DE4311358C2
(de)
*
|
1992-04-07 |
1999-07-22 |
Mitsubishi Electric Corp |
Nicht-flüchtige Halbleiterspeichereinrichtung und Betriebsverfahren für eine nicht-flüchtige Halbleiterspeichereinrichtung und Verfahren zum Programmieren von Information in eine nicht-flüchtige Halbleiterspeichereinrichtung
|
EP0637035B1
(en)
*
|
1993-07-29 |
1996-11-13 |
STMicroelectronics S.r.l. |
Circuit structure for a memory matrix and corresponding manufacturing method
|
US5912842A
(en)
*
|
1995-11-14 |
1999-06-15 |
Programmable Microelectronics Corp. |
Nonvolatile PMOS two transistor memory cell and array
|
US5680348A
(en)
*
|
1995-12-01 |
1997-10-21 |
Advanced Micro Devices, Inc. |
Power supply independent current source for FLASH EPROM erasure
|
US5579262A
(en)
*
|
1996-02-05 |
1996-11-26 |
Integrated Silicon Solution, Inc. |
Program verify and erase verify control circuit for EPROM/flash
|
US5646890A
(en)
*
|
1996-03-29 |
1997-07-08 |
Aplus Integrated Circuits, Inc. |
Flexible byte-erase flash memory and decoder
|
US5682350A
(en)
*
|
1996-03-29 |
1997-10-28 |
Aplus Integrated Circuits, Inc. |
Flash memory with divided bitline
|
WO1998035344A2
(en)
*
|
1997-02-12 |
1998-08-13 |
Hyundai Electronics America, Inc. |
A nonvolatile memory structure
|
JP3370563B2
(ja)
*
|
1997-07-09 |
2003-01-27 |
シャープ株式会社 |
不揮発性半導体記憶装置の駆動方法
|
US5801994A
(en)
*
|
1997-08-15 |
1998-09-01 |
Programmable Microelectronics Corporation |
Non-volatile memory array architecture
|
US5909392A
(en)
*
|
1997-10-09 |
1999-06-01 |
Programmable Microelectronics Corporation |
PMOS memory array having OR gate architecture
|
US6359810B1
(en)
|
1998-03-13 |
2002-03-19 |
Atmel Corporation |
Page mode erase in a flash memory array
|
US6118705A
(en)
*
|
1998-03-13 |
2000-09-12 |
Atmel Corporation |
Page mode erase in a flash memory array
|
US5995417A
(en)
*
|
1998-10-20 |
1999-11-30 |
Advanced Micro Devices, Inc. |
Scheme for page erase and erase verify in a non-volatile memory array
|
EP1067557B1
(en)
*
|
1999-06-22 |
2005-02-02 |
STMicroelectronics S.r.l. |
Flash compatible EEPROM
|
US6266281B1
(en)
|
2000-02-16 |
2001-07-24 |
Advanced Micro Devices, Inc. |
Method of erasing non-volatile memory cells
|
US6950336B2
(en)
*
|
2000-05-03 |
2005-09-27 |
Emosyn America, Inc. |
Method and apparatus for emulating an electrically erasable programmable read only memory (EEPROM) using non-volatile floating gate memory cells
|
US6400603B1
(en)
|
2000-05-03 |
2002-06-04 |
Advanced Technology Materials, Inc. |
Electronically-eraseable programmable read-only memory having reduced-page-size program and erase
|
US7747833B2
(en)
*
|
2005-09-30 |
2010-06-29 |
Mosaid Technologies Incorporated |
Independent link and bank selection
|
US11948629B2
(en)
|
2005-09-30 |
2024-04-02 |
Mosaid Technologies Incorporated |
Non-volatile memory device with concurrent bank operations
|
US7652922B2
(en)
*
|
2005-09-30 |
2010-01-26 |
Mosaid Technologies Incorporated |
Multiple independent serial link memory
|
US20070076502A1
(en)
*
|
2005-09-30 |
2007-04-05 |
Pyeon Hong B |
Daisy chain cascading devices
|
KR101293365B1
(ko)
|
2005-09-30 |
2013-08-05 |
모사이드 테크놀로지스 인코퍼레이티드 |
출력 제어 메모리
|
US8364861B2
(en)
*
|
2006-03-28 |
2013-01-29 |
Mosaid Technologies Incorporated |
Asynchronous ID generation
|
US8335868B2
(en)
*
|
2006-03-28 |
2012-12-18 |
Mosaid Technologies Incorporated |
Apparatus and method for establishing device identifiers for serially interconnected devices
|
US8069328B2
(en)
*
|
2006-03-28 |
2011-11-29 |
Mosaid Technologies Incorporated |
Daisy chain cascade configuration recognition technique
|
US7551492B2
(en)
|
2006-03-29 |
2009-06-23 |
Mosaid Technologies, Inc. |
Non-volatile semiconductor memory with page erase
|
ATE488009T1
(de)
*
|
2006-03-31 |
2010-11-15 |
Mosaid Technologies Inc |
Flash-speichersystem-steuerverfahren
|
CN103280239B
(zh)
|
2006-05-12 |
2016-04-06 |
苹果公司 |
存储设备中的失真估计和消除
|
US8239735B2
(en)
|
2006-05-12 |
2012-08-07 |
Apple Inc. |
Memory Device with adaptive capacity
|
KR101202537B1
(ko)
|
2006-05-12 |
2012-11-19 |
애플 인크. |
메모리 디바이스를 위한 결합된 왜곡 추정 및 에러 보정 코딩
|
US7904639B2
(en)
*
|
2006-08-22 |
2011-03-08 |
Mosaid Technologies Incorporated |
Modular command structure for memory and memory system
|
WO2008026203A2
(en)
*
|
2006-08-27 |
2008-03-06 |
Anobit Technologies |
Estimation of non-linear distortion in memory devices
|
US8700818B2
(en)
*
|
2006-09-29 |
2014-04-15 |
Mosaid Technologies Incorporated |
Packet based ID generation for serially interconnected devices
|
US7975192B2
(en)
|
2006-10-30 |
2011-07-05 |
Anobit Technologies Ltd. |
Reading memory cells using multiple thresholds
|
US7817470B2
(en)
*
|
2006-11-27 |
2010-10-19 |
Mosaid Technologies Incorporated |
Non-volatile memory serial core architecture
|
US7924648B2
(en)
*
|
2006-11-28 |
2011-04-12 |
Anobit Technologies Ltd. |
Memory power and performance management
|
US8151163B2
(en)
|
2006-12-03 |
2012-04-03 |
Anobit Technologies Ltd. |
Automatic defect management in memory devices
|
US8271758B2
(en)
|
2006-12-06 |
2012-09-18 |
Mosaid Technologies Incorporated |
Apparatus and method for producing IDS for interconnected devices of mixed type
|
US8010709B2
(en)
*
|
2006-12-06 |
2011-08-30 |
Mosaid Technologies Incorporated |
Apparatus and method for producing device identifiers for serially interconnected devices of mixed type
|
US8331361B2
(en)
*
|
2006-12-06 |
2012-12-11 |
Mosaid Technologies Incorporated |
Apparatus and method for producing device identifiers for serially interconnected devices of mixed type
|
US7853727B2
(en)
*
|
2006-12-06 |
2010-12-14 |
Mosaid Technologies Incorporated |
Apparatus and method for producing identifiers regardless of mixed device type in a serial interconnection
|
US7818464B2
(en)
*
|
2006-12-06 |
2010-10-19 |
Mosaid Technologies Incorporated |
Apparatus and method for capturing serial input data
|
US7529149B2
(en)
*
|
2006-12-12 |
2009-05-05 |
Mosaid Technologies Incorporated |
Memory system and method with serial and parallel modes
|
US7900102B2
(en)
|
2006-12-17 |
2011-03-01 |
Anobit Technologies Ltd. |
High-speed programming of memory devices
|
US8984249B2
(en)
*
|
2006-12-20 |
2015-03-17 |
Novachips Canada Inc. |
ID generation apparatus and method for serially interconnected devices
|
US8151166B2
(en)
|
2007-01-24 |
2012-04-03 |
Anobit Technologies Ltd. |
Reduction of back pattern dependency effects in memory devices
|
US7751240B2
(en)
|
2007-01-24 |
2010-07-06 |
Anobit Technologies Ltd. |
Memory device with negative thresholds
|
US8010710B2
(en)
*
|
2007-02-13 |
2011-08-30 |
Mosaid Technologies Incorporated |
Apparatus and method for identifying device type of serially interconnected devices
|
US20080201588A1
(en)
*
|
2007-02-16 |
2008-08-21 |
Mosaid Technologies Incorporated |
Semiconductor device and method for reducing power consumption in a system having interconnected devices
|
US8046527B2
(en)
|
2007-02-22 |
2011-10-25 |
Mosaid Technologies Incorporated |
Apparatus and method for using a page buffer of a memory device as a temporary cache
|
US7796462B2
(en)
|
2007-02-22 |
2010-09-14 |
Mosaid Technologies Incorporated |
Data flow control in multiple independent port
|
US8086785B2
(en)
|
2007-02-22 |
2011-12-27 |
Mosaid Technologies Incorporated |
System and method of page buffer operation for memory devices
|
US7577059B2
(en)
*
|
2007-02-27 |
2009-08-18 |
Mosaid Technologies Incorporated |
Decoding control with address transition detection in page erase function
|
US7804718B2
(en)
*
|
2007-03-07 |
2010-09-28 |
Mosaid Technologies Incorporated |
Partial block erase architecture for flash memory
|
WO2008111058A2
(en)
|
2007-03-12 |
2008-09-18 |
Anobit Technologies Ltd. |
Adaptive estimation of memory cell read thresholds
|
US8001320B2
(en)
|
2007-04-22 |
2011-08-16 |
Anobit Technologies Ltd. |
Command interface for memory devices
|
US8234545B2
(en)
|
2007-05-12 |
2012-07-31 |
Apple Inc. |
Data storage with incremental redundancy
|
WO2008139441A2
(en)
*
|
2007-05-12 |
2008-11-20 |
Anobit Technologies Ltd. |
Memory device with internal signal processing unit
|
US7925936B1
(en)
|
2007-07-13 |
2011-04-12 |
Anobit Technologies Ltd. |
Memory device with non-uniform programming levels
|
US8259497B2
(en)
*
|
2007-08-06 |
2012-09-04 |
Apple Inc. |
Programming schemes for multi-level analog memory cells
|
US8174905B2
(en)
|
2007-09-19 |
2012-05-08 |
Anobit Technologies Ltd. |
Programming orders for reducing distortion in arrays of multi-level analog memory cells
|
US8068360B2
(en)
|
2007-10-19 |
2011-11-29 |
Anobit Technologies Ltd. |
Reading analog memory cells using built-in multi-threshold commands
|
US8527819B2
(en)
|
2007-10-19 |
2013-09-03 |
Apple Inc. |
Data storage in analog memory cell arrays having erase failures
|
US8000141B1
(en)
|
2007-10-19 |
2011-08-16 |
Anobit Technologies Ltd. |
Compensation for voltage drifts in analog memory cells
|
KR101509836B1
(ko)
|
2007-11-13 |
2015-04-06 |
애플 인크. |
멀티 유닛 메모리 디바이스에서의 메모리 유닛의 최적화된 선택
|
US7913128B2
(en)
*
|
2007-11-23 |
2011-03-22 |
Mosaid Technologies Incorporated |
Data channel test apparatus and method thereof
|
US8225181B2
(en)
*
|
2007-11-30 |
2012-07-17 |
Apple Inc. |
Efficient re-read operations from memory devices
|
US8209588B2
(en)
|
2007-12-12 |
2012-06-26 |
Anobit Technologies Ltd. |
Efficient interference cancellation in analog memory cell arrays
|
US8456905B2
(en)
*
|
2007-12-16 |
2013-06-04 |
Apple Inc. |
Efficient data storage in multi-plane memory devices
|
US7983099B2
(en)
|
2007-12-20 |
2011-07-19 |
Mosaid Technologies Incorporated |
Dual function compatible non-volatile memory device
|
US8085586B2
(en)
|
2007-12-27 |
2011-12-27 |
Anobit Technologies Ltd. |
Wear level estimation in analog memory cells
|
US7940572B2
(en)
*
|
2008-01-07 |
2011-05-10 |
Mosaid Technologies Incorporated |
NAND flash memory having multiple cell substrates
|
US8156398B2
(en)
|
2008-02-05 |
2012-04-10 |
Anobit Technologies Ltd. |
Parameter estimation based on error correction code parity check equations
|
US7924587B2
(en)
|
2008-02-21 |
2011-04-12 |
Anobit Technologies Ltd. |
Programming of analog memory cells using a single programming pulse per state transition
|
US7864573B2
(en)
*
|
2008-02-24 |
2011-01-04 |
Anobit Technologies Ltd. |
Programming analog memory cells for reduced variance after retention
|
US8230300B2
(en)
|
2008-03-07 |
2012-07-24 |
Apple Inc. |
Efficient readout from analog memory cells using data compression
|
US8400858B2
(en)
|
2008-03-18 |
2013-03-19 |
Apple Inc. |
Memory device with reduced sense time readout
|
US8059457B2
(en)
|
2008-03-18 |
2011-11-15 |
Anobit Technologies Ltd. |
Memory device with multiple-accuracy read commands
|
US7924613B1
(en)
|
2008-08-05 |
2011-04-12 |
Anobit Technologies Ltd. |
Data storage in analog memory cells with protection against programming interruption
|
US7995388B1
(en)
|
2008-08-05 |
2011-08-09 |
Anobit Technologies Ltd. |
Data storage using modified voltages
|
US8169825B1
(en)
|
2008-09-02 |
2012-05-01 |
Anobit Technologies Ltd. |
Reliable data storage in analog memory cells subjected to long retention periods
|
US8949684B1
(en)
|
2008-09-02 |
2015-02-03 |
Apple Inc. |
Segmented data storage
|
US8482978B1
(en)
|
2008-09-14 |
2013-07-09 |
Apple Inc. |
Estimation of memory cell read thresholds by sampling inside programming level distribution intervals
|
US8000135B1
(en)
|
2008-09-14 |
2011-08-16 |
Anobit Technologies Ltd. |
Estimation of memory cell read thresholds by sampling inside programming level distribution intervals
|
US8239734B1
(en)
|
2008-10-15 |
2012-08-07 |
Apple Inc. |
Efficient data storage in storage device arrays
|
US8261159B1
(en)
|
2008-10-30 |
2012-09-04 |
Apple, Inc. |
Data scrambling schemes for memory devices
|
US8208304B2
(en)
|
2008-11-16 |
2012-06-26 |
Anobit Technologies Ltd. |
Storage at M bits/cell density in N bits/cell analog memory cell devices, M>N
|
US8174857B1
(en)
|
2008-12-31 |
2012-05-08 |
Anobit Technologies Ltd. |
Efficient readout schemes for analog memory cell devices using multiple read threshold sets
|
US8248831B2
(en)
|
2008-12-31 |
2012-08-21 |
Apple Inc. |
Rejuvenation of analog memory cells
|
US8924661B1
(en)
|
2009-01-18 |
2014-12-30 |
Apple Inc. |
Memory system including a controller and processors associated with memory devices
|
US8228701B2
(en)
*
|
2009-03-01 |
2012-07-24 |
Apple Inc. |
Selective activation of programming schemes in analog memory cell arrays
|
US8259506B1
(en)
|
2009-03-25 |
2012-09-04 |
Apple Inc. |
Database of memory read thresholds
|
US8832354B2
(en)
|
2009-03-25 |
2014-09-09 |
Apple Inc. |
Use of host system resources by memory controller
|
US8238157B1
(en)
|
2009-04-12 |
2012-08-07 |
Apple Inc. |
Selective re-programming of analog memory cells
|
US8479080B1
(en)
|
2009-07-12 |
2013-07-02 |
Apple Inc. |
Adaptive over-provisioning in memory systems
|
US8495465B1
(en)
|
2009-10-15 |
2013-07-23 |
Apple Inc. |
Error correction coding over multiple memory pages
|
US8677054B1
(en)
|
2009-12-16 |
2014-03-18 |
Apple Inc. |
Memory management schemes for non-volatile memory devices
|
US8694814B1
(en)
|
2010-01-10 |
2014-04-08 |
Apple Inc. |
Reuse of host hibernation storage space by memory controller
|
US8572311B1
(en)
|
2010-01-11 |
2013-10-29 |
Apple Inc. |
Redundant data storage in multi-die memory systems
|
US8694853B1
(en)
|
2010-05-04 |
2014-04-08 |
Apple Inc. |
Read commands for reading interfering memory cells
|
US8572423B1
(en)
|
2010-06-22 |
2013-10-29 |
Apple Inc. |
Reducing peak current in memory systems
|
US8595591B1
(en)
|
2010-07-11 |
2013-11-26 |
Apple Inc. |
Interference-aware assignment of programming levels in analog memory cells
|
US9104580B1
(en)
|
2010-07-27 |
2015-08-11 |
Apple Inc. |
Cache memory for hybrid disk drives
|
US8767459B1
(en)
|
2010-07-31 |
2014-07-01 |
Apple Inc. |
Data storage in analog memory cells across word lines using a non-integer number of bits per cell
|
US8856475B1
(en)
|
2010-08-01 |
2014-10-07 |
Apple Inc. |
Efficient selection of memory blocks for compaction
|
US8493781B1
(en)
|
2010-08-12 |
2013-07-23 |
Apple Inc. |
Interference mitigation using individual word line erasure operations
|
US8694854B1
(en)
|
2010-08-17 |
2014-04-08 |
Apple Inc. |
Read threshold setting based on soft readout statistics
|
US9021181B1
(en)
|
2010-09-27 |
2015-04-28 |
Apple Inc. |
Memory management for unifying memory cell conditions by using maximum time intervals
|
US11556416B2
(en)
|
2021-05-05 |
2023-01-17 |
Apple Inc. |
Controlling memory readout reliability and throughput by adjusting distance between read thresholds
|
US11847342B2
(en)
|
2021-07-28 |
2023-12-19 |
Apple Inc. |
Efficient transfer of hard data and confidence levels in reading a nonvolatile memory
|