KR970013239A - 반도체장치 및 그 실장 구조 - Google Patents

반도체장치 및 그 실장 구조 Download PDF

Info

Publication number
KR970013239A
KR970013239A KR1019960034225A KR19960034225A KR970013239A KR 970013239 A KR970013239 A KR 970013239A KR 1019960034225 A KR1019960034225 A KR 1019960034225A KR 19960034225 A KR19960034225 A KR 19960034225A KR 970013239 A KR970013239 A KR 970013239A
Authority
KR
South Korea
Prior art keywords
semiconductor element
semiconductor device
connection terminal
substrate
mounting
Prior art date
Application number
KR1019960034225A
Other languages
English (en)
Other versions
KR100231589B1 (ko
Inventor
미쓰토시 히가시
하지메 이이즈까
께이 무라야마
Original Assignee
모기 쥰이찌
신꼬오덴기 고오교오 가부시끼가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 모기 쥰이찌, 신꼬오덴기 고오교오 가부시끼가이샤 filed Critical 모기 쥰이찌
Publication of KR970013239A publication Critical patent/KR970013239A/ko
Application granted granted Critical
Publication of KR100231589B1 publication Critical patent/KR100231589B1/ko

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/56Encapsulations, e.g. encapsulation layers, coatings
    • H01L21/563Encapsulation of active face of flip-chip device, e.g. underfilling or underencapsulation of flip-chip, encapsulation preform on chip or mounting substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/12Mountings, e.g. non-detachable insulating substrates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/12Mountings, e.g. non-detachable insulating substrates
    • H01L23/13Mountings, e.g. non-detachable insulating substrates characterised by the shape
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/498Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
    • H01L23/49811Additional leads joined to the metallisation on the insulating substrate, e.g. pins, bumps, wires, flat leads
    • H01L23/49816Spherical bumps on the substrate for external connection, e.g. ball grid arrays [BGA]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32225Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73201Location after the connecting process on the same surface
    • H01L2224/73203Bump and layer connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73201Location after the connecting process on the same surface
    • H01L2224/73203Bump and layer connectors
    • H01L2224/73204Bump and layer connectors the bump connector being embedded into the layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73253Bump and layer connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01079Gold [Au]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1532Connection portion the connection portion being formed on the die mounting surface of the substrate
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0201Thermal arrangements, e.g. for cooling, heating or preventing overheating
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/303Surface mounted components, e.g. affixing before soldering, aligning means, spacing means
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/341Surface mounted components
    • H05K3/3431Leadless components
    • H05K3/3436Leadless components having an array of bottom contacts, e.g. pad grid array or ball grid array components

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Wire Bonding (AREA)
  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)

Abstract

본 발명은 탑재한 반도체소자의 양면측에서 방열할 수 있는 방열성이 개선된 반도체장치를 제공하는데 있다. 기판(10)에 탑재된 반도체소자(14)의 일면측에 구비된 접속단자(16)와 반도체소자(14)의 탑재면 근방의 기판면에 배치설비된 외부접속단자가 상기 기판면에 형성된 도체패턴(12)을 거쳐서 접합되고, 또 반도체소자(14)의 접속단자(16)와 도체패턴(12)의 일단의 접속부가 봉지수지에 의해서 봉지된 반도체장치에 있어서, 반도체소자(14)의 일면측에 형성된 접속단자(16)와 상기 기판면에 형성된 도체패턴(12)의 일단이 플립칩본딩방식으로 접속되고, 또 반도체소자(14)의 다른 면측이 봉지수지에 의해서 형성된 수지봉지층(17)으로부터 노출되는 것을 특징으로 한다.

Description

반도체장치 및 그 실장 구조
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명에 관한 일실시태양을 설명하기 위한 종단면도.

Claims (10)

  1. 기판에 탑재된 반도체소자의 일면측에 구비된 접속단자와, 상기 반도체소자의 탑재부 근방의 기판면에 배치설비된 외부접속단자가 상기 기판면에 형성된 도체패턴을 거쳐서 접속되고, 또 반도체소자의 접속단자와 도체패턴의 일단의 접속부가 봉지수지에 의해서 봉지되어 되는 반도체장치에 있어서, 반도체소자의 일면측에 구비된 접속단자와, 상기 기판면에 형성된 도체패턴의 일단이 플립칩본딩방식으로 접속되고, 또 반도체소자의 다른 면측이 봉지수지에 의해서 형성된 수지봉지층으로부터 노출되는 것을 특징으로 하는 반도체장치.
  2. 제1항에 있어서, 외부접속단자 납땜 볼인 것을 특징인 반도체장치.
  3. 제1항 또는 제2항에 있어서, 외부접속단자가 외부접속단자를 실장기판의 회로에 접속하여 반도체장치를 실장했을 때 반도체소자의 노출면이 실장기판면에 실질적으로 맞닿도록 높이가 조정되어 있는 것이 특징인 반도체장치.
  4. 제1항 내지 제3항중 어느 한항에 있어서, 기판이 가요성 필름에 의해서 형성된 플렉시블배선기판으로서, 일면측에 반도체소자의 탑재부가 형성된 플렉시블배선 기판의 다른 면측에, 상기 탑재부에 상당하는 부분에 공간부가 형성된 프레임보디가 방열체로서 피착되어 있는 것을 특징인 반도체장치.
  5. 제1항 내지 제4항중 어느 한항에 있어서, 프레임보디가 금속프레임보디인 것을 특징인 반도체장치.
  6. 기판에 탑재된 반도체소자의 일면측에 구비된 접속단자와, 상기 반도체소자의 탑재부 근방의 기판면에 배치설비된 외부접속단자가 상기 기판면에 형성된 도페패턴을 거쳐서 접속되고, 또 반도체소자의 접속단자와 도체패턴의 일단의 접속부가 봉지수지에 의해서 봉지되어 되는 반도체장치가 실장기판에 실장된 반도체장치의 실장구조에 있어서, 실장기판에 실장된 반도체장치가 반도체소자의 일면측에 형성된 접속단자와, 상기 기판면에 형성된 도체패턴의 일단이 플립칩본딩방식으로 접속된 반도체장치로서, 상기 반도체장치의 외부접속단자가 실장기관의 회로패턴과 접속되어 있는 동시에, 상기 봉지수지에 의해서 형성된 봉지수지층으로부터 노출하는 반도체소자의 다른 면측이 실장기판면에 실질적으로 맞닿아 있는 것이 특징인 반도체장치의 실장구조.
  7. 제6항에 있어서, 외부접속단자가 납땜 볼인 것이 특징인 반도체장치의 실장구조.
  8. 제6항 또는 제7항에 있어서, 기판이 가요설필름에 의해서 형성된 플렉시블배선기판으로서, 일면측에 반도체소자의 탑재부가 형성된 플렉시블배선기판의 다른 면측에, 상기 탑재부에 상당하는 부분에 공간부가 형성된 프레임보디가 방열체로서 피착된 반도체장치가 사용되는 것이 특징인 반도체장치의 실장구조.
  9. 제6항 내지 제8중에 어느 한항에 있어서, 반도체소자의 다른 면측과 실장기판의 기판면 사이에 금속분말이 혼합된 열전도성접착제층이 형성되어 있는 것을 특징인 반도체장치의 실장구조.
  10. 제6항 내지 제9항중 어느 한항에 있어서, 반도체소자의 다른 면측이 맞닿는 실장기판의 영역에, 금속층이 구비되어 있는 것이 특징인 반도체장치의 실장구조.
KR1019960034225A 1995-08-23 1996-08-19 반도체장치 및 그 실장구조 KR100231589B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP95214466 1995-08-23
JP21446695A JP3549294B2 (ja) 1995-08-23 1995-08-23 半導体装置及びその実装構造
JP95-214466 1995-08-23

Publications (2)

Publication Number Publication Date
KR970013239A true KR970013239A (ko) 1997-03-29
KR100231589B1 KR100231589B1 (ko) 1999-11-15

Family

ID=16656195

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019960034225A KR100231589B1 (ko) 1995-08-23 1996-08-19 반도체장치 및 그 실장구조

Country Status (3)

Country Link
US (1) US5777386A (ko)
JP (1) JP3549294B2 (ko)
KR (1) KR100231589B1 (ko)

Families Citing this family (53)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6848173B2 (en) 1994-07-07 2005-02-01 Tessera, Inc. Microelectric packages having deformed bonded leads and methods therefor
US6486003B1 (en) * 1996-12-13 2002-11-26 Tessera, Inc. Expandable interposer for a microelectronic package and method therefor
US7149095B2 (en) * 1996-12-13 2006-12-12 Tessera, Inc. Stacked microelectronic assemblies
US6225688B1 (en) * 1997-12-11 2001-05-01 Tessera, Inc. Stacked microelectronic assembly and method therefor
US5900675A (en) * 1997-04-21 1999-05-04 International Business Machines Corporation Organic controlled collapse chip connector (C4) ball grid array (BGA) chip carrier with dual thermal expansion rates
US6440750B1 (en) 1997-06-10 2002-08-27 Agere Systems Guardian Corporation Method of making integrated circuit having a micromagnetic device
US6118351A (en) * 1997-06-10 2000-09-12 Lucent Technologies Inc. Micromagnetic device for power processing applications and method of manufacture therefor
US6180261B1 (en) * 1997-10-21 2001-01-30 Nitto Denko Corporation Low thermal expansion circuit board and multilayer wiring circuit board
JP3460559B2 (ja) * 1997-12-12 2003-10-27 セイコーエプソン株式会社 半導体装置及びその製造方法、回路基板並びに電子機器
JPH11204699A (ja) * 1998-01-09 1999-07-30 Sony Corp 半導体装置とその製造方法と電子装置
US6362530B1 (en) * 1998-04-06 2002-03-26 National Semiconductor Corporation Manufacturing methods and construction for integrated circuit packages
US6156980A (en) * 1998-06-04 2000-12-05 Delco Electronics Corp. Flip chip on circuit board with enhanced heat dissipation and method therefor
US6224711B1 (en) * 1998-08-25 2001-05-01 International Business Machines Corporation Assembly process for flip chip package having a low stress chip and resulting structure
US6130477A (en) * 1999-03-17 2000-10-10 Chen; Tsung-Chieh Thin enhanced TAB BGA package having improved heat dissipation
US6137174A (en) * 1999-05-26 2000-10-24 Chipmos Technologies Inc. Hybrid ASIC/memory module package
US6255714B1 (en) 1999-06-22 2001-07-03 Agere Systems Guardian Corporation Integrated circuit having a micromagnetic device including a ferromagnetic core and method of manufacture therefor
US6255143B1 (en) * 1999-08-04 2001-07-03 St. Assembly Test Services Pte Ltd. Flip chip thermally enhanced ball grid array
US7394153B2 (en) * 1999-12-17 2008-07-01 Osram Opto Semiconductors Gmbh Encapsulation of electronic devices
EP1240808B1 (en) 1999-12-17 2003-05-21 Osram Opto Semiconductors GmbH Encapsulation for organic led device
CN1264057C (zh) 1999-12-17 2006-07-12 奥斯兰姆奥普托半导体有限责任公司 有机发光二极管器件封装装置及方法
US6507118B1 (en) 2000-07-14 2003-01-14 3M Innovative Properties Company Multi-metal layer circuit
JP4544724B2 (ja) * 2000-10-30 2010-09-15 京セラ株式会社 半導体装置
US6469384B2 (en) * 2001-02-01 2002-10-22 Fairchild Semiconductor Corporation Unmolded package for a semiconductor device
JP2002250826A (ja) * 2001-02-22 2002-09-06 Nec Corp チップ、チップの製造方法およびチップ収容モジュール
US6472743B2 (en) * 2001-02-22 2002-10-29 Siliconware Precision Industries, Co., Ltd. Semiconductor package with heat dissipating structure
US6562656B1 (en) 2001-06-25 2003-05-13 Thin Film Module, Inc. Cavity down flip chip BGA
US7061077B2 (en) 2002-08-30 2006-06-13 Fairchild Semiconductor Corporation Substrate based unmolded package including lead frame structure and semiconductor die
EP1556895A4 (en) * 2002-10-08 2009-12-30 Chippac Inc SEMICONDUCTOR STACKED MULTIPLE CAPSULATION MODULE WITH INVERTED SECOND CAPACITY
US7781873B2 (en) * 2003-04-28 2010-08-24 Kingston Technology Corporation Encapsulated leadframe semiconductor package for random access memory integrated circuits
JP2004327920A (ja) * 2003-04-28 2004-11-18 Sharp Corp 半導体装置の製造方法、フレキシブル基板及び半導体装置
US6864116B1 (en) * 2003-10-01 2005-03-08 Optopac, Inc. Electronic package of photo-sensing semiconductor devices, and the fabrication and assembly thereof
US8641913B2 (en) 2003-10-06 2014-02-04 Tessera, Inc. Fine pitch microcontacts and method for forming thereof
US7495179B2 (en) 2003-10-06 2009-02-24 Tessera, Inc. Components with posts and pads
US7709968B2 (en) * 2003-12-30 2010-05-04 Tessera, Inc. Micro pin grid array with pin motion isolation
US7196313B2 (en) * 2004-04-02 2007-03-27 Fairchild Semiconductor Corporation Surface mount multi-channel optocoupler
JP4613536B2 (ja) * 2004-07-12 2011-01-19 セイコーエプソン株式会社 半導体素子実装基板、電気光学装置、電子機器
US7405474B1 (en) * 2004-10-12 2008-07-29 Cypress Semiconductor Corporation Low cost thermally enhanced semiconductor package
CN101807533B (zh) 2005-06-30 2016-03-09 费查尔德半导体有限公司 半导体管芯封装及其制作方法
JP5183949B2 (ja) * 2007-03-30 2013-04-17 日本電気株式会社 半導体装置の製造方法
EP2206145A4 (en) 2007-09-28 2012-03-28 Tessera Inc FLIP-CHIP CONNECTION WITH DOUBLE POSTS
US20090184416A1 (en) * 2008-01-22 2009-07-23 Yinon Degani MCM packages
JP5238274B2 (ja) * 2008-01-31 2013-07-17 日東電工株式会社 配線回路基板およびその製造方法
DE102009006757B3 (de) * 2009-01-30 2010-08-19 Continental Automotive Gmbh Lötstopplack-Beschichtung für starrbiegsame Leiterplatten
US7973393B2 (en) * 2009-02-04 2011-07-05 Fairchild Semiconductor Corporation Stacked micro optocouplers and methods of making the same
JP2010010693A (ja) * 2009-07-31 2010-01-14 Seiko Epson Corp 実装装置、及び半導体素子実装基板の製造方法
US8330272B2 (en) 2010-07-08 2012-12-11 Tessera, Inc. Microelectronic packages with dual or multiple-etched flip-chip connectors
US8580607B2 (en) 2010-07-27 2013-11-12 Tessera, Inc. Microelectronic packages with nanoparticle joining
US8853558B2 (en) 2010-12-10 2014-10-07 Tessera, Inc. Interconnect structure
JP5951967B2 (ja) * 2011-11-22 2016-07-13 日本碍子株式会社 大容量モジュールの周辺回路用の回路基板および当該回路基板を用いる周辺回路を含む大容量モジュール
US9633971B2 (en) 2015-07-10 2017-04-25 Invensas Corporation Structures and methods for low temperature bonding using nanoparticles
US10886250B2 (en) 2015-07-10 2021-01-05 Invensas Corporation Structures and methods for low temperature bonding using nanoparticles
TWI822659B (zh) 2016-10-27 2023-11-21 美商艾德亞半導體科技有限責任公司 用於低溫接合的結構和方法
US11542152B2 (en) * 2019-07-29 2023-01-03 Stmicroelectronics, Inc. Semiconductor package with flexible interconnect

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5155661A (en) * 1991-05-15 1992-10-13 Hewlett-Packard Company Aluminum nitride multi-chip module
KR100280762B1 (ko) * 1992-11-03 2001-03-02 비센트 비.인그라시아 노출 후부를 갖는 열적 강화된 반도체 장치 및 그 제조방법
US5616958A (en) * 1995-01-25 1997-04-01 International Business Machines Corporation Electronic package

Also Published As

Publication number Publication date
US5777386A (en) 1998-07-07
JP3549294B2 (ja) 2004-08-04
JPH0964099A (ja) 1997-03-07
KR100231589B1 (ko) 1999-11-15

Similar Documents

Publication Publication Date Title
KR970013239A (ko) 반도체장치 및 그 실장 구조
KR100694739B1 (ko) 다수의 전원/접지면을 갖는 볼 그리드 어레이 패키지
US6188578B1 (en) Integrated circuit package with multiple heat dissipation paths
US5642261A (en) Ball-grid-array integrated circuit package with solder-connected thermal conductor
JP3150351B2 (ja) 電子装置及びその製造方法
US5991156A (en) Ball grid array integrated circuit package with high thermal conductivity
KR100391093B1 (ko) 히트 싱크가 부착된 볼 그리드 어레이 패키지
US20040109292A1 (en) Reversible heat sink packaging assembly for an integrated circuit
US5869889A (en) Thin power tape ball grid array package
KR970013236A (ko) 금속 회로 기판을 갖는 칩 스케일 패키지
KR940010293A (ko) 파워모듈
KR930011240A (ko) 반도체 모듈
KR960035993A (ko) 반도체장치
US6396699B1 (en) Heat sink with chip die EMC ground interconnect
KR19990006272A (ko) 반도체 패키지 및 이것을 사용한 반도체 모듈
JPS6221249A (ja) 半導体装置
KR960002775A (ko) 수지-봉합(resin-sealed) 반도체 소자
JPH0382060A (ja) 半導体装置
US7019410B1 (en) Die attach material for TBGA or flexible circuitry
US6265769B1 (en) Double-sided chip mount package
KR20000045081A (ko) 반도체패키지 구조
KR100532863B1 (ko) 탄성 중합체를 사용하는 반도체 패키지
KR20020088300A (ko) 냉매를 방열재로 사용한 반도체 패키지
KR100388291B1 (ko) 반도체패키지 구조
KR970077561A (ko) 금속 기판을 이용한 칩 스케일 패키지(Chip Scale Package)

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
FPAY Annual fee payment

Payment date: 20130822

Year of fee payment: 15

FPAY Annual fee payment

Payment date: 20140825

Year of fee payment: 16

LAPS Lapse due to unpaid annual fee