KR960042216A - 샌드블라스트레지스트용 감광성수지조성물 - Google Patents
샌드블라스트레지스트용 감광성수지조성물 Download PDFInfo
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- KR960042216A KR960042216A KR1019960014114A KR19960014114A KR960042216A KR 960042216 A KR960042216 A KR 960042216A KR 1019960014114 A KR1019960014114 A KR 1019960014114A KR 19960014114 A KR19960014114 A KR 19960014114A KR 960042216 A KR960042216 A KR 960042216A
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- compound
- component
- resin composition
- photosensitive resin
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- 239000011342 resin composition Substances 0.000 title claims abstract description 16
- 150000001875 compounds Chemical class 0.000 claims abstract 15
- -1 urethane compound Chemical class 0.000 claims abstract 14
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims abstract 10
- 229920000642 polymer Polymers 0.000 claims abstract 10
- 229920000728 polyester Polymers 0.000 claims abstract 8
- 239000004721 Polyphenylene oxide Substances 0.000 claims abstract 5
- 239000002253 acid Substances 0.000 claims abstract 5
- 229920000570 polyether Polymers 0.000 claims abstract 5
- NIXOWILDQLNWCW-UHFFFAOYSA-M acrylate group Chemical group C(C=C)(=O)[O-] NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 claims abstract 4
- 238000005488 sandblasting Methods 0.000 claims abstract 4
- 239000000178 monomer Substances 0.000 claims abstract 3
- 150000002009 diols Chemical class 0.000 claims abstract 2
- 238000005530 etching Methods 0.000 claims abstract 2
- 239000003999 initiator Substances 0.000 claims abstract 2
- 150000002596 lactones Chemical class 0.000 claims abstract 2
- 229920000515 polycarbonate Polymers 0.000 claims abstract 2
- 239000004417 polycarbonate Substances 0.000 claims abstract 2
- 239000008240 homogeneous mixture Substances 0.000 claims 3
- 238000000034 method Methods 0.000 claims 3
- CERQOIWHTDAKMF-UHFFFAOYSA-N Methacrylic acid Chemical compound CC(=C)C(O)=O CERQOIWHTDAKMF-UHFFFAOYSA-N 0.000 claims 2
- 125000002947 alkylene group Chemical group 0.000 claims 2
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 claims 2
- 229920003145 methacrylic acid copolymer Polymers 0.000 claims 2
- 125000004122 cyclic group Chemical group 0.000 claims 1
- 238000001035 drying Methods 0.000 claims 1
- 125000001033 ether group Chemical group 0.000 claims 1
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims 1
- 125000001261 isocyanato group Chemical group *N=C=O 0.000 claims 1
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 claims 1
- 239000000203 mixture Substances 0.000 claims 1
- 239000000088 plastic resin Substances 0.000 claims 1
- 238000006116 polymerization reaction Methods 0.000 claims 1
- 125000005373 siloxane group Chemical group [SiH2](O*)* 0.000 claims 1
- 238000001459 lithography Methods 0.000 abstract 1
- 239000000463 material Substances 0.000 abstract 1
- 238000000059 patterning Methods 0.000 abstract 1
- 238000007151 ring opening polymerisation reaction Methods 0.000 abstract 1
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24C—ABRASIVE OR RELATED BLASTING WITH PARTICULATE MATERIAL
- B24C3/00—Abrasive blasting machines or devices; Plants
- B24C3/32—Abrasive blasting machines or devices; Plants designed for abrasive blasting of particular work, e.g. the internal surfaces of cylinder blocks
- B24C3/322—Abrasive blasting machines or devices; Plants designed for abrasive blasting of particular work, e.g. the internal surfaces of cylinder blocks for electrical components
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24C—ABRASIVE OR RELATED BLASTING WITH PARTICULATE MATERIAL
- B24C1/00—Methods for use of abrasive blasting for producing particular effects; Use of auxiliary equipment in connection with such methods
- B24C1/04—Methods for use of abrasive blasting for producing particular effects; Use of auxiliary equipment in connection with such methods for treating only selected parts of a surface, e.g. for carving stone or glass
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
- G03F7/032—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders
- G03F7/033—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders the binders being polymers obtained by reactions only involving carbon-to-carbon unsaturated bonds, e.g. vinyl polymers
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
- G03F7/032—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders
- G03F7/035—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders the binders being polyurethanes
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/12—Production of screen printing forms or similar printing forms, e.g. stencils
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
- Y10S430/1053—Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
- Y10S430/1055—Radiation sensitive composition or product or process of making
- Y10S430/106—Binder containing
- Y10S430/111—Polymer of unsaturated acid or ester
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
- Y10S430/1053—Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
- Y10S430/1055—Radiation sensitive composition or product or process of making
- Y10S430/106—Binder containing
- Y10S430/112—Cellulosic
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials For Photolithography (AREA)
- Macromonomer-Based Addition Polymer (AREA)
- Manufacturing Of Printed Circuit Boards (AREA)
Abstract
Description
Claims (14)
- (a) 분자사슬말단에 히드록시기를 지닌 폴리에테르 또는 폴리에스테르화합물과, 디이소시아네이트화합물과, 히드록시기를 지닌 (메타)아크릴레이트화합물로부터 얻어진, 분자말단에 (메타)아크릴레이트기를 지닌 우레탄화합물 100중량부; (b) 상기 (a) 성분과 (b) 성분과의 중량비가 30 : 70~95 : 5 범위내의 양이 되도록 한산가 50~250mgKOH/g의 알칼리가용성고분자화합물 및 (c) 광중합개시제, 0.1~20중량부를 균일한 혼합물로서 함유한 것을 특징으로 하는 샌드블라스팅에 대해서 레지스트로서 이용하기에 적합한 감광성수지조성물.
- 제1항에 있어서, 상기 (a)성분을 형성하는, 분자사슬말단에 히드록시기를 지닌 폴리에스테르화합물은 락톤모노머의 고리열림중합에 의한 중합체인 것을 특징으로 하는 감광성수지조성물.
- 제1항에 있어서, 상기 (a)성분을 형성하는, 분자사슬말단에 히드록시기를 지닌 폴리에스테르화합물을 폴리카보네이트디올인 것을 특징으로 하는 감광성수지조성물.
- 제1항에 있어서, 상기 (a)성분의 우레탄화합물을 일반식, CH2=CR2-CO-O-R1-(NH-CO-O-R3-O-CO-NH-R4-NH-CO-O-R3-O-CO-NH)n-R1-O-CO-CR|2=CH2(식중, R1은 알킬렌기 또는 알킬렌에테르기, R2는 수소원자 또는 메틸기, R3은 2개의 이소시아네이토기가 제거된 디이소시아네이트화합물의 레지듀, R4는 폴리에테르 또는 폴리에스테르화합물의 레지듀, n은 5이하의 양의 정수)으로 표시되는 것을 특징으로 하는 감광성수지조성물.
- 제1항에 있어서, 상기 (a)성분의 우레탄화합물의 분자량은 1000~30000 범위내인 것을 특징으로 하는 감광성수지조성물.
- 제1항에 있어서, 상기 (b)성분의 알칼리가용성고분자화합물은 (메타)아크릴산과 (메타)아크릴산에스테르와의 공중합체 및 카르복시기함유셀롤로스화합물로 이루어진 군에서 선택한 것을 특징으로 하는 감광성수지 조성물.
- 제4항에 있어서, 상기 (b)성분의 알칼리가용성고분자화합물은 (메타)아크릴산과 (메타)아크릴산에스테르와의 공중합체이고, (a)성분과 (b)성분과의 중량비는 35:65~85:15 범위내인 것을 특징으로 하는 감광성수지 조성물.
- 제4항에 있어서, 상기 (b)성분의 알칼리가용성고분자화합물은 카르복시기함유셀롤로스화합물이고 (a)성분과 (b)성분과의 중량비는 50:50~95:5 범위내인 것을 특징으로 하는 감광성수지조성물.
- 제1항에 있어서, 상기 (b)성분의 알칼리가용성고분자화합물의 산가는 80~200mgKOH/g 범위내인 것을 특징으로 하는 감광성수지조성물.
- 제1항에 있어서, 상기 (a)성분의 100중량부에 대해서 20중량부 이하의 양으로 (d)광중합성모노머를 더 함유한 것을 특징으로 하는 감광성수지조성물.
- (A)(a) 분자사슬말단에 히드록시기를 지닌 폴리에테르 또는 폴리에스테르화합물과, 디이소시아네이트화합물과, 히드록시기를 지닌 (메타)아크릴레이트화합물로부터 얻어진, 부자말단에 (메타)아크릴레이트기를 지닌 우레탄화합물 100중량부; (b) 상기 (a)성분과 (b)성분과의 중량비가 30 : 70~95 : 5 범위내의 양이 되도록 한 산가 50~250mgKOH/g의 알칼리가용성고분자화합물; 및 (c) 광중합개시제 0.1~20중량부를 균일한 혼합물로서 함유하는, 플라스틱수지막상에 형성된 감광성수지조성물층과; (B) 상기 (A)층의 표면상에 이형으로 유연하게 적층되어 상기 (A)층을 샌드위치하는 2개의 막을 구비하는 것을 특징으로 하는, 샌드블라스팅에 대해서 레지스트로서 적합하게 적층된 감광성건조막.
- 제11항에 있어서, 상기 (A)층의 두께는 10~100㎛ 범위내인 것을 특징으로 하는 감광성건조막.
- i) (a) 분자사슬말단에 히드록시기를 지닌 폴리에테르 또는 폴리에스테르화합물과, 디이소시아네이트화합물과, 히드록시기를 지닌 (메타)아크릴레이트화합물로부터 얻어진, 분자말단에 (메타)아크릴레이트기를 지닌 우레탄화합물 100중량부; (b) 상기 (a) 성분과 (b)성분과의 중량비가 30 : 70~95 : 5 범위내의 양이 되도록 한 산가 50~250mgKOH/g의 알칼리가용성고분자화합물 및 (c) 광중합개시제 0.1~20중량부를 균일한 혼합물로서 함유한 감광성수지조성물층을 피처리체표면상에 형성하고; ii) 상기 감광성수지조성물패턴층을 화학선에 노광시켜 패턴의 잠재상을 형성하괴; iii) 경화수지조성물의 패턴층이 잔재하는 잠재상을 레지스트로서 현상하고, iv) 피처리체의 패턴이 제거된 표면을 샌드블라스팅 처리하는 단계로 이루어진 것을 특징으로 하는 피처리체표면의 패턴식각방법.
- 제13항에 있어서, 표면이 패턴식각처리된 피처리체는 플라즈마표시패널인 것을 특징으로 하는 피처리체표면의 패턴식각방법.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP95-107703 | 1995-05-01 | ||
JP10770395A JP3638660B2 (ja) | 1995-05-01 | 1995-05-01 | 感光性樹脂組成物、それを用いたサンドブラスト用感光性ドライフィルム及びそれを用いた食刻方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR960042216A true KR960042216A (ko) | 1996-12-21 |
KR100198725B1 KR100198725B1 (ko) | 1999-06-15 |
Family
ID=14465810
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019960014114A KR100198725B1 (ko) | 1995-05-01 | 1996-05-01 | 샌드블라스트레지스트용 감광성수지조성물 |
Country Status (7)
Country | Link |
---|---|
US (3) | US5756261A (ko) |
EP (1) | EP0741332B1 (ko) |
JP (1) | JP3638660B2 (ko) |
KR (1) | KR100198725B1 (ko) |
CN (1) | CN1082679C (ko) |
DE (1) | DE69609656T2 (ko) |
TW (1) | TW439014B (ko) |
Cited By (1)
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KR100519032B1 (ko) * | 2000-11-07 | 2005-10-05 | 도쿄 오카 고교 가부시키가이샤 | 샌드블래스팅용 감광성 조성물 및 이를 사용한 감광성 필름 |
Families Citing this family (40)
Publication number | Priority date | Publication date | Assignee | Title |
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TW475098B (en) * | 1995-10-27 | 2002-02-01 | Tokyo Ohka Kogyo Co Ltd | Photosensitive resin composition and photosensitive resin laminated film containing the same |
CA2217084A1 (en) * | 1996-10-30 | 1998-04-30 | Tin-Tack Peter Cheung | Hydrogenation catalysts and processes therewith |
JPH1128667A (ja) * | 1997-07-10 | 1999-02-02 | Tokyo Ohka Kogyo Co Ltd | サンドブラスト用プラスチック研磨材およびそれを用いたプラズマディスプレイパネル基板のサンドブラスト加工法、並びにサンドブラスト廃材の処理方法 |
CN1076868C (zh) * | 1997-10-22 | 2001-12-26 | 研能科技股份有限公司 | 具保护层的晶片透孔加工法 |
US6096635A (en) * | 1997-10-21 | 2000-08-01 | Microjet Technology Co., Ltd. | Method for creating via hole in chip |
CN1077722C (zh) * | 1997-10-21 | 2002-01-09 | 研能科技股份有限公司 | 具透明遮罩式晶片透孔加工法 |
TW513614B (en) | 1997-12-18 | 2002-12-11 | Nippon Synthetic Chem Ind | Photosensitive resin composition |
JPH11226874A (ja) * | 1998-02-16 | 1999-08-24 | Murata Mfg Co Ltd | 凹溝加工方法 |
JP2000066391A (ja) * | 1998-08-17 | 2000-03-03 | Tokyo Ohka Kogyo Co Ltd | サンドブラスト用感光性組成物及びそれを用いた感光性フィルム |
US6322951B1 (en) * | 1998-12-11 | 2001-11-27 | Norton International, Inc. | Photoimageable compositions having improved flexibility and stripping ability |
CN1168576C (zh) * | 1999-08-18 | 2004-09-29 | 皇家菲利浦电子有限公司 | 在板件上获得凹区或凹口图案的方法 |
KR20020006688A (ko) * | 2000-01-25 | 2002-01-24 | 고지마 아끼로, 오가와 다이스께 | 광경화성 수지 조성물 |
US20040259027A1 (en) * | 2001-04-11 | 2004-12-23 | Munnelly Heidi M. | Infrared-sensitive composition for printing plate precursors |
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-
1995
- 1995-05-01 JP JP10770395A patent/JP3638660B2/ja not_active Expired - Fee Related
-
1996
- 1996-04-26 US US08/638,189 patent/US5756261A/en not_active Expired - Lifetime
- 1996-04-26 EP EP96302975A patent/EP0741332B1/en not_active Expired - Lifetime
- 1996-04-26 DE DE69609656T patent/DE69609656T2/de not_active Expired - Fee Related
- 1996-04-26 TW TW085105015A patent/TW439014B/zh not_active IP Right Cessation
- 1996-05-01 KR KR1019960014114A patent/KR100198725B1/ko not_active IP Right Cessation
- 1996-05-01 CN CN96108446A patent/CN1082679C/zh not_active Expired - Fee Related
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1998
- 1998-02-04 US US09/018,729 patent/US5916738A/en not_active Expired - Fee Related
- 1998-02-04 US US09/018,730 patent/US5924912A/en not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100519032B1 (ko) * | 2000-11-07 | 2005-10-05 | 도쿄 오카 고교 가부시키가이샤 | 샌드블래스팅용 감광성 조성물 및 이를 사용한 감광성 필름 |
Also Published As
Publication number | Publication date |
---|---|
JPH08305017A (ja) | 1996-11-22 |
US5756261A (en) | 1998-05-26 |
DE69609656T2 (de) | 2001-04-12 |
CN1082679C (zh) | 2002-04-10 |
DE69609656D1 (de) | 2000-09-14 |
EP0741332A1 (en) | 1996-11-06 |
US5924912A (en) | 1999-07-20 |
EP0741332B1 (en) | 2000-08-09 |
CN1140843A (zh) | 1997-01-22 |
JP3638660B2 (ja) | 2005-04-13 |
TW439014B (en) | 2001-06-07 |
US5916738A (en) | 1999-06-29 |
KR100198725B1 (ko) | 1999-06-15 |
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