KR20110082476A - 대상체들의 다수의 측면을 이미지 촬영하도록 된 이미징 시스템에 대상체들을 제공하는 시스템 및 방법 - Google Patents

대상체들의 다수의 측면을 이미지 촬영하도록 된 이미징 시스템에 대상체들을 제공하는 시스템 및 방법 Download PDF

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Publication number
KR20110082476A
KR20110082476A KR1020100135191A KR20100135191A KR20110082476A KR 20110082476 A KR20110082476 A KR 20110082476A KR 1020100135191 A KR1020100135191 A KR 1020100135191A KR 20100135191 A KR20100135191 A KR 20100135191A KR 20110082476 A KR20110082476 A KR 20110082476A
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KR
South Korea
Prior art keywords
objects
container
tunnels
feeder
amount
Prior art date
Application number
KR1020100135191A
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English (en)
Korean (ko)
Inventor
샤이 코헨
Original Assignee
캠텍 리미티드
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Publication date
Application filed by 캠텍 리미티드 filed Critical 캠텍 리미티드
Publication of KR20110082476A publication Critical patent/KR20110082476A/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G51/00—Conveying articles through pipes or tubes by fluid flow or pressure; Conveying articles over a flat surface, e.g. the base of a trough, by jets located in the surface
    • B65G51/02—Directly conveying the articles, e.g. slips, sheets, stockings, containers or workpieces, by flowing gases
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Fluid Mechanics (AREA)
  • Mechanical Engineering (AREA)
  • Sorting Of Articles (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
KR1020100135191A 2010-01-11 2010-12-27 대상체들의 다수의 측면을 이미지 촬영하도록 된 이미징 시스템에 대상체들을 제공하는 시스템 및 방법 KR20110082476A (ko)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US29372810P 2010-01-11 2010-01-11
US61/293,728 2010-01-11
JP2010269949A JP5774296B2 (ja) 2010-01-11 2010-12-03 物体の複数側面を画像化するようになされた画像システムへの物体の供給
JPJP-P-2010-269949 2010-12-03

Publications (1)

Publication Number Publication Date
KR20110082476A true KR20110082476A (ko) 2011-07-19

Family

ID=44456546

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020100135191A KR20110082476A (ko) 2010-01-11 2010-12-27 대상체들의 다수의 측면을 이미지 촬영하도록 된 이미징 시스템에 대상체들을 제공하는 시스템 및 방법

Country Status (3)

Country Link
JP (1) JP5774296B2 (zh)
KR (1) KR20110082476A (zh)
CN (1) CN102183698B (zh)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9645097B2 (en) 2014-06-20 2017-05-09 Kla-Tencor Corporation In-line wafer edge inspection, wafer pre-alignment, and wafer cleaning
US9885671B2 (en) 2014-06-09 2018-02-06 Kla-Tencor Corporation Miniaturized imaging apparatus for wafer edge

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6085530U (ja) * 1983-11-15 1985-06-12 アジナ技研株式会社 球体の圧縮空気による搬送装置
JP2961510B2 (ja) * 1995-05-23 1999-10-12 長野日本無線株式会社 部品供給装置
JPH11301850A (ja) * 1998-04-20 1999-11-02 Sony Corp バルクフィーダ
JPH11330782A (ja) * 1998-05-13 1999-11-30 Taiyo Yuden Co Ltd 電子部品取込装置
JP2000183590A (ja) * 1998-12-18 2000-06-30 Sony Corp 部品供給装置及びそれを備えた部品装着装置
JP3521401B2 (ja) * 2000-10-30 2004-04-19 日本リトル株式会社 電子部品整列供給装置
CN2935142Y (zh) * 2005-11-22 2007-08-15 清华大学 成像设备
CN200989990Y (zh) * 2006-09-04 2007-12-12 万航 X片传送装置
CN200996943Y (zh) * 2006-10-09 2007-12-26 同方威视技术股份有限公司 一种货物检查设备
EP2011574A1 (en) * 2007-07-02 2009-01-07 STMicroelectronics (Research & Development) Limited Assaying device and method of transporting a fluid in an assaying device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9885671B2 (en) 2014-06-09 2018-02-06 Kla-Tencor Corporation Miniaturized imaging apparatus for wafer edge
US9645097B2 (en) 2014-06-20 2017-05-09 Kla-Tencor Corporation In-line wafer edge inspection, wafer pre-alignment, and wafer cleaning

Also Published As

Publication number Publication date
JP5774296B2 (ja) 2015-09-09
CN102183698B (zh) 2015-04-01
JP2011140398A (ja) 2011-07-21
CN102183698A (zh) 2011-09-14

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