-01-14 Kabushiki Kaisha Topcon Position detecting apparatus which uses a continuously moving light spot
US5880880A (en) * 1995-01-13 1999-03-09 The General Hospital Corp. Three-dimensional scanning confocal laser microscope
US6108127A (en) * 1997-05-15 2000-08-22 3M Innovative Properties Company High resolution confocal microscope
US6355919B1 (en) 1998-02-20 2002-03-12 Leica Microsystems Heidelberg Gmbh Confocal laser scanning microscope, calibration unit for a confocal laser scanning microscope and method for calibrating a confocal laser scanning microscope
DE19944148C2 (de) * 1999-09-15 2003-08-21 Leica Microsystems Mikroskop
US6423960B1 (en) * 1999-12-31 2002-07-23 Leica Microsystems Heidelberg Gmbh Method and system for processing scan-data from a confocal microscope
DE10160172B4 (de) * 2001-12-07 2016-06-09 Carl Zeiss Microscopy Gmbh Laserscanningmikroskop und Laserscanningmikroskopieverfahren
US7129473B2 (en) * 2003-05-16 2006-10-31 Olympus Corporation Optical image pickup apparatus for imaging living body tissue
US7270881B2 (en) 2003-08-06 2007-09-18 The Procter & Gamble Company Coated water-swellable material
WO2005014065A1 (en) 2003-08-06 2005-02-17 The Procter & Gamble Company Absorbant structures comprising coated water-swellable material
CN100471525C (zh) 2003-08-06 2009-03-25 宝洁公司 包含已涂敷的水可溶胀材料的吸收制品
EP1518567B1 (de) 2003-09-25 2017-06-28 The Procter & Gamble Company Absorbierende artikel mit flüssigkeitsaufnahmezone und darin beschichteten superabsorbierenden partikeln
WO2006082239A2 (en) * 2005-02-04 2006-08-10 Basf Aktiengesellschaft Water-absorbing material having a coating of elastic film-forming polymers
JP2008529590A (ja) * 2005-02-04 2008-08-07 ザ プロクター アンド ギャンブル カンパニー 改善された吸水性材料を有する吸収性構造体
US20080154224A1 (en) * 2005-02-04 2008-06-26 Basf Aktiengesellschaft Process for Producing a Water-Absorbing Material Having a Coating of Elastic Filmforming Polymers
JP2008528785A (ja) * 2005-02-04 2008-07-31 ビーエーエスエフ ソシエタス・ヨーロピア 弾性被膜形成ポリマーの塗膜を有する吸水性材料の製造方法
TW200635959A (en) * 2005-02-04 2006-10-16 Basf Ag Water swellable material
JP4877634B2 (ja) * 2008-10-09 2012-02-15 修 永井 ナースコールクリップ
KR102013259B1 (ko) * 2011-10-20 2019-08-22 에이에스엠엘 네델란즈 비.브이. 리소그래피 장치 및 방법
JP5896797B2 (ja) * 2012-03-16 2016-03-30 オリンパス株式会社 ピクセルクロック発生装置
EP3538941A4 (de) 2016-11-10 2020-06-17 The Trustees of Columbia University in the City of New York Schnelles hochauflösendes bildgebungsverfahren für grosse proben
CN106990542B (zh) * 2017-05-26 2023-07-04 四川瑞丰锻造有限公司 稳定性好的分光器

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3849004A (en) * 1973-10-11 1974-11-19 Geisco Ass Photo-detector for optical inspection system
US4037941A (en) * 1975-06-30 1977-07-26 International Business Machines Corporation Inspection tool
US4152588A (en) * 1977-10-28 1979-05-01 Hughes Aircraft Company Infrared scanning and display system having a noncontacting angle encoder
JPS5850333U (ja) * 1981-09-30 1983-04-05 スズキ株式会社 車輛用油圧式クツシヨン装置
JPS6197619A (ja) * 1984-10-19 1986-05-16 Fuji Photo Film Co Ltd 光学式リニアエンコ−ダ
US4643569A (en) * 1985-06-18 1987-02-17 Lincoln Laser Company Dual beam laser inspection apparatus
DE3531129A1 (de) * 1985-08-30 1987-03-12 Siemens Ag Verfahren und anordnung zum betrieb eines rastermikroskopes
US4775788A (en) * 1986-10-03 1988-10-04 Greyhawk Systems, Inc. Apparatus for detecting position of a rotating element using a two-grating moire pattern

Also Published As

Publication number Publication date
DE3879790T2 (de) 1993-09-23
JPS6437521A (en) 1989-02-08
EP0300571A1 (de) 1989-01-25
NL8701716A (nl) 1989-02-16
EP0300571B1 (de) 1993-03-31
US4861982A (en) 1989-08-29

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: PHILIPS ELECTRONICS N.V., EINDHOVEN, NL

8339 Ceased/non-payment of the annual fee