DE3853676D1 - Mikroskop. - Google Patents

Mikroskop.

Info

Publication number
DE3853676D1
DE3853676D1 DE3853676T DE3853676T DE3853676D1 DE 3853676 D1 DE3853676 D1 DE 3853676D1 DE 3853676 T DE3853676 T DE 3853676T DE 3853676 T DE3853676 T DE 3853676T DE 3853676 D1 DE3853676 D1 DE 3853676D1
Authority
DE
Germany
Prior art keywords
microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE3853676T
Other languages
English (en)
Other versions
DE3853676T2 (de
Inventor
Robert Messerschmidt
Donald Sting
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Spectra Tech Inc
Original Assignee
Spectra Tech Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Spectra Tech Inc filed Critical Spectra Tech Inc
Publication of DE3853676D1 publication Critical patent/DE3853676D1/de
Application granted granted Critical
Publication of DE3853676T2 publication Critical patent/DE3853676T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1738—Optionally different kinds of measurements; Method being valid for different kinds of measurement
    • G01N2021/1742—Optionally different kinds of measurements; Method being valid for different kinds of measurement either absorption or reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N2021/3595—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using FTIR

Landscapes

  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
DE3853676T 1987-02-17 1988-02-17 Mikroskop. Expired - Fee Related DE3853676T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US1531587A 1987-02-17 1987-02-17
PCT/US1988/000539 WO1988006300A1 (en) 1987-02-17 1988-02-17 Microscope

Publications (2)

Publication Number Publication Date
DE3853676D1 true DE3853676D1 (de) 1995-06-01
DE3853676T2 DE3853676T2 (de) 1996-01-11

Family

ID=21770712

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3853676T Expired - Fee Related DE3853676T2 (de) 1987-02-17 1988-02-17 Mikroskop.

Country Status (4)

Country Link
EP (1) EP0345293B1 (de)
JP (1) JP2801232B2 (de)
DE (1) DE3853676T2 (de)
WO (1) WO1988006300A1 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0776747B2 (ja) * 1989-11-03 1995-08-16 株式会社堀場製作所 顕微分光測定装置
US5093580A (en) * 1990-03-02 1992-03-03 Spectra-Tech, Inc. ATR objective and method for sample analyzation using an ATR crystal
JP6565100B2 (ja) * 2015-10-20 2019-08-28 国立大学法人北海道大学 光断層計測装置および光断層計測方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AT325869B (de) * 1973-03-06 1975-11-10 Reinert Guido Georg Mikroskop-beleuchtungsanordnung zur verwirklichung des köhler'schen beleuchtungsprinzips
US3798435A (en) * 1973-08-09 1974-03-19 Reichert Optische Werke Ag Versatile light source for a microscope
JPS5139547A (en) * 1974-10-01 1976-04-02 Nippon Kokan Kk Hakogatadanmenchuno shiguchibuno seisakuhoho
US4113344A (en) * 1975-08-25 1978-09-12 American Optical Corporation Microscope illuminator for both transmitted and vertical microscopy
JPS5524566Y2 (de) * 1975-10-28 1980-06-12
JPS6033552Y2 (ja) * 1977-08-29 1985-10-05 株式会社リコー 温度ヒユ−ズ装置
JPS5442913U (de) * 1977-08-29 1979-03-23

Also Published As

Publication number Publication date
JP2801232B2 (ja) 1998-09-21
WO1988006300A1 (en) 1988-08-25
EP0345293B1 (de) 1995-04-26
EP0345293A1 (de) 1989-12-13
DE3853676T2 (de) 1996-01-11
EP0345293A4 (de) 1990-02-05
JPH02502407A (ja) 1990-08-02

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee