KR960004440B1 - 자기저항센서 - Google Patents
자기저항센서 Download PDFInfo
- Publication number
- KR960004440B1 KR960004440B1 KR1019910701184A KR910701184A KR960004440B1 KR 960004440 B1 KR960004440 B1 KR 960004440B1 KR 1019910701184 A KR1019910701184 A KR 1019910701184A KR 910701184 A KR910701184 A KR 910701184A KR 960004440 B1 KR960004440 B1 KR 960004440B1
- Authority
- KR
- South Korea
- Prior art keywords
- substrate
- sensor
- corner portions
- magnetic field
- disposed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000758 substrate Substances 0.000 claims description 115
- 230000005291 magnetic effect Effects 0.000 claims description 72
- 238000001514 detection method Methods 0.000 claims description 30
- 230000005294 ferromagnetic effect Effects 0.000 claims description 20
- 239000010409 thin film Substances 0.000 claims description 20
- 230000002093 peripheral effect Effects 0.000 claims description 3
- 238000012545 processing Methods 0.000 claims description 3
- 239000004065 semiconductor Substances 0.000 claims description 3
- 239000008188 pellet Substances 0.000 description 44
- 239000000919 ceramic Substances 0.000 description 24
- 229920005989 resin Polymers 0.000 description 20
- 239000011347 resin Substances 0.000 description 20
- 238000000034 method Methods 0.000 description 19
- 238000000465 moulding Methods 0.000 description 18
- 238000004519 manufacturing process Methods 0.000 description 17
- 239000010410 layer Substances 0.000 description 12
- 239000011295 pitch Substances 0.000 description 9
- 238000005530 etching Methods 0.000 description 5
- 239000010408 film Substances 0.000 description 5
- 238000000206 photolithography Methods 0.000 description 5
- 229910000679 solder Inorganic materials 0.000 description 5
- 230000015572 biosynthetic process Effects 0.000 description 4
- 238000000151 deposition Methods 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 4
- 238000010304 firing Methods 0.000 description 4
- 238000002161 passivation Methods 0.000 description 4
- 238000005476 soldering Methods 0.000 description 4
- 238000012360 testing method Methods 0.000 description 4
- 238000001721 transfer moulding Methods 0.000 description 4
- 229910001030 Iron–nickel alloy Inorganic materials 0.000 description 3
- 239000011248 coating agent Substances 0.000 description 3
- 238000000576 coating method Methods 0.000 description 3
- 239000007772 electrode material Substances 0.000 description 3
- 239000010931 gold Substances 0.000 description 3
- 238000007747 plating Methods 0.000 description 3
- 229910045601 alloy Inorganic materials 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- VNNRSPGTAMTISX-UHFFFAOYSA-N chromium nickel Chemical compound [Cr].[Ni] VNNRSPGTAMTISX-UHFFFAOYSA-N 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 239000003302 ferromagnetic material Substances 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 238000001746 injection moulding Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 229910001120 nichrome Inorganic materials 0.000 description 2
- 229920002120 photoresistant polymer Polymers 0.000 description 2
- 238000003825 pressing Methods 0.000 description 2
- 230000003014 reinforcing effect Effects 0.000 description 2
- 230000003746 surface roughness Effects 0.000 description 2
- 241000251468 Actinopterygii Species 0.000 description 1
- 239000004593 Epoxy Substances 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- 239000004734 Polyphenylene sulfide Substances 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 238000005253 cladding Methods 0.000 description 1
- 239000011247 coating layer Substances 0.000 description 1
- 238000002485 combustion reaction Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 230000001747 exhibiting effect Effects 0.000 description 1
- 239000012467 final product Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 229920006015 heat resistant resin Polymers 0.000 description 1
- 230000000977 initiatory effect Effects 0.000 description 1
- 230000005415 magnetization Effects 0.000 description 1
- 231100000989 no adverse effect Toxicity 0.000 description 1
- -1 polybutylene terephthalate Polymers 0.000 description 1
- 229920001707 polybutylene terephthalate Polymers 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 229920000069 polyphenylene sulfide Polymers 0.000 description 1
- 230000002787 reinforcement Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- 229920005992 thermoplastic resin Polymers 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/09—Magnetoresistive devices
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Hall/Mr Elements (AREA)
- Measuring Magnetic Variables (AREA)
- Transmission And Conversion Of Sensor Element Output (AREA)
Abstract
Description
Claims (11)
- 코너부들을 포함하는 표면을 갖는 기판으로서, 상기 기판은 적어도 2개의 코너부들을 갖고, 상기 적어도 2개의 코너부들의 표면수준은 상기 적어도 2개의 코너부들을 제외한 나머지 기판표면의 수준 보다 더 낮고, 나머지 기판표면은 실질적으로 평평한 기판, 상기 더 낮은 기판표면을 갖는 상기 적어도 2개의 코너부들에 각각 별도로 배치된 적어도 2개의 단자 전극부들, 상기 적어도 2개의 코너부들 이외의 상기 나머지 기판표면상에 배치된 패턴 강자성 박막을 포함하는 자계 검출수단, 상기 표면상에 배치되어 상기 자계 검출수단을 상기 적어도 2개의 단자 전극부들에 연결하는 배선부로 이루어지는 것을 특징으로 하는 자기저항센서.
- 제1항에 있어서, 상기 기판의 상기 표면상의 상기 적어도 2개의 코너부들은 상기 더 낮은 표면수준을 형성하는 단차부들을 갖는 것을 특징으로 하는 자기저항센서.
- 제1항에 있어서, 상기 기판의 표면상의 상기 적어도 2개의 코너부들은 상기 더 낮은 표면수준을 형성하기 위해 상기 나머지 기판표면에 대해 경사져 있는 것을 특징으로 하는 자기저항센서.
- 제1항에 있어서, 상기 기판은 정사각형임을 특징으로 하는 자기저항센서.
- 제4항에 있어서, 상기 자계 검출수단은 길이방향을 갖는 센서 패턴을 포함하고, 상기 센서 패턴의 길이방향이 상기 정사각형 기판의 대각선에 나란하게 형성됨을 특징으로 하는 자기저항센서.
- 제1항에 있어서, 상기단자 전극부들은 상기 기판의 표면 중심에 대해 서로 대칭적 위치에 배치된 입력 및 출력단자들을 포함하는 것을 특징으로 하는 자기저항센서.
- 제1항에 있어서, 상기 단자 전극부들이 배치되어 있는 상기 코너부들의 상기 더 낮은 표면수준은 상기 자계 검출수단이 배치되어 있는 상기 기판표면 수준 보다 적어도 50㎛ 더 낮음을 특징으로 하는 자기저항센서.
- 제1항 내지 제7항중 어느 한 항에 있어서, 상기 기판의 상기 한 표면상에서, 상기 코너부들을 제외한 주변부들 일부의 표면수준은 상기 자계 검출수단이 배치되어 있는 표면수준 보다 더 낮은 것을 특징으로 하는 자기저항센서.
- 제1항에 있어서, 상기 기판의 표면상에 배치되어 있는 전기 저항소자를 또한 포함하는 것을 특징으로 하는 자기저항센서.
- 제1항에 있어서, 상기 기판의 표면상에 배치되어 있는 기능 소자를 또한 포함하는 것을 특징으로 하는 자기저항센서.
- 코너부들을 포함하는 표면을 갖는 자기저항센서 기판으로서, 상기 기판은 나머지 기판표면의 수준 보다 더 낮은 적어도 2개의 코너부들의 표면수준을 갖는 기판, 상기 더 낮은 표면수준을 갖는 상기 적어도 2개의 코너부들에 각각 별도로 배치된 적어도 2개의 단자 전극부들, 상기 적어도 2개의 코너부들 이외의 상기 나머지 기판표면상에 배치된 강자성 박막을 포함하는 자계 검출수단, 상기 단자 전극부에 연결되고 반도체 기판상에 배치된 집적회로 소자를 포함하는 자기 신호 처리부를 구비함을 특징으로 하는 자기저항센서.
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP90/13,493 | 1990-01-25 | ||
JP2013493A JP2572139B2 (ja) | 1990-01-25 | 1990-01-25 | 磁気抵抗センサー |
JP90-13493 | 1990-01-25 | ||
PCT/JP1991/000082 WO1991011729A1 (en) | 1990-01-25 | 1991-01-25 | Magnetoresistance sensor |
Publications (2)
Publication Number | Publication Date |
---|---|
KR920701831A KR920701831A (ko) | 1992-08-12 |
KR960004440B1 true KR960004440B1 (ko) | 1996-04-03 |
Family
ID=11834643
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019910701184A Expired - Lifetime KR960004440B1 (ko) | 1990-01-25 | 1991-01-25 | 자기저항센서 |
Country Status (6)
Country | Link |
---|---|
US (1) | US5227761A (ko) |
EP (1) | EP0464226B1 (ko) |
JP (1) | JP2572139B2 (ko) |
KR (1) | KR960004440B1 (ko) |
DE (1) | DE69126828T2 (ko) |
WO (1) | WO1991011729A1 (ko) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5617071A (en) * | 1992-11-16 | 1997-04-01 | Nonvolatile Electronics, Incorporated | Magnetoresistive structure comprising ferromagnetic thin films and intermediate alloy layer having magnetic concentrator and shielding permeable masses |
KR100225179B1 (ko) | 1992-11-30 | 1999-10-15 | 니시무로 타이죠 | 박막 자기 헤드 및 자기 저항 효과형 헤드 |
US6178066B1 (en) | 1998-05-27 | 2001-01-23 | Read-Rite Corporation | Method of fabricating an improved thin film device having a small element with well defined corners |
JP4104099B2 (ja) | 1999-07-09 | 2008-06-18 | 東京エレクトロン株式会社 | プローブカード搬送機構 |
US6828517B2 (en) * | 2001-05-16 | 2004-12-07 | Bourns, Inc. | Position encoder |
CN101308200A (zh) * | 2002-11-29 | 2008-11-19 | 雅马哈株式会社 | 磁传感器及补偿磁传感器的温度相关特性的方法 |
JP4612554B2 (ja) * | 2006-02-16 | 2011-01-12 | 株式会社東海理化電機製作所 | 電流センサ |
JP5949672B2 (ja) * | 2013-06-10 | 2016-07-13 | 日立金属株式会社 | 検出装置、及び検出装置の製造方法 |
US12044754B2 (en) * | 2021-09-21 | 2024-07-23 | Tdk Corporation | Magnetic sensor |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5779780U (ko) * | 1980-10-30 | 1982-05-17 | ||
DE3229774C2 (de) * | 1981-08-10 | 1987-05-07 | Matsushita Electric Industrial Co., Ltd., Kadoma, Osaka | Magnetoresistives Bauelement |
JPS58154478U (ja) * | 1982-04-07 | 1983-10-15 | シャープ株式会社 | 磁気センサ− |
JPS5917322U (ja) * | 1982-07-23 | 1984-02-02 | ソニー株式会社 | カセットテープ転写装置 |
JPS5997487U (ja) * | 1982-12-21 | 1984-07-02 | 松下電器産業株式会社 | 磁気センサ |
JPS59179322U (ja) * | 1983-05-16 | 1984-11-30 | ティーディーケイ株式会社 | 磁気センサ |
JPS59179320U (ja) * | 1983-05-17 | 1984-11-30 | ティーディーケイ株式会社 | 磁気センサ |
JPS59179321U (ja) * | 1983-05-17 | 1984-11-30 | ティーディーケイ株式会社 | 磁気センサ |
US4782157A (en) * | 1984-12-03 | 1988-11-01 | American Cyanamid Co. | Preparation of substituted and unsubstituted 2-carbamoyl nicotinic and 3-quinolinecarboxylic acids |
JPH0732274B2 (ja) * | 1986-07-29 | 1995-04-10 | 松下電器産業株式会社 | 磁気センサ |
JPH0613681B2 (ja) * | 1986-08-08 | 1994-02-23 | バンドー化学株式会社 | 感圧接着性シ−ト |
JPS6345570A (ja) * | 1986-08-13 | 1988-02-26 | Fujitsu Ltd | 磁気センサ回路 |
JPH01214784A (ja) * | 1988-02-23 | 1989-08-29 | Fujitsu Ltd | 磁気検出装置及びそのバイアス磁界設定方法 |
-
1990
- 1990-01-25 JP JP2013493A patent/JP2572139B2/ja not_active Expired - Fee Related
-
1991
- 1991-01-25 KR KR1019910701184A patent/KR960004440B1/ko not_active Expired - Lifetime
- 1991-01-25 DE DE69126828T patent/DE69126828T2/de not_active Expired - Fee Related
- 1991-01-25 EP EP91902788A patent/EP0464226B1/en not_active Expired - Lifetime
- 1991-01-25 US US07/761,948 patent/US5227761A/en not_active Expired - Lifetime
- 1991-01-25 WO PCT/JP1991/000082 patent/WO1991011729A1/ja active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
US5227761A (en) | 1993-07-13 |
EP0464226B1 (en) | 1997-07-16 |
HK1000832A1 (en) | 1998-05-01 |
EP0464226A4 (en) | 1993-03-31 |
KR920701831A (ko) | 1992-08-12 |
EP0464226A1 (en) | 1992-01-08 |
JP2572139B2 (ja) | 1997-01-16 |
DE69126828T2 (de) | 1998-03-05 |
JPH03220472A (ja) | 1991-09-27 |
WO1991011729A1 (en) | 1991-08-08 |
DE69126828D1 (de) | 1997-08-21 |
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