NL8000166A - Inrichting voor het door projectie kopieren van maskers op een werkstuk. - Google Patents

Inrichting voor het door projectie kopieren van maskers op een werkstuk. Download PDF

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Publication number
NL8000166A
NL8000166A NL8000166A NL8000166A NL8000166A NL 8000166 A NL8000166 A NL 8000166A NL 8000166 A NL8000166 A NL 8000166A NL 8000166 A NL8000166 A NL 8000166A NL 8000166 A NL8000166 A NL 8000166A
Authority
NL
Netherlands
Prior art keywords
adjustment
projection
workpiece
alignment pattern
mask
Prior art date
Application number
NL8000166A
Other languages
English (en)
Dutch (nl)
Original Assignee
Censor Patent Versuch
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Censor Patent Versuch filed Critical Censor Patent Versuch
Publication of NL8000166A publication Critical patent/NL8000166A/nl

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
    • G03F9/7073—Alignment marks and their environment
    • G03F9/7076—Mark details, e.g. phase grating mark, temporary mark
NL8000166A 1979-01-11 1980-01-10 Inrichting voor het door projectie kopieren van maskers op een werkstuk. NL8000166A (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE2900921 1979-01-11
DE2900921A DE2900921C2 (de) 1979-01-11 1979-01-11 Verfahren zum Projektionskopieren von Masken auf ein Werkstück

Publications (1)

Publication Number Publication Date
NL8000166A true NL8000166A (nl) 1980-07-15

Family

ID=6060372

Family Applications (1)

Application Number Title Priority Date Filing Date
NL8000166A NL8000166A (nl) 1979-01-11 1980-01-10 Inrichting voor het door projectie kopieren van maskers op een werkstuk.

Country Status (6)

Country Link
US (1) US4357100A (fr)
JP (1) JPS5924537B2 (fr)
DE (1) DE2900921C2 (fr)
FR (1) FR2446507A1 (fr)
GB (1) GB2041554A (fr)
NL (1) NL8000166A (fr)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3318980C2 (de) * 1982-07-09 1986-09-18 Perkin-Elmer Censor Anstalt, Vaduz Vorrichtung zum Justieren beim Projektionskopieren von Masken
JPS5950518A (ja) * 1982-09-01 1984-03-23 パ−キン−エルマ−・ツエンゾ−ル・アンシュタルト 投影プリント方法
JPS5946026A (ja) * 1982-09-09 1984-03-15 Toshiba Corp 試料位置測定方法
JPS5972728A (ja) * 1982-10-20 1984-04-24 Canon Inc 自動整合装置
JPS59101829A (ja) * 1982-12-01 1984-06-12 Canon Inc アライメントマ−クの配置方法
DE3485022D1 (de) * 1983-12-26 1991-10-10 Hitachi Ltd Belichtungsvorrichtung und verfahren fuer die ausrichtung einer maske mit einem arbeitsstueck.
DE3402177A1 (de) * 1984-01-23 1985-07-25 Werner Dr. Vaduz Tabarelli Einrichtung zum kopieren einer maske auf ein halbleitersubstrat
DE3402178A1 (de) * 1984-01-23 1985-07-25 Werner Dr. Vaduz Tabarelli Vorrichtung zum projektionskopieren von masken auf ein werkstueck
JPH0722097B2 (ja) * 1984-06-11 1995-03-08 株式会社ニコン 投影露光方法
US4682037A (en) * 1984-07-10 1987-07-21 Canon Kabushiki Kaisha Projection exposure apparatus having an alignment light of a wavelength other than that of the exposure light
US4701050A (en) * 1984-08-10 1987-10-20 Hitachi, Ltd. Semiconductor exposure apparatus and alignment method therefor
EP0182251B1 (fr) * 1984-11-13 1989-10-18 Hitachi, Ltd. Procédé d'alignement pour dispositif d'ajustage de type projecteur par réduction
JPS61183928A (ja) * 1985-02-12 1986-08-16 Nippon Kogaku Kk <Nikon> 投影光学装置
JPS61123139A (ja) * 1985-10-11 1986-06-11 Canon Inc アライメント装置
JPH0685387B2 (ja) * 1986-02-14 1994-10-26 株式会社東芝 位置合わせ方法
JPS62293718A (ja) * 1986-06-13 1987-12-21 Canon Inc 露光装置
JPS62281422A (ja) * 1986-05-30 1987-12-07 Canon Inc 露光装置
US5137363A (en) * 1986-06-04 1992-08-11 Canon Kabushiki Kaisha Projection exposure apparatus
JPS63187729U (fr) * 1987-05-26 1988-12-01
JPS63153821A (ja) * 1987-10-27 1988-06-27 Nikon Corp 位置合わせ装置
US5631731A (en) * 1994-03-09 1997-05-20 Nikon Precision, Inc. Method and apparatus for aerial image analyzer
US5917332A (en) * 1996-05-09 1999-06-29 Advanced Micro Devices, Inc. Arrangement for improving defect scanner sensitivity and scanning defects on die of a semiconductor wafer
SE540184C2 (en) 2016-07-29 2018-04-24 Exeger Operations Ab A light absorbing layer and a photovoltaic device including a light absorbing layer

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3695758A (en) * 1969-06-30 1972-10-03 Nippon Kogaku Kk Illumination device for projector type ic printer
US3844655A (en) * 1973-07-27 1974-10-29 Kasper Instruments Method and means for forming an aligned mask that does not include alignment marks employed in aligning the mask
US3865483A (en) * 1974-03-21 1975-02-11 Ibm Alignment illumination system
DE2539206A1 (de) * 1975-09-03 1977-03-17 Siemens Ag Verfahren zur automatischen justierung von halbleiterscheiben
JPS52109875A (en) * 1976-02-25 1977-09-14 Hitachi Ltd Position matching system for mask and wafer and its unit

Also Published As

Publication number Publication date
DE2900921B1 (de) 1980-07-24
FR2446507B3 (fr) 1981-10-16
JPS5924537B2 (ja) 1984-06-09
GB2041554A (en) 1980-09-10
US4357100A (en) 1982-11-02
JPS55108743A (en) 1980-08-21
DE2900921C2 (de) 1981-06-04
FR2446507A1 (fr) 1980-08-08

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Legal Events

Date Code Title Description
BA A request for search or an international-type search has been filed
A85 Still pending on 85-01-01
BB A search report has been drawn up
DNT Communications of changes of names of applicants whose applications have been laid open to public inspection

Free format text: PERKIN-ELMER CENSOR ANSTALT

BC A request for examination has been filed
CNR Transfer of rights (patent application after its laying open for public inspection)

Free format text: MERCOTRUST AKTIENGESELLSCHAFT

BV The patent application has lapsed