KR890002287B1 - 패턴 매칭방법 및 장치 - Google Patents

패턴 매칭방법 및 장치 Download PDF

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Publication number
KR890002287B1
KR890002287B1 KR1019840003221A KR840003221A KR890002287B1 KR 890002287 B1 KR890002287 B1 KR 890002287B1 KR 1019840003221 A KR1019840003221 A KR 1019840003221A KR 840003221 A KR840003221 A KR 840003221A KR 890002287 B1 KR890002287 B1 KR 890002287B1
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South Korea
Prior art keywords
pattern
master
circuit
extraction
image
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Expired
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KR1019840003221A
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English (en)
Korean (ko)
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KR850000088A (ko
Inventor
데쓰오 고에즈까
히로유끼 쓰까하라
마사또 나까시마
Original Assignee
후지쓰 가부시끼가이샤
야마모도 다꾸마
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First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=14287975&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=KR890002287(B1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by 후지쓰 가부시끼가이샤, 야마모도 다꾸마 filed Critical 후지쓰 가부시끼가이샤
Publication of KR850000088A publication Critical patent/KR850000088A/ko
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M4/00—Electrodes
    • H01M4/02—Electrodes composed of, or comprising, active material
    • H01M4/62—Selection of inactive substances as ingredients for active masses, e.g. binders, fillers
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/20—Image preprocessing
    • G06V10/24—Aligning, centring, orientation detection or correction of the image
    • G06V10/245—Aligning, centring, orientation detection or correction of the image by locating a pattern; Special marks for positioning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/21—Design or setup of recognition systems or techniques; Extraction of features in feature space; Blind source separation
    • G06F18/211—Selection of the most significant subset of features
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/28—Determining representative reference patterns, e.g. by averaging or distorting; Generating dictionaries
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/74—Image or video pattern matching; Proximity measures in feature spaces
    • G06V10/75—Organisation of the matching processes, e.g. simultaneous or sequential comparisons of image or video features; Coarse-fine approaches, e.g. multi-scale approaches; using context analysis; Selection of dictionaries
    • G06V10/758—Involving statistics of pixels or of feature values, e.g. histogram matching
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/77—Processing image or video features in feature spaces; using data integration or data reduction, e.g. principal component analysis [PCA] or independent component analysis [ICA] or self-organising maps [SOM]; Blind source separation
    • G06V10/772—Determining representative reference patterns, e.g. averaging or distorting patterns; Generating dictionaries
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10—Energy storage using batteries

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • Evolutionary Computation (AREA)
  • Artificial Intelligence (AREA)
  • Multimedia (AREA)
  • Data Mining & Analysis (AREA)
  • Software Systems (AREA)
  • Databases & Information Systems (AREA)
  • Computing Systems (AREA)
  • Medical Informatics (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Evolutionary Biology (AREA)
  • General Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Image Analysis (AREA)
KR1019840003221A 1983-06-08 1984-06-08 패턴 매칭방법 및 장치 Expired KR890002287B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP58100962A JPS59226981A (ja) 1983-06-08 1983-06-08 パタ−ンマツチング方法および装置
JP58-100962 1983-06-08
JP???58-100962 1983-06-08

Publications (2)

Publication Number Publication Date
KR850000088A KR850000088A (ko) 1985-02-25
KR890002287B1 true KR890002287B1 (ko) 1989-06-27

Family

ID=14287975

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019840003221A Expired KR890002287B1 (ko) 1983-06-08 1984-06-08 패턴 매칭방법 및 장치

Country Status (5)

Country Link
US (1) US4805224A (enExample)
EP (1) EP0128820B2 (enExample)
JP (1) JPS59226981A (enExample)
KR (1) KR890002287B1 (enExample)
DE (1) DE3484522D1 (enExample)

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DE3720489A1 (de) * 1987-06-20 1988-12-29 Sood Ralf A Verfahren zum lesen von text- und druckvorlagen
JP2539856B2 (ja) * 1987-10-15 1996-10-02 株式会社ヒューテック 印刷パタ―ン周期長のずれ検知方法
JPH01140271A (ja) * 1987-11-26 1989-06-01 Oki Electric Ind Co Ltd パターン欠陥検出装置
US5127532A (en) * 1988-06-24 1992-07-07 Cimino William J Automatic key identification system
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US5406642A (en) * 1988-12-23 1995-04-11 Nec Corporation Image matching method using direction sensitivity and vector smoothing functions for correcting matches
US5119436A (en) * 1990-09-24 1992-06-02 Kulicke And Soffa Industries, Inc Method of centering bond positions
US5091968A (en) * 1990-12-28 1992-02-25 Ncr Corporation Optical character recognition system and method
US8352400B2 (en) 1991-12-23 2013-01-08 Hoffberg Steven M Adaptive pattern recognition based controller apparatus and method and human-factored interface therefore
US6850252B1 (en) * 1999-10-05 2005-02-01 Steven M. Hoffberg Intelligent electronic appliance system and method
US6400996B1 (en) 1999-02-01 2002-06-04 Steven M. Hoffberg Adaptive pattern recognition based control system and method
US6418424B1 (en) 1991-12-23 2002-07-09 Steven M. Hoffberg Ergonomic man-machine interface incorporating adaptive pattern recognition based control system
US10361802B1 (en) 1999-02-01 2019-07-23 Blanding Hovenweep, Llc Adaptive pattern recognition based control system and method
US5903454A (en) 1991-12-23 1999-05-11 Hoffberg; Linda Irene Human-factored interface corporating adaptive pattern recognition based controller apparatus
US7242988B1 (en) 1991-12-23 2007-07-10 Linda Irene Hoffberg Adaptive pattern recognition based controller apparatus and method and human-factored interface therefore
US5479533A (en) * 1992-02-28 1995-12-26 Yamatake-Honeywell Co., Ltd. Pattern recognition apparatus and method using fuzzy logic
US5590048A (en) * 1992-06-05 1996-12-31 Fujitsu Limited Block exposure pattern data extracting system and method for charged particle beam exposure
US5442572A (en) * 1992-11-23 1995-08-15 Ford Motor Company Method and system for comparing free-form geometries using high density point data models
US5638301A (en) * 1994-06-02 1997-06-10 Ford Motor Company Method and system for inspecting die sets using free-form inspection techniques
KR980700633A (ko) * 1994-12-06 1998-03-30 로버트 에프. 도너후 디스플레이 스크린상의 데이터 블록의 디스플레이를 제어하기 위한 회로, 시스템 및 방법(circuits, systems and methods for controlling the display of blocks of data on a display screen)
JPH07302344A (ja) * 1995-01-17 1995-11-14 Toshiba Seiki Kk パターン認識装置
US5659493A (en) * 1995-03-03 1997-08-19 Ford Motor Company Virtual machining techniques for modifying computer models of parts
US5739518A (en) * 1995-05-17 1998-04-14 Metanetics Corporation Autodiscrimination for dataform decoding and standardized recording
JPH09251536A (ja) * 1996-03-15 1997-09-22 Komatsu Ltd パターンマッチングによる検査装置および検査方法
US5911003A (en) * 1996-04-26 1999-06-08 Pressco Technology Inc. Color pattern evaluation system for randomly oriented articles
US6222939B1 (en) * 1996-06-25 2001-04-24 Eyematic Interfaces, Inc. Labeled bunch graphs for image analysis
RU2129301C1 (ru) * 1997-03-04 1999-04-20 Научно-исследовательский институт измерительных систем Способ диагностики по статическому низкочастотному сигналу
RU2128843C1 (ru) * 1997-03-04 1999-04-10 Научно-исследовательский институт измерительных систем Система диагностики по статическому низкочастотному сигналу
KR100278064B1 (ko) * 1997-08-20 2001-02-01 전주범 눈영역검출장치및방법
US6272231B1 (en) 1998-11-06 2001-08-07 Eyematic Interfaces, Inc. Wavelet-based facial motion capture for avatar animation
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Also Published As

Publication number Publication date
EP0128820A3 (en) 1988-07-27
DE3484522D1 (de) 1991-06-06
EP0128820B2 (en) 1996-05-29
KR850000088A (ko) 1985-02-25
US4805224A (en) 1989-02-14
JPH0215102B2 (enExample) 1990-04-11
EP0128820B1 (en) 1991-05-02
JPS59226981A (ja) 1984-12-20
EP0128820A2 (en) 1984-12-19

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