DE3777594D1 - Mikroskop. - Google Patents

Mikroskop.

Info

Publication number
DE3777594D1
DE3777594D1 DE8787202436T DE3777594T DE3777594D1 DE 3777594 D1 DE3777594 D1 DE 3777594D1 DE 8787202436 T DE8787202436 T DE 8787202436T DE 3777594 T DE3777594 T DE 3777594T DE 3777594 D1 DE3777594 D1 DE 3777594D1
Authority
DE
Germany
Prior art keywords
microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8787202436T
Other languages
English (en)
Inventor
Jozef Petrus Henricus Benschop
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Application granted granted Critical
Publication of DE3777594D1 publication Critical patent/DE3777594D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0056—Optical details of the image generation based on optical coherence, e.g. phase-contrast arrangements, interference arrangements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/14—Condensers affording illumination for phase-contrast observation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/28—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising
    • G02B27/283—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising used for beam splitting or combining

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Microscoopes, Condenser (AREA)
DE8787202436T 1986-12-08 1987-12-07 Mikroskop. Expired - Lifetime DE3777594D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL8603108A NL8603108A (nl) 1986-12-08 1986-12-08 Mikroskoop.

Publications (1)

Publication Number Publication Date
DE3777594D1 true DE3777594D1 (de) 1992-04-23

Family

ID=19848960

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8787202436T Expired - Lifetime DE3777594D1 (de) 1986-12-08 1987-12-07 Mikroskop.

Country Status (5)

Country Link
US (1) US4845352A (de)
EP (1) EP0274155B1 (de)
JP (1) JP2603660B2 (de)
DE (1) DE3777594D1 (de)
NL (1) NL8603108A (de)

Families Citing this family (45)

* Cited by examiner, † Cited by third party
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US5351150A (en) * 1987-09-24 1994-09-27 Washington University Rotating slit aperture for scanning microscopy
JPH0289016A (ja) * 1988-09-26 1990-03-29 Nikon Corp 走査型顕微鏡
NL8901442A (nl) * 1989-06-07 1991-01-02 Philips Nv Werkwijze en inrichting voor het bepalen van de positie van een vlak.
US5078482A (en) * 1989-07-28 1992-01-07 At&T Bell Laboratories Resolution confocal microscope, and device fabrication method using same
US5084612A (en) * 1989-10-20 1992-01-28 Fuji Photo Film Co., Ltd. Imaging method for scanning microscopes, and confocal scanning microscope
DE4012927C2 (de) * 1990-04-24 1995-10-12 Daimler Benz Aerospace Ag Meß-Verfahren und -Vorrichtung zur dreidimensionalen Lageregelung des Brennpunktes eines Hochenergie-Laserstrahls
DE69117455T2 (de) * 1990-12-03 1996-09-05 Nikon Corp Konfokales Laser-Abtastmikroskop mit Kontrast durch Differenz aus Interferenzsignalen
JP3018687B2 (ja) * 1991-12-12 2000-03-13 松下電器産業株式会社 走査型レーザー顕微鏡
US5306902A (en) * 1992-09-01 1994-04-26 International Business Machines Corporation Confocal method and apparatus for focusing in projection lithography
US5430807A (en) * 1992-12-14 1995-07-04 Gravely Research Corporation Variable magnification color scanning light microscope
AUPN201295A0 (en) * 1995-03-28 1995-04-27 Commonwealth Scientific And Industrial Research Organisation Simplified conditions and configurations for phase-contrast imaging with hard x-rays
US5813987A (en) * 1995-08-01 1998-09-29 Medispectra, Inc. Spectral volume microprobe for analysis of materials
US5713364A (en) * 1995-08-01 1998-02-03 Medispectra, Inc. Spectral volume microprobe analysis of materials
US6104945A (en) * 1995-08-01 2000-08-15 Medispectra, Inc. Spectral volume microprobe arrays
US6847490B1 (en) 1997-01-13 2005-01-25 Medispectra, Inc. Optical probe accessory device for use in vivo diagnostic procedures
US6826422B1 (en) 1997-01-13 2004-11-30 Medispectra, Inc. Spectral volume microprobe arrays
US6226036B1 (en) * 1997-11-04 2001-05-01 Rudolf E. Grosskopf Device for optical investigation of an object
AU760402B2 (en) 1998-12-23 2003-05-15 Medispectra, Inc. Optical methods and systems for cervical screening
EP1161178A2 (de) 1998-12-23 2001-12-12 Medispectra Inc. Systeme und verfahren zur optischen untersuchung von proben
US7187810B2 (en) 1999-12-15 2007-03-06 Medispectra, Inc. Methods and systems for correcting image misalignment
US7260248B2 (en) 1999-12-15 2007-08-21 Medispectra, Inc. Image processing using measures of similarity
US20020007122A1 (en) * 1999-12-15 2002-01-17 Howard Kaufman Methods of diagnosing disease
US6839661B2 (en) 2000-12-15 2005-01-04 Medispectra, Inc. System for normalizing spectra
US6870896B2 (en) 2000-12-28 2005-03-22 Osmic, Inc. Dark-field phase contrast imaging
US6804324B2 (en) 2001-03-01 2004-10-12 Osmo, Inc. X-ray phase contrast imaging using a fabry-perot interferometer concept
US7863552B2 (en) * 2001-07-06 2011-01-04 Palantyr Research Llc Digital images and related methodologies
US6624403B2 (en) * 2001-10-11 2003-09-23 Therma-Wave, Inc. Autofocus system
US7312432B2 (en) * 2002-07-08 2007-12-25 Dmetrix, Inc. Single axis illumination for multi-axis imaging system
US6933154B2 (en) 2002-07-09 2005-08-23 Medispectra, Inc. Optimal windows for obtaining optical data for characterization of tissue samples
US7309867B2 (en) 2003-04-18 2007-12-18 Medispectra, Inc. Methods and apparatus for characterization of tissue samples
US7136518B2 (en) 2003-04-18 2006-11-14 Medispectra, Inc. Methods and apparatus for displaying diagnostic data
US6818903B2 (en) * 2002-07-09 2004-11-16 Medispectra, Inc. Method and apparatus for identifying spectral artifacts
US7282723B2 (en) 2002-07-09 2007-10-16 Medispectra, Inc. Methods and apparatus for processing spectral data for use in tissue characterization
US7469160B2 (en) 2003-04-18 2008-12-23 Banks Perry S Methods and apparatus for evaluating image focus
US7459696B2 (en) 2003-04-18 2008-12-02 Schomacker Kevin T Methods and apparatus for calibrating spectral data
US7103401B2 (en) * 2002-07-10 2006-09-05 Medispectra, Inc. Colonic polyp discrimination by tissue fluorescence and fiberoptic probe
US6768918B2 (en) 2002-07-10 2004-07-27 Medispectra, Inc. Fluorescent fiberoptic probe for tissue health discrimination and method of use thereof
JP2006091507A (ja) * 2004-09-24 2006-04-06 Nikon Corp 共焦点顕微鏡
PL2531880T3 (pl) 2010-02-01 2017-09-29 Illumina Inc. Sposoby ogniskowania oraz układy optyczne i zespoły optyczne realizujące te sposoby
JP2012048026A (ja) * 2010-08-27 2012-03-08 Sony Corp 顕微鏡及びフィルタ挿入方法
US8989347B2 (en) 2012-12-19 2015-03-24 General Electric Company Image reconstruction method for differential phase contrast X-ray imaging
US9014333B2 (en) 2012-12-31 2015-04-21 General Electric Company Image reconstruction methods for differential phase contrast X-ray imaging
WO2017181044A1 (en) * 2016-04-15 2017-10-19 The Regents Of The University Of California Optical phase retrieval systems using color-multiplexed illumination
JP6784514B2 (ja) * 2016-06-06 2020-11-11 オリンパス株式会社 レーザ走査型顕微鏡
TWI637166B (zh) * 2017-11-14 2018-10-01 國立臺灣大學 微分相位對比顯微系統與方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2222665B1 (de) * 1973-03-21 1975-10-31 Thomson Brandt
DE2423136C3 (de) * 1974-05-13 1982-07-29 Fa. Carl Zeiss, 7920 Heidenheim Vorrichtung zur automatischen Fokussierung von Stereomikroskopen
NL7414776A (nl) * 1974-11-13 1976-05-17 Philips Nv Inrichting voor het uitlezen van een registra- tiedrager met een optische informatiestruktuur.
US4255014A (en) * 1977-07-20 1981-03-10 Research Corporation Edge enhancement of phase phenomena
JPS57108811A (en) * 1980-12-26 1982-07-07 Hitachi Ltd Optical focus position detector
CA1174882A (en) * 1981-02-23 1984-09-25 Charles J. Kramer Plane grating polarizing beamsplitter
JPS59221835A (ja) * 1983-05-31 1984-12-13 Sony Corp フオ−カス誤差検出装置
JP2539350B2 (ja) * 1983-12-16 1996-10-02 株式会社日立製作所 光ヘツド装置

Also Published As

Publication number Publication date
EP0274155B1 (de) 1992-03-18
EP0274155A1 (de) 1988-07-13
JP2603660B2 (ja) 1997-04-23
US4845352A (en) 1989-07-04
JPS63155114A (ja) 1988-06-28
NL8603108A (nl) 1988-07-01

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: PHILIPS ELECTRONICS N.V., EINDHOVEN, NL

8327 Change in the person/name/address of the patent owner

Owner name: KONINKLIJKE PHILIPS ELECTRONICS N.V., EINDHOVEN, N

8339 Ceased/non-payment of the annual fee