MX9306826A - Aparato de seleccion automatica de reloj de prueba. - Google Patents
Aparato de seleccion automatica de reloj de prueba.Info
- Publication number
- MX9306826A MX9306826A MX9306826A MX9306826A MX9306826A MX 9306826 A MX9306826 A MX 9306826A MX 9306826 A MX9306826 A MX 9306826A MX 9306826 A MX9306826 A MX 9306826A MX 9306826 A MX9306826 A MX 9306826A
- Authority
- MX
- Mexico
- Prior art keywords
- clock signal
- mode
- test
- clock
- test clock
- Prior art date
Links
- 230000003111 delayed effect Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
- H03K5/26—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being duration, interval, position, frequency, or sequence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
- G01R31/318328—Generation of test inputs, e.g. test vectors, patterns or sequences for delay tests
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
- G01R31/3016—Delay or race condition test, e.g. race hazard test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31922—Timing generation or clock distribution
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Semiconductor Integrated Circuits (AREA)
Abstract
Un circuito integrado (IC 100) incluye circuitos para generar una señal dereloj (CLOCK) durante un modo normal de operación y durante un modo deoperación de prueba. Durante el modo normal, la señal de reloj de entradaes retardada mediante un corrector de distorsión (135). En el modo deprueba, una señal de reloj de prueba de entrada (TEST CLOCK) deriva elcorrector de distorsión por medio de un selector (150) de fuente de señalde reloj. El selector de fuente de señal de reloj es controladoautomáticamente mediante un detector de modo (140) que responde a lasseñales de reloj de entrada, para determinar el modo de operación de CI.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US97118392A | 1992-11-03 | 1992-11-03 |
Publications (1)
Publication Number | Publication Date |
---|---|
MX9306826A true MX9306826A (es) | 1995-01-31 |
Family
ID=25518032
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MX9306826A MX9306826A (es) | 1992-11-03 | 1993-11-03 | Aparato de seleccion automatica de reloj de prueba. |
Country Status (9)
Country | Link |
---|---|
US (1) | US5517109A (es) |
EP (1) | EP0596435A1 (es) |
JP (1) | JPH06201788A (es) |
KR (1) | KR940012799A (es) |
CN (1) | CN1095872A (es) |
MX (1) | MX9306826A (es) |
MY (1) | MY109842A (es) |
SG (1) | SG92594A1 (es) |
TW (1) | TW255052B (es) |
Families Citing this family (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2315347B (en) * | 1993-08-23 | 1998-04-01 | Advanced Risc Mach Ltd | Testing integrated circuits |
US5982188A (en) * | 1994-07-29 | 1999-11-09 | Stmicroelectronics, Inc. | Test mode control circuit of an integrated circuit device |
US5614838A (en) * | 1995-11-03 | 1997-03-25 | International Business Machines Corporation | Reduced power apparatus and method for testing high speed components |
DE19615745A1 (de) * | 1996-04-20 | 1997-10-23 | Philips Patentverwaltung | Meßschaltung |
JPH09318704A (ja) * | 1996-05-30 | 1997-12-12 | Ando Electric Co Ltd | Ic試験装置 |
US6259674B1 (en) | 1998-07-30 | 2001-07-10 | Siemens Information And Communication Networks, Inc. | Device and method for automatic initialization of a multi-mode interface controller |
US6760857B1 (en) * | 2000-02-18 | 2004-07-06 | Rambus Inc. | System having both externally and internally generated clock signals being asserted on the same clock pin in normal and test modes of operation respectively |
JP4980538B2 (ja) * | 2000-03-24 | 2012-07-18 | トムソン ライセンシング | 集積回路用の制御および検査が可能な発振器装置 |
US6794919B1 (en) * | 2000-09-29 | 2004-09-21 | Intel Corporation | Devices and methods for automatically producing a clock signal that follows the master clock signal |
SG108251A1 (en) * | 2001-05-03 | 2005-01-28 | Ibm | Innovative bypass circuit for circuit testing and modification |
US7080304B2 (en) * | 2002-02-26 | 2006-07-18 | Teradyne, Inc. | Technique for programming clocks in automatic test system |
US7284143B2 (en) * | 2003-12-29 | 2007-10-16 | Texas Instruments Incorporated | System and method for reducing clock skew |
US7038506B2 (en) * | 2004-03-23 | 2006-05-02 | Stmicroelectronics Pvt. Ltd. | Automatic selection of an on-chip ancillary internal clock generator upon resetting a digital system |
JP2006039693A (ja) * | 2004-07-23 | 2006-02-09 | Matsushita Electric Ind Co Ltd | 半導体装置 |
US20070200597A1 (en) * | 2006-02-28 | 2007-08-30 | Oakland Steven F | Clock generator having improved deskewer |
WO2010056343A2 (en) * | 2008-11-14 | 2010-05-20 | Teradyne, Inc. | Fast open circuit detection for open power and ground pins |
US8461934B1 (en) * | 2010-10-26 | 2013-06-11 | Marvell International Ltd. | External oscillator detector |
JP2015088876A (ja) | 2013-10-30 | 2015-05-07 | セイコーエプソン株式会社 | 振動素子、振動子、電子デバイス、電子機器及び移動体 |
JP2015088931A (ja) * | 2013-10-30 | 2015-05-07 | セイコーエプソン株式会社 | 発振回路、発振器、発振器の製造方法、電子機器及び移動体 |
JP6206664B2 (ja) | 2013-10-30 | 2017-10-04 | セイコーエプソン株式会社 | 発振回路、発振器、発振器の製造方法、電子機器及び移動体 |
JP2015088930A (ja) | 2013-10-30 | 2015-05-07 | セイコーエプソン株式会社 | 発振回路、発振器、発振器の製造方法、電子機器及び移動体 |
JP6226127B2 (ja) | 2013-10-30 | 2017-11-08 | セイコーエプソン株式会社 | 発振回路、発振器、発振器の製造方法、電子機器及び移動体 |
JP6344544B2 (ja) * | 2013-11-11 | 2018-06-20 | セイコーエプソン株式会社 | 発振器の製造方法、半導体回路装置の製造方法及び半導体回路装置 |
JP2015159369A (ja) * | 2014-02-21 | 2015-09-03 | アルプス電気株式会社 | 発振回路及びこれを有する半導体集積回路装置 |
CN108120917B (zh) * | 2016-11-29 | 2020-05-05 | 深圳市中兴微电子技术有限公司 | 测试时钟电路确定方法及装置 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3675127A (en) * | 1970-12-28 | 1972-07-04 | Bell Telephone Labor Inc | Gated-clock time measurement apparatus including granularity error elimination |
US4293870A (en) * | 1980-01-31 | 1981-10-06 | Rca Corporation | Circuit arrangement for multiplexing an input function and an output function at a single terminal |
US4272777A (en) * | 1980-02-08 | 1981-06-09 | Rca Corporation | Service switch apparatus |
US4365203A (en) * | 1981-02-05 | 1982-12-21 | General Electric Company | Multi-frequency clock generator with error-free frequency switching |
GB8432458D0 (en) * | 1984-12-21 | 1985-02-06 | Plessey Co Plc | Integrated circuits |
US4800564A (en) * | 1986-09-29 | 1989-01-24 | International Business Machines Corporation | High performance clock system error detection and fault isolation |
US5079623A (en) * | 1990-04-30 | 1992-01-07 | Thomson Consumer Electronics, Inc. | Signal clamp for a dual function input terminal of a "one-chip" television signal processing IC |
US5065042A (en) * | 1990-08-01 | 1991-11-12 | Vlsi Technology, Inc. | Self-configuring clock interface circuit |
US5066868A (en) * | 1990-08-13 | 1991-11-19 | Thomson Consumer Electronics, Inc. | Apparatus for generating phase shifted clock signals |
JPH04282913A (ja) * | 1991-03-12 | 1992-10-08 | Nec Corp | バイパス回路内蔵形半導体集積回路 |
-
1993
- 1993-10-29 TW TW082109069A patent/TW255052B/zh active
- 1993-11-01 MY MYPI93002278A patent/MY109842A/en unknown
- 1993-11-02 JP JP5306963A patent/JPH06201788A/ja active Pending
- 1993-11-02 CN CN93119600A patent/CN1095872A/zh active Pending
- 1993-11-02 KR KR1019930023062A patent/KR940012799A/ko active IP Right Grant
- 1993-11-02 EP EP93117659A patent/EP0596435A1/en not_active Withdrawn
- 1993-11-02 SG SG9602538A patent/SG92594A1/en unknown
- 1993-11-03 MX MX9306826A patent/MX9306826A/es not_active IP Right Cessation
-
1995
- 1995-01-26 US US08/378,765 patent/US5517109A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
CN1095872A (zh) | 1994-11-30 |
TW255052B (es) | 1995-08-21 |
EP0596435A1 (en) | 1994-05-11 |
SG92594A1 (en) | 2002-11-19 |
US5517109A (en) | 1996-05-14 |
JPH06201788A (ja) | 1994-07-22 |
KR940012799A (ko) | 1994-06-24 |
MY109842A (en) | 1997-08-30 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FG | Grant or registration | ||
MM | Annulment or lapse due to non-payment of fees |