MY144187A - A cmp composition with a polymer additive for polishing noble metals - Google Patents

A cmp composition with a polymer additive for polishing noble metals

Info

Publication number
MY144187A
MY144187A MYPI20054754A MYPI20054754A MY144187A MY 144187 A MY144187 A MY 144187A MY PI20054754 A MYPI20054754 A MY PI20054754A MY PI20054754 A MYPI20054754 A MY PI20054754A MY 144187 A MY144187 A MY 144187A
Authority
MY
Malaysia
Prior art keywords
polishing
substrate
cmp composition
polymer additive
noble metal
Prior art date
Application number
MYPI20054754A
Other languages
English (en)
Inventor
Francesco De Rege Thesauro
Benjamin P Bayer
Original Assignee
Cabot Microelectronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cabot Microelectronics Corp filed Critical Cabot Microelectronics Corp
Publication of MY144187A publication Critical patent/MY144187A/en

Links

Classifications

    • C—CHEMISTRY; METALLURGY
    • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09G—POLISHING COMPOSITIONS; SKI WAXES
    • C09G1/00—Polishing compositions
    • C09G1/02—Polishing compositions containing abrasives or grinding agents
    • C—CHEMISTRY; METALLURGY
    • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K3/00—Materials not provided for elsewhere
    • C09K3/14—Anti-slip materials; Abrasives
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
    • H10P52/40—Chemomechanical polishing [CMP]
    • H10P52/403—Chemomechanical polishing [CMP] of conductive or resistive materials
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D1/00—Resistors, capacitors or inductors
    • H10D1/60—Capacitors
    • H10D1/68—Capacitors having no potential barriers
    • H10D1/692—Electrodes
    • H10D1/694—Electrodes comprising noble metals or noble metal oxides

Landscapes

  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
MYPI20054754A 2004-10-12 2005-10-10 A cmp composition with a polymer additive for polishing noble metals MY144187A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/963,108 US7563383B2 (en) 2004-10-12 2004-10-12 CMP composition with a polymer additive for polishing noble metals

Publications (1)

Publication Number Publication Date
MY144187A true MY144187A (en) 2011-08-15

Family

ID=35677420

Family Applications (1)

Application Number Title Priority Date Filing Date
MYPI20054754A MY144187A (en) 2004-10-12 2005-10-10 A cmp composition with a polymer additive for polishing noble metals

Country Status (9)

Country Link
US (1) US7563383B2 (https=)
EP (1) EP1799785A2 (https=)
JP (1) JP5583888B2 (https=)
KR (1) KR101128551B1 (https=)
CN (1) CN101040021B (https=)
IL (1) IL182170A (https=)
MY (1) MY144187A (https=)
TW (1) TWI308924B (https=)
WO (1) WO2006044417A2 (https=)

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US8008202B2 (en) * 2007-08-01 2011-08-30 Cabot Microelectronics Corporation Ruthenium CMP compositions and methods
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CN104073169B (zh) * 2014-06-10 2015-07-22 大庆佳昌晶能信息材料有限公司 一种用于化合物半导体的化学机械抛光剂
WO2021242755A1 (en) * 2020-05-29 2021-12-02 Versum Materials Us, Llc Low dishing oxide cmp polishing compositions for shallow trench isolation applications and methods of making thereof
WO2022024636A1 (ja) * 2020-07-31 2022-02-03 富士フイルム株式会社 薬液、薬液収容体、基板の処理方法
US11820919B2 (en) * 2021-10-19 2023-11-21 Tokyo Electron Limited Ruthenium CMP chemistry based on halogenation
CN116875194A (zh) * 2023-05-18 2023-10-13 万华化学集团电子材料有限公司 一种钨化学机械抛光液及其应用

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Also Published As

Publication number Publication date
IL182170A (en) 2011-12-29
US7563383B2 (en) 2009-07-21
WO2006044417A3 (en) 2006-08-10
US20060076317A1 (en) 2006-04-13
JP5583888B2 (ja) 2014-09-03
TW200624527A (en) 2006-07-16
CN101040021A (zh) 2007-09-19
EP1799785A2 (en) 2007-06-27
WO2006044417A2 (en) 2006-04-27
TWI308924B (en) 2009-04-21
KR101128551B1 (ko) 2012-03-23
JP2008516465A (ja) 2008-05-15
IL182170A0 (en) 2007-07-24
CN101040021B (zh) 2012-06-20
WO2006044417B1 (en) 2006-08-31
KR20070084096A (ko) 2007-08-24

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