MY140439A - Adhesive sheet for semiconductor device production, semiconductor device using the same, and production method of semiconductor device - Google Patents
Adhesive sheet for semiconductor device production, semiconductor device using the same, and production method of semiconductor deviceInfo
- Publication number
- MY140439A MY140439A MYPI20041058A MYPI20041058A MY140439A MY 140439 A MY140439 A MY 140439A MY PI20041058 A MYPI20041058 A MY PI20041058A MY PI20041058 A MYPI20041058 A MY PI20041058A MY 140439 A MY140439 A MY 140439A
- Authority
- MY
- Malaysia
- Prior art keywords
- semiconductor device
- production
- adhesive sheet
- same
- adhesive
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title abstract 6
- 239000000853 adhesive Substances 0.000 title abstract 4
- 230000001070 adhesive effect Effects 0.000 title abstract 4
- 238000004519 manufacturing process Methods 0.000 title abstract 4
- 239000012790 adhesive layer Substances 0.000 abstract 2
- 230000002950 deficient Effects 0.000 abstract 1
- 239000000463 material Substances 0.000 abstract 1
- 229920005992 thermoplastic resin Polymers 0.000 abstract 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/93—Batch processes
- H01L24/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L24/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/60—Attaching or detaching leads or other conductive members, to be used for carrying current to or from the device in operation
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/45144—Gold (Au) as principal constituent
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
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- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
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- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
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- H01L2224/92—Specific sequence of method steps
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- H01L2224/9222—Sequential connecting processes
- H01L2224/92242—Sequential connecting processes the first connecting process involving a layer connector
- H01L2224/92247—Sequential connecting processes the first connecting process involving a layer connector the second connecting process involving a wire connector
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- H01L2224/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
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- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/156—Material
- H01L2924/157—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2924/15738—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950 C and less than 1550 C
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- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Adhesives Or Adhesive Processes (AREA)
- Adhesive Tapes (AREA)
- Die Bonding (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Laminated Bodies (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003083795A JP4421204B2 (ja) | 2003-03-25 | 2003-03-25 | 半導体装置製造用接着シート及びそれを用いた半導体装置並びに製造方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
MY140439A true MY140439A (en) | 2009-12-31 |
Family
ID=33399169
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MYPI20041058A MY140439A (en) | 2003-03-25 | 2004-03-25 | Adhesive sheet for semiconductor device production, semiconductor device using the same, and production method of semiconductor device |
Country Status (6)
Country | Link |
---|---|
JP (1) | JP4421204B2 (ja) |
KR (1) | KR100596186B1 (ja) |
CN (1) | CN100492586C (ja) |
HK (1) | HK1073178A1 (ja) |
MY (1) | MY140439A (ja) |
TW (1) | TWI313481B (ja) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4863690B2 (ja) * | 2005-10-31 | 2012-01-25 | 株式会社巴川製紙所 | 半導体装置製造用接着シート及び半導体装置並びにその製造方法 |
JP4654062B2 (ja) * | 2005-03-30 | 2011-03-16 | 株式会社巴川製紙所 | 半導体装置製造用接着シート及び半導体装置の製造方法 |
JP4538398B2 (ja) * | 2005-10-31 | 2010-09-08 | 株式会社巴川製紙所 | 半導体装置製造用接着シート及び半導体装置の製造方法 |
JP4505649B2 (ja) * | 2006-03-23 | 2010-07-21 | フジコピアン株式会社 | 固定シート |
JP2009158817A (ja) * | 2007-12-27 | 2009-07-16 | Tomoegawa Paper Co Ltd | Qfn用熱硬化型樹脂組成物及びそれを用いたqfn用接着シート |
KR20110087547A (ko) * | 2010-01-26 | 2011-08-03 | 도레이첨단소재 주식회사 | 내열성 점착시트를 이용한 반도체 장치의 제조방법 |
JP5714349B2 (ja) * | 2011-01-31 | 2015-05-07 | ニッタ株式会社 | 易剥離性粘着シートおよび易剥離性粘着テープ |
CN106574163B (zh) * | 2014-08-08 | 2019-12-03 | 东丽株式会社 | 临时粘接用粘合剂、粘合剂层、晶片加工体及使用其的半导体器件的制造方法、聚酰亚胺共聚物、聚酰亚胺混合树脂以及树脂组合物 |
TWI732764B (zh) * | 2015-06-01 | 2021-07-11 | 日商富士軟片股份有限公司 | 暫時接著劑、接著膜、接著性支持體、積層體及接著劑套組 |
CN108922854B (zh) * | 2018-06-14 | 2020-06-05 | 中国电子科技集团公司第二十四研究所 | 一种用于封装硅基芯片的瞬态电路封装结构实现方法 |
JP7187906B2 (ja) * | 2018-09-10 | 2022-12-13 | 昭和電工マテリアルズ株式会社 | 半導体装置の製造方法 |
WO2021131925A1 (ja) * | 2019-12-23 | 2021-07-01 | 日産化学株式会社 | 接着剤組成物、積層体及びその製造方法並びに積層体の剥離方法及び半導体形成基板を加工する方法 |
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2003
- 2003-03-25 JP JP2003083795A patent/JP4421204B2/ja not_active Expired - Lifetime
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2004
- 2004-03-22 KR KR1020040019211A patent/KR100596186B1/ko active IP Right Grant
- 2004-03-23 CN CNB2004100387951A patent/CN100492586C/zh not_active Expired - Lifetime
- 2004-03-24 TW TW093107894A patent/TWI313481B/zh not_active IP Right Cessation
- 2004-03-25 MY MYPI20041058A patent/MY140439A/en unknown
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2005
- 2005-07-07 HK HK05105728.3A patent/HK1073178A1/xx not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
JP2004296549A (ja) | 2004-10-21 |
JP4421204B2 (ja) | 2010-02-24 |
CN1622279A (zh) | 2005-06-01 |
KR100596186B1 (ko) | 2006-07-03 |
TW200501208A (en) | 2005-01-01 |
KR20040084680A (ko) | 2004-10-06 |
TWI313481B (en) | 2009-08-11 |
HK1073178A1 (en) | 2005-09-23 |
CN100492586C (zh) | 2009-05-27 |
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