KR20220167212A - 시험 장치 - Google Patents

시험 장치 Download PDF

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Publication number
KR20220167212A
KR20220167212A KR1020220055825A KR20220055825A KR20220167212A KR 20220167212 A KR20220167212 A KR 20220167212A KR 1020220055825 A KR1020220055825 A KR 1020220055825A KR 20220055825 A KR20220055825 A KR 20220055825A KR 20220167212 A KR20220167212 A KR 20220167212A
Authority
KR
South Korea
Prior art keywords
terminal
terminals
value
measurement
output value
Prior art date
Application number
KR1020220055825A
Other languages
English (en)
Korean (ko)
Inventor
마사유키 카와바타
타카유키 아키타
Original Assignee
주식회사 아도반테스토
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 주식회사 아도반테스토 filed Critical 주식회사 아도반테스토
Publication of KR20220167212A publication Critical patent/KR20220167212A/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0038—Circuits for comparing several input signals and for indicating the result of this comparison, e.g. equal, different, greater, smaller (comparing pulses or pulse trains according to amplitude)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0084—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring voltage only
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/10—Measuring sum, difference or ratio
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2825—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere in household appliances or professional audio/video equipment

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Multimedia (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Glass Compositions (AREA)
  • Transition And Organic Metals Composition Catalysts For Addition Polymerization (AREA)
  • Undergarments, Swaddling Clothes, Handkerchiefs Or Underwear Materials (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
KR1020220055825A 2021-06-11 2022-05-06 시험 장치 KR20220167212A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2021-097940 2021-06-11
JP2021097940A JP2022189388A (ja) 2021-06-11 2021-06-11 試験装置

Publications (1)

Publication Number Publication Date
KR20220167212A true KR20220167212A (ko) 2022-12-20

Family

ID=84533003

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020220055825A KR20220167212A (ko) 2021-06-11 2022-05-06 시험 장치

Country Status (3)

Country Link
JP (1) JP2022189388A (ja)
KR (1) KR20220167212A (ja)
TW (1) TWI815413B (ja)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0862307A (ja) 1994-08-17 1996-03-08 Advantest Corp 高精度電圧試験装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3558964B2 (ja) * 1999-07-23 2004-08-25 シャープ株式会社 半導体集積回路の検査装置及びその検査方法
JP3522662B2 (ja) * 1999-07-23 2004-04-26 シャープ株式会社 半導体集積回路の検査装置及びその検査方法並びにその検査プログラムを記録した記憶媒体
JP4157144B2 (ja) * 2005-05-09 2008-09-24 株式会社アドバンテスト 試験装置、試験方法、および半導体デバイス
JPWO2011001463A1 (ja) * 2009-06-29 2012-12-10 株式会社アドバンテスト 試験装置、校正方法およびプログラム
WO2018163021A1 (en) * 2017-03-07 2018-09-13 Semiconductor Energy Laboratory Co., Ltd. Ic, driver ic, display system, and electronic device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0862307A (ja) 1994-08-17 1996-03-08 Advantest Corp 高精度電圧試験装置

Also Published As

Publication number Publication date
TW202248656A (zh) 2022-12-16
TWI815413B (zh) 2023-09-11
JP2022189388A (ja) 2022-12-22

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