NL193258B - Keten voor het kiezen van een werkingsmodus. - Google Patents

Keten voor het kiezen van een werkingsmodus.

Info

Publication number
NL193258B
NL193258B NL8901533A NL8901533A NL193258B NL 193258 B NL193258 B NL 193258B NL 8901533 A NL8901533 A NL 8901533A NL 8901533 A NL8901533 A NL 8901533A NL 193258 B NL193258 B NL 193258B
Authority
NL
Netherlands
Prior art keywords
choosing
chain
operating mode
operating
mode
Prior art date
Application number
NL8901533A
Other languages
English (en)
Other versions
NL193258C (nl
NL8901533A (nl
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of NL8901533A publication Critical patent/NL8901533A/nl
Publication of NL193258B publication Critical patent/NL193258B/nl
Application granted granted Critical
Publication of NL193258C publication Critical patent/NL193258C/nl

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M7/00—Conversion of a code where information is represented by a given sequence or number of digits to a code where the same, similar or subset of information is represented by a different sequence or number of digits
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/28—Error detection; Error correction; Monitoring by checking the correct order of processing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F7/00—Methods or arrangements for processing data by operating upon the order or content of the data handled
    • G06F7/02—Comparing digital values

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computational Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Mathematical Analysis (AREA)
  • Mathematical Optimization (AREA)
  • Pure & Applied Mathematics (AREA)
  • Logic Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Shift Register Type Memory (AREA)
NL8901533A 1988-07-18 1989-06-16 Keten voor het kiezen van een werkingsmodus. NL193258C (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR880008954 1988-07-18
KR1019880008954A KR910005615B1 (ko) 1988-07-18 1988-07-18 프로그래머블 순차코오드 인식회로

Publications (3)

Publication Number Publication Date
NL8901533A NL8901533A (nl) 1990-02-16
NL193258B true NL193258B (nl) 1998-12-01
NL193258C NL193258C (nl) 1999-04-02

Family

ID=19276182

Family Applications (1)

Application Number Title Priority Date Filing Date
NL8901533A NL193258C (nl) 1988-07-18 1989-06-16 Keten voor het kiezen van een werkingsmodus.

Country Status (7)

Country Link
US (1) US5015886A (nl)
JP (1) JP2551659B2 (nl)
KR (1) KR910005615B1 (nl)
DE (1) DE3917945C2 (nl)
FR (1) FR2634299B1 (nl)
GB (1) GB2221072B (nl)
NL (1) NL193258C (nl)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0831529B2 (ja) * 1989-11-20 1996-03-27 株式会社東芝 半導体集積回路装置の論理プログラム方法
US5379404A (en) * 1990-03-16 1995-01-03 Motorola, Inc. Plug code for automatically recognizing and configuring both non-microprocessor and microprocessor based radio frequency communication devices
NL9001333A (nl) * 1990-06-13 1992-01-02 Philips Nv Werkwijze voor het besturen van een zelftest in een dataverwerkend systeem en dataverwerkend systeem geschikt voor deze werkwijze.
EP0475588B1 (en) * 1990-08-17 1996-06-26 STMicroelectronics, Inc. A semiconductor memory with inhibited test mode entry during power-up
US5072138A (en) * 1990-08-17 1991-12-10 Sgs-Thomson Microelectronics, Inc. Semiconductor memory with sequential clocked access codes for test mode entry
US5072137A (en) * 1990-08-17 1991-12-10 Sgs-Thomson Microelectronics, Inc. Semiconductor memory with a clocked access code for test mode entry
US5161159A (en) * 1990-08-17 1992-11-03 Sgs-Thomson Microelectronics, Inc. Semiconductor memory with multiple clocking for test mode entry
US5412260A (en) * 1991-05-03 1995-05-02 Lattice Semiconductor Corporation Multiplexed control pins for in-system programming and boundary scan state machines in a high density programmable logic device
US5237218A (en) * 1991-05-03 1993-08-17 Lattice Semiconductor Corporation Structure and method for multiplexing pins for in-system programming
US5471481A (en) * 1992-05-18 1995-11-28 Sony Corporation Testing method for electronic apparatus
EP0618530A1 (en) * 1993-03-30 1994-10-05 Koninklijke Philips Electronics N.V. Finite state machine with means for the reduction of noise effects
US5488318A (en) * 1994-10-04 1996-01-30 Texas Instruments Multifunction register
JPH09167483A (ja) * 1995-12-19 1997-06-24 Mitsubishi Electric Corp 動作モード設定回路
KR100878663B1 (ko) * 2002-10-07 2009-01-15 주식회사 포스코 고효율 용강 정련방법
US7508943B2 (en) 2003-05-16 2009-03-24 Mo-Dv, Inc. Multimedia storage systems and methods
US8181703B2 (en) * 2003-05-16 2012-05-22 Halliburton Energy Services, Inc. Method useful for controlling fluid loss in subterranean formations
JP4321608B2 (ja) 2007-02-28 2009-08-26 ブラザー工業株式会社 シート搬送装置及び画像読取装置。
US9552855B2 (en) * 2009-06-26 2017-01-24 Mo-Dv, Inc. Accessing a serial number of a removable non-volatile memory device
US8751795B2 (en) 2010-09-14 2014-06-10 Mo-Dv, Inc. Secure transfer and tracking of data using removable non-volatile memory devices
KR20170007927A (ko) * 2015-07-13 2017-01-23 에스케이하이닉스 주식회사 반도체장치 및 반도체시스템
KR102375054B1 (ko) * 2015-12-11 2022-03-17 에스케이하이닉스 주식회사 테스트 모드 설정회로 및 이를 포함하는 반도체 장치

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3374466A (en) * 1965-05-10 1968-03-19 Ibm Data processing system
AU474461B2 (en) * 1972-06-30 1976-07-22 Notifier Company Method and apparatus for operating authorization control systems
US3839710A (en) * 1973-01-04 1974-10-01 Rusco Ind Inc Access apparatus control system
US3922508A (en) * 1974-01-14 1975-11-25 Magnetic Controls Co Coded telephone line testing equipment
CH622901A5 (nl) * 1977-10-11 1981-04-30 Fast Digital Syst
JPS5745944A (en) * 1980-09-02 1982-03-16 Toshiba Corp Semiconductor integrated circuit device
US4431991A (en) * 1981-10-13 1984-02-14 Motorola, Inc. Encoder for transmitted message deactivation code
US4427980A (en) * 1981-10-13 1984-01-24 Motorola, Inc. Encoder for transmitted message activation code
DE3232215A1 (de) * 1982-08-30 1984-03-01 Siemens AG, 1000 Berlin und 8000 München Monolithisch integrierte digitale halbleiterschaltung
EP0158311A3 (en) * 1984-04-06 1989-04-26 Nec Corporation Apparatus for retrieving character strings
DE3682305D1 (de) * 1985-03-23 1991-12-12 Int Computers Ltd Integrierte digitale schaltungen.
US4802133A (en) * 1985-03-26 1989-01-31 Kabushiki Kaisha Toshiba Logic circuit
JPS61247984A (ja) * 1985-04-26 1986-11-05 Toshiba Corp テスト回路
GB8518859D0 (en) * 1985-07-25 1985-08-29 Int Computers Ltd Digital integrated circuits
JPS62182937A (ja) * 1986-02-07 1987-08-11 Toshiba Corp テストモ−ド設定回路
US4772811A (en) * 1986-07-04 1988-09-20 Ricoh Company, Ltd. Programmable logic device
US4873671A (en) * 1988-01-28 1989-10-10 National Semiconductor Corporation Sequential read access of serial memories with a user defined starting address

Also Published As

Publication number Publication date
GB8916398D0 (en) 1989-09-06
FR2634299B1 (fr) 1993-04-23
JP2551659B2 (ja) 1996-11-06
KR910005615B1 (ko) 1991-07-31
NL193258C (nl) 1999-04-02
FR2634299A1 (fr) 1990-01-19
KR900002574A (ko) 1990-02-28
GB2221072A (en) 1990-01-24
DE3917945C2 (de) 1994-08-18
GB2221072B (en) 1992-04-08
US5015886A (en) 1991-05-14
NL8901533A (nl) 1990-02-16
JPH0247575A (ja) 1990-02-16
DE3917945A1 (de) 1990-01-25

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Legal Events

Date Code Title Description
A1A A request for search or an international-type search has been filed
BB A search report has been drawn up
BC A request for examination has been filed
V4 Discontinued because of reaching the maximum lifetime of a patent

Effective date: 20090616