KR970030218A - 알루미나 세라믹을 이용한 기판의 제조방법 - Google Patents
알루미나 세라믹을 이용한 기판의 제조방법 Download PDFInfo
- Publication number
- KR970030218A KR970030218A KR1019950043682A KR19950043682A KR970030218A KR 970030218 A KR970030218 A KR 970030218A KR 1019950043682 A KR1019950043682 A KR 1019950043682A KR 19950043682 A KR19950043682 A KR 19950043682A KR 970030218 A KR970030218 A KR 970030218A
- Authority
- KR
- South Korea
- Prior art keywords
- substrate
- attaching
- manufacturing
- copper
- alumina
- Prior art date
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 9
- PNEYBMLMFCGWSK-UHFFFAOYSA-N Alumina Chemical compound [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 title claims abstract 8
- 238000004519 manufacturing process Methods 0.000 title claims abstract 4
- 239000010949 copper Substances 0.000 claims abstract 8
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims abstract 6
- 239000000919 ceramic Substances 0.000 claims abstract 5
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract 4
- 239000004593 Epoxy Substances 0.000 claims abstract 4
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 claims abstract 4
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims abstract 4
- 239000011248 coating agent Substances 0.000 claims abstract 4
- 238000000576 coating method Methods 0.000 claims abstract 4
- 229910052802 copper Inorganic materials 0.000 claims abstract 4
- 239000010931 gold Substances 0.000 claims abstract 4
- 238000000034 method Methods 0.000 claims abstract 4
- 229910052709 silver Inorganic materials 0.000 claims abstract 4
- 239000004332 silver Substances 0.000 claims abstract 4
- 239000010936 titanium Substances 0.000 claims abstract 4
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims abstract 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims abstract 2
- 229910052737 gold Inorganic materials 0.000 claims abstract 2
- 229910052759 nickel Inorganic materials 0.000 claims abstract 2
- 229910052763 palladium Inorganic materials 0.000 claims abstract 2
- 229910000679 solder Inorganic materials 0.000 claims abstract 2
- 238000004544 sputter deposition Methods 0.000 claims abstract 2
- 229910052719 titanium Inorganic materials 0.000 claims abstract 2
- 108091008695 photoreceptors Proteins 0.000 claims 2
- 229910018072 Al 2 O 3 Inorganic materials 0.000 claims 1
- 238000009713 electroplating Methods 0.000 claims 1
- 239000004020 conductor Substances 0.000 abstract 1
- 229910052593 corundum Inorganic materials 0.000 abstract 1
- 229910001845 yogo sapphire Inorganic materials 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
- H05K1/0306—Inorganic insulating substrates, e.g. ceramic, glass
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/58—Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries
- H01L23/64—Impedance arrangements
- H01L23/66—High-frequency adaptations
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/285—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
- H01L21/28506—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers
- H01L21/28512—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table
- H01L21/2855—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table by physical means, e.g. sputtering, evaporation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/288—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition
- H01L21/2885—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition using an external electrical current, i.e. electro-deposition
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Inorganic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Manufacturing Of Printed Wiring (AREA)
Abstract
본 발명은 알루미나 세라믹을 이용한 기판의 제조 방법에 관한 것으로, 특히 고순도의 알루미나 세라믹을 이용하여 제작하여 매우 높은 주파수를 사용하는 RF 전력 분배기 등에 사용할 수 있는 알루미나 세라믹을 이용한 기판의 제조방법에 관한 것으로, 알루미나(Al₂O₃) 세라믹 기판에 티타늄(Ti), 파라듐(Pb), 그리고 구리(Cu) 등을 차례로 D·C 스퍼터링 방식으로 소정의 두께로 입히는 단계와, 음성 감광체를 기판에 부착한 다음 설계된 회로의 마스크를 대고 자외선 단색 광원으로 음성 감광체를 감광시킨 후 현상 공정을 거쳐 불필요한 감광체를 제거하는 단계와, 전도체인 구리(Cu), 니켈(Ni), 그리고 금(Au)을 차례로 전기 도금 방식으로 소정의 두께로 입힌 다음 하우징에 은 에폭시로 접합하는 단계와, 소정의 위치에 은 에폭시를 사용하여 커넥터를 부착하고 2Ag/62Sn/36Pn의 솔더를 이용하여 소자 및 핀 등을 부착하는 단계로 이루어진다.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명에 따라 제작된 기판의 단면도.
Claims (1)
- 알루미나(Al2O3) 세라믹 기판에 티타늄(Ti), 파라듐(Pb), 그리고 구리(Cu) 등을 차례로 D·C 스퍼터링 방식으로 소정의 두께로 입히는 단계와, 음성 감광체를 기판에 부착한 다음 설계된 회로의 마스크를 대고 자외선 단색 광원으로 음성 감광체를 감광시킨 후 현상 공정을 거쳐 불필요한 감광체를 제거하는 단계와, 전도체인 구리(Cu), 니켈(Ni), 그리고 금(Au)을 차례로 전기 도금 방식으로 소정의 두께로 입힌 다음 하우징에 은 에폭시로 접합하는 단계와, 소정의 위치에 은 에폭시를 사용하여 커넥터를 부착하고 2Ag/62Sn/36Pn의 솔더를 이용하여 소자 및 핀 등을 부착하는 단계로 이루어지는 것을 특징으로 하는 알루미나 세라믹을 이용한 기판의 제조 방법.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950043682A KR100188227B1 (ko) | 1995-11-24 | 1995-11-24 | 알루미나를 이용한 기판의 제조방법 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950043682A KR100188227B1 (ko) | 1995-11-24 | 1995-11-24 | 알루미나를 이용한 기판의 제조방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR970030218A true KR970030218A (ko) | 1997-06-26 |
KR100188227B1 KR100188227B1 (ko) | 1999-06-01 |
Family
ID=19435691
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019950043682A KR100188227B1 (ko) | 1995-11-24 | 1995-11-24 | 알루미나를 이용한 기판의 제조방법 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR100188227B1 (ko) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100467200B1 (ko) * | 2002-03-28 | 2005-01-24 | (주) 케이엠씨 테크놀러지 | 이동통신용 세라믹 고주파 전력분배기 제조방법 |
-
1995
- 1995-11-24 KR KR1019950043682A patent/KR100188227B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR100188227B1 (ko) | 1999-06-01 |
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A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20011224 Year of fee payment: 4 |
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LAPS | Lapse due to unpaid annual fee |