NL160991C - Werkwijze voor de vervaardiging van een voor infra- roodstralinggevoelige fotodiode. - Google Patents
Werkwijze voor de vervaardiging van een voor infra- roodstralinggevoelige fotodiode.Info
- Publication number
- NL160991C NL160991C NL7506863.A NL7506863A NL160991C NL 160991 C NL160991 C NL 160991C NL 7506863 A NL7506863 A NL 7506863A NL 160991 C NL160991 C NL 160991C
- Authority
- NL
- Netherlands
- Prior art keywords
- manufacture
- radiation sensitive
- photo diode
- infra red
- red radiation
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
- 230000005855 radiation Effects 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/1828—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof the active layers comprising only AIIBVI compounds, e.g. CdS, ZnS, CdTe
- H01L31/1832—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof the active layers comprising only AIIBVI compounds, e.g. CdS, ZnS, CdTe comprising ternary compounds, e.g. Hg Cd Te
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/34—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies not provided for in groups H01L21/0405, H01L21/0445, H01L21/06, H01L21/16 and H01L21/18 with or without impurities, e.g. doping materials
- H01L21/46—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/428
- H01L21/461—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/428 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/469—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/428 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After-treatment of these layers
- H01L21/471—Inorganic layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
- H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
- H01L31/102—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier
- H01L31/103—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier being of the PN homojunction type
- H01L31/1032—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier being of the PN homojunction type the devices comprising active layers formed only by AIIBVI compounds, e.g. HgCdTe IR photodiodes
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/153—Solar cells-implantations-laser beam
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Manufacturing & Machinery (AREA)
- Light Receiving Elements (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR7427282A FR2281650A1 (fr) | 1974-08-06 | 1974-08-06 | Procede de fabrication d'une photodiode sensible aux rayonnements infrarouges et photodiode obtenue par ce procede |
Publications (3)
Publication Number | Publication Date |
---|---|
NL7506863A NL7506863A (nl) | 1976-02-10 |
NL160991B NL160991B (nl) | 1979-07-16 |
NL160991C true NL160991C (nl) | 1979-12-17 |
Family
ID=9142164
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL7506863.A NL160991C (nl) | 1974-08-06 | 1975-06-10 | Werkwijze voor de vervaardiging van een voor infra- roodstralinggevoelige fotodiode. |
Country Status (6)
Country | Link |
---|---|
US (1) | US3988774A (ja) |
JP (1) | JPS5144396B2 (ja) |
DE (1) | DE2517939C2 (ja) |
FR (1) | FR2281650A1 (ja) |
GB (1) | GB1508027A (ja) |
NL (1) | NL160991C (ja) |
Families Citing this family (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2336804A1 (fr) * | 1975-12-23 | 1977-07-22 | Telecommunications Sa | Perfectionnements apportes aux dispositifs semi-conducteurs, notamment aux detecteurs photovoltaiques comprenant un substrat a base d'un alliage cdxhg1-xte, et procede de fabrication d'un tel dispositif perfectionne |
US4037311A (en) * | 1976-07-14 | 1977-07-26 | U.S. Philips Corporation | Methods of manufacturing infra-red detector elements |
FR2376513A1 (fr) * | 1976-12-31 | 1978-07-28 | Radiotechnique Compelec | Dispositif semiconducteur muni d'un film protecteur |
JPS5455228A (en) * | 1977-10-10 | 1979-05-02 | Nippon Denso Co Ltd | Fuel injection pump for internal combustion engine |
US4170781A (en) * | 1978-04-06 | 1979-10-09 | The United States Of America As Represented By The Secretary Of The Army | Photodiode and method of manufacture |
DE3068571D1 (en) * | 1979-05-01 | 1984-08-23 | Secr Defence Brit | Radiation detectors |
JPS56169376A (en) * | 1980-05-30 | 1981-12-26 | New Japan Radio Co Ltd | Light receiving semiconductor device |
JPS5745289A (en) * | 1980-08-29 | 1982-03-15 | Fujitsu Ltd | Production of multidimentional semiconductor device |
US4357620A (en) * | 1980-11-18 | 1982-11-02 | The United States Of America As Represented By The Secretary Of The Army | Liquid-phase epitaxial growth of cdTe on HgCdTe |
US4376663A (en) * | 1980-11-18 | 1983-03-15 | The United States Of America As Represented By The Secretary Of The Army | Method for growing an epitaxial layer of CdTe on an epitaxial layer of HgCdTe grown on a CdTe substrate |
US4465565A (en) * | 1983-03-28 | 1984-08-14 | Ford Aerospace & Communications Corporation | CdTe passivation of HgCdTe by electrochemical deposition |
FR2592740B1 (fr) * | 1986-01-08 | 1988-03-18 | Commissariat Energie Atomique | Detecteur photovoltaique en hgcdte a heterojonction et son procede de fabrication |
US4731640A (en) * | 1986-05-20 | 1988-03-15 | Westinghouse Electric Corp. | High resistance photoconductor structure for multi-element infrared detector arrays |
FR2604298B1 (fr) * | 1986-09-19 | 1988-10-28 | Commissariat Energie Atomique | Procede de realisation d'une prise de contact electrique sur un substrat en hgcdte de conductivite p et application a la fabrication d'une diode n/p |
US5936268A (en) * | 1988-03-29 | 1999-08-10 | Raytheon Company | Epitaxial passivation of group II-VI infrared photodetectors |
US4956304A (en) * | 1988-04-07 | 1990-09-11 | Santa Barbara Research Center | Buried junction infrared photodetector process |
US5880510A (en) * | 1988-05-11 | 1999-03-09 | Raytheon Company | Graded layer passivation of group II-VI infrared photodetectors |
US4910154A (en) * | 1988-12-23 | 1990-03-20 | Ford Aerospace Corporation | Manufacture of monolithic infrared focal plane arrays |
US4961098A (en) * | 1989-07-03 | 1990-10-02 | Santa Barbara Research Center | Heterojunction photodiode array |
US5049962A (en) * | 1990-03-07 | 1991-09-17 | Santa Barbara Research Center | Control of optical crosstalk between adjacent photodetecting regions |
JPH0492481A (ja) * | 1990-08-07 | 1992-03-25 | Mitsubishi Electric Corp | 光検知装置 |
JP3029497B2 (ja) * | 1991-12-20 | 2000-04-04 | ローム株式会社 | フォトダイオードアレイおよびその製造法 |
US5296384A (en) * | 1992-07-21 | 1994-03-22 | Santa Barbara Research Center | Bake-stable HgCdTe photodetector and method for fabricating same |
EP0635892B1 (en) * | 1992-07-21 | 2002-06-26 | Raytheon Company | Bake-stable HgCdTe photodetector and method for fabricating same |
JP2859789B2 (ja) * | 1992-11-13 | 1999-02-24 | ローム株式会社 | フォトダイオードアレイおよびその製法 |
US5633526A (en) * | 1992-11-01 | 1997-05-27 | Rohm Co., Ltd. | Photodiode array and method for manufacturing the same |
WO2011040273A1 (ja) * | 2009-09-30 | 2011-04-07 | シャープ株式会社 | 半導体装置およびその製造方法、ならびに半導体装置を備えた表示装置 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1614435B2 (de) * | 1967-02-23 | 1979-05-23 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Verfahren zum Herstellen von aus Germanium bestehenden, doppeldiffundierten Halbleiteranordnungen |
US3576478A (en) * | 1969-07-22 | 1971-04-27 | Philco Ford Corp | Igfet comprising n-type silicon substrate, silicon oxide gate insulator and p-type polycrystalline silicon gate electrode |
DE1948884B2 (de) * | 1969-09-27 | 1971-09-30 | Verfahren zum beseitigen von inversionsschichten |
-
1974
- 1974-08-06 FR FR7427282A patent/FR2281650A1/fr active Granted
-
1975
- 1975-04-23 DE DE2517939A patent/DE2517939C2/de not_active Expired
- 1975-04-28 US US05/572,225 patent/US3988774A/en not_active Expired - Lifetime
- 1975-05-23 GB GB22853/75A patent/GB1508027A/en not_active Expired
- 1975-06-10 NL NL7506863.A patent/NL160991C/xx not_active IP Right Cessation
- 1975-07-16 JP JP50086241A patent/JPS5144396B2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
DE2517939C2 (de) | 1982-06-09 |
DE2517939A1 (de) | 1976-02-26 |
FR2281650B1 (ja) | 1976-12-31 |
FR2281650A1 (fr) | 1976-03-05 |
US3988774A (en) | 1976-10-26 |
GB1508027A (en) | 1978-04-19 |
JPS5144396B2 (ja) | 1976-11-27 |
NL7506863A (nl) | 1976-02-10 |
NL160991B (nl) | 1979-07-16 |
JPS5136088A (ja) | 1976-03-26 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
NL80 | Information provided on patent owner name for an already discontinued patent |
Owner name: TELECOMMUNIC |
|
V4 | Discontinued because of reaching the maximum lifetime of a patent |