KR20100102616A - 기판의 오염물을 제어하기 위한 방법 및 장치 - Google Patents
기판의 오염물을 제어하기 위한 방법 및 장치 Download PDFInfo
- Publication number
- KR20100102616A KR20100102616A KR1020107013791A KR20107013791A KR20100102616A KR 20100102616 A KR20100102616 A KR 20100102616A KR 1020107013791 A KR1020107013791 A KR 1020107013791A KR 20107013791 A KR20107013791 A KR 20107013791A KR 20100102616 A KR20100102616 A KR 20100102616A
- Authority
- KR
- South Korea
- Prior art keywords
- container
- purge
- wafer
- substrate
- enclosure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Images
Classifications
-
- H10P72/3404—
-
- H10P72/0402—
Landscapes
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Treatments Of Macromolecular Shaped Articles (AREA)
- Packaging Frangible Articles (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US1470907P | 2007-12-18 | 2007-12-18 | |
| US61/014,709 | 2007-12-18 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20100102616A true KR20100102616A (ko) | 2010-09-24 |
Family
ID=40796141
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020107013791A Withdrawn KR20100102616A (ko) | 2007-12-18 | 2008-12-18 | 기판의 오염물을 제어하기 위한 방법 및 장치 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20110114129A1 (enExample) |
| JP (1) | JP2011507309A (enExample) |
| KR (1) | KR20100102616A (enExample) |
| CN (1) | CN101970315B (enExample) |
| TW (1) | TW200948688A (enExample) |
| WO (1) | WO2009079636A2 (enExample) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20170113389A (ko) * | 2016-03-31 | 2017-10-12 | 가부시키가이샤 다이후쿠 | 용기 수납 설비 |
| KR20180028974A (ko) * | 2016-09-09 | 2018-03-19 | 가부시키가이샤 다이후쿠 | 물품 수납 설비 |
| KR20180059914A (ko) * | 2015-10-05 | 2018-06-05 | 브룩스 씨씨에스 게엠베하 | 반도체 시스템의 습도 제어 |
Families Citing this family (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7328727B2 (en) * | 2004-04-18 | 2008-02-12 | Entegris, Inc. | Substrate container with fluid-sealing flow passageway |
| US9536763B2 (en) | 2011-06-28 | 2017-01-03 | Brooks Automation, Inc. | Semiconductor stocker systems and methods |
| KR101147192B1 (ko) * | 2011-11-11 | 2012-05-25 | 주식회사 엘에스테크 | 웨이퍼 표면상의 증착 이물 제거 장치 |
| JP5527624B2 (ja) * | 2012-01-05 | 2014-06-18 | 株式会社ダイフク | 保管棚用の不活性ガス注入装置 |
| US9381011B2 (en) | 2012-03-29 | 2016-07-05 | Depuy (Ireland) | Orthopedic surgical instrument for knee surgery |
| CN103426792A (zh) * | 2012-05-24 | 2013-12-04 | 上海宏力半导体制造有限公司 | 一种密封的n2清洗装置 |
| JP6131534B2 (ja) * | 2012-06-11 | 2017-05-24 | シンフォニアテクノロジー株式会社 | パージノズルユニット、ロードポート、載置台、ストッカー |
| US9412632B2 (en) * | 2012-10-25 | 2016-08-09 | Taiwan Semiconductor Manufacturing Company, Ltd. | Reticle pod |
| US9136149B2 (en) | 2012-11-16 | 2015-09-15 | Taiwan Semiconductor Manufacturing Company, Ltd. | Loading port, system for etching and cleaning wafers and method of use |
| FR2999016A1 (fr) * | 2012-11-30 | 2014-06-06 | Adixen Vacuum Products | Station et procede de mesure de la contamination en particules d'une enceinte de transport pour le convoyage et le stockage atmospherique de substrats semi-conducteurs |
| TWI615334B (zh) * | 2013-03-26 | 2018-02-21 | Gudeng Precision Industrial Co., Ltd. | 具有氣體導引裝置之光罩盒 |
| CN103409814B (zh) * | 2013-07-15 | 2016-05-18 | 东华大学 | 一种密封式吹干装置及方法 |
| US10583983B2 (en) | 2016-03-31 | 2020-03-10 | Daifuku Co., Ltd. | Container storage facility |
| JP2017210899A (ja) * | 2016-05-24 | 2017-11-30 | 愛三工業株式会社 | 燃料通路構造 |
| US10741432B2 (en) * | 2017-02-06 | 2020-08-11 | Applied Materials, Inc. | Systems, apparatus, and methods for a load port door opener |
| JP6347301B2 (ja) * | 2017-04-06 | 2018-06-27 | シンフォニアテクノロジー株式会社 | ロードポート及びノズル駆動ユニット |
| KR102516885B1 (ko) * | 2018-05-10 | 2023-03-30 | 삼성전자주식회사 | 증착 장비 및 이를 이용한 반도체 장치 제조 방법 |
| JP6614278B2 (ja) * | 2018-05-24 | 2019-12-04 | シンフォニアテクノロジー株式会社 | 容器パージ装置 |
| US11189511B2 (en) * | 2018-10-26 | 2021-11-30 | Applied Materials, Inc. | Side storage pods, equipment front end modules, and methods for operating EFEMs |
| US11244844B2 (en) * | 2018-10-26 | 2022-02-08 | Applied Materials, Inc. | High flow velocity, gas-purged, side storage pod apparatus, assemblies, and methods |
| US11373891B2 (en) | 2018-10-26 | 2022-06-28 | Applied Materials, Inc. | Front-ducted equipment front end modules, side storage pods, and methods of operating the same |
| KR102479895B1 (ko) * | 2020-07-03 | 2022-12-21 | 우범제 | 웨이퍼 수납용기 |
| US12087605B2 (en) * | 2020-09-30 | 2024-09-10 | Gudeng Precision Industrial Co., Ltd. | Reticle pod with antistatic capability |
| US11822257B2 (en) * | 2021-03-12 | 2023-11-21 | Gudeng Precision Industrial Co., Ltd. | Reticle storage pod and method for securing reticle |
| JP2024533399A (ja) * | 2021-09-09 | 2024-09-12 | インテグリス・インコーポレーテッド | 傾斜面を含むラッチを有するレチクルポッド |
| TWI805266B (zh) * | 2022-03-11 | 2023-06-11 | 迅得機械股份有限公司 | 基板卡匣的載具及微型倉儲系統 |
| FR3139904B1 (fr) * | 2022-09-20 | 2024-08-30 | Pfeiffer Vacuum | Dispositif de mesure de la contamination gazeuse d’une enceinte de transport de substrats semi-conducteurs et procédé de mesure associé |
| US20250208526A1 (en) * | 2023-12-26 | 2025-06-26 | Entegris, Inc. | Photolithography substrate with purge flow direction |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0552756A1 (en) * | 1992-01-21 | 1993-07-28 | Shinko Electric Co. Ltd. | Article storage house in a clean room |
| US5746008A (en) * | 1992-07-29 | 1998-05-05 | Shinko Electric Co., Ltd. | Electronic substrate processing system using portable closed containers |
| JP3226998B2 (ja) * | 1992-12-04 | 2001-11-12 | 株式会社荏原製作所 | 二重シール容器構造 |
| US6926017B2 (en) * | 1998-01-09 | 2005-08-09 | Entegris, Inc. | Wafer container washing apparatus |
| EP1062468B1 (en) * | 1998-03-09 | 2004-01-07 | Convey Incorporated | A package for storing contaminant-sensitive articles |
| TW522482B (en) * | 2000-08-23 | 2003-03-01 | Tokyo Electron Ltd | Vertical heat treatment system, method for controlling vertical heat treatment system, and method for transferring object to be treated |
| JP3939101B2 (ja) * | 2000-12-04 | 2007-07-04 | 株式会社荏原製作所 | 基板搬送方法および基板搬送容器 |
| JP2003092345A (ja) * | 2001-07-13 | 2003-03-28 | Semiconductor Leading Edge Technologies Inc | 基板収納容器、基板搬送システム、保管装置及びガス置換方法 |
| KR100649926B1 (ko) * | 2001-11-14 | 2006-11-27 | 로제 가부시키가이샤 | 웨이퍼 위치 결정 방법 및 장치, 처리 시스템, 웨이퍼위치 결정 장치의 웨이퍼 시트 회전 축선 위치 결정 방법 |
| US7400383B2 (en) * | 2005-04-04 | 2008-07-15 | Entegris, Inc. | Environmental control in a reticle SMIF pod |
-
2008
- 2008-12-18 TW TW097149370A patent/TW200948688A/zh unknown
- 2008-12-18 KR KR1020107013791A patent/KR20100102616A/ko not_active Withdrawn
- 2008-12-18 WO PCT/US2008/087474 patent/WO2009079636A2/en not_active Ceased
- 2008-12-18 US US12/809,049 patent/US20110114129A1/en not_active Abandoned
- 2008-12-18 JP JP2010539813A patent/JP2011507309A/ja active Pending
- 2008-12-18 CN CN2008801269959A patent/CN101970315B/zh not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20180059914A (ko) * | 2015-10-05 | 2018-06-05 | 브룩스 씨씨에스 게엠베하 | 반도체 시스템의 습도 제어 |
| KR20170113389A (ko) * | 2016-03-31 | 2017-10-12 | 가부시키가이샤 다이후쿠 | 용기 수납 설비 |
| KR20180028974A (ko) * | 2016-09-09 | 2018-03-19 | 가부시키가이샤 다이후쿠 | 물품 수납 설비 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101970315B (zh) | 2013-05-15 |
| WO2009079636A3 (en) | 2009-09-11 |
| US20110114129A1 (en) | 2011-05-19 |
| JP2011507309A (ja) | 2011-03-03 |
| WO2009079636A4 (en) | 2009-10-29 |
| WO2009079636A2 (en) | 2009-06-25 |
| TW200948688A (en) | 2009-12-01 |
| CN101970315A (zh) | 2011-02-09 |
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St.27 status event code: A-0-1-A10-A15-nap-PA0105 |
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| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
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| P13-X000 | Application amended |
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| PG1501 | Laying open of application |
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| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
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| PC1203 | Withdrawal of no request for examination |
St.27 status event code: N-1-6-B10-B12-nap-PC1203 |
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| WITN | Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid | ||
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| R18-X000 | Changes to party contact information recorded |
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| P22-X000 | Classification modified |
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