NL8301987A - Correctie-inrichting voor roentgenstralen. - Google Patents

Correctie-inrichting voor roentgenstralen. Download PDF

Info

Publication number
NL8301987A
NL8301987A NL8301987A NL8301987A NL8301987A NL 8301987 A NL8301987 A NL 8301987A NL 8301987 A NL8301987 A NL 8301987A NL 8301987 A NL8301987 A NL 8301987A NL 8301987 A NL8301987 A NL 8301987A
Authority
NL
Netherlands
Prior art keywords
ray
rays
shutter
correction
detector
Prior art date
Application number
NL8301987A
Other languages
English (en)
Dutch (nl)
Original Assignee
Seiko Instr & Electronics
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instr & Electronics filed Critical Seiko Instr & Electronics
Publication of NL8301987A publication Critical patent/NL8301987A/nl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Toxicology (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
NL8301987A 1982-06-03 1983-06-03 Correctie-inrichting voor roentgenstralen. NL8301987A (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP8282382U JPS58184655U (ja) 1982-06-03 1982-06-03 Ｘ線自動較正装置
JP8282382 1982-06-03

Publications (1)

Publication Number Publication Date
NL8301987A true NL8301987A (nl) 1984-01-02

Family

ID=13785118

Family Applications (1)

Application Number Title Priority Date Filing Date
NL8301987A NL8301987A (nl) 1982-06-03 1983-06-03 Correctie-inrichting voor roentgenstralen.

Country Status (6)

Country Link
JP (1) JPS58184655U (enrdf_load_stackoverflow)
DE (1) DE3319984A1 (enrdf_load_stackoverflow)
FR (1) FR2528266B1 (enrdf_load_stackoverflow)
GB (1) GB2121168B (enrdf_load_stackoverflow)
HK (1) HK73390A (enrdf_load_stackoverflow)
NL (1) NL8301987A (enrdf_load_stackoverflow)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3731973A1 (de) * 1987-09-23 1989-04-13 Helmut Fischer Gmbh & Co Vorrichtung zur stabilisierung fuer roentgenfluoreszenzschichtdicken-messgeraete und verfahren hierzu
JPH0744967Y2 (ja) * 1988-11-17 1995-10-11 セイコー電子工業株式会社 蛍光ｘ線膜厚計
FR2721789A1 (fr) * 1994-06-24 1995-12-29 Ge Medical Syst Sa Appareil d'irradiation comprenant des moyens de mesure de l'exposition.
EP0781992B1 (en) * 1995-12-21 2006-06-07 Horiba, Ltd. Fluorescence X-ray analyzer
JP5839284B2 (ja) * 2012-05-01 2016-01-06 アースニクス株式会社 γ線反射型計測装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1285885A (en) * 1968-11-07 1972-08-16 Atomic Energy Authority Uk Improvements in or relating to nephelometers
US4134012A (en) * 1977-10-17 1979-01-09 Bausch & Lomb, Inc. X-ray analytical system
DE3062151D1 (en) * 1979-02-09 1983-04-07 Martin Marietta Corp Element analysis unit
JPS5758300U (enrdf_load_stackoverflow) * 1980-09-22 1982-04-06

Also Published As

Publication number Publication date
FR2528266A1 (fr) 1983-12-09
JPH0328400Y2 (enrdf_load_stackoverflow) 1991-06-18
FR2528266B1 (fr) 1988-07-08
GB2121168B (en) 1986-02-19
GB2121168A (en) 1983-12-14
DE3319984A1 (de) 1983-12-08
HK73390A (en) 1990-09-21
JPS58184655U (ja) 1983-12-08
GB8315135D0 (en) 1983-07-06

Similar Documents

Publication Publication Date Title
US4277685A (en) Adjustable collimator
US3684887A (en) Apparatus for inspecting tubular goods having an automatic shutter
EP0274403A3 (en) Light absorption analyser
NL8301987A (nl) Correctie-inrichting voor roentgenstralen.
US3562525A (en) X-ray fludrescence gauging employing a single x-ray source and a reference sample for comparative measurements
US4535469A (en) X-Ray analysis apparatus having an adjustable stray radiation slit
US5060247A (en) Fluorescent x-ray film thickness gauge
US3683187A (en) Methods and apparatus for inspecting tubular goods using a continuous signal calibrating system
US20050047545A1 (en) Non-destructive process for continuously measuring the density profile of panels
KR101211647B1 (ko) Ｘ선 검사장비의 가변 슬릿장치
US3683186A (en) Apparatus for inspecting tubular goods using a radiation-focussing device for producing a substantially uniform composite radiation pattern
US4442535A (en) Fluorescent X-ray film thickness gauge for very small areas
KR200418412Y1 (ko) Ｘ선을 이용한 결정체의 원자 간 거리 측정장치
JPS5928247B2 (ja) 波長自動選定装置
US3855465A (en) Apparatus for inspecting tubular goods
DE3624567A1 (de) Spektralanalytisches gasmessgeraet
JPS6259258B2 (enrdf_load_stackoverflow)
FR2550701A1 (fr) Appareil a rayons x pour l'exposition radiologique d'un sujet
JP3847197B2 (ja) 分光分析装置
JPS6315546B2 (enrdf_load_stackoverflow)
JP3051907B2 (ja) 蛍光ｘ線微小部膜厚計
CN107680699A (zh) 一种用于测试ｘ射线焦点的屏蔽装置
KR20030009825A (ko) 과일의 당도선별을 위한 광원자동보정장치
JPH09257447A (ja) 板厚測定装置および板厚測定方法
JPH0833358B2 (ja) 全反射螢光ｘ線分析装置

Legal Events

Date Code Title Description
A85 Still pending on 85-01-01
BA A request for search or an international-type search has been filed
BB A search report has been drawn up
BC A request for examination has been filed
BV The patent application has lapsed