KR20060105607A - 집적 회로 장치 및 뒤틀림 제어 방법 - Google Patents
집적 회로 장치 및 뒤틀림 제어 방법 Download PDFInfo
- Publication number
- KR20060105607A KR20060105607A KR1020060029103A KR20060029103A KR20060105607A KR 20060105607 A KR20060105607 A KR 20060105607A KR 1020060029103 A KR1020060029103 A KR 1020060029103A KR 20060029103 A KR20060029103 A KR 20060029103A KR 20060105607 A KR20060105607 A KR 20060105607A
- Authority
- KR
- South Korea
- Prior art keywords
- base
- die
- layer
- thermal expansion
- offset
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W40/00—Arrangements for thermal protection or thermal control
- H10W40/20—Arrangements for cooling
- H10W40/25—Arrangements for cooling characterised by their materials
- H10W40/255—Arrangements for cooling characterised by their materials having a laminate or multilayered structure, e.g. direct bond copper [DBC] ceramic substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
Landscapes
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/095,929 US7408246B2 (en) | 2005-03-31 | 2005-03-31 | Controlling warping in integrated circuit devices |
| US11/095,929 | 2005-03-31 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020130092155A Division KR20130100074A (ko) | 2005-03-31 | 2013-08-02 | 집적 회로 장치 및 뒤틀림 제어 방법 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20060105607A true KR20060105607A (ko) | 2006-10-11 |
Family
ID=37069337
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020060029103A Ceased KR20060105607A (ko) | 2005-03-31 | 2006-03-30 | 집적 회로 장치 및 뒤틀림 제어 방법 |
| KR1020130092155A Ceased KR20130100074A (ko) | 2005-03-31 | 2013-08-02 | 집적 회로 장치 및 뒤틀림 제어 방법 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020130092155A Ceased KR20130100074A (ko) | 2005-03-31 | 2013-08-02 | 집적 회로 장치 및 뒤틀림 제어 방법 |
Country Status (3)
| Country | Link |
|---|---|
| US (4) | US7408246B2 (https=) |
| JP (1) | JP5657188B2 (https=) |
| KR (2) | KR20060105607A (https=) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1930943A4 (en) * | 2005-09-28 | 2009-11-11 | Ngk Insulators Ltd | COOLING BODY MODULE AND PROCESS FOR ITS MANUFACTURE |
| JP5466578B2 (ja) * | 2010-05-27 | 2014-04-09 | 株式会社神戸製鋼所 | ダイヤモンド・アルミニウム接合体及びその製造方法 |
| US20130308274A1 (en) * | 2012-05-21 | 2013-11-21 | Triquint Semiconductor, Inc. | Thermal spreader having graduated thermal expansion parameters |
| US9028628B2 (en) | 2013-03-14 | 2015-05-12 | International Business Machines Corporation | Wafer-to-wafer oxide fusion bonding |
| US9058974B2 (en) | 2013-06-03 | 2015-06-16 | International Business Machines Corporation | Distorting donor wafer to corresponding distortion of host wafer |
| KR20170054958A (ko) * | 2015-11-10 | 2017-05-18 | 주식회사 기가레인 | 고주파 전력 증폭기 |
| WO2024101163A1 (ja) * | 2022-11-08 | 2024-05-16 | 日本碍子株式会社 | 電気化学セル |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5339742B2 (https=) | 1971-11-08 | 1978-10-23 | ||
| JPS63261863A (ja) * | 1987-04-20 | 1988-10-28 | Hitachi Cable Ltd | 表面実装用基板 |
| JPH08222658A (ja) * | 1995-02-17 | 1996-08-30 | Sumitomo Electric Ind Ltd | 半導体素子用パッケージ及びその製造方法 |
| JPH1079405A (ja) | 1996-09-04 | 1998-03-24 | Hitachi Ltd | 半導体装置およびそれが実装された電子部品 |
| JPH10163386A (ja) * | 1996-12-03 | 1998-06-19 | Toshiba Corp | 半導体装置、半導体パッケージおよび実装回路装置 |
| US6291899B1 (en) * | 1999-02-16 | 2001-09-18 | Micron Technology, Inc. | Method and apparatus for reducing BGA warpage caused by encapsulation |
| US6696748B1 (en) * | 2002-08-23 | 2004-02-24 | Micron Technology, Inc. | Stress balanced semiconductor packages, method of fabrication and modified mold segment |
| US7164200B2 (en) * | 2004-02-27 | 2007-01-16 | Agere Systems Inc. | Techniques for reducing bowing in power transistor devices |
-
2005
- 2005-03-31 US US11/095,929 patent/US7408246B2/en not_active Expired - Lifetime
-
2006
- 2006-03-30 KR KR1020060029103A patent/KR20060105607A/ko not_active Ceased
- 2006-03-31 JP JP2006096225A patent/JP5657188B2/ja not_active Expired - Lifetime
-
2008
- 2008-06-27 US US12/163,453 patent/US7598602B2/en not_active Expired - Lifetime
-
2009
- 2009-08-24 US US12/546,083 patent/US7923347B2/en not_active Expired - Lifetime
-
2011
- 2011-03-07 US US13/041,674 patent/US8133799B2/en not_active Expired - Lifetime
-
2013
- 2013-08-02 KR KR1020130092155A patent/KR20130100074A/ko not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| JP2006287227A (ja) | 2006-10-19 |
| US8133799B2 (en) | 2012-03-13 |
| US20080258275A1 (en) | 2008-10-23 |
| US7923347B2 (en) | 2011-04-12 |
| US7408246B2 (en) | 2008-08-05 |
| JP5657188B2 (ja) | 2015-01-21 |
| US20110250742A1 (en) | 2011-10-13 |
| US20060220194A1 (en) | 2006-10-05 |
| US20090311853A1 (en) | 2009-12-17 |
| US7598602B2 (en) | 2009-10-06 |
| KR20130100074A (ko) | 2013-09-09 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| R17-X000 | Change to representative recorded |
St.27 status event code: A-3-3-R10-R17-oth-X000 |
|
| A201 | Request for examination | ||
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
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| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
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| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
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| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
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St.27 status event code: U-3-3-T10-T11-oth-X000 |
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St.27 status event code: U-3-3-T10-T11-oth-X000 |
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| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
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| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
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| E601 | Decision to refuse application | ||
| PE0601 | Decision on rejection of patent |
St.27 status event code: N-2-6-B10-B15-exm-PE0601 |
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| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
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| J201 | Request for trial against refusal decision | ||
| PJ0201 | Trial against decision of rejection |
St.27 status event code: A-3-3-V10-V11-apl-PJ0201 |
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| A107 | Divisional application of patent | ||
| PA0107 | Divisional application |
St.27 status event code: A-0-1-A10-A18-div-PA0107 St.27 status event code: A-0-1-A10-A16-div-PA0107 |
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| J301 | Trial decision |
Free format text: TRIAL DECISION FOR APPEAL AGAINST DECISION TO DECLINE REFUSAL REQUESTED 20130708 Effective date: 20140930 Free format text: TRIAL NUMBER: 2013101005025; TRIAL DECISION FOR APPEAL AGAINST DECISION TO DECLINE REFUSAL REQUESTED 20130708 Effective date: 20140930 |
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| PJ1301 | Trial decision |
St.27 status event code: A-3-3-V10-V15-crt-PJ1301 Decision date: 20140930 Appeal event data comment text: Appeal Kind Category : Appeal against decision to decline refusal, Appeal Ground Text : 2006 0029103 Appeal request date: 20130708 Appellate body name: Patent Examination Board Decision authority category: Office appeal board Decision identifier: 2013101005025 |
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| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
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| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |