KR20080076694A - 반도체 발광 소자, 및 그것을 이용한 광전자 집적 회로, 및광전자 집적 회로의 제조 방법 - Google Patents
반도체 발광 소자, 및 그것을 이용한 광전자 집적 회로, 및광전자 집적 회로의 제조 방법 Download PDFInfo
- Publication number
- KR20080076694A KR20080076694A KR1020070117564A KR20070117564A KR20080076694A KR 20080076694 A KR20080076694 A KR 20080076694A KR 1020070117564 A KR1020070117564 A KR 1020070117564A KR 20070117564 A KR20070117564 A KR 20070117564A KR 20080076694 A KR20080076694 A KR 20080076694A
- Authority
- KR
- South Korea
- Prior art keywords
- light emitting
- silicon
- film
- region
- waveguide
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 122
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 121
- 230000005693 optoelectronics Effects 0.000 title claims description 6
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 188
- 239000010703 silicon Substances 0.000 claims abstract description 187
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 186
- 238000000034 method Methods 0.000 claims abstract description 125
- 239000000758 substrate Substances 0.000 claims abstract description 75
- 230000008569 process Effects 0.000 claims abstract description 56
- 239000010409 thin film Substances 0.000 claims abstract description 44
- 229910021421 monocrystalline silicon Inorganic materials 0.000 claims abstract description 29
- 239000000463 material Substances 0.000 claims abstract description 19
- 239000010408 film Substances 0.000 claims description 301
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 74
- 239000010410 layer Substances 0.000 claims description 73
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 66
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims description 66
- 229910052814 silicon oxide Inorganic materials 0.000 claims description 44
- 229910052751 metal Inorganic materials 0.000 claims description 41
- 239000002184 metal Substances 0.000 claims description 41
- 239000012535 impurity Substances 0.000 claims description 40
- 239000013078 crystal Substances 0.000 claims description 27
- 230000003647 oxidation Effects 0.000 claims description 26
- 238000007254 oxidation reaction Methods 0.000 claims description 26
- 239000011229 interlayer Substances 0.000 claims description 22
- 150000001875 compounds Chemical class 0.000 claims description 20
- 230000015572 biosynthetic process Effects 0.000 claims description 18
- 150000002500 ions Chemical class 0.000 claims description 17
- 150000004767 nitrides Chemical class 0.000 claims description 16
- 238000000151 deposition Methods 0.000 claims description 14
- 238000010438 heat treatment Methods 0.000 claims description 14
- 229910021332 silicide Inorganic materials 0.000 claims description 14
- FVBUAEGBCNSCDD-UHFFFAOYSA-N silicide(4-) Chemical compound [Si-4] FVBUAEGBCNSCDD-UHFFFAOYSA-N 0.000 claims description 14
- 230000007704 transition Effects 0.000 claims description 13
- 238000009792 diffusion process Methods 0.000 claims description 11
- 238000012545 processing Methods 0.000 claims description 10
- 230000003287 optical effect Effects 0.000 claims description 7
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims description 6
- 230000005669 field effect Effects 0.000 claims description 4
- 238000002347 injection Methods 0.000 claims description 3
- 239000007924 injection Substances 0.000 claims description 3
- 230000005540 biological transmission Effects 0.000 claims description 2
- 229910044991 metal oxide Inorganic materials 0.000 claims description 2
- 150000004706 metal oxides Chemical class 0.000 claims description 2
- 239000012530 fluid Substances 0.000 claims 1
- 229910052732 germanium Inorganic materials 0.000 abstract description 3
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 abstract description 3
- 230000005428 wave function Effects 0.000 description 24
- 238000010586 diagram Methods 0.000 description 19
- 238000005468 ion implantation Methods 0.000 description 18
- 235000012239 silicon dioxide Nutrition 0.000 description 15
- 239000000377 silicon dioxide Substances 0.000 description 15
- 230000006870 function Effects 0.000 description 14
- 238000002513 implantation Methods 0.000 description 14
- 239000012212 insulator Substances 0.000 description 13
- 235000012431 wafers Nutrition 0.000 description 11
- 238000001312 dry etching Methods 0.000 description 10
- 239000000523 sample Substances 0.000 description 10
- 239000012298 atmosphere Substances 0.000 description 8
- 229920002120 photoresistant polymer Polymers 0.000 description 8
- 230000008859 change Effects 0.000 description 7
- 238000005229 chemical vapour deposition Methods 0.000 description 7
- 230000000694 effects Effects 0.000 description 7
- 238000004020 luminiscence type Methods 0.000 description 7
- 125000006850 spacer group Chemical group 0.000 description 7
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 6
- 229910052796 boron Inorganic materials 0.000 description 6
- 238000004891 communication Methods 0.000 description 6
- 239000000243 solution Substances 0.000 description 6
- 230000004913 activation Effects 0.000 description 5
- 230000005684 electric field Effects 0.000 description 5
- 238000005530 etching Methods 0.000 description 5
- 239000011521 glass Substances 0.000 description 5
- 230000003993 interaction Effects 0.000 description 5
- 239000002105 nanoparticle Substances 0.000 description 5
- 230000001590 oxidative effect Effects 0.000 description 5
- 229910052698 phosphorus Inorganic materials 0.000 description 5
- 238000000206 photolithography Methods 0.000 description 5
- 229920001296 polysiloxane Polymers 0.000 description 5
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 4
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 description 4
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 4
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 4
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 4
- 230000001133 acceleration Effects 0.000 description 4
- 229910052785 arsenic Inorganic materials 0.000 description 4
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 4
- 230000008878 coupling Effects 0.000 description 4
- 238000010168 coupling process Methods 0.000 description 4
- 238000005859 coupling reaction Methods 0.000 description 4
- 238000002474 experimental method Methods 0.000 description 4
- 238000009413 insulation Methods 0.000 description 4
- 238000001459 lithography Methods 0.000 description 4
- 239000011159 matrix material Substances 0.000 description 4
- 239000002245 particle Substances 0.000 description 4
- 238000000059 patterning Methods 0.000 description 4
- 239000011574 phosphorus Substances 0.000 description 4
- 238000005424 photoluminescence Methods 0.000 description 4
- 238000005498 polishing Methods 0.000 description 4
- 230000006798 recombination Effects 0.000 description 4
- 238000005215 recombination Methods 0.000 description 4
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 4
- 229910000577 Silicon-germanium Inorganic materials 0.000 description 3
- LEVVHYCKPQWKOP-UHFFFAOYSA-N [Si].[Ge] Chemical compound [Si].[Ge] LEVVHYCKPQWKOP-UHFFFAOYSA-N 0.000 description 3
- 229910021417 amorphous silicon Inorganic materials 0.000 description 3
- 230000004888 barrier function Effects 0.000 description 3
- 238000004140 cleaning Methods 0.000 description 3
- 230000007547 defect Effects 0.000 description 3
- 230000010354 integration Effects 0.000 description 3
- 230000005610 quantum mechanics Effects 0.000 description 3
- 238000001228 spectrum Methods 0.000 description 3
- 238000005406 washing Methods 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 2
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 2
- 238000000137 annealing Methods 0.000 description 2
- 229910017052 cobalt Inorganic materials 0.000 description 2
- 239000010941 cobalt Substances 0.000 description 2
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 230000005685 electric field effect Effects 0.000 description 2
- 238000005401 electroluminescence Methods 0.000 description 2
- 239000001257 hydrogen Substances 0.000 description 2
- 229910052739 hydrogen Inorganic materials 0.000 description 2
- 238000002955 isolation Methods 0.000 description 2
- 238000010030 laminating Methods 0.000 description 2
- 239000005543 nano-size silicon particle Substances 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 239000013307 optical fiber Substances 0.000 description 2
- 230000010355 oscillation Effects 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 230000001902 propagating effect Effects 0.000 description 2
- 150000003376 silicon Chemical class 0.000 description 2
- 230000005476 size effect Effects 0.000 description 2
- 230000003595 spectral effect Effects 0.000 description 2
- 230000008093 supporting effect Effects 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- 229910052719 titanium Inorganic materials 0.000 description 2
- 238000001039 wet etching Methods 0.000 description 2
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 238000002048 anodisation reaction Methods 0.000 description 1
- -1 as shown in FIG. 106 Chemical compound 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000007795 chemical reaction product Substances 0.000 description 1
- 238000005253 cladding Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000001427 coherent effect Effects 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 229910021419 crystalline silicon Inorganic materials 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 230000005672 electromagnetic field Effects 0.000 description 1
- 238000000572 ellipsometry Methods 0.000 description 1
- 238000004134 energy conservation Methods 0.000 description 1
- 238000004299 exfoliation Methods 0.000 description 1
- 210000000416 exudates and transudate Anatomy 0.000 description 1
- 238000011049 filling Methods 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 230000005283 ground state Effects 0.000 description 1
- 239000002784 hot electron Substances 0.000 description 1
- 238000009396 hybridization Methods 0.000 description 1
- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 1
- 239000007943 implant Substances 0.000 description 1
- 230000001976 improved effect Effects 0.000 description 1
- 230000001939 inductive effect Effects 0.000 description 1
- 230000010365 information processing Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000005459 micromachining Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000012299 nitrogen atmosphere Substances 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 229910021426 porous silicon Inorganic materials 0.000 description 1
- 238000005036 potential barrier Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000004321 preservation Methods 0.000 description 1
- 239000000047 product Substances 0.000 description 1
- 230000000644 propagated effect Effects 0.000 description 1
- 230000005639 quantum mechanical wave Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
- 238000000391 spectroscopic ellipsometry Methods 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
- 229910000314 transition metal oxide Inorganic materials 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 238000012795 verification Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H29/00—Integrated devices, or assemblies of multiple devices, comprising at least one light-emitting semiconductor element covered by group H10H20/00
- H10H29/10—Integrated devices comprising at least one light-emitting semiconductor component covered by group H10H20/00
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/10—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
- G02B6/12—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
- G02B6/13—Integrated optical circuits characterised by the manufacturing method
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/822—Materials of the light-emitting regions
- H10H20/826—Materials of the light-emitting regions comprising only Group IV materials
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/42—Coupling light guides with opto-electronic elements
- G02B6/43—Arrangements comprising a plurality of opto-electronic elements and associated optical interconnections
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Led Devices (AREA)
- Optical Couplings Of Light Guides (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2007-00036328 | 2007-02-16 | ||
| JP2007036328A JP4996938B2 (ja) | 2007-02-16 | 2007-02-16 | 半導体発光素子 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20080076694A true KR20080076694A (ko) | 2008-08-20 |
Family
ID=39420503
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020070117564A Abandoned KR20080076694A (ko) | 2007-02-16 | 2007-11-16 | 반도체 발광 소자, 및 그것을 이용한 광전자 집적 회로, 및광전자 집적 회로의 제조 방법 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US8030668B2 (enExample) |
| EP (1) | EP1959504A3 (enExample) |
| JP (1) | JP4996938B2 (enExample) |
| KR (1) | KR20080076694A (enExample) |
Families Citing this family (37)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5003013B2 (ja) * | 2006-04-25 | 2012-08-15 | 株式会社日立製作所 | シリコン発光ダイオード、シリコン光トランジスタ、シリコンレーザー及びそれらの製造方法。 |
| JP5117156B2 (ja) * | 2007-10-05 | 2013-01-09 | 株式会社日立製作所 | 半導体装置 |
| FR2925728B1 (fr) * | 2007-12-20 | 2010-01-01 | Commissariat Energie Atomique | Procede de fabrication d'un dispositif d'identification et d'authentification a base de diode organique, dispositif et procede d'utilisation. |
| US20100289037A1 (en) * | 2008-01-15 | 2010-11-18 | Shin Matsumoto | Semiconductor device, manufacturing method thereof and display device |
| JP2010238722A (ja) * | 2009-03-30 | 2010-10-21 | Hitachi Ltd | シリコン発光素子 |
| US8269931B2 (en) * | 2009-09-14 | 2012-09-18 | The Aerospace Corporation | Systems and methods for preparing films using sequential ion implantation, and films formed using same |
| US8946864B2 (en) | 2011-03-16 | 2015-02-03 | The Aerospace Corporation | Systems and methods for preparing films comprising metal using sequential ion implantation, and films formed using same |
| JP5762851B2 (ja) * | 2011-06-28 | 2015-08-12 | 株式会社日立製作所 | シリコン及びゲルマニウム発光素子 |
| US9209091B1 (en) | 2011-08-05 | 2015-12-08 | Maxim Integrated Products, Inc. | Integrated monolithic galvanic isolator |
| WO2013118248A1 (ja) * | 2012-02-06 | 2013-08-15 | 株式会社日立製作所 | 発光素子 |
| US8995800B2 (en) * | 2012-07-06 | 2015-03-31 | Teledyne Scientific & Imaging, Llc | Method of fabricating silicon waveguides with embedded active circuitry |
| US20140027808A1 (en) * | 2012-07-26 | 2014-01-30 | University Of Rochester | Lateral carrier injection infrared light emitting diode structure, method and applications |
| US20140103452A1 (en) | 2012-10-15 | 2014-04-17 | Marvell World Trade Ltd. | Isolation components for transistors formed on fin features of semiconductor substrates |
| JP2014093500A (ja) * | 2012-11-07 | 2014-05-19 | Nippon Telegr & Teleph Corp <Ntt> | 発光素子 |
| JP2014165292A (ja) * | 2013-02-25 | 2014-09-08 | Hitachi Ltd | 発光素子及びその製造方法並びに光送受信器 |
| US9324579B2 (en) | 2013-03-14 | 2016-04-26 | The Aerospace Corporation | Metal structures and methods of using same for transporting or gettering materials disposed within semiconductor substrates |
| US9690042B2 (en) * | 2013-05-23 | 2017-06-27 | Electronics And Telecommunications Research Institute | Optical input/output device, optical electronic system including the same, and method of manufacturing the same |
| US10571631B2 (en) | 2015-01-05 | 2020-02-25 | The Research Foundation For The State University Of New York | Integrated photonics including waveguiding material |
| US9362444B1 (en) * | 2015-03-18 | 2016-06-07 | International Business Machines Corporation | Optoelectronics and CMOS integration on GOI substrate |
| KR101677542B1 (ko) * | 2015-04-15 | 2016-11-18 | 연세대학교 산학협력단 | 무기물질 웨이퍼 내부의 스트레인을 이용한 고성능 유연 무기물질, 그 제조 방법 및 전계효과 트랜지스터 |
| JP6600513B2 (ja) * | 2015-09-04 | 2019-10-30 | ルネサスエレクトロニクス株式会社 | 半導体装置およびその製造方法 |
| JP6697858B2 (ja) * | 2015-09-04 | 2020-05-27 | ルネサスエレクトロニクス株式会社 | 半導体装置およびその製造方法 |
| US10776912B2 (en) * | 2016-03-09 | 2020-09-15 | Agency For Science, Technology And Research | Self-determining inspection method for automated optical wire bond inspection |
| US9653441B1 (en) * | 2016-06-20 | 2017-05-16 | International Business Machines Corporation | Monolithic integration of a III-V optoelectronic device, a filter and a driving circuit |
| US10976491B2 (en) | 2016-11-23 | 2021-04-13 | The Research Foundation For The State University Of New York | Photonics interposer optoelectronics |
| EP3340403B1 (en) * | 2016-12-23 | 2023-06-28 | IMEC vzw | Improvements in or relating to laser devices |
| CN110770615A (zh) * | 2017-04-19 | 2020-02-07 | 卢克斯特拉有限公司 | 用于二维模式匹配光栅耦合器的方法和系统 |
| US10698156B2 (en) | 2017-04-27 | 2020-06-30 | The Research Foundation For The State University Of New York | Wafer scale bonded active photonics interposer |
| FR3079036A1 (fr) * | 2018-03-15 | 2019-09-20 | Stmicroelectronics (Crolles 2) Sas | Dispositif de filtrage dans un guide d'onde |
| US10877300B2 (en) | 2018-04-04 | 2020-12-29 | The Research Foundation For The State University Of New York | Heterogeneous structure on an integrated photonics platform |
| US10816724B2 (en) | 2018-04-05 | 2020-10-27 | The Research Foundation For The State University Of New York | Fabricating photonics structure light signal transmission regions |
| TWI851601B (zh) | 2018-11-21 | 2024-08-11 | 紐約州立大學研究基金會 | 光子光電系統及其製造方法 |
| US11550099B2 (en) | 2018-11-21 | 2023-01-10 | The Research Foundation For The State University Of New York | Photonics optoelectrical system |
| US11029466B2 (en) | 2018-11-21 | 2021-06-08 | The Research Foundation For The State University Of New York | Photonics structure with integrated laser |
| TWI683370B (zh) * | 2019-03-12 | 2020-01-21 | 環球晶圓股份有限公司 | 半導體元件及其製造方法 |
| EP3987578A2 (en) | 2019-06-18 | 2022-04-27 | The Research Foundation for The State University of New York | Fabricating photonics structure conductive pathways |
| JP7467146B2 (ja) * | 2020-02-07 | 2024-04-15 | ソニーセミコンダクタソリューションズ株式会社 | 発光装置及び発光装置の製造方法、並びに、表示装置 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3181303B2 (ja) * | 1990-04-20 | 2001-07-03 | 株式会社日立製作所 | 発光素子 |
| JPH06140669A (ja) * | 1992-10-29 | 1994-05-20 | Hitachi Ltd | 発光素子及びその製造方法 |
| JPH06268254A (ja) * | 1993-03-15 | 1994-09-22 | Toshiba Corp | 半導体装置 |
| JPH0846237A (ja) * | 1994-07-27 | 1996-02-16 | Nippon Telegr & Teleph Corp <Ntt> | シリコン発光ダイオード |
| JP3565453B2 (ja) * | 1994-08-23 | 2004-09-15 | キヤノン株式会社 | 画像入出力装置 |
| US5466948A (en) * | 1994-10-11 | 1995-11-14 | John M. Baker | Monolithic silicon opto-coupler using enhanced silicon based LEDS |
| JPH09205223A (ja) * | 1995-11-24 | 1997-08-05 | Denso Corp | 半導体装置 |
| JPH10144953A (ja) * | 1996-11-05 | 1998-05-29 | Denso Corp | モノリシックフォトカプラ |
| EP0895292A1 (en) * | 1997-07-29 | 1999-02-03 | Hitachi Europe Limited | Electroluminescent device |
| JP2001042150A (ja) * | 1999-07-30 | 2001-02-16 | Canon Inc | 光導波路、その作製方法、およびこれを用いた光インタコネクション装置 |
| US6611000B2 (en) * | 2001-03-14 | 2003-08-26 | Matsushita Electric Industrial Co., Ltd. | Lighting device |
| AUPR534201A0 (en) * | 2001-05-30 | 2001-06-21 | Unisearch Limited | High efficiency silicon light emitting device |
-
2007
- 2007-02-16 JP JP2007036328A patent/JP4996938B2/ja not_active Expired - Fee Related
- 2007-11-06 US US11/935,904 patent/US8030668B2/en not_active Expired - Fee Related
- 2007-11-12 EP EP07021946A patent/EP1959504A3/en not_active Withdrawn
- 2007-11-16 KR KR1020070117564A patent/KR20080076694A/ko not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| EP1959504A3 (en) | 2012-12-26 |
| US8030668B2 (en) | 2011-10-04 |
| EP1959504A2 (en) | 2008-08-20 |
| JP2008205006A (ja) | 2008-09-04 |
| JP4996938B2 (ja) | 2012-08-08 |
| US20080197362A1 (en) | 2008-08-21 |
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