KR930009046A - 리드프레임 - Google Patents
리드프레임 Download PDFInfo
- Publication number
- KR930009046A KR930009046A KR1019920018712A KR920018712A KR930009046A KR 930009046 A KR930009046 A KR 930009046A KR 1019920018712 A KR1019920018712 A KR 1019920018712A KR 920018712 A KR920018712 A KR 920018712A KR 930009046 A KR930009046 A KR 930009046A
- Authority
- KR
- South Korea
- Prior art keywords
- plating layer
- iron
- nickel
- cobalt
- lead frame
- Prior art date
Links
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49579—Lead-frames or other flat leads characterised by the materials of the lead frames or layers thereon
- H01L23/49582—Metallic layers on lead frames
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/8538—Bonding interfaces outside the semiconductor or solid-state body
- H01L2224/85399—Material
- H01L2224/854—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/85438—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/85439—Silver (Ag) as principal constituent
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/8538—Bonding interfaces outside the semiconductor or solid-state body
- H01L2224/85399—Material
- H01L2224/854—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/85438—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/85444—Gold (Au) as principal constituent
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/8538—Bonding interfaces outside the semiconductor or solid-state body
- H01L2224/85399—Material
- H01L2224/854—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/85463—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than 1550°C
- H01L2224/85464—Palladium (Pd) as principal constituent
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01046—Palladium [Pd]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01078—Platinum [Pt]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
Abstract
철 또는 철을 주성분으로 하는 소재를 사용하여 전면에 얇은 귀금속 도금을 행한 것에 있어서 내식성이 우수한 리드프레임을 제공하는 것이다. 철 또는 철을 주성분으로 하는 금속으로 된 소재의 전면에 1㎛이하의 두께의 귀금속 도금층을 형성하여 된 리드프레임에 있어서, 소재(10)위에 동 또는 동합금 도금층으로 된 제1 도금층(12)을 형성하고 이 제1 도금층(12)위에 니켈, 코발트 또는 니켈-코발트층으로 된 제2 도금층(14)을 형성하고 이 제2 도금층(14)위에 상기 귀금속 도금층(16)을 형성한 것을 특징으로 한다.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 리드프레임의 단면도
Claims (2)
- 철 또는 철을 주성분으로 하는 금속으로 된 소재의 전면에 1㎛이하의 두께의 귀금속 도금층을 형성하여 된 리드프레임에 있어서, 상기 소재위에 동 또는 동합금 도금층으로 된 제1 도금층을 형성하고 이 제1 도금층위에 니켈, 코발트 또는 니켈-코발트층으로 된 제2 도금층을 형성하고 이 제2 도금층위에 상기 귀금속 도금층을 형성한 것을 특징으로 하는 리드프레임.
- 제1항에 있어서, 상기 귀금속 도금층이 파라듐 도금층인 것을 특징으로 하는 리드프레임.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP91-298219 | 1991-10-17 | ||
JP3298219A JPH05109958A (ja) | 1991-10-17 | 1991-10-17 | リードフレーム |
Publications (1)
Publication Number | Publication Date |
---|---|
KR930009046A true KR930009046A (ko) | 1993-05-22 |
Family
ID=17856767
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019920018712A KR930009046A (ko) | 1991-10-17 | 1992-10-12 | 리드프레임 |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0538019A2 (ko) |
JP (1) | JPH05109958A (ko) |
KR (1) | KR930009046A (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100254271B1 (ko) * | 1997-08-04 | 2000-05-01 | 유무성 | 다층 도금 리이드 프레임 |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3693300B2 (ja) * | 1993-09-03 | 2005-09-07 | 日本特殊陶業株式会社 | 半導体パッケージの外部接続端子及びその製造方法 |
US5436082A (en) * | 1993-12-27 | 1995-07-25 | National Semiconductor Corporation | Protective coating combination for lead frames |
US5728285A (en) * | 1993-12-27 | 1998-03-17 | National Semiconductor Corporation | Protective coating combination for lead frames |
US5650661A (en) * | 1993-12-27 | 1997-07-22 | National Semiconductor Corporation | Protective coating combination for lead frames |
US6140703A (en) * | 1996-08-05 | 2000-10-31 | Motorola, Inc. | Semiconductor metallization structure |
KR20100103015A (ko) * | 2009-03-12 | 2010-09-27 | 엘지이노텍 주식회사 | 리드 프레임 및 그 제조방법 |
US10366946B2 (en) | 2017-10-30 | 2019-07-30 | Infineon Technologies Ag | Connection member with bulk body and electrically and thermally conductive coating |
CN110265376A (zh) | 2018-03-12 | 2019-09-20 | 意法半导体股份有限公司 | 引线框架表面精整 |
US11735512B2 (en) | 2018-12-31 | 2023-08-22 | Stmicroelectronics International N.V. | Leadframe with a metal oxide coating and method of forming the same |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4141029A (en) * | 1977-12-30 | 1979-02-20 | Texas Instruments Incorporated | Integrated circuit device |
DE3312713A1 (de) * | 1983-04-08 | 1984-10-11 | The Furukawa Electric Co., Ltd., Tokio/Tokyo | Silberbeschichtete elektrische materialien und verfahren zu ihrer herstellung |
JPS607157A (ja) * | 1983-06-25 | 1985-01-14 | Masami Kobayashi | Ic用リ−ドフレ−ム |
EP0384586A3 (en) * | 1989-02-22 | 1991-03-06 | Texas Instruments Incorporated | High reliability plastic package for integrated circuits |
JPH02222567A (ja) * | 1989-02-23 | 1990-09-05 | Hitachi Cable Ltd | リードフレーム |
JPH03225947A (ja) * | 1990-01-31 | 1991-10-04 | Shinko Electric Ind Co Ltd | リードフレーム |
-
1991
- 1991-10-17 JP JP3298219A patent/JPH05109958A/ja active Pending
-
1992
- 1992-10-12 KR KR1019920018712A patent/KR930009046A/ko not_active Application Discontinuation
- 1992-10-14 EP EP92309379A patent/EP0538019A2/en not_active Withdrawn
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100254271B1 (ko) * | 1997-08-04 | 2000-05-01 | 유무성 | 다층 도금 리이드 프레임 |
Also Published As
Publication number | Publication date |
---|---|
EP0538019A3 (ko) | 1994-03-09 |
JPH05109958A (ja) | 1993-04-30 |
EP0538019A2 (en) | 1993-04-21 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E601 | Decision to refuse application |