KR940012049A - 교차결합된 또는 경화된 레지스트 수지로 금속부식을 감소시키는 알칼리함유 포토레지스트 스트리핑 조성물 - Google Patents

교차결합된 또는 경화된 레지스트 수지로 금속부식을 감소시키는 알칼리함유 포토레지스트 스트리핑 조성물 Download PDF

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KR940012049A
KR940012049A KR1019930023214A KR930023214A KR940012049A KR 940012049 A KR940012049 A KR 940012049A KR 1019930023214 A KR1019930023214 A KR 1019930023214A KR 930023214 A KR930023214 A KR 930023214A KR 940012049 A KR940012049 A KR 940012049A
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stripping
composition
stripping composition
alkali
acid
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KR100297893B1 (ko
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슈바르쯔코프 게오르게
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안토니 피에르죠반니 쥬니어
제이. 티. 베이커 인코오퍼레이티드
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    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26Processing photosensitive materials; Apparatus therefor
    • G03F7/42Stripping or agents therefor
    • G03F7/422Stripping or agents therefor using liquids only
    • G03F7/425Stripping or agents therefor using liquids only containing mineral alkaline compounds; containing organic basic compounds, e.g. quaternary ammonium compounds; containing heterocyclic basic compounds containing nitrogen
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/22Organic compounds
    • C11D7/26Organic compounds containing oxygen
    • C11D7/264Aldehydes; Ketones; Acetals or ketals
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/22Organic compounds
    • C11D7/32Organic compounds containing nitrogen
    • C11D7/3209Amines or imines with one to four nitrogen atoms; Quaternized amines
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/22Organic compounds
    • C11D7/32Organic compounds containing nitrogen
    • C11D7/3218Alkanolamines or alkanolimines
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D2111/00Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
    • C11D2111/10Objects to be cleaned
    • C11D2111/14Hard surfaces
    • C11D2111/22Electronic devices, e.g. PCBs or semiconductors

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  • Chemical & Material Sciences (AREA)
  • Oil, Petroleum & Natural Gas (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Physics & Mathematics (AREA)
  • Wood Science & Technology (AREA)
  • Organic Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Emergency Medicine (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

포토레지스트에 대하 아민함유 알칼리 스트리퍼에 질소 무함유 약산을 부가시키는 것은 어떠한 실질적인 금속부식을 일으키지 않고 고도로 교차결합되거나 경화된 포토레지스트 필름을 스트리핑할 수 있는 스트리퍼 조성물을 제공한다. 스트리핑 조성물에 유용한 약산은 2.0 또는 그 이상의 수용액중의 pK와 약140미만의 당량을 갖는 것들을 포함하며 스트리퍼 조성물중에 존재하는 아민의 약 19%내지 약 75%를 중화시키는 양으로 사용된다.

Description

교차결합된 또는 경화된 레지스트 수지로 금속부식을 감소시키는 알칼리함유 포토레지스트 스트리핑 조성물
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음

Claims (6)

  1. 스트리핑 용매, 구핵성 아민 및 구핵성 아민을 부분적으로 중화시키기에 충분한 양으로 질소 무함유 약산으로 이루어지며, 이로써 어떠한 실질적인 금속 부식을 일으키지 않으면서 금속함유 기판으로부터 경화된 또는 고도로 교차결합된 포토레지스트 수지 필름을 스트리핑 할수 있는 것을 특징으로 하는 알칼리함유 포토레지스트스트리핑 조성물.
  2. 제1항에 있어서, 스트리핑 용매는 약 8 내지 약 15의용해도 파라미터를 가지는 스트리핑 용매 시스템이고 스트리핑 조성물의 약 50중량% 내지 약 98%의 양중에 존재하며 ; 구핵성 아민은 스트리핑 조성물의 약 1 내지 50중량%의 양으로존재하고 ; 수성요액중에서 약산은 2.0 또는 그 이상의 수용액중의 pK값과 140이하의 당량을 가지며 스트리핑 조성물이 약 pH9.6 내지 약10. 9범위이내의 수성 pH를 갖도록 구핵성 아민의 약 19중량% 내지 약 75중량%를 중화시키기에 충분한 상기 스트리핑 조성물의 약 0.05 중량%내지 약 25중량%의 양으로 스트리핑조성물중에 존재하는 것을 특징으로 하는 아칼리함유 포토레지스트 스트리핑 조성물.
  3. 제1항 또는 제2항에 있어서, 약산은 2.5 또는 그 이상의 pK를 가지며 아세트산, 프달산, 2-메르캅토벤조산, 2-메르캅토에탄올, 1, 3, 5-트리히드록시??젠, 피로갈롤, 리조르시놀, 4-tert-부틸카네콜, 탄산 및 플루오르화수소산으로 굿어되는 군으로부터 선택되고, 아민은 1-아미노-2-프로판올, 2-(2-아미노에톡시) 에탄올, 2-아미노에탄올, 2-(아미노에틸아미노) 에탄올 및 2-(2-아미노에틸아미노) 에틸아민으로 구성되는 군으로부터 선택되는 것을 특징으로 하는 알칼리 함유 포토레지스트 스트리핑 조성물.
  4. 제1항, 제2항 또는 제3항중의 어느 한항에 이써서, 스트리핑 용매가 2-피롤디논, 1-메틸-2-피롤리디논, 1-에틸-2-피롤리디논, 1-프로필-2-피롤리디논, 1-히드록시에틸-2-피롤리디논, 1-히드록시프로필-2-피롤리디논, 식 HOCH2CH2-O-R (여기서 R은 1 내지4탄소원자의 알킬라디칼 )의 디에틸렌 클리콜모노알킬 에테르, 식(여기서 R1및 R2는 1 내지 4탄소원자의 알킬)의 디알킬술폰, 디메틸술폭시드, 식
    (여기서 R1은 수소, 메틸 또는 에틸)의 테트라히드로티오펜-1, 1-디옥사이드 화합물, 폴리에틸렌 글리콜, 디메틸아세트아미드 및 다메틸 포름아미드로 구성되는군으로 부터 선택된 하나 또는 그 이상의 용매로 이루어진 것을 특징으로 하는 알칼리 함유 포토레지스트 스트리핑 조성물.
  5. 제1항, 제2항, 제3항, 또는 제4항중의 어느 하나에 있어서, 상기조성물이 중량기준으 N-메틸피롤리디논 약 50중량% 내지 약 98중량%, 1-아미노-2-푸로판올, 2-(2-아미노에톡시)에탄올 및 2-아미노에탄올로부터 선택된 아민 1내지 약50중량%, 스트리핑 조성물이 약 pH9.6 내지 약 10.9의 범위내에 수성pH를 갖도록 아민을 중화시키는 양으로 존재하는 아시트산 약 0.5%내지 약 25%로 이루어지는 것을 특징으로 하는 알칼리함유 포토레지스트 스트리핑 조성물.
  6. 포토레지스트 스트리핑 조성물이 있는 기판으로부터 고도로 교차결합되거나 경화된 포토레지스트 수지를 스트리핑 하는 방법에 있어서, 제1항, 제2항, 제3항, 제4항 또는 제5항중의 어느 한 항에 따른 알칼리함유 포토레지스트 스트리핑 조성물을 사용하는 것으로 이루어지는 것을 특징으로 하는 스트리핑 방법.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019930023214A 1992-11-06 1993-11-03 교차결합된또는경화된레지스트수지를가진금속의부식을감소시키는알칼리함유포토레지스트스트리핑조성물 KR100297893B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/972,511 US5308745A (en) 1992-11-06 1992-11-06 Alkaline-containing photoresist stripping compositions producing reduced metal corrosion with cross-linked or hardened resist resins
US07/972,511 1992-11-06

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KR940012049A true KR940012049A (ko) 1994-06-22
KR100297893B1 KR100297893B1 (ko) 2001-11-22

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US (1) US5308745A (ko)
EP (1) EP0596515B1 (ko)
JP (1) JP2683729B2 (ko)
KR (1) KR100297893B1 (ko)
CA (1) CA2106750C (ko)
DE (1) DE69314279T2 (ko)
IL (1) IL107263A (ko)
TW (1) TW338120B (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7658803B2 (en) 2005-12-06 2010-02-09 Samsung Electronics Co., Ltd. Manufacturing and cleansing of thin film transistor panels

Families Citing this family (111)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6121217A (en) 1990-11-05 2000-09-19 Ekc Technology, Inc. Alkanolamine semiconductor process residue removal composition and process
US5279771A (en) * 1990-11-05 1994-01-18 Ekc Technology, Inc. Stripping compositions comprising hydroxylamine and alkanolamine
US20040018949A1 (en) * 1990-11-05 2004-01-29 Wai Mun Lee Semiconductor process residue removal composition and process
US7205265B2 (en) * 1990-11-05 2007-04-17 Ekc Technology, Inc. Cleaning compositions and methods of use thereof
US6110881A (en) * 1990-11-05 2000-08-29 Ekc Technology, Inc. Cleaning solutions including nucleophilic amine compound having reduction and oxidation potentials
US6000411A (en) * 1990-11-05 1999-12-14 Ekc Technology, Inc. Cleaning compositions for removing etching residue and method of using
US6242400B1 (en) 1990-11-05 2001-06-05 Ekc Technology, Inc. Method of stripping resists from substrates using hydroxylamine and alkanolamine
US5753601A (en) * 1991-01-25 1998-05-19 Ashland Inc Organic stripping composition
US5556482A (en) * 1991-01-25 1996-09-17 Ashland, Inc. Method of stripping photoresist with composition containing inhibitor
US5928430A (en) * 1991-01-25 1999-07-27 Advanced Scientific Concepts, Inc. Aqueous stripping and cleaning compositions containing hydroxylamine and use thereof
US5988186A (en) * 1991-01-25 1999-11-23 Ashland, Inc. Aqueous stripping and cleaning compositions
US6825156B2 (en) * 2002-06-06 2004-11-30 Ekc Technology, Inc. Semiconductor process residue removal composition and process
US7144849B2 (en) * 1993-06-21 2006-12-05 Ekc Technology, Inc. Cleaning solutions including nucleophilic amine compound having reduction and oxidation potentials
US6326130B1 (en) * 1993-10-07 2001-12-04 Mallinckrodt Baker, Inc. Photoresist strippers containing reducing agents to reduce metal corrosion
US5545353A (en) * 1995-05-08 1996-08-13 Ocg Microelectronic Materials, Inc. Non-corrosive photoresist stripper composition
US5472830A (en) * 1994-04-18 1995-12-05 Ocg Microelectronic Materials, Inc. Non-corrosion photoresist stripping composition
KR100372995B1 (ko) * 1994-05-24 2003-03-31 히다치 가세고교 가부시끼가이샤 반도체기판위에목적하는패턴의수지막을형성하는방법,반도체칩,반도체패키지,및레지스트상박리액
US5885901A (en) * 1994-08-11 1999-03-23 Texas Instruments Incorporated Rinsing solution after resist stripping process and method for manufacturing semiconductor device
US5507978A (en) * 1995-05-08 1996-04-16 Ocg Microelectronic Materials, Inc. Novolak containing photoresist stripper composition
US5561105A (en) * 1995-05-08 1996-10-01 Ocg Microelectronic Materials, Inc. Chelating reagent containing photoresist stripper composition
JP3236220B2 (ja) * 1995-11-13 2001-12-10 東京応化工業株式会社 レジスト用剥離液組成物
US5665688A (en) * 1996-01-23 1997-09-09 Olin Microelectronics Chemicals, Inc. Photoresist stripping composition
US5648324A (en) * 1996-01-23 1997-07-15 Ocg Microelectronic Materials, Inc. Photoresist stripping composition
US5741368A (en) * 1996-01-30 1998-04-21 Silicon Valley Chemlabs Dibasic ester stripping composition
US6511547B1 (en) 1996-01-30 2003-01-28 Siliconvalley Chemlabs, Inc. Dibasic ester stripping composition
US5909744A (en) * 1996-01-30 1999-06-08 Silicon Valley Chemlabs, Inc. Dibasic ester stripping composition
JP2836562B2 (ja) * 1996-02-08 1998-12-14 日本電気株式会社 半導体ウェハのウェット処理方法
EP0843841B1 (en) * 1996-06-10 2002-09-04 Koninklijke Philips Electronics N.V. Stripping composition
JPH1055993A (ja) * 1996-08-09 1998-02-24 Hitachi Ltd 半導体素子製造用洗浄液及びそれを用いた半導体素子の製造方法
US5817610A (en) * 1996-09-06 1998-10-06 Olin Microelectronic Chemicals, Inc. Non-corrosive cleaning composition for removing plasma etching residues
US5780406A (en) * 1996-09-06 1998-07-14 Honda; Kenji Non-corrosive cleaning composition for removing plasma etching residues
US5759973A (en) * 1996-09-06 1998-06-02 Olin Microelectronic Chemicals, Inc. Photoresist stripping and cleaning compositions
US6030932A (en) 1996-09-06 2000-02-29 Olin Microelectronic Chemicals Cleaning composition and method for removing residues
DE69613476T2 (de) * 1996-12-09 2002-04-18 Imec Inter Uni Micro Electr Metallspülungsverfahren mit kontrollierter Metallmikrokorrosionsreduktion
US6755989B2 (en) 1997-01-09 2004-06-29 Advanced Technology Materials, Inc. Aqueous cleaning composition containing copper-specific corrosion inhibitor for cleaning inorganic residues on semiconductor substrate
US6224785B1 (en) 1997-08-29 2001-05-01 Advanced Technology Materials, Inc. Aqueous ammonium fluoride and amine containing compositions for cleaning inorganic residues on semiconductor substrates
US6896826B2 (en) * 1997-01-09 2005-05-24 Advanced Technology Materials, Inc. Aqueous cleaning composition containing copper-specific corrosion inhibitor for cleaning inorganic residues on semiconductor substrate
US6551409B1 (en) 1997-02-14 2003-04-22 Interuniversitair Microelektronica Centrum, Vzw Method for removing organic contaminants from a semiconductor surface
US5798323A (en) * 1997-05-05 1998-08-25 Olin Microelectronic Chemicals, Inc. Non-corrosive stripping and cleaning composition
US6268323B1 (en) * 1997-05-05 2001-07-31 Arch Specialty Chemicals, Inc. Non-corrosive stripping and cleaning composition
US6701941B1 (en) 1997-05-09 2004-03-09 Semitool, Inc. Method for treating the surface of a workpiece
US7163588B2 (en) * 1997-05-09 2007-01-16 Semitool, Inc. Processing a workpiece using water, a base, and ozone
US6869487B1 (en) * 1997-05-09 2005-03-22 Semitool, Inc. Process and apparatus for treating a workpiece such as a semiconductor wafer
US7264680B2 (en) * 1997-05-09 2007-09-04 Semitool, Inc. Process and apparatus for treating a workpiece using ozone
US6240933B1 (en) 1997-05-09 2001-06-05 Semitool, Inc. Methods for cleaning semiconductor surfaces
US7378355B2 (en) * 1997-05-09 2008-05-27 Semitool, Inc. System and methods for polishing a wafer
US20020157686A1 (en) * 1997-05-09 2002-10-31 Semitool, Inc. Process and apparatus for treating a workpiece such as a semiconductor wafer
US7416611B2 (en) * 1997-05-09 2008-08-26 Semitool, Inc. Process and apparatus for treating a workpiece with gases
US20050034745A1 (en) * 1997-05-09 2005-02-17 Semitool, Inc. Processing a workpiece with ozone and a halogenated additive
US20050215063A1 (en) * 1997-05-09 2005-09-29 Bergman Eric J System and methods for etching a silicon wafer using HF and ozone
US7404863B2 (en) * 1997-05-09 2008-07-29 Semitool, Inc. Methods of thinning a silicon wafer using HF and ozone
SG71147A1 (en) * 1997-08-29 2000-03-21 Dow Corning Toray Silicone Method for forming insulating thin films
KR100271761B1 (ko) * 1997-11-21 2000-12-01 윤종용 반도체장치 제조용 현상장치 및 그의 제어방법
US6159666A (en) * 1998-01-14 2000-12-12 Fijitsu Limited Environmentally friendly removal of photoresists used in wet etchable polyimide processes
US6432209B2 (en) 1998-03-03 2002-08-13 Silicon Valley Chemlabs Composition and method for removing resist and etching residues using hydroxylazmmonium carboxylates
US6465403B1 (en) 1998-05-18 2002-10-15 David C. Skee Silicate-containing alkaline compositions for cleaning microelectronic substrates
JP3606738B2 (ja) 1998-06-05 2005-01-05 東京応化工業株式会社 アッシング後の処理液およびこれを用いた処理方法
US6159663A (en) * 1998-06-30 2000-12-12 Intersil Corporation Method of creating a solderable metal layer on glass or ceramic
US7135445B2 (en) * 2001-12-04 2006-11-14 Ekc Technology, Inc. Process for the use of bis-choline and tris-choline in the cleaning of quartz-coated polysilicon and other materials
US6368421B1 (en) 1998-07-10 2002-04-09 Clariant Finance (Bvi) Limited Composition for stripping photoresist and organic materials from substrate surfaces
US6627553B1 (en) 1998-11-27 2003-09-30 Showa Denko K.K. Composition for removing side wall and method of removing side wall
US6878213B1 (en) * 1998-12-07 2005-04-12 Scp Global Technologies, Inc. Process and system for rinsing of semiconductor substrates
KR100286860B1 (ko) * 1998-12-31 2001-07-12 주식회사 동진쎄미켐 포토레지스트 리무버 조성물
TW500831B (en) * 1999-01-20 2002-09-01 Sumitomo Chemical Co Metal-corrosion inhibitor and cleaning liquid
FR2792737B1 (fr) * 1999-04-26 2001-05-18 Atochem Elf Sa Compositions pour le decapage de photoresists dans la fabrication de circuits integres
US6610168B1 (en) * 1999-08-12 2003-08-26 Sipec Corporation Resist film removal apparatus and resist film removal method
KR20000006831A (ko) * 1999-11-05 2000-02-07 윤세훈 수용성 포지티브 스트리퍼의 조성
US6413923B2 (en) 1999-11-15 2002-07-02 Arch Specialty Chemicals, Inc. Non-corrosive cleaning composition for removing plasma etching residues
US6194366B1 (en) 1999-11-16 2001-02-27 Esc, Inc. Post chemical-mechanical planarization (CMP) cleaning composition
US6723691B2 (en) 1999-11-16 2004-04-20 Advanced Technology Materials, Inc. Post chemical-mechanical planarization (CMP) cleaning composition
KR100363271B1 (ko) * 2000-06-12 2002-12-05 주식회사 동진쎄미켐 포토레지스트 리무버 조성물
US6558879B1 (en) * 2000-09-25 2003-05-06 Ashland Inc. Photoresist stripper/cleaner compositions containing aromatic acid inhibitors
US6599370B2 (en) * 2000-10-16 2003-07-29 Mallinckrodt Inc. Stabilized alkaline compositions for cleaning microelectronic substrates
MY143399A (en) * 2001-07-09 2011-05-13 Avantor Performance Mat Inc Microelectronic cleaning compositons containing ammonia-free fluoride salts for selective photoresist stripping and plasma ash residue cleaning
MY131912A (en) * 2001-07-09 2007-09-28 Avantor Performance Mat Inc Ammonia-free alkaline microelectronic cleaning compositions with improved substrate compatibility
TW575783B (en) * 2001-07-13 2004-02-11 Ekc Technology Inc Sulfoxide pyrolid(in)one alkanolamine cleaner composition
US20030138737A1 (en) 2001-12-27 2003-07-24 Kazumasa Wakiya Photoresist stripping solution and a method of stripping photoresists using the same
US6943142B2 (en) 2002-01-09 2005-09-13 Air Products And Chemicals, Inc. Aqueous stripping and cleaning composition
KR100518714B1 (ko) * 2002-02-19 2005-10-05 주식회사 덕성 레지스트 박리액 조성물
WO2003091376A1 (en) * 2002-04-24 2003-11-06 Ekc Technology, Inc. Oxalic acid as a cleaning product for aluminium, copper and dielectric surfaces
US8003587B2 (en) * 2002-06-06 2011-08-23 Ekc Technology, Inc. Semiconductor process residue removal composition and process
TWI330766B (en) * 2002-06-07 2010-09-21 Mallinckrodt Bader Inc Microelectronic cleaning and arc remover compositions
JP4304154B2 (ja) * 2002-06-07 2009-07-29 マリンクロッド・ベイカー・インコーポレイテッド 酸化剤および有機溶媒を含有するマイクロエレクトロニクス洗浄組成物
US7393819B2 (en) * 2002-07-08 2008-07-01 Mallinckrodt Baker, Inc. Ammonia-free alkaline microelectronic cleaning compositions with improved substrate compatibility
US20040023367A1 (en) * 2002-07-31 2004-02-05 Affymetrix, Inc. Method of photolithographic production of polymer arrays
US20050032657A1 (en) * 2003-08-06 2005-02-10 Kane Sean Michael Stripping and cleaning compositions for microelectronics
US7384900B2 (en) * 2003-08-27 2008-06-10 Lg Display Co., Ltd. Composition and method for removing copper-compatible resist
BRPI0416067A (pt) * 2003-10-29 2007-01-02 Mallinckrodt Baker Inc removedores alcalinos de resìduo de cinza/gravação pós-plasma e composições de descascamento de fotorresistes contendo inibidores de corrosão de haleto de metal
KR100663624B1 (ko) * 2004-04-29 2007-01-02 엘지.필립스 엘시디 주식회사 액정표시장치 제조방법
ATE450595T1 (de) 2004-08-03 2009-12-15 Mallinckrodt Baker Inc Reinigungsmittel für mikroelektronik-substrate
US20060094612A1 (en) * 2004-11-04 2006-05-04 Mayumi Kimura Post etch cleaning composition for use with substrates having aluminum
KR20060064441A (ko) * 2004-12-08 2006-06-13 말린크로트 베이커, 인코포레이티드 비수성 비부식성 마이크로전자 세정 조성물
US7923423B2 (en) * 2005-01-27 2011-04-12 Advanced Technology Materials, Inc. Compositions for processing of semiconductor substrates
SG158920A1 (en) * 2005-01-27 2010-02-26 Advanced Tech Materials Compositions for processing of semiconductor substrates
US7632796B2 (en) * 2005-10-28 2009-12-15 Dynaloy, Llc Dynamic multi-purpose composition for the removal of photoresists and method for its use
US8263539B2 (en) * 2005-10-28 2012-09-11 Dynaloy, Llc Dynamic multi-purpose composition for the removal of photoresists and methods for its use
TW200734448A (en) * 2006-02-03 2007-09-16 Advanced Tech Materials Low pH post-CMP residue removal composition and method of use
TWI417683B (zh) * 2006-02-15 2013-12-01 Avantor Performance Mat Inc 用於微電子基板之穩定化,非水性清潔組合物
TW200736855A (en) * 2006-03-22 2007-10-01 Quanta Display Inc Method of fabricating photoresist thinner
KR101403515B1 (ko) * 2006-06-22 2014-06-09 주식회사 동진쎄미켐 포토레지스트 제거용 조성물
US20080076688A1 (en) * 2006-09-21 2008-03-27 Barnes Jeffrey A Copper passivating post-chemical mechanical polishing cleaning composition and method of use
US8685909B2 (en) 2006-09-21 2014-04-01 Advanced Technology Materials, Inc. Antioxidants for post-CMP cleaning formulations
WO2008039730A1 (en) * 2006-09-25 2008-04-03 Advanced Technology Materials, Inc. Compositions and methods for the removal of photoresist for a wafer rework application
JP5063138B2 (ja) * 2007-02-23 2012-10-31 株式会社Sokudo 基板現像方法および現像装置
US8551682B2 (en) 2007-08-15 2013-10-08 Dynaloy, Llc Metal conservation with stripper solutions containing resorcinol
JP2009205771A (ja) * 2008-02-28 2009-09-10 Fuji Electric Device Technology Co Ltd パターン化磁気記録媒体の製造方法
TWI450052B (zh) * 2008-06-24 2014-08-21 Dynaloy Llc 用於後段製程操作有效之剝離溶液
WO2010048139A2 (en) 2008-10-21 2010-04-29 Advanced Technology Materials, Inc. Copper cleaning and protection formulations
US8518865B2 (en) 2009-08-31 2013-08-27 Air Products And Chemicals, Inc. Water-rich stripping and cleaning formulation and method for using same
TWI539493B (zh) 2010-03-08 2016-06-21 黛納羅伊有限責任公司 用於摻雜具有分子單層之矽基材之方法及組合物
FR2976290B1 (fr) 2011-06-09 2014-08-15 Jerome Daviot Composition de solutions et conditions d'utilisation permettant le retrait et la dissolution complete de resines photo-lithographiques

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3813309A (en) * 1969-12-23 1974-05-28 Ibm Method for stripping resists from substrates
US4170478A (en) * 1977-06-06 1979-10-09 Eastman Kodak Company Photographic color developer compositions
US4428871A (en) * 1981-09-23 1984-01-31 J. T. Baker Chemical Company Stripping compositions and methods of stripping resists
US4395479A (en) * 1981-09-23 1983-07-26 J. T. Baker Chemical Company Stripping compositions and methods of stripping resists
US4401747A (en) * 1982-09-02 1983-08-30 J. T. Baker Chemical Company Stripping compositions and methods of stripping resists
US4403029A (en) * 1982-09-02 1983-09-06 J. T. Baker Chemical Company Stripping compositions and methods of stripping resists
US4401748A (en) * 1982-09-07 1983-08-30 J. T. Baker Chemical Company Stripping compositions and methods of stripping resists
US4877818A (en) * 1984-09-26 1989-10-31 Rohm And Haas Company Electrophoretically depositable photosensitive polymer composition
US4592787A (en) * 1984-11-05 1986-06-03 The Dow Chemical Company Composition useful for stripping photoresist polymers and method
US4617251A (en) * 1985-04-11 1986-10-14 Olin Hunt Specialty Products, Inc. Stripping composition and method of using the same
US5102777A (en) * 1990-02-01 1992-04-07 Ardrox Inc. Resist stripping
JP2532287B2 (ja) * 1990-02-07 1996-09-11 富士写真フイルム株式会社 水なしps版用現像液
JPH0470756A (ja) * 1990-07-11 1992-03-05 Konica Corp 感光性平版印刷版の現像方法及び現像液
JP2527268B2 (ja) * 1990-09-17 1996-08-21 東京応化工業株式会社 レジスト用剥離剤組成物
US5279771A (en) * 1990-11-05 1994-01-18 Ekc Technology, Inc. Stripping compositions comprising hydroxylamine and alkanolamine
JPH05259066A (ja) * 1992-03-13 1993-10-08 Texas Instr Japan Ltd ポジ型フォトレジスト用剥離液および半導体装置の製造方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7658803B2 (en) 2005-12-06 2010-02-09 Samsung Electronics Co., Ltd. Manufacturing and cleansing of thin film transistor panels
US8389454B2 (en) 2005-12-06 2013-03-05 Samsung Display Co., Ltd. Manufacturing and cleansing of thin film transistor panels

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US5308745A (en) 1994-05-03
DE69314279D1 (de) 1997-11-06
CA2106750A1 (en) 1994-05-07
KR100297893B1 (ko) 2001-11-22
CA2106750C (en) 1999-03-30
JPH06202345A (ja) 1994-07-22
DE69314279T2 (de) 1998-05-07
IL107263A0 (en) 1994-01-25
IL107263A (en) 1998-02-22
TW338120B (ko) 1998-08-11
EP0596515B1 (en) 1997-10-01
EP0596515A1 (en) 1994-05-11

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