KR20130117324A - 반도체 웨이퍼의 싱귤레이션 장치 및 방법 - Google Patents
반도체 웨이퍼의 싱귤레이션 장치 및 방법 Download PDFInfo
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- KR20130117324A KR20130117324A KR20120107148A KR20120107148A KR20130117324A KR 20130117324 A KR20130117324 A KR 20130117324A KR 20120107148 A KR20120107148 A KR 20120107148A KR 20120107148 A KR20120107148 A KR 20120107148A KR 20130117324 A KR20130117324 A KR 20130117324A
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- Prior art keywords
- semiconductor wafer
- dicing
- cutting
- singulation
- wafer
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 74
- 238000000034 method Methods 0.000 title claims abstract description 17
- 239000000853 adhesive Substances 0.000 claims description 2
- 230000001070 adhesive effect Effects 0.000 claims description 2
- 230000002093 peripheral effect Effects 0.000 abstract description 2
- 235000012431 wafers Nutrition 0.000 description 81
- 239000000758 substrate Substances 0.000 description 5
- 238000012546 transfer Methods 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 241001050985 Disco Species 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000013021 overheating Methods 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
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Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/08—Devices involving relative movement between laser beam and workpiece
- B23K26/083—Devices involving movement of the workpiece in at least one axial direction
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/02—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills
- B28D5/022—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills by cutting with discs or wheels
- B28D5/029—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills by cutting with discs or wheels with a plurality of cutting blades
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T83/00—Cutting
- Y10T83/748—With work immobilizer
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Mechanical Engineering (AREA)
- Plasma & Fusion (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Dicing (AREA)
- Processing Of Stones Or Stones Resemblance Materials (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Abstract
Description
도 2는 기어를 갖는 전동 기구를 포함하는 본 발명의 실시예에 따른 다이싱 장치의 실시예의 사시도이다.
도 3은 풀리 및 벨트를 갖는 전동 기구를 포함하는 도 2의 다이싱 장치의 대안적인 실시예의 사시도이다.
도 4는 서로 대향한 다이싱 블레이드의 쌍들을 갖는 본 발명에 따른 다이싱 장치의 실시예의 사시도이다.
도 5는 제1 방향 및 이에 직교하는 제2 방향으로 동시에 작동할 수 있는 다이싱 블레이드들을 갖는 본 발명에 따른 다이싱 장치의 실시예의 사시도이다.
도 6은 레이저 모듈을 포함한 절단 장치를 구비하는 본 발명에 따른 본 발명에 따른 다이싱 장치의 다른 실시예의 사시도이다.
도 7은 회전 미러를 갖는 레이저 모듈을 포함하는 도 6의 다이싱 장치의 실시예의 사시도이다.
도 8은 연속하여 배치된 레이저 모듈들을 갖고 있는 본 발명에 따른 다이싱 장치의 실시예의 사시도이다.
도 9는 반도체 웨이퍼의 싱귤레이션 방법의 몇몇 실시예의 흐름도이다.
102, 202, 302, 602자, 702, 802 : 지지체
103, 203, 303, 403, 503, 603, 703, 803 : 반도체 웨이퍼
104, 204, 304, 604, 704, 804 : 다이싱 테이프
106, 206, 306 : 다이싱 소오
205, 505, 605 : 반도체 웨이퍼의 둘레 에지
410, 510 : 다이싱 블레이드
606, 706, 806 : 레이저 모듈(절단 장치)
Claims (10)
- 반도체 웨이퍼의 싱귤레이션(singulation) 장치로서,
반도체 웨이퍼 지지체; 및
복수의 절단 장치
를 포함하며, 이 절단 장치는 복수의 절단 라인을 평행하게 동시에 형성하도록 반도체 웨이퍼의 표면을 동시에 절단하는 것인 반도체 웨이퍼의 싱귤레이션 장치. - 제1항에 있어서, 상기 절단 장치는 적어도 2개의 다이싱 소오를 포함하는 것인 반도체 웨이퍼의 싱귤레이션 장치.
- 제2항에 있어서, 상기 다이싱 소오들은 반도체 웨이퍼의 표면을 따라 서로 직교하는 해당 축선을 따라 절단 라인을 형성하도록 작동하는 것인 반도체 웨이퍼의 싱귤레이션 장치.
- 제2항에 있어서, 상기 다이싱 소오들은 반도체 웨이퍼의 전체 둘레 에지에 걸쳐 U자 형상을 형성하도록 배치되는 것인 반도체 웨이퍼의 싱귤레이션 장치.
- 제1항에 있어서, 상기 절단 장치는 적어도 2개의 레이저 모듈을 포함하는 것인 반도체 웨이퍼의 싱귤레이션 장치.
- 제5항에 있어서, 각각의 레이저 모듈은 레이저의 반사각을 조절하도록 회전 미러를 더 포함하는 것인 반도체 웨이퍼의 싱귤레이션 장치.
- 반도체 웨이퍼의 싱귤레이션 방법으로서,
반도체 웨이퍼를 지지체 표면 상에 지지하는 단계;
복수의 절단 장치를 제공하는 단계; 및
상기 복수의 절단 장치로 반도체 웨이퍼를 절단하는 단계
를 포함하며, 상기 절단 장치는 반도체 웨이퍼의 표면 상에 복수의 절단 라인을 동시에 형성하도록 작동할 수 있는 것인 반도체 웨이퍼의 싱귤레이션 방법. - 제7항에 있어서, 상기 절단 장치를 반도체 웨이퍼에 대해 또는 반도체 웨이퍼를 절단 장치에 대해 90°만큼 회전시키는 단계를 더 포함하는 것인 반도체 웨이퍼의 싱귤레이션 방법.
- 적어도 2개의 절단 장치를 포함하는 반도체 웨이퍼의 싱귤레이션 장치로서,
상기 절단 장치는 다이싱 블레이드 또는 레이저 모듈을 포함하는 한편, 반도체 웨이퍼의 전체 둘레 에지에 걸쳐 소정 방향으로 반도체 웨이퍼의 동시 다이싱을 수행하도록 작동할 수 있는 것인 반도체 웨이퍼의 싱귤레이션 장치. - 제9항에 있어서, 반도체 웨이퍼 지지체를 더 포함하며, 이 지지체는 반도체 웨이퍼를 지지체에 장착하도록 기계식, 진공식, 또는 접착식 수단을 포함하는 것인 반도체 웨이퍼의 싱귤레이션 장치.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13/448,648 | 2012-04-17 | ||
US13/448,648 US20130273717A1 (en) | 2012-04-17 | 2012-04-17 | Apparatus and Method for the Singulation of a Semiconductor Wafer |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20130117324A true KR20130117324A (ko) | 2013-10-25 |
Family
ID=49325466
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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KR20120107148A KR20130117324A (ko) | 2012-04-17 | 2012-09-26 | 반도체 웨이퍼의 싱귤레이션 장치 및 방법 |
Country Status (4)
Country | Link |
---|---|
US (1) | US20130273717A1 (ko) |
KR (1) | KR20130117324A (ko) |
CN (1) | CN103377909B (ko) |
TW (1) | TWI489538B (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20180104566A (ko) * | 2017-03-13 | 2018-09-21 | 가부시기가이샤 디스코 | 피가공물의 가공 방법 |
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GB2426757B (en) * | 2005-06-03 | 2008-02-27 | Crt Heaven Ltd | Apparatus and method for cutting a cathode ray tube |
JP5996260B2 (ja) * | 2012-05-09 | 2016-09-21 | 株式会社ディスコ | 被加工物の分割方法 |
US9154138B2 (en) | 2013-10-11 | 2015-10-06 | Palo Alto Research Center Incorporated | Stressed substrates for transient electronic systems |
US9508570B2 (en) * | 2013-10-21 | 2016-11-29 | Asm Technology Singapore Pte Ltd | Singulation apparatus and method |
PT2974822T (pt) * | 2014-07-14 | 2017-11-14 | Asm Tech Singapore Pte Ltd | Método de divisão de substratos semicondutores finos |
KR20160113892A (ko) * | 2015-03-23 | 2016-10-04 | 삼성전자주식회사 | 발광 소자 패키지 제조 방법 |
DE102015118042A1 (de) * | 2015-10-22 | 2017-04-27 | Nexwafe Gmbh | Verfahren und Vorrichtung zum Herstellen einer Halbleiterschicht |
US10224297B2 (en) | 2016-07-26 | 2019-03-05 | Palo Alto Research Center Incorporated | Sensor and heater for stimulus-initiated fracture of a substrate |
US10026579B2 (en) | 2016-07-26 | 2018-07-17 | Palo Alto Research Center Incorporated | Self-limiting electrical triggering for initiating fracture of frangible glass |
CN106548981B (zh) * | 2016-09-30 | 2019-01-22 | 大族激光科技产业集团股份有限公司 | 硅晶片的激光加工方法 |
US10903173B2 (en) | 2016-10-20 | 2021-01-26 | Palo Alto Research Center Incorporated | Pre-conditioned substrate |
US10717669B2 (en) * | 2018-05-16 | 2020-07-21 | Palo Alto Research Center Incorporated | Apparatus and method for creating crack initiation sites in a self-fracturing frangible member |
KR102674268B1 (ko) * | 2018-10-30 | 2024-06-12 | 하마마츠 포토닉스 가부시키가이샤 | 레이저 가공 장치 |
US11107645B2 (en) | 2018-11-29 | 2021-08-31 | Palo Alto Research Center Incorporated | Functionality change based on stress-engineered components |
US10947150B2 (en) | 2018-12-03 | 2021-03-16 | Palo Alto Research Center Incorporated | Decoy security based on stress-engineered substrates |
US10969205B2 (en) | 2019-05-03 | 2021-04-06 | Palo Alto Research Center Incorporated | Electrically-activated pressure vessels for fracturing frangible structures |
CN112338669B (zh) * | 2020-10-29 | 2021-08-13 | 邵阳学院 | 一种用于高端装备制造的钢块分割抛光设备 |
US12013043B2 (en) | 2020-12-21 | 2024-06-18 | Xerox Corporation | Triggerable mechanisms and fragment containment arrangements for self-destructing frangible structures and sealed vessels |
US11904986B2 (en) | 2020-12-21 | 2024-02-20 | Xerox Corporation | Mechanical triggers and triggering methods for self-destructing frangible structures and sealed vessels |
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US6250192B1 (en) * | 1996-11-12 | 2001-06-26 | Micron Technology, Inc. | Method for sawing wafers employing multiple indexing techniques for multiple die dimensions |
JP3485816B2 (ja) * | 1998-12-09 | 2004-01-13 | 太陽誘電株式会社 | ダイシング装置 |
JP2002359211A (ja) * | 2001-05-30 | 2002-12-13 | Disco Abrasive Syst Ltd | 切削機 |
SG118084A1 (en) * | 2001-08-24 | 2006-01-27 | Micron Technology Inc | Method and apparatus for cutting semiconductor wafers |
US7100486B2 (en) * | 2003-07-08 | 2006-09-05 | Leprino Foods Company | Apparatus for dicing a deformable product |
JP4481667B2 (ja) * | 2004-02-02 | 2010-06-16 | 株式会社ディスコ | 切削方法 |
KR100462359B1 (ko) * | 2004-08-18 | 2004-12-17 | 주식회사 이오테크닉스 | 폴리곤 미러를 이용한 레이저 가공장치 및 방법 |
JP4919339B2 (ja) * | 2006-11-10 | 2012-04-18 | レオン自動機株式会社 | 食品生地の切断方法及びその装置 |
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2012
- 2012-04-17 US US13/448,648 patent/US20130273717A1/en not_active Abandoned
- 2012-08-06 TW TW101128180A patent/TWI489538B/zh active
- 2012-08-07 CN CN201210278313.4A patent/CN103377909B/zh active Active
- 2012-09-26 KR KR20120107148A patent/KR20130117324A/ko active Search and Examination
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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KR20180104566A (ko) * | 2017-03-13 | 2018-09-21 | 가부시기가이샤 디스코 | 피가공물의 가공 방법 |
Also Published As
Publication number | Publication date |
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CN103377909B (zh) | 2016-09-07 |
TWI489538B (zh) | 2015-06-21 |
CN103377909A (zh) | 2013-10-30 |
TW201344772A (zh) | 2013-11-01 |
US20130273717A1 (en) | 2013-10-17 |
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