KR20100083125A - 간접적 표면 세정 장치 및 방법 - Google Patents
간접적 표면 세정 장치 및 방법 Download PDFInfo
- Publication number
- KR20100083125A KR20100083125A KR1020107005270A KR20107005270A KR20100083125A KR 20100083125 A KR20100083125 A KR 20100083125A KR 1020107005270 A KR1020107005270 A KR 1020107005270A KR 20107005270 A KR20107005270 A KR 20107005270A KR 20100083125 A KR20100083125 A KR 20100083125A
- Authority
- KR
- South Korea
- Prior art keywords
- substrate
- laser
- temperature
- photomask
- cleaning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
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Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B7/00—Cleaning by methods not provided for in a single other subclass or a single group in this subclass
- B08B7/0035—Cleaning by methods not provided for in a single other subclass or a single group in this subclass by radiant energy, e.g. UV, laser, light beam or the like
- B08B7/0042—Cleaning by methods not provided for in a single other subclass or a single group in this subclass by radiant energy, e.g. UV, laser, light beam or the like by laser
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/68—Preparation processes not covered by groups G03F1/20 - G03F1/50
- G03F1/82—Auxiliary processes, e.g. cleaning or inspecting
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S134/00—Cleaning and liquid contact with solids
- Y10S134/902—Semiconductor wafer
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- General Physics & Mathematics (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US95498907P | 2007-08-09 | 2007-08-09 | |
| US60/954,989 | 2007-08-09 | ||
| US12/055,178 | 2008-03-25 | ||
| US12/055,178 US7993464B2 (en) | 2007-08-09 | 2008-03-25 | Apparatus and method for indirect surface cleaning |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20100083125A true KR20100083125A (ko) | 2010-07-21 |
Family
ID=40341647
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020107005270A Ceased KR20100083125A (ko) | 2007-08-09 | 2008-07-30 | 간접적 표면 세정 장치 및 방법 |
Country Status (5)
| Country | Link |
|---|---|
| US (5) | US7993464B2 (enExample) |
| EP (1) | EP2178655B1 (enExample) |
| JP (1) | JP5174910B2 (enExample) |
| KR (1) | KR20100083125A (enExample) |
| WO (1) | WO2009020808A1 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2021003288A1 (en) * | 2019-07-02 | 2021-01-07 | Entegris, Inc. | Methods of using laser energy to remove particles from a surface |
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| US11311917B2 (en) * | 2007-08-09 | 2022-04-26 | Bruker Nano, Inc. | Apparatus and method for contamination identification |
| EP2077467B9 (fr) | 2008-01-04 | 2014-09-03 | Adixen Vacuum Products | Procédé de fabrication de photomasques et dispositif pour sa mise en oeuvre |
| KR101253825B1 (ko) * | 2008-03-05 | 2013-04-12 | 알까뗄 루슨트 | 포토마스크 제조 방법 |
| JP2009244686A (ja) * | 2008-03-31 | 2009-10-22 | Fujitsu Microelectronics Ltd | フォトマスクの処理方法及び装置 |
| JP5478145B2 (ja) * | 2009-08-18 | 2014-04-23 | 東京エレクトロン株式会社 | ポリマー除去装置およびポリマー除去方法 |
| JP2011066259A (ja) * | 2009-09-18 | 2011-03-31 | Toshiba Corp | マスク洗浄方法及びマスク洗浄装置 |
| US8987632B2 (en) * | 2009-10-09 | 2015-03-24 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Modification of surface energy via direct laser ablative surface patterning |
| US8658937B2 (en) * | 2010-01-08 | 2014-02-25 | Uvtech Systems, Inc. | Method and apparatus for processing substrate edges |
| US20110147350A1 (en) * | 2010-12-03 | 2011-06-23 | Uvtech Systems Inc. | Modular apparatus for wafer edge processing |
| US20130126467A1 (en) * | 2011-11-18 | 2013-05-23 | Shenzhen China Star Optoelectronics Technology Co., Ltd. | Method for manufacturing conductive lines with small line-to-line space |
| US9278374B2 (en) | 2012-06-08 | 2016-03-08 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Modified surface having low adhesion properties to mitigate insect residue adhesion |
| TW201422320A (zh) * | 2012-12-03 | 2014-06-16 | Gudeng Prec Industral Co Ltd | 光罩之吹氣清潔系統及其清潔方法 |
| KR20140130963A (ko) * | 2013-05-02 | 2014-11-12 | 삼성디스플레이 주식회사 | 유기물 세정 장치 및 세정 방법 |
| KR101461437B1 (ko) * | 2013-05-27 | 2014-11-18 | 에이피시스템 주식회사 | 포토마스크 세정 장치 및 이를 이용한 포토마스크 세정 방법 |
| KR102402035B1 (ko) | 2014-11-14 | 2022-05-26 | 삼성전자주식회사 | 펠리클을 포함하는 마스크, 펠리클 리페어 장치, 및 기판 제조 설비 |
| JP2018508048A (ja) * | 2015-03-12 | 2018-03-22 | レイヴ リミテッド ライアビリティ カンパニー | 間接的表面清浄化装置および方法 |
| JP6565473B2 (ja) * | 2015-08-20 | 2019-08-28 | 大日本印刷株式会社 | 露光用マスクおよびその管理方法 |
| KR20170025100A (ko) * | 2015-08-27 | 2017-03-08 | 삼성전자주식회사 | 포토 마스크 세정 장치 |
| KR102661452B1 (ko) | 2015-10-14 | 2024-04-26 | 파이버린 테크놀로지스 리미티드 | 3d-성형 가능한 시트 물질 |
| TWI619937B (zh) * | 2016-01-15 | 2018-04-01 | 奇美視像科技股份有限公司 | 以多光子激發技術檢查物體之方法以及量測物體之裝置 |
| DE102016206088A1 (de) * | 2016-04-12 | 2017-05-24 | Carl Zeiss Smt Gmbh | Verfahren zum Bestimmen der Dicke einer kontaminierenden Schicht und/oder der Art eines kontaminierenden Materials, optisches Element und EUV-Lithographiesystem |
| US9958771B2 (en) * | 2016-06-23 | 2018-05-01 | Rave Llc | Method and apparatus for pellicle removal |
| KR102500603B1 (ko) * | 2017-01-06 | 2023-02-17 | 레이브 엘엘씨 | 오염 식별 장치 및 방법 |
| WO2018145001A1 (en) * | 2017-02-06 | 2018-08-09 | Planar Semiconductor, Inc. | Subnanometer-level light-based substrate cleaning mechanism |
| WO2019024091A1 (zh) * | 2017-08-04 | 2019-02-07 | 深圳市柔宇科技有限公司 | 激光修复方法和激光修复设备 |
| CN108160617B (zh) * | 2017-12-12 | 2021-04-30 | 深圳市华星光电半导体显示技术有限公司 | 清洁装置 |
| US10898932B2 (en) * | 2018-02-12 | 2021-01-26 | Suss Micro Tec Photomask Equipment Gmbh & Co Kg | Method and apparatus for cleaning a substrate and computer program product |
| JP7597993B2 (ja) * | 2020-01-21 | 2024-12-11 | 横浜ゴム株式会社 | 加硫用モールドの洗浄方法 |
| CN111940423B (zh) * | 2020-08-07 | 2021-07-13 | 武汉金顿激光科技有限公司 | 一种飞机非导电复合涂层的原位激光清洗方法 |
| KR20220049651A (ko) | 2020-10-14 | 2022-04-22 | 삼성전자주식회사 | 극자외선(euv) 포토마스크 제조 방법, 포토마스크 보정 방법 및 장치 |
| KR20220125832A (ko) * | 2021-03-03 | 2022-09-15 | 삼성전자주식회사 | Euv 마스크 검사 시스템 및 이를 이용한 euv 마스크 검사 방법 |
| US11822231B2 (en) * | 2021-03-30 | 2023-11-21 | Taiwan Semiconductor Manufacturing Company Ltd. | Method for removing particles from pellicle and photomask |
| DE102021120747B4 (de) | 2021-08-10 | 2024-07-11 | Carl Zeiss Sms Ltd. | Verfahren zur Entfernung eines Partikels von einem Maskensystem |
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2008
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- 2008-07-30 WO PCT/US2008/071546 patent/WO2009020808A1/en not_active Ceased
- 2008-07-30 EP EP08796835.0A patent/EP2178655B1/en active Active
- 2008-07-30 JP JP2010520148A patent/JP5174910B2/ja active Active
- 2008-07-30 KR KR1020107005270A patent/KR20100083125A/ko not_active Ceased
- 2008-11-24 US US12/277,106 patent/US8293019B2/en active Active
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2012
- 2012-10-22 US US13/657,847 patent/US8613803B2/en active Active
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2013
- 2013-11-11 US US14/077,028 patent/US8741067B2/en active Active
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2021003288A1 (en) * | 2019-07-02 | 2021-01-07 | Entegris, Inc. | Methods of using laser energy to remove particles from a surface |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2009020808A1 (en) | 2009-02-12 |
| JP5174910B2 (ja) | 2013-04-03 |
| US20130276818A1 (en) | 2013-10-24 |
| US20140283873A1 (en) | 2014-09-25 |
| EP2178655B1 (en) | 2018-09-19 |
| US8293019B2 (en) | 2012-10-23 |
| US8986460B2 (en) | 2015-03-24 |
| JP2010536066A (ja) | 2010-11-25 |
| US20090065024A1 (en) | 2009-03-12 |
| US7993464B2 (en) | 2011-08-09 |
| US20140069457A1 (en) | 2014-03-13 |
| EP2178655A1 (en) | 2010-04-28 |
| US8613803B2 (en) | 2013-12-24 |
| EP2178655A4 (en) | 2014-05-07 |
| US20090038637A1 (en) | 2009-02-12 |
| US8741067B2 (en) | 2014-06-03 |
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