KR20060082053A - 와이어 루프, 그것을 갖는 반도체 장치 및 와이어 본딩방법 - Google Patents
와이어 루프, 그것을 갖는 반도체 장치 및 와이어 본딩방법 Download PDFInfo
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Abstract
Description
Claims (14)
- 제1 본딩 포인트와 제2 본딩 포인트를 연결하는 와이어를 포함하되,상기 와이어는, 상기 제1 본딩 포인트에 본딩된 볼, 상기 볼에 인접한 목 부분 및 상기 목 부분으로부터 상기 제2 본딩 포인트까지 연장하는 주요부를 포함하고,상기 목 부분은, 상기 제2 본딩 포인트를 향해 상기 본딩된 볼로부터 경사지게 위로 연장하는 기상부를 포함하고, 상기 기상부는, 모세관의 개구부로 들어가고 볼 본딩시에 형상화된, 상기 볼의 상부에 의해 형성되는 와이어 루프.
- 청구항 1에 있어서,상기 와이어는 상기 목 부분 또는 상기 주요부 상에 형성된 적어도 하나의 절곡 마크를 포함하는 와이어 루프.
- 청구항 2에 있어서,상기 와이어는 상기 목 부분과 상기 주요부 사이에 절곡부를 포함하고,복수개의 상기 절곡 마크들이 상기 절곡부 상에 또는 상기 절곡부 근처에 형성된 와이어 루프.
- 모세관을 사용하여 제1 본딩 포인트와 제2 본딩 포인트 사이에 와이어를 본 딩하기 위한 와이어 본딩 방법에 있어서,상기 제1 본딩 포인트에 상기 와이어의 끝단 상에 형성된 볼을 본딩하고;상기 본딩된 볼에서 연장하는 상기 와이어의 기상부를 상기 제2 본딩 포인트를 향해 기울이는 것을 포함하되, 상기 기상부는, 상기 모세관의 개구부에 들어가고 상기 제1 본딩 포인트에 상기 볼 본딩시 형상화된, 상기 볼의 상부에 의해 형성되는 와이어 본딩 방법.
- 청구항 4에 있어서,상기 모세관을 경사지게 위로 이동하거나, 상기 모세관을 위로 이동한 후 수평으로 이동하거나, 또는 상기 모세관을 위로 이동한 후 경사지게 아래로 이동함으로써, 상기 기상부에서 연장하는 상기 와이어의 일부분 상에 적어도 하나의 절곡부를 형성하는 것을 더 포함하는 와이어 본딩 방법.
- 청구항 5에 있어서,상기 기상부를 기울이는 것은 상기 모세관을 경사지게 위로 이동함으로써 수행되고 상기 와이어의 상기 기상부 상에 절곡부를 형성하는 것을 포함하는 와이어 본딩 방법.
- 모세관을 사용하여 제1 본딩 포인트와 제2 본딩 포인트 사이에 와이어를 본딩하기 위한 와이어 본딩 방법에 있어서,(a) 상기 제1 본딩 포인트에 상기 와이어의 끝단 상에 형성된 볼을 본딩하고;(b) 상기 모세관을 상기 제2 본딩 포인트를 향해 경사지게 위로 이동하여 상기 와이어의 제1 부분을 만들되, 상기 제1 부분은, 상기 제1 본딩 포인트에 상기 볼 본딩시 상기 모세관의 개구부에 들어간 부분으로, 상기 제2 본딩 포인트를 향해 경사지게 위로 연장하고,(c) 그 후, 루프 제어를 수행하면서 상기 모세관을 수직 및 수평으로 이동하여 상기 제1 부분에서 연장하는 상기 와이어의 제2 부분 상에 적어도 하나의 절곡부를 형성하고,(d) 그 후, 상기 모세관으로부터 상기 와이어를 공급하고 루프 제어를 수행하면서 상기 모세관을 수평 및 수직으로 상기 제2 본딩 포인트 까지 이동한 후, 상기 와이어를 상기 제2 본딩 포인트에 본딩하는 단계들을 포함하는 와이어 본딩 방법.
- 청구항 7에 있어서,상기 단계 (b)에서 또 다른 절곡부가 상기 와이어의 상기 제1 부분 상에 형성되는 와이어 본딩 방법.
- 청구항 7에 있어서,상기 단계 (c)는, 상기 모세관을 경사지게 위로 이동하거나, 상기 모세관을 위로 이동한 후 수평으로 이동하거나, 또는 상기 모세관을 위로 이동한 후 경사지게 아래로 이동함으로써 수행되는 와이어 본딩 방법.
- 청구항 9에 있어서,상기 단계 (c)는 반복 수행되어 상기 와이어의 상기 제2 부분 상에 복수개의 상기 절곡부들을 형성하는 와이어 본딩 방법.
- 청구항 9에 있어서,큰 크기의 최종 절곡부가 상기 단계 (d)에서 상기 와이어의 상기 제1 부분 및 상기 제2 부분 사이에 형성되되, 상기 적어도 하나의 절곡부가 절곡 마크로서 상기 최종 절곡부 상에 또는 상기 최종 절곡부 근처에 놓여질 상기 와이어 상의 위치에 상기 적어도 하나의 절곡부가 배치되는 와이어 본딩 방법.
- 제1 본딩 포인트;제2 본딩 포인트; 및상기 제1 본딩 포인트와 상기 제2 본딩 포인트에 본딩되어 상기 제1 본딩 포인트와 상기 제2 본딩 포인트를 연결하는 와이어를 포함하되, 상기 와이어는 상기 제1 본딩 포인트에 본딩된 볼, 상기 볼에 인접한 목 부분 및 상기 목 부분으로부터 상기 제2 본딩 포인트까지 연장하는 주요부를 포함하고,상기 목 부분은 상기 제2 본딩 포인트를 향해 상기 본딩된 볼로부터 경사지 게 위로 연장하는 기상부를 포함하고, 상기 기상부는, 모세관의 개구부에 들어가고 볼 본딩시에 형상화된, 상기 볼의 상부에 의해 형성된 반도체 장치.
- 청구항 12에 있어서,상기 와이어는 상기 목 부분 또는 상기 주요부 상에 형성된 적어도 하나의 절곡 마크를 포함하는 반도체 장치.
- 청구항 13에 있어서,상기 와이어는 상기 상기 목 부분과 상기 주요부 사이에 절곡부를 포함하고,복수개의 상기 절곡 마크들이 상기 절곡부 상에 또는 상기 절곡부 근처에 형성된 반도체 장치.
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2012021349A2 (en) * | 2010-08-10 | 2012-02-16 | Kulicke And Soffa Industries, Inc. | Wire loops, methods of forming wire loops, and related process |
Families Citing this family (30)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4625858B2 (ja) * | 2008-09-10 | 2011-02-02 | 株式会社カイジョー | ワイヤボンディング方法、ワイヤボンディング装置及びワイヤボンディング制御プログラム |
US8389862B2 (en) | 2008-10-07 | 2013-03-05 | Mc10, Inc. | Extremely stretchable electronics |
US8097926B2 (en) | 2008-10-07 | 2012-01-17 | Mc10, Inc. | Systems, methods, and devices having stretchable integrated circuitry for sensing and delivering therapy |
US9123614B2 (en) | 2008-10-07 | 2015-09-01 | Mc10, Inc. | Methods and applications of non-planar imaging arrays |
JP4361593B1 (ja) | 2008-10-21 | 2009-11-11 | 株式会社新川 | ワイヤボンディング方法 |
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JP2011097042A (ja) * | 2009-09-30 | 2011-05-12 | Toto Ltd | ボンディングキャピラリー |
MY181180A (en) * | 2011-09-09 | 2020-12-21 | Carsem M Sdn Bhd | Low loop wire bonding |
US9226402B2 (en) | 2012-06-11 | 2015-12-29 | Mc10, Inc. | Strain isolation structures for stretchable electronics |
US9295842B2 (en) | 2012-07-05 | 2016-03-29 | Mc10, Inc. | Catheter or guidewire device including flow sensing and use thereof |
JP2016500869A (ja) | 2012-10-09 | 2016-01-14 | エムシー10 インコーポレイテッドMc10,Inc. | 衣類と一体化されたコンフォーマル電子回路 |
US9171794B2 (en) | 2012-10-09 | 2015-10-27 | Mc10, Inc. | Embedding thin chips in polymer |
US9706647B2 (en) | 2013-05-14 | 2017-07-11 | Mc10, Inc. | Conformal electronics including nested serpentine interconnects |
EP3030873A4 (en) | 2013-08-05 | 2017-07-05 | Mc10, Inc. | Flexible temperature sensor including conformable electronics |
CA2925387A1 (en) | 2013-10-07 | 2015-04-16 | Mc10, Inc. | Conformal sensor systems for sensing and analysis |
EP3071096A4 (en) | 2013-11-22 | 2017-08-09 | Mc10, Inc. | Conformal sensor systems for sensing and analysis of cardiac activity |
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KR20170058968A (ko) * | 2014-09-22 | 2017-05-29 | 엠씨10, 인크 | 신축성 및 굴곡성 상호 연결부의 역할을 하는 본딩 와이어를 성형 및 루핑하는 방법 및 장치 |
USD781270S1 (en) | 2014-10-15 | 2017-03-14 | Mc10, Inc. | Electronic device having antenna |
CN107530004A (zh) | 2015-02-20 | 2018-01-02 | Mc10股份有限公司 | 基于贴身状况、位置和/或取向的可穿戴式设备的自动检测和构造 |
WO2017015000A1 (en) | 2015-07-17 | 2017-01-26 | Mc10, Inc. | Conductive stiffener, method of making a conductive stiffener, and conductive adhesive and encapsulation layers |
US10709384B2 (en) | 2015-08-19 | 2020-07-14 | Mc10, Inc. | Wearable heat flux devices and methods of use |
EP4079383A3 (en) | 2015-10-01 | 2023-02-22 | Medidata Solutions, Inc. | Method and system for interacting with a virtual environment |
US10532211B2 (en) | 2015-10-05 | 2020-01-14 | Mc10, Inc. | Method and system for neuromodulation and stimulation |
WO2017147053A1 (en) | 2016-02-22 | 2017-08-31 | Mc10, Inc. | System, device, and method for coupled hub and sensor node on-body acquisition of sensor information |
CN115175014A (zh) | 2016-02-22 | 2022-10-11 | 美谛达解决方案公司 | 贴身传感器系统 |
CN109310340A (zh) | 2016-04-19 | 2019-02-05 | Mc10股份有限公司 | 用于测量汗液的方法和系统 |
US10447347B2 (en) | 2016-08-12 | 2019-10-15 | Mc10, Inc. | Wireless charger and high speed data off-loader |
GB2604433B (en) * | 2020-12-23 | 2023-05-03 | Skyworks Solutions Inc | Apparatus and methods for tool mark free stitch bonding |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4327860A (en) * | 1980-01-03 | 1982-05-04 | Kulicke And Soffa Ind. Inc. | Method of making slack free wire interconnections |
JPH06101490B2 (ja) | 1989-10-30 | 1994-12-12 | 三菱電機株式会社 | ワイヤボンディング方法 |
JPH04273135A (ja) | 1991-02-27 | 1992-09-29 | Shinkawa Ltd | ワイヤボンデイング方法 |
JP3152764B2 (ja) | 1992-10-21 | 2001-04-03 | 株式会社東芝 | ワイヤボンダ− |
JPH0951011A (ja) | 1995-08-10 | 1997-02-18 | Tanaka Denshi Kogyo Kk | 半導体チップのワイヤボンディング方法 |
JPH09252249A (ja) * | 1996-03-15 | 1997-09-22 | Hitachi Ltd | Pll周波数シンセサイザ |
JP3349886B2 (ja) * | 1996-04-18 | 2002-11-25 | 松下電器産業株式会社 | 半導体素子の2段突起形状バンプの形成方法 |
JP3189115B2 (ja) * | 1996-12-27 | 2001-07-16 | 株式会社新川 | 半導体装置及びワイヤボンディング方法 |
JP3370539B2 (ja) | 1997-01-13 | 2003-01-27 | 株式会社新川 | ワイヤボンディング方法 |
US6213378B1 (en) * | 1997-01-15 | 2001-04-10 | National Semiconductor Corporation | Method and apparatus for ultra-fine pitch wire bonding |
JPH1167808A (ja) | 1997-08-21 | 1999-03-09 | Hitachi Ltd | 半導体装置の製造方法および半導体装置 |
JP3522123B2 (ja) * | 1998-09-30 | 2004-04-26 | 株式会社新川 | ワイヤボンディング方法 |
JP2000114304A (ja) * | 1998-10-08 | 2000-04-21 | Shinkawa Ltd | ワイヤボンディング方法 |
JP4467175B2 (ja) | 2000-12-22 | 2010-05-26 | 株式会社新川 | ボンディングデータ設定装置および方法 |
JP2002280414A (ja) * | 2001-03-22 | 2002-09-27 | Mitsubishi Electric Corp | 半導体装置およびその製造方法 |
JP3768168B2 (ja) | 2002-04-10 | 2006-04-19 | 株式会社カイジョー | 半導体構造およびボンディング方法 |
US7227240B2 (en) | 2002-09-10 | 2007-06-05 | Semiconductor Components Industries, L.L.C. | Semiconductor device with wire bond inductor and method |
JP2004172477A (ja) | 2002-11-21 | 2004-06-17 | Kaijo Corp | ワイヤループ形状、そのワイヤループ形状を備えた半導体装置、ワイヤボンディング方法及び半導体製造装置 |
JP2004247674A (ja) * | 2003-02-17 | 2004-09-02 | Shinkawa Ltd | ワイヤボンディング方法 |
-
2005
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2012021349A2 (en) * | 2010-08-10 | 2012-02-16 | Kulicke And Soffa Industries, Inc. | Wire loops, methods of forming wire loops, and related process |
WO2012021349A3 (en) * | 2010-08-10 | 2012-05-10 | Kulicke And Soffa Industries, Inc. | Wire loops, methods of forming wire loops, and related process |
US9455544B2 (en) | 2010-08-10 | 2016-09-27 | Kulicke And Soffa Industries, Inc. | Wire loops, methods of forming wire loops, and related processes |
Also Published As
Publication number | Publication date |
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CN1815727B (zh) | 2011-01-26 |
US7815095B2 (en) | 2010-10-19 |
TWI342055B (en) | 2011-05-11 |
TW200629450A (en) | 2006-08-16 |
KR100725307B1 (ko) | 2007-06-07 |
CN1815727A (zh) | 2006-08-09 |
US20060151579A1 (en) | 2006-07-13 |
JP2006196495A (ja) | 2006-07-27 |
JP4137061B2 (ja) | 2008-08-20 |
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