KR950021540A - 적어도 하나의 시모스-낸드 게이트를 가진 집적회로 및 제조방법 - Google Patents
적어도 하나의 시모스-낸드 게이트를 가진 집적회로 및 제조방법 Download PDFInfo
- Publication number
- KR950021540A KR950021540A KR1019940033064A KR19940033064A KR950021540A KR 950021540 A KR950021540 A KR 950021540A KR 1019940033064 A KR1019940033064 A KR 1019940033064A KR 19940033064 A KR19940033064 A KR 19940033064A KR 950021540 A KR950021540 A KR 950021540A
- Authority
- KR
- South Korea
- Prior art keywords
- layer
- opening
- conductor structure
- doped
- conductivity type
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/80—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
- H10D84/82—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
- H10D84/83—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
- H10D84/85—Complementary IGFETs, e.g. CMOS
- H10D84/856—Complementary IGFETs, e.g. CMOS the complementary IGFETs having different architectures than each other, e.g. high-voltage and low-voltage CMOS
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/02—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components
- H03K19/08—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices
- H03K19/094—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices using field-effect transistors
- H03K19/0944—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices using field-effect transistors using MOSFET or insulated gate field-effect transistors, i.e. IGFET
- H03K19/0948—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices using field-effect transistors using MOSFET or insulated gate field-effect transistors, i.e. IGFET using CMOS or complementary insulated gate field-effect transistors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W10/00—Isolation regions in semiconductor bodies between components of integrated devices
- H10W10/01—Manufacture or treatment
- H10W10/011—Manufacture or treatment of isolation regions comprising dielectric materials
- H10W10/018—Manufacture or treatment of isolation regions comprising dielectric materials using selective deposition of crystalline silicon, e.g. using epitaxial growth of silicon
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W10/00—Isolation regions in semiconductor bodies between components of integrated devices
- H10W10/10—Isolation regions comprising dielectric materials
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Computing Systems (AREA)
- General Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Thin Film Transistor (AREA)
- Semiconductor Memories (AREA)
- Non-Volatile Memory (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DEP4341667.5 | 1993-12-07 | ||
| DE4341667A DE4341667C1 (de) | 1993-12-07 | 1993-12-07 | Integrierte Schaltungsanordnung mit mindestens einem CMOS-NAND-Gatter und Verfahren zu deren Herstellung |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR950021540A true KR950021540A (ko) | 1995-07-26 |
Family
ID=6504379
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019940033064A Withdrawn KR950021540A (ko) | 1993-12-07 | 1994-12-07 | 적어도 하나의 시모스-낸드 게이트를 가진 집적회로 및 제조방법 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US5559353A (enExample) |
| EP (1) | EP0657930A3 (enExample) |
| JP (1) | JPH07235605A (enExample) |
| KR (1) | KR950021540A (enExample) |
| DE (1) | DE4341667C1 (enExample) |
| TW (1) | TW304286B (enExample) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19611045C1 (de) * | 1996-03-20 | 1997-05-22 | Siemens Ag | Durch Feldeffekt steuerbares Halbleiterbauelement |
| US5795807A (en) * | 1996-12-20 | 1998-08-18 | Advanced Micro Devices | Semiconductor device having a group of high performance transistors and method of manufacture thereof |
| TW423116B (en) * | 1997-08-22 | 2001-02-21 | Siemens Ag | Circuit-arrangement with at least four transistors and its production method |
| DE19801095B4 (de) * | 1998-01-14 | 2007-12-13 | Infineon Technologies Ag | Leistungs-MOSFET |
| DE19840032C1 (de) * | 1998-09-02 | 1999-11-18 | Siemens Ag | Halbleiterbauelement und Herstellungsverfahren dazu |
| CN1152425C (zh) * | 1998-09-25 | 2004-06-02 | 印芬龙科技股份有限公司 | 制作具有垂直的mos晶体管的集成电路的方法 |
| KR100419538B1 (ko) | 1998-09-30 | 2004-02-21 | 인피니언 테크놀로지스 아게 | 집적 회로 장치용 홈을 가진 기판 및 그 제조 방법 |
| FR2789227B1 (fr) * | 1999-02-03 | 2003-08-15 | France Telecom | DISPOSITIF SEMI-CONDUCTEUR DE PORTES LOGIQUES NON-ET OU NON-OU A n ENTREES, ET PROCEDE DE FABRICATION CORRESPONDANT |
| JP2001111538A (ja) * | 1999-10-05 | 2001-04-20 | Dainippon Printing Co Ltd | 通信システムとその方法、通信装置およびicカード |
| US6828609B2 (en) * | 2001-11-09 | 2004-12-07 | Infineon Technologies Ag | High-voltage semiconductor component |
| US6819089B2 (en) | 2001-11-09 | 2004-11-16 | Infineon Technologies Ag | Power factor correction circuit with high-voltage semiconductor component |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4554570A (en) * | 1982-06-24 | 1985-11-19 | Rca Corporation | Vertically integrated IGFET device |
| US4810906A (en) * | 1985-09-25 | 1989-03-07 | Texas Instruments Inc. | Vertical inverter circuit |
| US4788158A (en) * | 1985-09-25 | 1988-11-29 | Texas Instruments Incorporated | Method of making vertical inverter |
| US4951102A (en) * | 1988-08-24 | 1990-08-21 | Harris Corporation | Trench gate VCMOS |
| JPH0828120B2 (ja) * | 1990-05-23 | 1996-03-21 | 株式会社東芝 | アドレスデコード回路 |
| MY107475A (en) * | 1990-05-31 | 1995-12-30 | Canon Kk | Semiconductor device and method for producing the same. |
| JP2991489B2 (ja) * | 1990-11-30 | 1999-12-20 | 株式会社東芝 | 半導体装置 |
-
1993
- 1993-12-07 DE DE4341667A patent/DE4341667C1/de not_active Expired - Fee Related
-
1994
- 1994-10-15 TW TW083109591A patent/TW304286B/zh active
- 1994-11-01 US US08/332,737 patent/US5559353A/en not_active Expired - Fee Related
- 1994-11-18 EP EP94118235A patent/EP0657930A3/de not_active Withdrawn
- 1994-11-30 JP JP6321724A patent/JPH07235605A/ja not_active Withdrawn
- 1994-12-07 KR KR1019940033064A patent/KR950021540A/ko not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| US5559353A (en) | 1996-09-24 |
| TW304286B (enExample) | 1997-05-01 |
| DE4341667C1 (de) | 1994-12-01 |
| EP0657930A2 (de) | 1995-06-14 |
| EP0657930A3 (de) | 1998-01-07 |
| JPH07235605A (ja) | 1995-09-05 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| R17-X000 | Change to representative recorded |
St.27 status event code: A-3-3-R10-R17-oth-X000 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
|
| PC1203 | Withdrawal of no request for examination |
St.27 status event code: N-1-6-B10-B12-nap-PC1203 |
|
| WITN | Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid | ||
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |