KR910017325U - 테스트 싸이클 라이트 풀 메모리 셀 - Google Patents

테스트 싸이클 라이트 풀 메모리 셀

Info

Publication number
KR910017325U
KR910017325U KR2019900002487U KR900002487U KR910017325U KR 910017325 U KR910017325 U KR 910017325U KR 2019900002487 U KR2019900002487 U KR 2019900002487U KR 900002487 U KR900002487 U KR 900002487U KR 910017325 U KR910017325 U KR 910017325U
Authority
KR
South Korea
Prior art keywords
memory cell
test cycle
full memory
write full
cycle write
Prior art date
Application number
KR2019900002487U
Other languages
English (en)
Other versions
KR960000460Y1 (ko
Inventor
박경아
도정기
김태훈
Original Assignee
엘지반도체 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 엘지반도체 주식회사 filed Critical 엘지반도체 주식회사
Priority to KR2019900002487U priority Critical patent/KR960000460Y1/ko
Publication of KR910017325U publication Critical patent/KR910017325U/ko
Application granted granted Critical
Publication of KR960000460Y1 publication Critical patent/KR960000460Y1/ko

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/022Detection or location of defective auxiliary circuits, e.g. defective refresh counters in I/O circuitry
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C2029/1202Word line control
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C2029/1204Bit line control
KR2019900002487U 1990-03-05 1990-03-05 테스트 싸이클 라이트 풀 메모리 셀 KR960000460Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019900002487U KR960000460Y1 (ko) 1990-03-05 1990-03-05 테스트 싸이클 라이트 풀 메모리 셀

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019900002487U KR960000460Y1 (ko) 1990-03-05 1990-03-05 테스트 싸이클 라이트 풀 메모리 셀

Publications (2)

Publication Number Publication Date
KR910017325U true KR910017325U (ko) 1991-10-28
KR960000460Y1 KR960000460Y1 (ko) 1996-01-10

Family

ID=19296454

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019900002487U KR960000460Y1 (ko) 1990-03-05 1990-03-05 테스트 싸이클 라이트 풀 메모리 셀

Country Status (1)

Country Link
KR (1) KR960000460Y1 (ko)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102065747B1 (ko) * 2019-07-30 2020-01-13 이병학 눈 운동장치

Also Published As

Publication number Publication date
KR960000460Y1 (ko) 1996-01-10

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