KR20040105831A - 화상 형성 방법 및 장치 - Google Patents
화상 형성 방법 및 장치 Download PDFInfo
- Publication number
- KR20040105831A KR20040105831A KR10-2004-7015595A KR20047015595A KR20040105831A KR 20040105831 A KR20040105831 A KR 20040105831A KR 20047015595 A KR20047015595 A KR 20047015595A KR 20040105831 A KR20040105831 A KR 20040105831A
- Authority
- KR
- South Korea
- Prior art keywords
- transparent medium
- image
- light
- defect
- lens
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 238000003384 imaging method Methods 0.000 title description 3
- 230000003287 optical effect Effects 0.000 claims abstract description 69
- 238000000034 method Methods 0.000 claims abstract description 45
- 230000007547 defect Effects 0.000 claims description 67
- 230000000903 blocking effect Effects 0.000 claims description 11
- 238000004458 analytical method Methods 0.000 claims description 8
- 238000009792 diffusion process Methods 0.000 claims description 7
- 239000011521 glass Substances 0.000 claims description 6
- 238000005286 illumination Methods 0.000 claims description 6
- 238000001914 filtration Methods 0.000 claims description 5
- 239000011248 coating agent Substances 0.000 claims description 3
- 238000000576 coating method Methods 0.000 claims description 3
- 239000000835 fiber Substances 0.000 claims description 3
- 229920006254 polymer film Polymers 0.000 claims description 3
- 239000010408 film Substances 0.000 description 10
- 238000004519 manufacturing process Methods 0.000 description 6
- 238000007689 inspection Methods 0.000 description 5
- 230000015572 biosynthetic process Effects 0.000 description 4
- 238000001514 detection method Methods 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- 230000008901 benefit Effects 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 2
- 230000005670 electromagnetic radiation Effects 0.000 description 2
- 239000012528 membrane Substances 0.000 description 2
- 239000012788 optical film Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 230000005856 abnormality Effects 0.000 description 1
- 238000000149 argon plasma sintering Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
Landscapes
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/115,533 US7023542B2 (en) | 2002-04-03 | 2002-04-03 | Imaging method and apparatus |
| US10/115,533 | 2002-04-03 | ||
| PCT/US2003/002979 WO2003085389A1 (en) | 2002-04-03 | 2003-01-31 | Imaging method and apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20040105831A true KR20040105831A (ko) | 2004-12-16 |
Family
ID=28673792
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR10-2004-7015595A Ceased KR20040105831A (ko) | 2002-04-03 | 2003-01-31 | 화상 형성 방법 및 장치 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US7023542B2 (enExample) |
| EP (1) | EP1493022A1 (enExample) |
| JP (1) | JP2005528593A (enExample) |
| KR (1) | KR20040105831A (enExample) |
| CN (1) | CN1646895A (enExample) |
| AU (1) | AU2003210779A1 (enExample) |
| WO (1) | WO2003085389A1 (enExample) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7623699B2 (en) | 2004-04-19 | 2009-11-24 | 3M Innovative Properties Company | Apparatus and method for the automated marking of defects on webs of material |
| GB0503184D0 (en) * | 2005-02-16 | 2005-03-23 | Greenbank Terotech Ltd | A method and a device for generating data relating to particles in a particulate material |
| FR2892191B1 (fr) * | 2005-10-17 | 2008-04-04 | Vai Clecim Soc Par Actions Sim | Dispositif compact et procede d'inspection d'un produit en defilement, pour la detection automatique de defauts. |
| KR101442871B1 (ko) * | 2007-02-16 | 2014-09-19 | 쓰리엠 이노베이티브 프로퍼티즈 컴파니 | 시트 재료 조명 시스템 및 방법 |
| US7542821B2 (en) * | 2007-07-26 | 2009-06-02 | 3M Innovative Properties Company | Multi-unit process spatial synchronization of image inspection systems |
| US8175739B2 (en) * | 2007-07-26 | 2012-05-08 | 3M Innovative Properties Company | Multi-unit process spatial synchronization |
| US7797133B2 (en) * | 2008-09-10 | 2010-09-14 | 3M Innovative Properties Company | Multi-roller registered repeat defect detection of a web process line |
| CN102081047B (zh) * | 2009-11-27 | 2015-04-08 | 法国圣-戈班玻璃公司 | 用于对基板的缺陷进行区分的方法和系统 |
| JP6037701B2 (ja) * | 2012-08-03 | 2016-12-07 | 株式会社日立ハイテクノロジーズ | 免疫分析装置 |
| CN107688248A (zh) * | 2016-08-05 | 2018-02-13 | 豪威科技股份有限公司 | 硅基液晶测试平台 |
| TW201818065A (zh) * | 2016-09-01 | 2018-05-16 | 美商3M新設資產公司 | 機器方向線膜檢測 |
| JP2018147579A (ja) * | 2017-03-01 | 2018-09-20 | オムロン株式会社 | 光電センサ |
| US12305983B2 (en) * | 2020-06-17 | 2025-05-20 | Corning Incorporated | Methods and apparatus for measuring a feature of glass-based substrate |
Family Cites Families (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| NL272308A (enExample) * | 1960-12-13 | |||
| GB1008769A (en) * | 1962-07-31 | 1965-11-03 | Ernest Arthur Timson | Apparatus for checking the pitch of uniformly spaced visible effects in the course of being formed in a travelling strip or web |
| DE2220373A1 (de) * | 1972-04-26 | 1973-11-15 | Wernicke & Co Kg | Vorrichtung zum zentrieren von brillenglaesern, insbesondere von brillenglaesern mit nahteil, und zum anbringen eines halteteils auf dem brillenglas |
| US3788750A (en) * | 1972-12-06 | 1974-01-29 | Libbey Owens Ford Co | Inspecting glass |
| SU840712A1 (ru) | 1978-02-09 | 1981-06-23 | Предприятие П/Я Р-6681 | Устройство дл исследовани опти-чЕСКиХ НЕОдНОРОдНОСТЕй |
| US4310242A (en) * | 1980-04-01 | 1982-01-12 | The United States Of America As Represented By The Secretary Of The Air Force | Field test unit for windscreen optical evaluation |
| DE3338802A1 (de) * | 1983-10-26 | 1985-05-09 | Feldmühle AG, 4000 Düsseldorf | Vorrichtung und verfahren zum pruefen von materialbahnen |
| GB8424084D0 (en) * | 1984-09-24 | 1984-10-31 | Sira Ltd | Inspection apparatus |
| DE3534019A1 (de) * | 1985-09-24 | 1987-04-02 | Sick Optik Elektronik Erwin | Optische bahnueberwachungsvorrichtung |
| GB8610305D0 (en) * | 1986-04-28 | 1986-06-04 | Sira Ltd | Inspection apparatus |
| WO1987007383A1 (en) | 1986-05-30 | 1987-12-03 | Diffracto, Ltd. | Index-sight |
| JPH0827443B2 (ja) * | 1986-10-16 | 1996-03-21 | オリンパス光学工業株式会社 | シユリ−レン光学装置 |
| GB2202627A (en) * | 1987-03-23 | 1988-09-28 | Sick Optik Elektronik Erwin | Optical arrangement in web monitoring device |
| EP0379281A3 (en) * | 1989-01-19 | 1991-03-20 | Cosmopolitan Textile Company Limited | Web inspecting method and apparatus |
| DE3926349A1 (de) | 1989-08-09 | 1991-02-14 | Sick Optik Elektronik Erwin | Optische fehlerinspektionsvorrichtung |
| DE4139094A1 (de) | 1991-11-28 | 1993-06-03 | Wolf & Beck Gmbh Dr | Messverfahren und messgeraet zur erkennung von stoerstellen bei flachglaesern |
| JP2795595B2 (ja) * | 1992-06-26 | 1998-09-10 | セントラル硝子株式会社 | 透明板状体の欠点検出方法 |
| JPH07151706A (ja) * | 1993-09-03 | 1995-06-16 | Minnesota Mining & Mfg Co <3M> | 物品の欠陥検知装置及びその使用方法 |
| US5515158A (en) * | 1994-02-01 | 1996-05-07 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Retroreflection focusing schlieren system |
| JP3385442B2 (ja) * | 1994-05-31 | 2003-03-10 | 株式会社ニュークリエイション | 検査用光学系および検査装置 |
| JP3178644B2 (ja) * | 1995-02-10 | 2001-06-25 | セントラル硝子株式会社 | 透明板状体の欠点検出方法 |
| US5642198A (en) * | 1995-04-03 | 1997-06-24 | Long; William R. | Method of inspecting moving material |
| JPH08327561A (ja) | 1995-06-05 | 1996-12-13 | Nippon Sheet Glass Co Ltd | 連続シート状物体の欠点検査装置 |
| JPH10115871A (ja) * | 1996-10-14 | 1998-05-06 | Canon Inc | 画像投射装置 |
| IL119850A (en) * | 1996-12-17 | 2000-11-21 | Prolaser Ltd | Optical method and apparatus for detecting low frequency defects |
| US6181416B1 (en) * | 1998-04-14 | 2001-01-30 | Optometrix, Inc. | Schlieren method for imaging semiconductor device properties |
| US6633377B1 (en) | 2000-04-20 | 2003-10-14 | Image Processing Systems Inc. | Dark view inspection system for transparent media |
| AU2000274686A1 (en) | 2000-08-09 | 2002-02-18 | Turkiye Sise Ve Cam Fabrikalari A.S. | Method and apparatus for imaging inhomogeneity in a transparent solid medium |
-
2002
- 2002-04-03 US US10/115,533 patent/US7023542B2/en not_active Expired - Lifetime
-
2003
- 2003-01-31 CN CNA038078430A patent/CN1646895A/zh active Pending
- 2003-01-31 JP JP2003582529A patent/JP2005528593A/ja active Pending
- 2003-01-31 EP EP03745714A patent/EP1493022A1/en not_active Withdrawn
- 2003-01-31 KR KR10-2004-7015595A patent/KR20040105831A/ko not_active Ceased
- 2003-01-31 WO PCT/US2003/002979 patent/WO2003085389A1/en not_active Ceased
- 2003-01-31 AU AU2003210779A patent/AU2003210779A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| AU2003210779A1 (en) | 2003-10-20 |
| US7023542B2 (en) | 2006-04-04 |
| WO2003085389A1 (en) | 2003-10-16 |
| EP1493022A1 (en) | 2005-01-05 |
| CN1646895A (zh) | 2005-07-27 |
| JP2005528593A (ja) | 2005-09-22 |
| US20030189704A1 (en) | 2003-10-09 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0105 | International application |
Patent event date: 20041001 Patent event code: PA01051R01D Comment text: International Patent Application |
|
| PG1501 | Laying open of application | ||
| A201 | Request for examination | ||
| PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 20071214 Comment text: Request for Examination of Application |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20091028 Patent event code: PE09021S01D |
|
| E601 | Decision to refuse application | ||
| PE0601 | Decision on rejection of patent |
Patent event date: 20100126 Comment text: Decision to Refuse Application Patent event code: PE06012S01D Patent event date: 20091028 Comment text: Notification of reason for refusal Patent event code: PE06011S01I |